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Test Program
Generate native system input events for the purposes of test automation, self-running demos, etc. (developer.com)
- Pickering Interfaces Inc.
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Switching System Test Tools
EBIRST™
Switching systems are an important part of many test systems, however, the switching system is in a vulnerable place. When accidents happen that can cause a faulty device, you need a way to get the system up and running again with a minimum of effort and operator skills.
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Test Requirement Document for Developing and Documenting Strategy and Structure of Test Programs
TRD System
The TRD System helps users develop and document the strategy and structure of test programs using TRD format screens, flowchart generation tools and documentation formats, all in accordance with the most popular military standard format ( MIL-STD-1519) or with unique custom formats. It also has the ability to automatically generate an ATLAS test program from the TRD information provided by the user.
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Probe System
Acculogic Sprint 4510
The Sprint 4510 family of flying probers are well known for their speed, reliability, ease of use and large world-wide installed base.Flying probe testers have few restrictions on access, require no test fixtures, and can test boards with virtually unlimited number of nets, allowing test developers to turn a program around in a short time.
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Software & Hardware Interface
XJAPI
The XJAPI is a simple-to-use DLL Application Program Interface (API), designed to give you low-level access to the JTAG chain via either the XJLink or the PXI hardware, allowing easy integration with a wide range of other systems such as development/evaluation boards, test systems
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6000 Series Digital I/O Modules
Series 6000 digital I/O modules record signals from frequency counters, flow meters, encoders, discrete transducers, IRIG time, etc. which are often part of the test environment. These digital signals are time aligned and recorded alongside the system’s analog measurements. High density digital inputs provide an opportunity to easily include facility controls like switches, valve positions, relays, lights, etc. along with the test data. Series 6000 digital I/O modules also provide outputs generated by user command or automatically by Sequence, Alarms or DSP. User generated outputs are accomplished in software while sequencers can be programmed prior to a test and initiated by program or hardware control. Alarm conditions preprogrammed on the analog side can automatically generate digital outputs which are typically connected to facility control systems or PLCs. A DSP adds powerful real-time processing and is appropriate for PID control loops, derived parameter calculations and a variety of other real-time operations.
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NET and C #
The programming software C # under .NET enables the development of test programs and additional components.
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DC Electronic Loads
LSG Series
*Operating Mode : C.V/C.C/C.R/C.P/C.C +C.V/C.R + C.V/C.P. + C.C.*High Precision, High Resolution (10 A),High Speed Variable Slew Rate (16A/ s).*Sequence Function for High Efficient Load Simulations.*Parallel Connection of Inputs for Higher Capacity. (With 4 Booster Units : Max 9.45kW or 4 Master Units)*External Channel Control/Monitoring via Analog Control Connector.*Program Mode to Create Work Routines for Repetitive Tests.*Multiple-Interface : USB 2.0 Device/Host and GPIB/RS-232C.*Adjustable OPP/OCP/OVP Setting.
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DynoLAB Test Cell Supervisory System
SAKOR Technologies’ DynoLAB™ data acquisition and control systems offer reliable, cost effective automation of all types of dynamometer test systems. As with all SAKOR products, the DynoLAB system undergoes a continuous program of upgrade and improvement, regularly expanding and enhancing DynoLAB’s capabilities.
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In Stock & Rental Testing Chambers
Weiss Technik In Stock and Rental test chamber programs help assist you with your environmental testing needs with a wide selection of stock for fast delivery. We offer many options that will fit your testing requirements. Our In Stock test chambers offer common sizes and features that allow you to keep your testing on track.
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Multi-Function PXI Card
GX3788
The GX3788 is a user configurable, FPGA-based, 3U PXI multi-function card which supports digital and analog test capabilities. The card employs the Altera Stratix III FPGA which features over 45,000 logic elements and 1.836 Kb of memory. The GX3788 is based on the GX3700 FPGA card and includes an integral daughter board which provides (8) differential input, 16-bit, 250 MS/s A to D converters and (8), 16-bit, 1 MS/s, D to A converters. The module's FPGA is pre-programmed, providing access to all digital and analog functions. Alternatively, users can program or modify the FPGA , allowing user to adapt the module to their own specific test needs. The design of the FPGA is done by using Altera's free Quartus II Web Edition tool set. Once the user has compiled the FPGA design, the configuration file can be loaded into the FPGA directly or via an on-board EEPROM.
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PCIe-7821, Kintex 7 FPGA, Digital Reconfigurable I/O Device
785359-01
The PCIe‑7821 is a reconfigurable I/O (RIO) device that features a user-programmable FPGA for onboard processing and flexible I/O operation. With LabVIEW FPGA, you can individually configure the digital lines as inputs, outputs, counter/timers, PWM, encoder inputs, or specialized communication protocols. You can also program custom onboard decision making that executes with hardware-timed speed and reliability. Each line offers software-selectable logic levels. The PCIe‑7821 is well-suited for a wide variety of applications, such as high-speed waveform generation, sensor simulation, hardware‑in-‑the‑loop (HIL) test, bit error rate test, and other applications that require precise timing and control.
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Custom Test System Solutions
No time to think about test? One-size-fits-all testers not ideal? Existing solution no longer fits your needs? Then count on integrated test solutions from Astronics. We’ll assist you with your test strategy and your test system, setting you on the path to market at a pace and ROI that ensures your program success.
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Soil Mechanics
INSITU
The INSITU program interprets statical and dynamical geotechnical in situ tests. In order to interpret the SPT tests, the program utilises the main correlations that are normally used to determine the geotechnical parameters of a soil. One should enter the geometrical and geotechnical parameters pertaining to the stratigraphy surveyed trough drilling and the number of blows relative to each test; some corrective parameters can be entered that enable one to limit the perturbations in the interpretation of the data caused by the way the test is performed and the type of instrument that is used.
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LCM Tester
Model 27012
To meet the high accuracy and low price requirements for LCM TV test device, Chroma 27012 that integrates the signal and power source provide a complete test solution for LCD Module. Its LVDS, TTL (Option) signal source fully complies with the digital signal standard, meanwhile with the 24V, 12V, 5V, 3.3V DC source output it is able to supply power to VDD, Backlight for LCM test without obtaining external power source. Equipped with the interface of single key to switch the Timing, Pattern and Program rapidly for test in auto or manual mode, the 27012 is able to provide a direct and convenient test environment for LCM TV by its complete hardware configuration and easy operation.
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Linear DC Power Supply
MPS-P Series
This series of programmable DC power supply is a new generation of high-quality programmable linear DC power supply. It can display voltage, current, power and other parameters in multiple windows at the same time. The series of products is equipped with RS232 communication interface. It can be combined with other instruments arbitrarily and integrated into a test system with special functions to meet the measurement requirements in different occasions. The host computer program can be edited through the communication protocol, which brings great convenience to the user's use. It is a replacement product of ordinary programmable power supplies, has a very high cost-effective advantage.
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Test Program Sets
Each grouping may consist of 15 levels of development ranging from Complexity 0 to Complexity 14, with level 14 the most complex. Within each complexity, nine additional subcomplexity levels exist.
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Ferroelectric Test System
LCII
Precision LC II is an affordable Ferroelectric Tester for research labs. This system offers 5Khz at 9.9V and also comes in a built in 10V, 30V, 100V, and 200V option. This unit can also be expanded to 10kV for bulk ceramic testing. Vision Software is provided with the LCII Test System. Vision uniquely allows the user to construct complex or simple programs with any number of tests to characterize all aspects of the sample in one execution while keeping track of the measurement results and the history of the sample being tested. Tasks such as Hysteresis, I/V, C/V, PUND, Waveform, Magnetoelectrics, Piezoelectrics are just a few features to choose from.
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PCI-7813, 3M Gate Virtex-II FPGA, Digital Reconfigurable I/O Device
779370-01
The PCI‑7813 is a reconfigurable I/O (RIO) device that features a user-programmable FPGA for onboard processing and flexible I/O operation. With LabVIEW FPGA, you can individually configure the digital lines as inputs, outputs, counter/timers, PWM, encoder inputs, or specialized communication protocols. You can also program custom onboard decision making that executes with hardware-timed speed and reliability. The PCI‑7813 is well-suited for a wide variety of applications, such as high-speed waveform generation, sensor simulation, hardware-in‑the‑loop (HIL) test, custom communications protocols, bit error rate test, and other applications that require precise timing and control.
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Analytical Services
S.D. Myers, Inc. Laboratory has provided Analytical Services since our company was founded in 1965. We provide laboratory analysis of electrical insulating liquids and electronic data management services. We also review, interpret, and analyze test data from our laboratory and from other sources to provide our customers with clear and unambiguous recommendations concerning their electrical equipment maintenance programs.
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FD-11601, 8-Channel, ±10 V Powered-Sensor Voltage Input Device for FieldDAQ
786374-01
The FD-11601 measures up to eight channels with a voltage input range of ±10 V. Each input channel supports TEDS and provides 24 V DC to power external-powered sensors without additional power supplies. The FD-11601 features 24-bit resolution, simultaneous sample rates up to 100 kS/s/ch, and channel-to-channel isolation. It is IP65/IP67 rated to be dust-tight and water-submersible, operates in -40 °C to 85 °C environments, and can sustain 100 g shock and 10 g vibration. The FD-11601 incorporates Time Sensitive Networking (TSN) and features an integrated network switch and built-in power circuitry for simple daisy chaining. You program the FD-11601 with NI-DAQmx, which automatically synchronizes multiple FieldDAQ™ devices. The FD-11601 is ideal for test cell and outdoor environments.
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Task Sequencing and Automated Process Control
T-Zero
Command and Control Technologies Inc.
T-Zero is a unique process control program that facilitates automated design and execution of command, control, test, and monitoring activities. It features visualization of the operations process itself coupled with automated coordination of group activities. The software provides a visual, role-based interactive timeline built on the real-time data processing power of the Command and Control Toolkit™ (CCTK). T-Zero is the perfect automation solution for labor -intensive procedural activities: improving process organization, repeatability, and freeing operations staff from tedious task details to focus on strategic operational objectives.
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DiodeTester
FECPLS500
Frothingham Electronics Corporation
The PLS500 automatic tester is designed primarily to do SURGE testing either as single pulses or with Forward and Reverse bias, according to methods 4066-1 or 4066-2. In addition, it can also test VF with rectangular pulses and THERMAL RESPONSE either in DVF (mV) or degrees per watt. All three test types may be performed in a single test program.
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SoC Test System
V93000 SoC / Smart Scale
Advantest’s V93000 Smart Scale generation incorporates innovative per-pin testing capabilities. Each pin runs it own sequencer program for maximum flexibility and performance, for example in multisite applications. Full test processor control ensures time synchronization between all card types, like digital, Power, RF, mixed signal and so on. The user benefits are reduced test time, best repeatability and simplified program creation. The system design makes it easy to extend your configuration with new modules and instrumentation, as your test needs change.
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Custom Testing Solutions
Test and MeasurementEnable increases the robustness of your test and measurement solutions, thereby reducing errors and associated costs. Data Acquisition (DAQ)Enable defines and builds custom DAQ systems for automated measurements of any process or manufactured part. Control and AutomationEngineeringEnable ensures that your processes are programmed to be safe, effective and optimized for both speed and quality. Real-Time and Mission CriticalSystemsEnable develops dependable real-time systems and Hardware in the Loop (HIL) simulations for high-speed applications. Motion ControlEnable creates software for synchronized multi-axis robotic control of velocity, position, force and action. Machine VisionEnable implements software and hardware-based solutions for precise image analysis, data extraction and vision-guided machine control. R&D Systems/Product DevelopmentEnable’s team of engineers and scientists works with you to address and solve problems containing technical challenges and uncertainties. Electronic Test SystemsEnable programs and builds software and hardware-based solutions for accurate measurements, from DC to RF. Mobile App DevelopmentEnable enhances your systems by integrating custom iOS and Android apps. Web DevelopmentEnable enhances your systems by integrating desktop and mobile web frameworks using PHP, CSS and HTML5. Database DevelopmentEnable decentralizes your data storage to be online, secure and accessible from anywhere.
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Test Programming
Terotest offers a full test programming service for all of our Automatic Test Equipment. In many cases test programs can be generated from CAD data on the product or component under test, or from autolearn facilities within the test system. Such techniques maximise accuracy and test program fault coverage, and allow quick and easy test program generation.
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Pattern Conversion
Wave Wizard
Wave Wizard generates a test program according to device spec. It avoids the inherent problems that exist when trying to force an event-driven simulation into a constrained ATE test program, by considering device perspective.
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Prodution Testers
Effitest E50
Effitest e50 is a flexible and cost efficient solution with easy programming, debugging of test programs and life-cycle support.
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Aging and Life Test Rack
SY2036
SY2036 Aging and life test rack is fully designed according to the IEC standard, and can also be designed based on the customer request. SY2036 can test LED, CFL, HID Indoor lamp and Outdoor lamp. Input Power supply: AC220V, 50/60HZ, 12KVA Min (110V is option) • Built-in transformer: 0-250V 5KVA and 0-300V 5KVA (Other power is option) • Maximum power for EUT: 5KVA and 12A (Other power is option) • EUT and Number: 112pcs B22, 112pcs E27. 36pcs T5/T8/T12 Tube. 32pcs LED panel (Other EUT can be designed according to customer request) • ON/OFF test: Can be set on the touch screen with program • Test number: 0~99999（Adjustable）
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High Performance EV Battery Test System
Shenzhen Sinexcel RE Equipment CO., Ltd
The 6V series battery test system uses a full-bridge circuit topology with a higher digit sampling chip. It can provide higher precision and more dynamic test data, and can provide a complete test program for mainstream lithium-ion batteries and batteries with a variety of material systems such as sodium batteries.
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Ring Wave Generator
SKS-1206IA/SKS-1206IB
Shanghai Sanki Electronic Industries Co., Ltd.
The ring wave generator is fully compliant with the new standards of IEC61000-4-12 and GB/T17626.12. The interface contains standard differences between IEC and Chinese national standards. Users can choose to enter the corresponding interface to perform different Test: Program -controlled high-voltage power supply and electronic switch have the characteristics of high precision, long life and good reproducibility.
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Remote Control Voice Recognition Tester
BK3013
Ready to help you take on the leading edge of consumer technology, we have designed a machine that tests microphones which both use RF and are used for voice recognition. The BK3013 runs a uniform SPL sweep to calculate FRF and also runs an SPL sweep that allows you to test the SPL range of your mic. Our "Test Shop" program will show you the results in graphs and allows you to have the computer check specific points in the test.
