TOPTEST GmbH
TOPTEST is active in design of circuit board test / in-circuit and functional testing.
- +49 (0) 8105 25989
- +49 (0) 8105 5508
- info@top-test.de
- Rudolf-Diesel-Str. 11
82205
Gilching,
Germany
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Aeroflex AIDE
This programming environment for analog and digital in-circuit test and function test allows a high depth in the realization of inspection tasks. We have many years of extensive experience in dealing with AIDE.
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Automatic testing with National Instruments TestStand
TestStand from National Instruments is standard software for automated testing. Complex, variable test systems can be built here by integrating various hardware and software modules (e.g. LabVIEW VIs, C # modules). We can easily integrate created LabVIEW VIs into TestStand for a product-specific test sequence. All functions that are required for an automatic test sequence are available. Parameters can be changed in the TestStand environment. The user interface can be adapted to your needs.
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Boundary Scan
Boundary Scan is a powerful test method for digital circuit components. The hardware and software components we use for the boundary scan implementation come from Göpel electronic
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High Voltage Test Station
High-voltage test stations place high demands on the safety aspect. We design these test stations in cooperation with our manufacturers as self-sufficient test systems.
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Integration of Flash / Controller Programming
Flash or microcontroller programming can be integrated in a wide variety of ways, depending on the type and scope of the application.
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Integration of Inline Test Systems
The test system and adapter can also be integrated in inline test systems. Additional communication can take place via interfaces (e.g. RS232, DLL). We have already created numerous integrations for different manufacturers.
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Manual Test Station
We also develop manual test stations for you, which save costs for small series or are required for multi-adaptive test objects. This refers to test objects that are usually not contacted via a needle bed, but rather via plug connections.
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NET and C #
The programming software C # under .NET enables the development of test programs and additional components.
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Programming
You are looking for a LabVIEW-solution for a test problem? LabVIEW is an excellent development environment for all areas of metrology. Here we have extensive experience and can help in your test problems. In the LabVIEW programming language, we develop VIs (Virtual Instruments) that can be integrated easily in TestStand. Using hardware-oriented programming languages such as C# and LabVIEW, we develop integrations of control and measurement components.
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PXI - Test System
We provide a complete PXI test system made by PXI individual components: 19'' rack, Measuring and stimuli cards, Relay cards, Power Supplies, Integration additional protocol cards such as CAN and CANopen, Boundary Scan, Integration of additional test hardware
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Rotary Table Test system
The requirement was to develop a test system that can take very different test and programming times into account so that the hardware used can be used in the best possible way.
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Test Adapter
Development of a 12-way test and programming adapter from Toptest for ?? The Dash ?? from Bragi, a wireless, intelligent earphone with communication and sensor technology. With the first version of the test adapter, only a purely sequential testing was possible due to the interdependencies of the tests. In version 3.0, the now autonomous tests were brought into a parallel TestStand sequence. In addition, individual sockets were prioritized in order to optimally use the hardware resources. This resulted in a time advantage of 80% compared to the initial situation.
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Test Adapters / Aeroflex Test System
52xx / 5300
We develop and manufacture test adapters for your existing interface including documentation and test program
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Test Hardware
Development of additional hardware components in-houseCreation of the layout of the developed circuit boards and subsequent production outside the companyAssembly of the printed circuit boardsCreation of additional circuits for test adapters
