Applied Test Resources
Applied Test Resources (ATR) was established in 1997, with the primary objective of providing advanced Analog Test software solutions for the semiconductor Industry. As ATR's business developed, we saw an increasing need in the industry for cost effective, user-friendly, specific advanced analog test hardware. ATR then redirected our focus to develop total test solutions at highly competitive prices. Our product to meet the demand for customized test solutions at lower test costs is the MTS-2010 Mixed Signal Test System.
- (610) 488-0802
- sales@atr-inc.org
- 3219 E. Camelback Rd.
Suite 201
Phoenix, AZ 85018
United States
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product
High Speed Matrix Card
MATX4001
The MATX4001 module is a general purpose-switching matrix, consisting of 40 relays arranged in 5 rows by 8 columns. Each row/column consists of independent Force/Sense lines that are switched simultaneously. Each relay is capable of handling 1 Amp and can isolate up to 5 KV. Each relay on the matrix is independently controlled with an On/Off command via software
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product
Timing Measurement Unit
TMM200
The TMM200 is a resource available for measuring such parameters as propagation delays, rise time, fall time and any other time-related parameter. Because of its wide input levels, the TMM200 is an instrument well suited to test both digital an analog devices.
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product
Floating Power FET moduleAmp Loop
PFM1010
The PFM1010 Module is a precision instrument capable of measuring all common DC parameters in a power MosFet as well as many of the AC parameters. This module uses some very innovative techniques to make it possible to measure parameters like Rdson down into the sub-million-ohm range.
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product
Mixed Signal Test Systems
MTS1010i
The MTS-1010i is a more economical version of the MTS-2010i & MTS-1020i testers. It has a reduced platform size and reduced power supplies. Like the other testers in the MTS family it is a highly cost effective production ATE designed for testing high-volume linear and mixed signal semiconductor devices (Op Amps, high-voltage drivers, DAC, ADC, etc.), both at the wafer sort and final test stages of the manufacturing process.
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product
Multiple (8) Four Quadrant High Power Source
PM0830
The PM0830 consists of eight fully independent four-quadrant power sources. Two of the channels are capable of supplying up to 30 V/500 mA each. The remaining six channels are capable of supplying up to 30 V/50 mA each. The PM0830 has a measurement range capable of measuring voltages up to 1000V.
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product
Floating 6-Ch Integrated Power Source
PM0650
The pulse channels provide voltage pulses with duration control 10us to 100ms, and measures current. The combination of capabilities provides a versatile solution on fulfilling the wide range of requirements on testing a device. The PM0650 may be floated up to ±1500V to facilitate HV isolation test of devices where outputs may be connected directly to line voltages.
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product
Multiple (8) High Power Four Quadrant Power Source
PM0825
The PM0825 consists of 8 fully independent four-quadrant power sources capable of supplying up to ±20V. Two of the sources are capable of up to 500mA each, four more are capable of performing at low levels with ranges of 1uA and 100uA; the remaining two are mid range with current ranges of 1mA and 100mA.
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product
Mixed Signal Test Systems
MTS1020i
The MTS-1020i is a cost effective production ATE designed for testing high-volume linear and mixed signal semiconductor devices (Op Amps, high-voltage drivers, DAC, ADC, etc.), both at the wafer sort and final test stages of the manufacturing process
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product
Matrix Card
MATX4010
The MATX4010 module is a general purpose-switching matrix, consisting of 40 relays arranged in 5 rows by 8 columns. Each row/column consists of independent Force/Sense lines that are switched simultaneously. Each relay is capable of handling 10 Amps and can isolate up to 5 KV. Each relay on the matrix is independently controlled with an On/Off command via software.
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product
Mixed Signal Test Systems
MTS1000i
The MTS-1000i is lowest cost platform available in the MTS series of ATE. It has a reduced platform size compared to the MTS-2010i & MTS-1020i, reduced power supplies, and 4 slots. It is mainly intended for single site testing. Like the other testers in the MTS family it is a highly cost effective production ATE designed for testing high-volume linear and mixed signal semiconductor devices (Op Amps, high-voltage drivers, DAC, ADC, etc.), both at the wafer sort and final test stages of the manufacturing process
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product
DUT Prototype Board
DPB8800
The DPB8800 is an 11? x 14? PC board used to interface the tester with the Device Under Test (DUT). This board contains generous area for custom circuitry and extra relays. The DPB8800 is also available with standard solutions to test families of components like Op-Amps, Regulators, ADC?s and DAC?s. +/-15 V and +5 V are available to support circuitry biasing.
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product
High Voltage Power Source
PM1000
The PM1000 is a high voltage power source capable of supplying up to 1000 V/20 mA to a load. It is intended for use in measuring leakage and breakdown voltages of devices. There are five voltage ranges and five current ranges.
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product
Mixed Signal Test Systems
MTS2010i
The MTS-2010i are a cost effective production ATE designed for testing high-volume linear and mixed signal semiconductor devices (Op Amps, high-voltage drivers, DAC, ADC, etc.), both at the wafer sort and final test stages of the manufacturing process.
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product
Multiple (8) Four Quadrant Power Source
PM0820
The PM0820 uses an onboard controller, which relieves the system CPU of performing many functions necessary for the module operation. The result is higher efficiency of the CPU and faster execution of the module commands.
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product
Quad Op-Amp Loop
QOAL400
The QOAL400 module is a precision instrument capable of measuring all common parameters of an Op Amp, including AC as well as DC parameters. The QOAL400 has four completely independent channels, which allow a quad device to be tested in a minimum amount of time. Each channel has a full set of resources to measure all common parameters.
