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High Parallel Test Handlers
High parallelism test in strip or singulated device batch handling on carriers, WLCSP post singulation test.
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High-Throughput Film Frame Handler
MCT FH-1200
FH-1200™ film frame test handler is designed to handle leadless devices mounted on film frame, such as QFN, DFN, WLCSP, BGA, µBGA and eWLB packages. The FH-1200 enables high parallelism testing of post-saw IC devices at ambient temperature. It can accommodate 200 mm and 300 mm wafer rings and custom shapes onto which multiple strips can be mounted. No change kits are required regardless of package size (if same frame is used).
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Solution For Test-in-Strip
InCarrier
The InCarrier process is based on a strip-like device carrier for single devices that combines the advantages of the singulated device test with the advantages of high parallel strip test. Leveraging the strip like design the InCarrier ensures robust test-handling for even smallest devices and supports high parallel test.
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High Performance Strip Handler
Rasco Jaguar
Jaguar is designed for high-volume production testing of ICs on a strip format or in device carrier. It is fully automotive qualified for tri-temperature test and the ideal solution for high parallel testing of small packages at short test times, but also for Power and Sensor devices. Due to the integrated vision alignment and high precision linear motors, Jaguar provides high yield and excellent OEE.
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High-Speed Laser Mark Handler
MCT MH-3300
MH-3300™ high-speed laser mark handler is used for marking of 2DID codes on the lead frame in support of strip testing, marking of reject devices, and for final package marking in strip test or assembly operations. The MH-3300 offers unparalleled throughput performance and the best cost-of-ownership in the industry.
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InCarrier Loader/Unloader
NY32-LU
NY32-LU™ loader unloader provides a high parallel single solution for singulated and strip IC testing with controlled and sensitive handling. The system is scalable; one system can be used as a Loader or Unloader, or can be reconfigured as a dedicated Loading or Unloading system.
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High-Performance Strip Handler
MCT SH-5300
SH-5300™ high-performance strip handler for testing advanced semiconductor packages, LEDs, MEMS sensors, and traditional ICs. It can handle a vast array of strip and laminate lead-frame sizes. Capable of tri-temp testing -55˚C to +160˚C and ambient testing to +160˚C.
