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Electron Spectroscopy for Chemical Analysis
determine the atomic composition of a surface.
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Energy Dispersive X-Ray Spectroscopy (EDS)
Rocky Mountain Laboratories, Inc.
Energy Dispersive Spectroscopy (EDS Analysis) is used in conjunction with the Scanning Electron Microscope (SEM) providing chemical analysis in areas as small as 1 µm in diameter. EDS detects all elements except for H, He, Li, and Be. EDS can be performed exactly on any features or particles seen in the SEM images and can “MAP” elements on a surface. Unknown materials can be identified and quantitative analysis can be performed.
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Imaging X-Ray Photoelectron Spectrometer
Kratos AXIS Nova
X-ray photoelectron spectroscopy (XPS), also known as electron spectroscopy for chemical analysis (ESCA), is a mature and widely used surface analysis technique for materials characterisation. XPS provides quantitative elemental and chemical state information from the upper most 10 nm of material. The The AXIS Nova photoelectron spectrometer can collect X-ray photoelectron spectra and images from any material that is stable under the ultra-high vacuum conditions required for the technique.
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Auger Electron Spectroscopy (AES)
Rocky Mountain Laboratories, Inc.
Auger Analysis, Auger Electron Spectroscopy (AES or Auger) is a chemical surface analysis method. AES measures the chemical composition of the outermost 100 Å of a sample. Measurements can be made at greater depths by ion sputter etching to remove surface layers.
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XPS/ESCA Service
X-ray Photoelectron Spectroscopy (XPS Analysis), also known as Electron Spectroscopy for Chemical Analysis (ESCA), is used to determine quantitative atomic composition and chemistry. It is a surface analysis technique with a sampling volume that extends from the surface to a depth of approximately 50-70 Angstroms. Alternatively, XPS analysis can be utilized for X-ray Photoelectron Spectroscopy (XPS) or Electron Spectroscopy for Chemical Analysis (ESCA) from Evans Analytical Group (EAG).sputter depth profiling to characterize thin films by quantifying matrix-level elements as a function of depth.
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Analytical Services
IGC: Inverse Gas Chromatography; Understand surface energies, polarities, acid/base properties and nanomorphology on powders and fibers. ToF-SIMS: Time-of-Flight Secondary Ion Mass Spectrometry. Localize your molecules at the first nanos! 2D imaging with resolution up to 200 nm. Highest sensitivity up to 10 ppm. CM: Quarz Crystal Microbalance In-situ observation of thickness and stiffness of any films in liquid environmentSEM: Scanning Electron Microscopy Images say more than words, especially with an artistic eye XPS/ESCA: X-ray Photoelectron Spectroscopy/Electron Spectroscopy for Chemical Analysis.
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Electron Multipliers
Electron multipliers are mainly used as positive/negative ion detectors. They are also useful for detecting and measuring vacuum UV rays and soft X-rays. Hamamatsu electron multipliers have a high gain (multiplication factor) yet low dark current, allowingoperation in photon counting mode to detect and measure extremely small incoming particles and their energy. This means our Hamamatsu electron multipliers are ideal for electron spectroscopy and vacuum UV spectroscopy such as ESCA (electron spectroscopy for chemical analysis) and Auger electron spectroscopy as well as mass spectroscopy and field-ion microscopy.
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X-ray Photoelectron Spectroscopy Analysis (XPS Analysis)
Rocky Mountain Laboratories, Inc.
X-ray photoelectron spectroscopy (XPS Analysis) also called Electron Spectroscopy for Chemical Analysis (ESCA) is a chemical surface analysis method. XPS measures the chemical composition of the outermost 100 Å of a sample. Measurements can be made at greater depths by ion sputter etching to remove surface layers.
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Chemical Testing and Analysis
Chemical testing and analysis is vital for regulatory compliance and to understand the quality and composition of chemical substances and materials that are used in products, industrial processes and manufacturing. Specialist industry knowledge, and expertise in applying the most relevant methodology are the keys to successful chemical testing. Advanced analytical instrumentation or a combination of techniques is necessary to solve problems or determine composition.
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Compact System for Chemical Analysis Technology
Small test system based on the LXinstruments OTP2 system platform. The system is used for assembly, final test and calibration of measuring instruments for chemical analysis in a high mix / medium volume environment.
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Materials And Chemical Analysis
Anderson Materials Evaluation, Inc.
Materials characterization, failure analysis, quality control, and materials and process development services are offered. Our analytical techniques allow us to assess elemental and chemical material composition, thermal properties, coating thickness, electrochemical properties, surface chemistry, surface wetting, corrosion rates and pitting potentials, contamination and degradation problems, metallography, fractography, phase transitions, static coefficient of friction, adhesive bonding strength and causes of adhesive bonding failures, surface tension and surface energy, tensile and compressive strength, bend deflection, lapshear strength, elasticity properties, UV and visible light absorption and reflection, density and porosity, and many other material properties integral to improving your products.
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Spectroscopy & Scientific Analysis Systems
Advancing Knowledge. Empowering Breakthroughs. Our spectroscopy instruments and software help advance knowledge and understanding of radioactive materials, empowering the next wave of breakthrough science and innovation.
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Electron Probe Microanalyzer
EPMA
JEOL commercialized the world's first FE-EPMA, the JXA-8500F in 2003. This highly regarded FE-EPMA has long been used in various fields, such as: metals, materials and geology in both industry and academia. The JXA-8530FPlus is a third-generation FE-EPMA that comes with enhanced analytical and imaging capabilities. The In-Lens Schottky field emission electron gun combined with new software provides higher throughput while maintaining high stability, thus allowing a wider range of EPMA applications to be achieved with higher resolution.
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Electron Microscope Analyzer
QUANTAX Micro-XRF
Micro-X-ray Fluorescence (Micro- XRF) spectroscopy analysis is a complementary non-destructive analytical technique to traditional Energy Dispersive Spectroscopy (EDS) analysis using a Scanning Electron Microscope (SEM).
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Electron Microscope Analyzer
QUANTAX EDS for SEM
Bruker's latest generation of QUANTAX EDS features the XFlash® 7 detector series, which provides the largest solid angle for X-ray collection (also called collection angle) and the highest throughput.
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Electron Diffraction System
Modern physics is the post-Newtonian conception of physics. It implies that classical descriptions of phenomena are lacking, and that an accurate, " Modern", description of nature requires theories to incorporate elements of quantum mechanics or relativity, or both. This section includes many of the most important experiments in physics, including e/m tubes, the Franck-Hertz experiment, and nuclear magnetic resonance (NMR)
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Alpha Spectroscopy
Alpha spectroscopy is used to identify and quantify radionuclides based on the alpha particles emitted in the decay process. Similar to Gamma Spectroscopy, energy spectra are generated with high precision detectors and electronics and analyzed with special software. Typically, samples are measured following chemical separation to isolate the radionuclides of concern due to the complexity associated with correcting for these interferences with spectrum analysis software as is common for many Gamma Spectroscopy measurements.
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NIR Spectroscopy Engines
Process control solution providers now have access to high performance micro-spectrometers designed to provide high resolution spectral data for Process Analytical Technology (PAT)/Pharmaceutical applications, real-time process control in Oil and Gas applications, and for general manufacturing process measurements with the IntegraSpec XL™. Excelitas' line of Axsun NIR Analyzers are designed to support methods development and provide for an easy conversion from the lab to the process environment.
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Raman Spectroscopy
Raman spectroscopy is a form of vibrational spectroscopy, like infrared (IR) absorption, that provides detailed chemical and structural characterisation. The Raman technique has the benefit of being non-destructive and requiring no sample preparation.
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Diode Laser Spectroscopy
Diode Laser Spectroscopy by Mesa Photonics: Herriott Cell and OEM laser diode controller boards.
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Spectroscopy Lamps and Light Sources
The StellarNet portable Light Sources facilitate measurements in the UV, VIS, and NIR for various samples and application types using standard SMA-905 optical connectors. These low cost modular components are robust, reliable, and designed to last in portable and industrial environments.
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Open-Path Chemical Detection System
LaserWarn™
Block Engineering's LaserWarn is an open path gas detection system based on patented quantum cascade laser technology. LaserWarn detects chemical threats, leaks, and fugitive emissions over a coverage area of thousands of square feet, and can be used in both indoor and outdoor applications.
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Chemical Absorbance Systems
UV-VIS & NIR systems for chemical absorbance measurements 190-2300nmSpectrochemistry Systems include a miniature spectrometer, light source, and sampling accessory such as cuvette holders, dip probes, & flow cellsSpectraWiz Software has built in features for ChemWiz Concentration Analyzer with multivariate chemometric optionsEpisodic capture for kinetics, time series analysis, & batch monitoringEasily convert to fluorescence or reflectance for multi applicationsGreat for Teaching Labs, Research, Process Control & much more!Also see details about our Fluorescence and Raman Systems
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Chemical Weapons Identification Systems
Portable Isotopic Neutron Spectroscopy (PINS) Systems have been deployed world-wide; increasingly, being deployed as part of national counter-terrorist efforts. PINS provides a non-contact and non-destructive means of identifying the CHEMICAL contents of "suspect" packages.
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Gas Analysis
HPR-20 TMS
The Hiden HPR-20 TMS Transient MS is configured for fast event gas analysis of gases and vapours at pressures near atmosphere. Ideal for fast gas switching experiments the MS features the Hiden QIC quartz-lined 0.9 m sampling interface.
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Impedance Analysis
S96041B
Make impedance analysis measurements of Surface Mount Device (SMD) components on the E5080B vector network analyzer with 16198A-010 10 GHz SMD test fixture.
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Sematech Analysis and SEMI Standards Analysis
Rocky Mountain Laboratories, Inc.
Rocky Mountain Laboratories, Inc. provides SEMI Standards analyses that conform to the following SEMATECH and SEMI Standards for testing of passivated 316L stainless steel components being considered for installation into a high-purity gas distribution system:SEMASPEC #90120401B-STD (SEM Analysis)SEMASPEC #90120402B-STD (EDS Analysis)SEMASPEC #90120403B-STD (XPS Analysis)SEMASPEC #91060573B-STD (Auger (AES) Analysis)SEMI F60-0306 (based on F60-0301) (XPS Analysis)SEMI F72-1102 (Auger (AES) Analysis)
