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- LBA Group, Inc
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RF Safety Monitoring
MVG EME Guard XS 40GHz
EME Guard XS 40 GHz has been specifically designed to cover the new 5G millimeter wave bands. This RF safety tool is important for keeping those working close to RF emitters safer. It is easy to use, continuously scanning electromagnetic waves, and alerts the user when acceptable pre-selected limits have been exceeded.
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Contactless Laser Extensometers
Jinan Testing Equipment IE Corporation
Model LE-05 and LE-15 extensometers measure strain optically, without contacting the specimen, using laser diode technology. The extensometers are self-contained and portable. They may be interfaced with a variety of testing machines and data acquisition systems using the ±10V analog output or bi-directional RS-232 serial port. Operation may be local or remote. A digital display is included. The scanning beam is always perpendicular to the specimen, unlike most laser extensometers. This eliminates errors when viewing through windows in chambers. It also minimizes sensitivity to the distance between the extensometer and the sample. Because the unit measures reflected light, no receiver is required behind the sample.
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Portable Microscope With XY Stage, X400 1mm Field Of View, 1µm High Resolution
*Counting of cells, algae and other samples*Easy positioning of the sample*Methodically scanning of slides and some counting chambers*Works with standard microscope slides (25x75mm or 1”x2”) and 32mm wide counting chambers (top cover of counting chamber needs to be <1mm thick)*Allows manual movement of the slide and counting chamber independently in the left-right (X) axis and front-back (Y) axis
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Industrial CT X-Ray Inspection System
X5000
The X5000 is the most versatile system offered by North Star Imaging. The system boasts a large scanning envelope and excellent ergonomics for loading sizable objects while still maintaining the sensitivity to inspect even the smallest of items.
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Electrolytic Capacitor Test & Scanning System
DU-9001
Delta United Instrument Co., Ltd.
The 10 capacitor - LCC/DZ/R in order to automatically scan test improve the test reliability and test efficiencyEach test channel can be opened / short circuit return to zero with high precision.Wide range scan box can be used to test 3mm~35mm 10 capacitorsSuitable for high voltage capacitance test, 450V330uF 10 capacitors can be smooth test
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Polarisation Mode Field Diameter
MA500
MA500 is our polarisation mode field diameter (MFD) and effective area (Aeff) measurement system, specially designed to measure large effective area and high NA single mode fibers with its enhanced dynamic range and high-resolution scanning optics.
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Fourier Transform Optical Spectrum Analyzer, 600 - 1700 nm
OSA202C
Thorlabs' Optical Spectrum Analyzers (OSAs) perform highly accurate spectral measurements. Compatible with fiber-coupled and free-space light sources, these compact benchtop instruments suit a wide variety of applications, such as analyzing the spectrum of a telecom signal, resolving the Fabry-Perot modes of a gain chip, and identifying gas absorption lines. Many commonly available OSAs use grating-based monochromators, which have slow acquisition times due to the need to mechanically scan the grating and average out noise at each wavelength. Thorlabs' OSAs acquire the spectrum via a Fourier transform using a scanning Michelson interferometer in a push/pull configuration. This approach dramatically improves the acquisition time, enables a high-precision wavelength meter mode with 7 significant figures and ±1 part-per-million accuracy, and allows the included software to provide robust statistical analysis of the acquired spectra, as explained in the Design tab.
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Universal Total Stations
SPS730 And SPS930
Nothing else comes close. Trimble Universal Total Stations lead the industry in accuracy, range and reliability for fine grading, paving, stockpile scanning and site measurements.
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Scanning Electron Microscope (SEM)
Prisma E
Prisma E scanning electron microscope (SEM) combines a wide array of imaging and analytical modalities with new advanced automation to offer the most complete solution of any instrument in its class. It is ideal for industrial R&D, quality control, and failure analysis applications that require high resolution, sample flexibility and an easy-to-use operator interface. Prisma E succeeds the highly successful Quanta SEM.
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Imaging Modules
Teledyne e2v has developed compact MIPI modules which feature our own high performance CMOS image sensors inside a pre-focused, industrial-grade scanning optic. As a turnkey sensor/optics for imaging systems, these modules offers customers significant reduction in development time and cost savings. Only a few screws are needed to mount the module, with simple connection to the image processing system through an FPC cable connector. Software development efforts can also be reduced by using some limited API-layer Linux software drivers. This enables the module to be seamlessly interfaced to popular ISP platforms.
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Scanning Probe Microscope
SPM-9700HT
Making the Unknown Visible Scanning probe microscope (SPM) is a generic term for microscopes that scan sample surfaces with an extremely sharp probe to observe their three-dimensional image or local properties at high magnifications. The SPM-9700HT takes high-throughput observations to the next level.
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Scanning Electron Microscopy
SEM
Materials Evaluation and Engineering
JEOL JSM-6610 LV LaboratoryScanning electron microscopy (SEM) uses electrons for imaging to obtain higher magnifications and greater depth of field than light microscopes. The instruments at MEE are capable of variable-pressure, or low vacuum, SEM (VPSEM), as well as traditional high-vacuum conditions for sample observation. VPSEM is a specialized method using a variable-pressure sample chamber that allows direct evaluation of samples that are not readily examined with a traditional high-vacuum SEM. Nonconductive or vacuum sensitive samples that would typically require additional sample preparation can be directly analyzed in VPSEM without the need for additional sample preparation, such as carbon or metallic conductive coatings. This reduces both sample preparation time and distractions in microanalysis. Our laboratory also has a field emission SEM (FESEM) for critical high-magnification work and low-voltage (LVSEM) applications. Each instrument has a spacious sample chamber that can accommodate large and irregularly-shaped specimens and accessories for feature dimensional analysis and chemical microanalysis.
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Incremental Length Gauges For Measuring Stations And Multipoint Inspection Equipment
CERTO series
*Interferential scanning principle*Very high system accuracy of down to ±0.03 µm*Well-matched ball-bearing guide for very high quality*Defined thermal behavior*Large measuring ranges of up to 60 mm*Interface: 11 µAPP
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3D Scanning Coordinate Measurement Machine
CUBE-R™
CUBE-R™ is a fast, reliable, and efficient complete turnkey solution for automated quality control applications. This automated 3D measuring machine features MetraSCAN 3D-R, a powerful robot-mounted optical 3D scanner that can be integrated into factory automation systems without compromising on accuracy. It is the perfect alternative to solve any productivity issues caused by bottlenecks at the traditional coordinate measuring machine (CMM).
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Laser Raman Microscopy System
RAMANforce/RAMANtouch
Nanophoton is the pioneer of confocal laser scanning microscopy and spectroscopic analysis. To celebrate, we relaunch our fastest and highest resolution confocal Raman microscope RAMANtouch/RAMANforce. With a newly designed spectrograph and the latest optical technologies, RAMANtouch/RAMANforce’s spatial resolution and sensitivity have been highly improved, making it the optimal solution for all applications.
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Flying Probe Electrical Testers
Gardien has been present in the PCB industry since the advent of the personal computer. In our beginning Mania, the company that pioneered some of the first electrical grid testers used by PCB fabricators. We still produce class leading equipment to this day, such as our line of Gardien Flying Probe Testers and our Acceler8 Scanning System.
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Electronic Warfare Solutions
Shoghi has a large portfolio of products under its category of Electronic Warfare. Traditional Electronic Warfare (EW) has three main elements of Electronic Support Measures (ESM), Electronic Counter Measures (ECM) and Electronic Counter Counter Measures (ECCM). Shoghi portfolio of products under EW are concentrated under the ESM and ECM umbrellas.The ESM products are passive means to monitor transmissions of various communication systems. Shoghi has covered these products in the numerous fields of satellite monitoring which covers both C/Ku band satellite monitoring, VSAT Monitoring, satellite phone monitoring under heads of Thuraya /Iridium / IsatPhone Monitoring, GSM/CDMA monitoring and Radio Monitoring using wideband scanning and multiple channel receivers. These are adequately covered under the head of Intelligence Surveillance and Reconnaissance (ISR) products.
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Cellular Phone/RF Signal/ Wired Camera/Bug Detector
SH-055GRV / 01125
This Cellular Phone Detector / RF Signal Detector / Wireless Camera Detector applies with fuzzy scanning technology to detect peeping cameras, tapping, cellular phones and other radio frequency devices
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Talon 26.5 GHz Sentinel Intelligent Signal Scanning Rackmount Recorder
Talon RTR 2654
- Search and capture system using Pentek's Sentinel™ Intelligent Signal Scanner- Captures RF signals from 800 MHz to 26.5 GHz- Capture and scan bandwidths up to 500 MHz- Selectable threshold triggered or manual record modes- 12-bit A/Ds with 57.5 dB SNR & 72 dB SFDR- Built-in DDC with selectable decimations of 4, 8 and 16- 4U chassis with front panel removable SSDs- Storage capabilities to 245 TB- RAID levels of 0, 5, and 6- Windows® workstation with Intel Core™ i7 processor- SystemFlow® GUI with virtual Oscilloscope, Spectrum Analyzer and Spectrogram displays
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Industrial CT X-Ray Inspection System
X7000
The X7000 is North Star Imaging’s largest standard system. The large scanning envelope and generous focal distance allow for unparalleled inspection capabilities of very large objects. The system is great for composites, castings, pipes, tubes, welds and similar parts.
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UMS Research
An automated scanning system designed to provide a cost-effective introduction to automated hydrophone measurement including the acquisition, display, storage and computation of 2D data.
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Ultrasonic Thickness Gauge
MMX-6
The MMX-6 is a simple to use hand-held Ultrasonic Thickness Gauge with the ability to measure through paint and coatings and eliminate the thickness of the paint or coating. The MMX-6 uses a dual element style transducer. With the single press of a button, the MMX-6 can be switched between pit or flaw mode ( pulse-echo), and through paint/coatings mode (echo-echo) for maximum inspection efficiency. The MMX-6 is equipped with a bundle of features to make your job easier: Alarm mode, high speed scanning, and data send are the main features of the MMX-6. The MMX-6 comes as a complete kit, ready to use, and is backed by Dakota Ultrasonics 5 year limited warranty.
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Ultrasonic Flaw Detector
ECHO
The ECHO scanning acoustic microscope is a nondestructive ultrasonic flaw detector designed to simplify testing, increase yield and maximize productivity in the lab or on the production floor.
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NEXTest 7
PK-2030/2032/2033/2036/2037/2038
NEXTest 7 is an advanced and unique tester in the market. It's designed to check and troubleshoot the pin connections of Display port & HDMI prior to installation on equipment. By using advanced technology to verify the integrity (20 pins + shield) of both display port and HDMI cables, especially for HDTV installation and DIY termination in the field, solving your cable testing need, unlink all of the other testers verify 9 circuits only. It checks for opens, shorts, miswires and intermittent faults in all conductors plus shield continuity, most tester only test for opens. It displays cable map results of both TX (near end) and RX (far end) on the main unit, either on testing before or after installation cables. User can easily read and determine the actual 21 pins configuration on main unit. It employs both auto and manual scanning of 21 wires. Tone Generator mode transmits two selectable tones on each pin for use with Net Probe (PR-06P) optional, enables one to quickly locate a cable. It's capable of testing up to 8 cables and locations at one time. NEXTest 7 especially features a self-learning mode to memorize cable pin out for testing large quantity standard or custom cables for PASS/FAIL a snap, makes testing quick and more efficient.
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Confocal FLIM for Macroscopic Objects
DCS-120 Macro
*FLIM of Macroscopic Objects*Scan Field Up to 15 mm Diameter*Two Fully Parallel TCSPC FLIM Channels*Compact bh Simple-Tau or Power-Tau System*Scanning by Fast Galvanometer Mirrors*Channel Seperation by Dichroic or Polarising Beamsplitters*Individually Selectable Pinholes and Filters*One or Two BDL-SMN or BDS-SM ps Diode Lasers*Tuneable Excitation by Super-Continuum Laser with AOTF*Two Fully Parallel Detection Channels*Two HPM-100-40 GaAsP Hybrid Detectors*Optional: Two HPM-100-06 Hybrid Detectors, IRF Width < 20 ps FWHM*Optional: HPM-100-50 Hybrid Detectors for NIR FLIM*Optional: Multi-Wavelength FLIM*Excellent Time Resolution: Electrical IRF Width 6.5 ps FWHM*Time Channel Width Down to 813 fs*Megapixel FLIM, Up to 2048 x 2048 Pixels at 256 Time Channels*Simultaneous FLIM/PLIM*Wideband Version, Compatible with Tuneable Lasers*Electronic Pinhole Alignment*Optional: Spatial Mosaic FLIM via Motorized Sample Stage
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Encoder | Trigger Board
ADLINK encoders and trigger boards are widely used in centralized motion controllers, supporting real-time encoder feedback as well as position comparison and high-speed trigger output functions for better motion control accuracy. Encoder and trigger cards are ideal add-on options when positioning comparison points on motion cards are insufficient. ADLINK encoder and trigger cards provide PCI/PCIe interfaces and 14 built-in comparators, providing flexible output and input modes suitable for applications with high requirements for distance measurement such as high-speed advanced scanning and automated optical inspection.
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AFM Atomic Force Microscope
FM-Nanoview 6800
Zhengzhou Nanbei Instrument Equipment Co. Ltd
All-in-one design, smart structure and shape.Scan head and sample stage are designed together, strong anti-vibration performance .Precision laser detection and probe alignment device make laser adjustment simple and easy.Adapt servomotor to drive the sample approaching tip manually or automatically, to realize precision scanning area positioning.
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LED Flash Drivers
Analog Devices LED flash drivers support general LED lighting, building technology, scanning equipment, and a range of other technologies. A range of features, such as automatic phototransistor controls and overtemperature protection, as well as compact size and diverse programmability options, allow these devices to be used in a number of applications including:
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Spirent SecurityLabs
The Spirent SecurityLabs’ services are structured to produce high-impact results with minimal impact on the client organization. Our dedicated teams of experienced security professionals offer comprehensive scanning, penetration testing and monitoring services for networks, applications and devices, as well as source code analysis.
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Sensors
Contact and Non-Contact Sensors for CMM, Optical High Speed Scanning and Computed Tomogrpahy Systems
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3D Software
Along with manufacturing professional 3D scanners, Artec develops smart 3D scanning software. Meticulously designed to meet the needs of both new and experienced users alike, it is the best choice for any application.
