Semiconductor Inspection
XT V 160R - Nikon Metrology, Inc.
The XT V 160R is a versatile microfocus X-ray system for both manual and programmed inspection of electronics, semiconductor or small industrial samples.
XT V 160R - Nikon Metrology, Inc.
The XT V 160R is a versatile microfocus X-ray system for both manual and programmed inspection of electronics, semiconductor or small industrial samples.
