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XY Stages
two linear axis movement positioning a test target.
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High-Precision XY Stage
V-731
Physik Instrumente GmbH & Co. KG
Reference-class XY stage. Travel range 205 mm × 205 mm (8"). Unidirectional repeatability to 0.1 μm. Velocity to 200 mm/s. Incremental encoder with 10 nm resolution.Optionally with stepper motor.
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XY Stage 10nm Resolution
U-723 PILine®
Physik Instrumente GmbH & Co. KG
Compact XY Stage with Ultrasonic Piezomotors. Fast positioning in 2 axes. Space-saving and light. Excellent guiding accuracy. High sensor resolution of 10 nm. Self-locking, no heat generation at rest. Low-noise operation.
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ElectroPuls® Automated XY Stage
Test the durability of your products and components in ways not possible until now, using Instron®’s ElectroPuls Automated XY Stage.
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Highly Dynamic XY Linear Motor Scanning Stage
L-731
Physik Instrumente GmbH & Co. KG
The magnetic linear direct drive is designed to provide high velocity and acceleration for inspection and microscopy. With a travel range of 205 mm square and solid velocity to 100 mm/sec, the L-731 is equipped to deliver high accuracy and smooth motion. Precision crossed roller bearings with anti-creep cage assist enable superior guiding accuracy (1.5 m straightness for loads up to 20 kg). An integrated optical reference encoder and limit switch provide further positioning control and accuracy for this compact stage with 5 nm resolution. DC servo motor versions are available on request.
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Portable Microscope With XY Stage, X150 2mm Field Of View
*Veterinary Worm Egg Counting*Counting of algae and other samples*Easy positioning of the sample*Methodically scanning of slides and counting chambers*Works with standard microscope slides and counting chambers (25x75mm or 1”x2”) and with 32mm wide counting chambers*Allows manual movement of the slide and counting chamber independently in the left-right (X) axis and front-back (Y) axis
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Crossed-Roller Bearing Linear Stage ,13mm Travel XY,Sensitivity 1um
NFP-2461
Model: NFP-2461 Crossed-Roller Bearing Linear Stage ,13mm Travel XY,Sensitivity 1um Details&Spec: Please refer to NFP-1461 Specification,It is combinated by 2pcs NFP-1461(C,SR,SL
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Crossed-Roller Bearing Linear Stage ,25mm Travel XY,Sensitivity 1um
NFP-2462
Model:NFP-2462 Crossed-Roller Bearing Linear Stage ,25mm Travel XY,Sensitivity 1um DetailsSpec: Please refer to NFP-1462 Specification,It is combinated by 2pcs NFP-1462(C,SR,SL)
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Portable Microscope With XY Stage, X400 1mm Field Of View, 1µm High Resolution
*Counting of cells, algae and other samples*Easy positioning of the sample*Methodically scanning of slides and some counting chambers*Works with standard microscope slides (25x75mm or 1”x2”) and 32mm wide counting chambers (top cover of counting chamber needs to be <1mm thick)*Allows manual movement of the slide and counting chamber independently in the left-right (X) axis and front-back (Y) axis
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Micrometer Positioning Stages
Del-Tron offers a wide range of linear positioners. These micrometer positioning stages and crossed roller positioning stages are available with travels ranging from .25” to 2.0”. All of are linear positioners are available in X, XY and XYZ configurations and can carry loads ranging from 4 lbs on our miniature ball slide series all the way up to 160 lbs on our crossed roller positioning stages. All model numbers are available with inch or metric micrometers and mounting holes.
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Nanopositioning Stage & Controller
PInano
Physik Instrumente GmbH & Co. KG
PInano® XY and XYZ low-profile piezo scanning stages are optimized for easy integration into high-resolution microscopes. They feature a very low profile of 20 mm (0.8") and a large aperture designed to hold Petri dishes and standard slide holders. The long travel ranges of up to 200 x 200 x 200 µm with nanometer closed-loop resolution are ideal for leading-edge microscopy and imaging applications. PInano® series piezo positioning stages are available in two versions: A) Highest Stability, Linearity and Precision with capacitive feedback sensors. B) High Precision with lower cost piezoresistive sensor feedback. Both types provide very high sensitivity and responsiveness as well as nanometer resolution. A proprietary servo controller significantly improves the motion linearity of the piezoresitive version compared to conventional piezoresistive sensor controllers.
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Miniature Linear Motor Stage
M-661 · M-662
Physik Instrumente GmbH & Co. KG
M-661 and M-662 PILine translation stages offer accelerations to 5 g with millisecond response and velocities to 500 mm/sec in an extremely compact package. Providing travel ranges to 20 mm, they are among the smallest motorized translation stages currently on the market. Both models are designed for open-loop operation (a similar closed-loop stage with linear encoder is available as model M-663. The M-662, with its square footprint, is also suitable for use in XY configurations. For applications where the smallest dimensions are essential, the P-652 micro stage is offered.
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Bond Tester for Wafers 2 - 12 inch
Sigma W12
Bondtester for wafers or at wafer level 2” – 12” (up to 300 mm)Precise testing and Cold Bump Pull (CBP) testingLarge X/Y stages X: 600mm, Y: 370 mmForce range from 1gf – 10 kgfBump pitch down to 20 µm
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Hardness Testing Machines
Operation by dedicated software AVPAKAutomatic reading for indentationAutomatic test positioning by motor-driven XY stage
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High Accuracy Dimensional Metrology System
Pinnacle 250
The Pinnacle features a damped granite base and column, with passive vibration isolation. A precision compound X-Y stage with high-speed linear motor drives provides velocity of 400 mm / sec and acceleration of 1000 mm / sec2. This combination of high acceleration and high velocity enables the high throughput required for near-line process monitoring.
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High-Resolution Interferometer
10716A
The Keysight 10716A High Resolution Interferometer is used for single and multiple axis applications such as precision X-Y stages. The 10716A offers twice the resolution of conventional plane mirror interferometers and has the same excellent thermal stability as the 10706B High Stability Plane Mirror Interferometer. Measurement drift is typically of that exhibited by a conventional plane mirror interferometer. These features result in improved accuracy, repeatability, and thermal stability. However, slew rate is halved.
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High Stability Plane Mirror Interferometer
10706B
The Keysight 10706B High Stability Plane Mirror Interferometer is a dual pass interferometer used for multiple axis applications such as X-Y stages where the measurement mirror may move perpendicular to the measurement axis. This thermally stable optic, an exact functional replacement for the 10706A Plane Mirror Interferometer, reduces thermal measurement drift to 1/12 the value typically achieved by conventional plane mirror interferometers. The unique contribution of the 10706B is its tolerance of angular misalignment of the plane mirror reflector. The 10706A can accept a range of measurement mirror angular alignment changes.
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Hot Temperature Hardness Tester
1200C
Rtec high temperature hardness tester is used to do high temperature materials testing up to 1200C. To prevent oxidation of tip and the samples the high temperature indenter comes with sealed chamber with inert gas. High resolution programmable down force control and XY stage allows to do multiple indents on same or multiple samples with ease.
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Miniature Translation
M-311 – M-318
Physik Instrumente GmbH & Co. KG
The M-310 series of translation stages are our smallest micrometer-driven positioners. The carriage is spring preloaded against the micrometer tip for elimination of backlash. M-310 series stages are available in one-, two- or three-axis configurations. The latter consists of a two-axis stage, an angle bracket and a one-axis stage. Please note that an XY unit cannot be separated into two one-axis stages. The vertical stage in the M-313 XYZ assembly supports the load through the micrometer spindle (not the preload springs) providing excellent stability.
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New Link system Control and Image Capture Software
New uncluttered and intuitive user interfaceLive display of current status for easy monitoringFull control of heating and cooling rate, limit and hold time of up to 100 rampsRow by Row control of Vacuum, Humidity, Tensile Force and Shear modes controllable and synchronised with TemperatureParameters of connected Linkam sensors displayed and stored - e.g. Vacuum, Humidity, Force, XY position and Pressure (dependent on connected stage type)Real Time chart of temperature and other measured parametersTrigger I/O for synchronisation with other equipmentTriggers recorded and plotted row by rowAutomatic setup of controls and parameter limits based on stage type connectedFull five point temperature calibrationUSB 2.0 to T96 and CSS450 ControllersOptional modules including Linkam Imaging Systems with high performance camerasIncludes .NET Components for easy integration into 3rd party applications e.g. LabViewNative 64 bit application
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Piezo-Z Top Plate
PZMU-2000
Applied Scientific Instrumentation
The PZMU-2000 is a precise piezo Z-axis stage that can be attached to the top of a microscope's existing XY stage or be used in stand-alone applications. On select models of microscopes, ASI can mount a PZMU-2000 to an OEM stage. We can procure a manual OEM stage for you if necessary.
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Plane Mirror Interferometer
10706A
The Keysight 10706A Plane Mirror Interferometer is a dual pass interferometer used for multiple axis applications such as X-Y stages where the measurement mirror may move perpendicular to the measurement axis. The unique contribution of the 10706A is its tolerance of angular misalignment of the plane mirror reflector. The 10706A can accept a range of measurement mirror angular alignment changes.
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Rapid Automated Modular Microscope
RAMM
Applied Scientific Instrumentation
*Featuring automated high-speed XY stages, precision piezo & motorized Z focusing, and a wide range of scanning options.*Configurable with infinity-corrected optics, dichroic filter cubes, multi-wavelength excitation and emission filterwheels, shutters, and detectors including cameras and photomultipliers.*Auto-focus, focus stabilization, tracker, and robotic specimen loader available.*Arrangement provides a solid platform for high throughput screening, genetic sequencing, experimental research, and much more.*Designed for flexible cost-effective OEM development using high quality high MTBF components to reduce cost and increase customer satisfaction.
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Spectroscopic Reflectometer
– Antireflective coating (ARC) on textured (poly-) crystalline silicon solar cellMeasurement– Thickness, Reflectivity, n&kWavelength– 420 – 950 nm (1.3-3.0 eV) : expandableAccuracy (thickness measurement on specular sample)– 104.5 nm for 104.8 nm SiO₂on c-Si* Accuracy can be dependent on the quality of filmThickness range– 10 nm ~ 20 mm (depend on sample)Data acquisition time– < 1 sBeam spot size– ~ 50 mmFocusing of beam– Manual (optional auto-focus)Sample stage– Manual X-Y stage (specify sample size and travel distance)(optional automatic X-Y stage for mapping)
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Stereoscopic Zoom Microscope Automation
SZ-2000
Applied Scientific Instrumentation
Based on ASI's proven DC servo motor technology, the SZ-2000 automates stereo zoom microscopes. The unit can be configured for motorized focus only, motorized focus with automated zoom control, or motorized focus with automated zoom control and an automated XY translation stage. The Z axis focus resolution varies slightly depending upon the model of the microscope, with 0.8 microns being the smallest step size available on a Nikon SMZ800.
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XRF
B Series
The B Series represents the most basic top-down measurement configuration that Bowman offers. The sample stage is a fixed base plate, requiring operators to manually position parts in the desired area for testing. This is accomplished by placing parts into the chamber and using the video image to align the desired location within the crosshairs on the screen. The sample chamber is the same as the P Series, with the slotted configuration, but without the programmable X-Y sample stage.
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XRF
G Series
The G Series’ two most distinctive features are precision video imaging, and “bottom-up” measurement using a motorized Z-axis with laser-based auto-focus. The latter is a feature unique to Bowman. An available manual XY stage with 1.5 X 1.5” travel facilitates easy positioning of small and large parts. The chamber is relatively small when compared to other models like the B Series. The smaller chamber and footprint is well suited for jewelry and other precious metal analysis applications, and components such as connectors and fasteners.
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XRF
L Series
The L Series is the most versatile instrument that Bowman offers. It combines all of the features of the P Series with a larger sample chamber and greater X-Y stage travel. For samples larger than ~12 inches (300 mm) in any direction, the L Series is a must-have. The large sample stage and travel allows for both large parts, or large sample fixtures holding multiple parts, to be measured. The chamber is fully enclosed and boasts a capacity to hold samples up to 22″ (550mm) x 24″ (600mm) x 13″ (330mm) (LxWxH). The X-Y stage travel distance is 10″x10″ (254mm x 254mm). The standard configuration includes a 4-position multiple collimator assembly, and a variable focus camera allowing for measurement in recessed areas. As with other models, the collimator sizes and focal distances are customizable for different customer applications. The programmable X-Y stage is included, but can be removed to allow for the maximum sample height capacity (10″ (254mm) z-height with stage, 13″ (300mm) without). The solid-state PIN detector is included along with our long-life micro-focus x-ray tube. The high performance SDD detector is an optional upgrade.
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XRF
P Series
The P series offers the flexibility of measuring a wide variety of sample sizes, shapes, and quantities. It is equipped with a high precision programmable X-Y stage that offers several convenience factors over a fixed stage. Operators can use the mouse and software interface to move to desired measurement locations easily. Multi-point programs can be created to automatically measure multiple sample locations with the click of a button. Pinpoint control is achievable for testing critical areas. Larger sampling volumes are possible through multi-point programming.
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Stages
Applied Scientific Instrumentation
Consists of ASI's proven piezo top plate mounted within your existing OEM stage. This requires a completely new top plate be machined for the OEM stage, however, this allows us to provide an elegant solution.
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Linear Stages
A new set of motorized tables developed by Klocke Nanotechnik allows high strokes at small volumes. The modules are driven by the Nanomotor®. Loads of up to two kg can be moved over centimeters of stroke with down to 2 nm resolution. Manipulation in many degrees of freedom is possible without backlash. The modules NMT xx-L are longer, but thin like a pencil. In most of the NMT-modules position measurement systems can be included without increasing the size. The resolution of the position sensor is better than 10 nm. All NMT modules can easily be fixed onto each other. Very small connectors allow the exchange of a module without removing cables. The NMT-Zxx are modules for vertical movement. They have an internal load compensation to lift up loads. Nanomotor-Grippers and force sensors that can easily be fixed on these modules are available.
