Test Contactor/Probe HEad

cRacer - Cohu, Inc.

The cRacer™ test contactor and probe head portfolio offer solutions for 5G mmWave FR2 up to 54+ GHz.

cRacer utilizes robust spring probe technology for testing singulated packages or probe heads for wafer probe (bumped/pad) applications with fine pitch and WLCSP compatibility – ranging from 100 µm to 650 µm, covering the majority of 5G devices.

cRacer features a stainless-steel spring for tri-temp testing and performance in operating temperatures -55°C to +155°C.