Cohu, Inc.
We are a global leader in test handling, thermal subsystems, package inspection, contactors and MEMS test solutions used by the semiconductor industry. We provide our customers with outstanding products and services that reflect our commitment to operational excellence, innovation and market leadership. Delta Design's engineering and manufacturing plant Cohu, Inc. was founded in 1957 and is comprised of three business units, Delta Design, Rasco and Ismeca.
- 858.848.8000
- 858.848.8180
- info@cohu.com
- 12367 Crosthwaite Circle
Poway, CA 92064
United States
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Highest Demanding Finishing Processes
Ismeca NY32
32-position turret platform for semiconductor test, inspection and packaging, providing the highest process integration capabilities. Integrating innovative hardware and software technology such as intelligent features enables extended autonomous operation and productivity.
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Highest Throughput For Fragile Devices
Ismeca NY20
20-position turret platform for semiconductor test, inspection and packaging, provides the highest quality yield and throughput. It integrates innovative hardware and software technology such as intelligent features that enable extended autonomous operation and productivity.
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High Parallel Test Of Barometric Pressure Sensors
InBaro
InBaro MEMS module, a proven solution for accurate barometric sensor test with high throughput and stability.
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High Parallel Test Of Environmental Sensors
InHumid Test Module
InHumid sensor test system for final test of environmental sensors allows for high volume single-insertion test and calibration of integrated environmental sensors measuring pressure, temperature, humidity and gas.
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High Parallel Test Of Inertial Sensors Up To 6DOF
InFlip
InFlip MEMS strip-test module incorporates a modular architecture designed to replace expensive custom-designed machinery. It can operate in a standalone mode or it can be configured with a Cohu InStrip platform for full automation.
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High Parallel Test Of Inertial Sensors Up To 9DOF
InGyro Test Module
The InGyro sensor test module and functional test program for physical stimulation of inertial sensors under temperature conditions supports multiple target applications: accelerometers, gyroscopes, as well as multi-axis IMU’s (inertial measurement units) up to 9DOF (Degrees of Freedom). To meet the requirements of automotive and other demanding applications the temperature range the InGyro module supports testing at temperatures from -40°C to +125°C.
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High Parallel Test Of TPMS And Pressure Sensors
InPressure
InPressure HD module for high pin count pressure test up to 16 bar and fully supports high multi-site test of high pin count devices with up to 2,268 signal lines.
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High Performance Strip Handler
Rasco Jaguar
Jaguar is designed for high-volume production testing of ICs on a strip format or in device carrier. It is fully automotive qualified for tri-temperature test and the ideal solution for high parallel testing of small packages at short test times, but also for Power and Sensor devices. Due to the integrated vision alignment and high precision linear motors, Jaguar provides high yield and excellent OEE.
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High Speed Gravity Handler
MT9928 xm
This well-established test handler provides field-proven reliability and performance. Its modular and scalable design and variety of options allow configuration of the MT9928 exactly according to the test needs. Easy-access design and easy-to-change conversion kit parts support fast and easy package style changes. The MT9928 has a large soak capacity and features the entire tri-temp range at outstanding temperature accuracy and stability.
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Humidity And Gas Test
Cohu’s established humidity and gas test equipment provides a high-volume final test solution for either humidity or gas sensors. The same equipment can be used to test a combo device of both humidity and gas in a single insertion.
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Modular Gravity Handler For Small Devices
Rasco SO2000
Modular designed gravity handler with various input and output possibilities. SO2000 can handle the smallest possible packages for gravity and provides a broad range of Sensor and MEMS applications.
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Optical Sensor Test
For optical sensor test Cohu offers a variety of solutions being driven by requirements for tri-temp, parallelism and stimulus spacing. Customized optical stimulus units are integrated into Cohu’s test handling systems. For light detector test, we implement different types of light sources, such as infrared, ambient- and colored light. We offer different solutions for 3D image sensors combining emitter and receiver tests of LiDAR, Time of Flight and Structured Light devices.
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PAx Test System
PAx semiconductor test system delivers uncompromised RF performance in a low-cost system for testing RF power amplifiers and front-end modules for next-generation wireless standards.
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Pick and Place Test Handler
Delta Eclipse
Eclipse delivers scalable performance for testing a wide range of semiconductors, from analog ICs to high-performance CPUs and mobile processors. The Eclipse is a high-speed pick-and-place handler designed to test up to 16 Integrated Circuits (ICs) in parallel, at temperatures from -45°C to +155°C*, with throughput up to 13,000 UPH.
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Pick and Place Test Handler
Delta MATRiX
Cohu’s MATRiX handler has a highly flexible test site configuration that’s well suited for a wide range of test applications, including analog ICs with short test times and high throughput, automotive devices requiring accurate thermal control, small pitch wireless-communication products, high parallel microcontroller testing, MEMS device testing, and many other device market segments with their unique requirements. The MATRiX has a highly flexible test site configuration that enables customers to reuse existing load-boards, including boards made for competitor’s legacy handlers.