Helmut Fischer AG
"Measuring Made Easy". According to this motto, market leading Helmut Fischer Group has been developing and manufacturing high-precision measuring instruments for coating thickness measurement, material analysis, materials testing and microhardness for industry and laboratories.
- 49 7031 303 0
- mail@helmut-fischer.com
- sales.de@helmut-fischer.com
- Industriestraße 21
Sindelfingen, 71069
Germany
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Compact Coating Thickness Gauges
MP0 Series
The small all-rounders for mobile coating thickness measurement. Leading industrial instrument series for fast and easy coating thickness measurement in corrosion protection and industrial applications.
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Automation Solutions
We have customized (partially) automated measuring solutions that can be fully integrated seamlessly across all levels of your plant – from cleanroom-compatible measuring systems for automated production to robot-assisted probes in thickness measurement. Whether X-ray, terahertz or electromagnetic, random sampling or 100 % inspection: We offer measurement technology that allows you to inspect surfaces quickly and under constant conditions, save time and costs and ensure the quality of your production.
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Handheld Gauge for Nondestructive Coating Thickness Measurement
PHASCOPE PMP10 DUPLEX
The professional for duplex measuring. The specialist for measuring the thickness of duplex layers from automotive to roof panels.
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XRF Instruments
FISCHERSCOPE® X-RAY XRF measuring instruments are exactly what you need. Precise, fast, reliable and durable: Measure coating thicknesses and analyze materials non-destructively, contact-free and conveniently. The instruments are easy to use and suitable for almost any application.
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Benchtop Unit for Universal Coating Thickness Measurement
FISCHERSCOPE MMS PC2
Multifaceted for coating thickness measurement and material testing. Universal multi-measuring system for parallel coating thickness measurement and material testing with up to eight measuring modules.
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X-ray Fluorescence Measuring system
FISCHERSCOPE® X-RAY 4000 Series
Inline measuring with maximum endurance. Robust inline device for measuring on solid strips, punched grids with measuring structures from a few millimeters up to coated membranes or solid strips up to one meter wide.
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Measuring Devices For Nanoindentation
With our measuring devices, you can determine the mechanical properties of thin coatings reliably and accurately. From protective paint coatings to hardness of PVD coatings: We have the right solution for you. We offer you powerful and easy-to-use measuring instruments for the laboratory and production. You can choose from a wide range of accessories to adapt your device to your individual requirements.
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Portable X-RAY Fluorescence Measuring System
FISCHERSCOPE® X-RAY XAN® 500
Mobile and universal handheld device for precise coating thickness measurement and material analysis - even with difficult material combinations.
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Electrical Conductivity Measuring Instrument
SIGMASCOPE® SMP350
Compact handheld device for measuring the electrical conductivity of non-ferrous metals.
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Premium Handheld Coating Thickness Gauges
DUALSCOPE® FMP100 and H FMP150
Coating thickness measurement at the highest level. The device series for maximum flexibility and control in coating thickness measurement. Ideal for the use of inspection plans.
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Tactile Measuring Devices
You want precise results easily, quickly and flexibly? We have the right tool for you with our tactile measuring devices. Benefit from the broadest probe portfolio on the market and get efficient software solutions for data transmission, data evaluation and data export with the Tactile Suite® and the Fischer DataCenter. Whether coating thickness measurement or materials testing: Discover the right solution for your application and your industry.
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X-ray Fluorescence Measuring Instrument
FISCHERSCOPE® X-RAY XDL®
Your entry into automated measuring. Robust XRF measuring device for quality control of electroplated bulk parts and for bath analysis.
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Terahertz Systems
Non-destructive and non-contact coating thickness measurement of organic single and multilayer systems as well as material analysis.
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X-ray Fluorescence Measuring System
FISCHERSCOPE X-RAY 5000
Inline measuring with highest precision for thin films. Robust XRF instrument for measuring and analyzing thin films and layer systems in the running process with connection to the production control system.
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X-ray Fluorescence (XRF) Measuring Instrument
FISCHERSCOPE XDV-µ
Smallest measuring surface, greatest precision. Universal instrument for measuring on smallest and flat components and structures as well as complex multilayer systems.
