![Scanning Kelvin Probe Microscope](https://d27wgn5g4t3wja.cloudfront.net/img/133ba219-be76-448f-bbf2-795e30fb7e02/333744.png)
Scanning Kelvin Probe Microscope
VS-SKP - Ametek Scientific Instruments (Ametek SI)
The Kelvin Probe experiment uses a nondestructive method to determine the relative work function difference between the probe and the sample. Work function describes the energy required to liberate an electron from the surface of a conductor; electrochemists often interpret this as the difference from an electrode’s Fermi Level, average energy of electrons, and that of vacuum.