Bruker microCT
Manufacture systems for microtomography, nontomography and non-invasive 3D X-ray microscopy.
- 32 3 877 5705
- 32 3 877 5769
- info.BmCT@bruker.com
- Kartuizersweg 3B
Kontich, 2550
Belgium
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Infrared, Near Infrared & Raman Spectroscopy
Our selection of near, mid and far infrared and Raman spectrometers is unrivalled across the industry. Our portfolio includes compact, portable routine as well as powerful research spectrometers. Our solutions cover the entire spectral range from near infrared, mid infrared, far infrared to THz applications.
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Laboratory Data Management
Bruker offers a wide range of laboratory data management solutions through its portfolio of Arxspan products.
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Nanoindenter
Hysitron TI 980
Bruker’s Hysitron TI 980 TriboIndenter operates at the intersection of maximum performance, flexibility, reliability, usability, and speed. This industry-leading system builds upon decades of Hysitron technological innovation to deliver new levels of extraordinary performance, enhanced capabilities, and ultimate versatility in nanomechanical characterization.
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Nanomechanical Test System
Hysitron TI Premier
Bruker’s Hysitron TI Premier nanoindenter was specifically designed to deliver industry-leading, quantitative nanomechanical characterization within a compact platform. Built upon proven Hysitron technology, the TI Premier provides a broad suite of nanoscale mechanical and tribological testing techniques.
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Nanomechanical Test System
Hysitron TS 77 Select
The Hysitron TS 77 Select automated benchtop nanomechanical and nanotribological test system provides the highest level of performance, functionality, and accessibility of any instrument in its class. Built around Bruker’s renowned TriboScope capacitive transducer technology, this new test system delivers reliable mechanical and tribological characterization over nanometer-to-micrometer length scales.
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Nanomechanical Test Systems
Bruker’s nanomechanical test systems deliver the highest degree of performance, accuracy, reliability, and versatility for quantitative mechanical and tribological characterization at the nanoscale and microscale. Utilizing multiple patented and proprietary technologies, the Hysitron product line of standalone nanomechanical test systems enable quantitative characterization at length scales unreachable by others.
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Optical Emission Spectrometers
Optical emission spectrometers (OES) and the measuring principle of the atomic emission are the ideal method and provide the perfect instrumentation for metal analysis in all different industrial businesses and environments.
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CBRNE Detectors
Investments in intellectual horsepower, research and development; enable Bruker to offer a wide range of products with a broad technological base and high end instrumentation
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CS/ONH-Analysis
G4 PHOENIX DH
The highly sensitive thermal conductivity detector allows analysis down to a sub-ppm range, while the optional mass spectrometer allows detection limits in the low ng/g range.
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CS/ONH-Analysis
G4 ICARUS Series 2
The combustion analyzer G4 ICARUS Series 2 with high frequency (HF) induction furnace and HighSense™ detection sets new standards in for a rapid and precise carbon (C) and sulfur (S) analysis in inorganic solids.
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CS/ONH-Analysis
G8 GALILEO
All state-of-the-art detectors used in the G8 GALILEO are equipped with internal reference channels for utmost stability and allow detection limits in a sub-ppm range (based on 1g sample mass)
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CS/ONH-Analysis
G6 LEONARDO
The high-end thermal conductivity detector used for hydrogen and nitrogen analysis allows detection limits in a sub-ppm range (based on 1g sample mass)
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CS/ONH Analyzers
Elemental analysis of CS and ONH in inorganic materials | Based on the know-how of many decades Bruker offers innovative solutions for rapid and precise elemental analysis of carbon, sulfur, oxygen, nitrogen and hydrogen.
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Electron Microscope Analyzer
QUANTAX Micro-XRF
Micro-X-ray Fluorescence (Micro- XRF) spectroscopy analysis is a complementary non-destructive analytical technique to traditional Energy Dispersive Spectroscopy (EDS) analysis using a Scanning Electron Microscope (SEM).
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Electron Microscope Analyzer
QUANTAX EDS for TEM
Long standing expertise in EDS ensures the configuration of the best solution for your specific microscope (STEM, TEM or SEM) thanks to slim-line detector design and geometrical optimization for each microscope pole piece and EDS flange type