PowerTECH Co,Ltd.
Semiconductor packaging and testing, it is a provider specializing in the R&D, production, and sales of specialized equipment for the backend packaging and testing sector of the semiconductor industry. I
- +86 757 83207313
- +86 757 83208786
- info@powertechsemi.com
- service@powertechsemi.com
- No. 16 Guangming Avenue, New Light Source Industry Base
Nanhai National High tech Zone
Foshan City, Guangdong Province 528226
China
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Hi-Speed Discrete Test System
QT-6000
QT-6000 Test System, with built-in capacitance test (DC+CAP) and Scanbox etc, is applicable to devices like medium & small power transistors, MOS-FET, diodes and Wafer.
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Discrete Devices High-speed Testing System
QT-6000 discrete device high-speed testing machine is suitable for testing small and medium-power diodes, transistors, field effect transistors and other products and wafers. It can expand built-in capacitance testing (DC+CAP), EAS, VC, pA modules, as well as external LCR (ultra high precision capacitance testing), Scanbox, etc. The machine can be used for FT mass production testing or laboratory testing.
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IC Testing System
Is a system for giving electrical signals to a semiconductor device to compare output signals against expected values for the purpose of testing if the device works as specified in its design specifications.
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Power Module And Device Testing System
Dynamic and static test system Meet the power IPM module dynamic and static electrical parameters test
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Power Device Testing System
Devices that control electric power, and are used in automobiles and a wide range of electrical products.