HenergySolar
Leading global SEMI and PV detection solutions provider. Through our dedication to customer-centric innovation and strong partnerships, we have supplied semiconductor material,ingot,block wafer,cell,module,saphare,SiC,slurry and so on with electrology, impurity,surface,geometry,physical,chemic characteristic and so on. We supply quality and competitiveness improvement solution(QCI solution) for company,laboratory,R&D center and University.We are committed to creating maximum value for telecom carriers, enterprises and consumers by providing QCI solutions and services.
- 008610-60546837
- 008610-60546837
- Sales@HenergySolar.com
- #16 GuangHua Road
TongZhou Industry Distric, Beijing
China
-
product
IV Tester System
PET-CC
Application ■Mono crystalline silicon (Si) ■Multi crystalline silicon (mc-Si) ■Amorphous silicon (a-Si) ■Gallium arsenide (GaAs) ■Gallium indium arsenide (GaInAs)
-
product
Large Range Resistivity Tester
HS-SFRT
HS-SFRT silicon filament resistivity tester is an advanced silicon cylinder resistivity tester, which can measure silicon filament, silicon phosphorus ingot, silicon boron ingot, seed crystal and so on. As it eliminates Peltier effect, Seebeck effect, minority carrier inject effect and so on, So it improve the accuracy greatly. The testing resistivity ranges from 0.0005Ω·cm to 50000Ω·cm. It is accurate, stable and convenient and a good friend to Siemens polysilicon material producer, SH4 polysilicon material producer, UMG polysilicon material producer and so on.
-
product
Multiple Angle Laser Ellipsometer
PH-LE
The multiple angle laser ellipsometer provides film thickness, refractive index and absorption index at the HeNe laser wavelength 632,8 nm with an extraordinary precision and accuracy. It can be utilized to characterize single films, multiple layer stacks and bulk materials.
-
product
Non-Contact Mapping Life Time System
MWR-2S-3
The device is designed for express non-destructive contactless local measurement of non-equilibrium charge carrier effective lifetime in silicon substrates, epi-wafers and solar cells at different stages of manufacturing cycle. It can be used for incoming and outcoming inspection of silicon ingots and wafers, tuning and periodic inspection of semiconductor and solar cell technology quality. Lifetime determination is based on measuring photoconductivity decay after pulselight photo-exciting with usage of reflected microwave as a probe.
-
product
olar Cells and Modules Online Measurement System
PV-LIT
The fully automatic PV-LIT testing system offers individual and serial testing options for solar cells and complete solar modules. The modular testing system allows easy integration into existing production lines and can be used in automated serial testing for quality assurance.
-
product
AAA Solar simulator
SS50AAA-PLC
Application ■Mono crystalline silicon (Si) ■Multi crystalline silicon (mc-Si) ■Amorphous silicon (a-Si) ■Gallium arsenide (GaAs) ■Gallium indium arsenide (GaInAs) ■Gallium aluminum arsenide (GaAlAs) ■Gallium indium phosphite (GaInP)
-
product
Automatic Online Flatness and Surface Appearance System
UltraSort200
The UltraSort continues our 25 year tradition of providing metrology solutions to semiconductor wafer manufacturers. Designed for volume wafer production, this automated system offers superior performance in rapid, repeatable, accurate, noncontact qualification of silicon and alternative substrate wafers.
-
product
Auto Spectroscopic Ellipsometer
PH-ASE
The PH-ASE spectroscopic ellipsometer measures thickness, refractive index and extinction coefficient of single films and multilayer stacks. Reflection measurements at different incident angles and transmission measurements can be carried out and combined with ellipsometric data.
-
product
Conductivity Type Tester
HS-HCTT
It is strictly designed according to the requirements of the hot-probe thermal EMF conductivity type test in standard ASTM F42: Standard Test Methods for Conductivity Type of Extrinsic Semiconductor Materials. A temperature controlling heating element is installed inside the hot probe so that the hot probe is heated automatically and its temperature is maintained in the range 40-60℃.
-
product
Contactless Lifetime Measurement and Inhomogenities Device
MWR-2S-3I
Lifetime determination is based on measuring photoconductivity decay after pulse light photo-exciting with usage of reflected microwave as probe.Simultaneous IR light transmission gives possibility to detect any inhomogenity insidesilicon brick and made 3D image of defects.
-
product
Spectroscopic Ellipsometer
PH-SE
The spectroscopic ellipsometer is used for thin film and material characterization in R & D. The spectroscopic ellipsometer is designed to meet the requirements in modern research with special emphasis on speed and accuracy for an unmatched variety of applications.
-
product
Super Silicon Resistivity and Type Tester
HS-3FC II
Super Silicon Resistivity and Type Tester is specially designed for silicon sorting，it can quickly test the silicon type, heavy-doped, resistivity and current, and can be widely used in all kinds of silicon sorting, like granular polysilicon material, break semiconduct silicon wafer, chunk material, top and tail material and so on. Furthermore, it integrates two probes, three probes and four probes. With the three probes, it could show type and heavy type simultaneously, strongly improved the sorting efficiency.
-
product
Surface Quality Measurement System
SQM-500W
SQM-500 Surface quality Measurement system is used for the surface cleanness testing and analyze of sample. SQM provide a quantitative analysis of the cleanness of the surface, which was the first announced by us. The system can be used to non-contract detect the contamination of the surface and provide an accurate result immediately. The result can provide a powerful and real data for analyze, which is the insurance for the quality.
-
product
Manual Contactless Wafer Detector
HS-NCS-300
Manual, non-contact measurement of wafer thickness, TTV and bow. Portable and easy to set-up, the Proforma 300/G measures all wafer materials including Silicon, Gallium-Arsenide, Indium-Phosphide and wafers mounted to sapphire or tape.
-
product
Minority Carrier Life Time System
MWR-SIM
MWR-SIM Lifetime determination is based on measuring photoconductivity decay after pulselight photo-exciting with usage of reflected microwave as probe.It enables repetition and contactless of measurement and does not require specialsurface treatment before measurement or wafer cutting.
