Laser Ellipsometers
CER – SE 500adv - SENTECH Instruments GmbH.
* The SE 500adv combines ellipsometry and reflectometry,
* Eliminates the ambiguity in layer thickness determination for transparent films,
* Extends thickness measurement to 25000 nm. # Laser wavelength 632.8 nm
# Spectral range of reflectivity from 450 nm to 920 nm wavelength
# Spot size 80 ?m
