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Near-Field
1) EMF closest to the antenna. 2) Near-field optics.
- LBA Group, Inc
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RF Safety Monitoring
FieldSENSE 60
The fieldSENSE 60 personal RF monitor has a proven track record of durability that works as hard as you do. fieldSENSE 60 is specifically designed with the RF climber in mind. Whether working in the nearfield of a broadcast system or in the far-field of a 5G system, exposure is correctly assessed and a warning is sounded, should the levels approach and exceed the OET65 and Safety Code 6 occupational limits. To ensure the device cannot be dropped off site, connect he device can be attached the included special harness-attachment mechanism. In the event of a warning while the monitor has fallen the buzzer is still within hearing range.
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Near Field Probes
A typical emi emission test is performed using broadband EMC antennas such as biconical, log periodics, Combilogs and horns. These antennas usually placed at 1, 3 or 10 meter distance as required by the test specification. These is considered far field measurements and the emission limits are given for the specific distance by the specification. During EMI compliance measurements, the emissions levels from products are compared with these limits. If the product exceeds these limits it is considered failing. These tests are typically conducted in a open area test site IOATS) or inside an anechoic chamber.
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Seismic Sensor
SmartPhone D
Teledyne Marine Real Time Systems
The highly rugged encapsulated SmartPhone D was designed for use with the SmartSource controller, or SmartPhone D system, for real-time monitoring of near-field signatures.
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NIRONE Sensor S
The NIRONE Sensor S brings material measurements from the laboratory to the field: it is small, mobile, innovative, robust and cost-effective. It is enabling fast and reliable measurements at the near infrared (NIR) spectral range from 1350 to 2450 nm and works even in the most demanding environments. NIRONE Sensor S offers excellent performance fully comparable to the best laboratory instruments in a small package and only a fraction of the cost. It can create new applications for materials analysis by NIR spectroscopy, including
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Near Field Micro Probe Sets
The near field probe is designed for a high-resolution measurement of electrical near fields.
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Near Field Probes
Anteral has extensive background in the design of Near Field Probes (open ended waveguides probes). Our Near Field Probes are currently being used in several laboratories around the world including the ESA's anechoic chamber. Anteral designs Near Field Probes from 10 GHz to 750 GHz covering the sectors requirements. Moreover, our Near Field Probes have a sharped design minimize reflections.
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AMIDA VCSEL Tester
AMIDA VCSEL tester can be divided into three parts: LIV measurement system, Near Field measurement system and Far Field measurement system. To achieve the above three measurements, in addition to the necessary optical components and optical instruments, the core technology is to provide fast and stable current pulses to drive the VCSEL laser diode to emit light, and then to test various optical and electrical properties
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1050 MHz Tracing Signal Generator
SM-5011
is used for the early test in the development of electrical products, troubleshooting of CATV/MATV system as well as the test and trouble diagnosis of cellular phone system. Combined with the near field probes of Mz530, it can detect the missing fields of radio frequency
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Near Field Probes 1GHz - 10 GHz
SX set
The SX1 set consists of 3 passive near field probes for making measurements in the development phase of E-field and magnetic field with a high clock frequency in the range from 1 GHz to 10 GHz. The probe heads of the set SX allow for measurements close to electronic assemblies, e.g. on single IC pins, conducting paths, components and their connectors, to localize interference sources. Field orientation and field distribution on an electronic assembly can be detected through trained use of the near field probe. The near field probes are small and handy. They have a sheath current attenuation and are electrically shielded. They can be connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. They have an internal terminating resistance.
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NI-5782, 100 MHz Bandwidth Transceiver Adapter Module for FlexRIO
782705-01
The NI‑5782 is ideal for applications that require the acquisition and generation of IF or baseband signals with in-line, real-time processing. You can analyze acquired signals in the PXI FPGA Module for FlexRIO to perform measurements and generate response signals. Application areas include RF modulation and demodulation, channel emulation, bit error rate testing (BERT), signal intelligence, radio frequency identification (RFID) and near-field communication (NFC) test, real-time spectrum analysis, and software defined radio (SDR).
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Near-Field Scanning Optical Microscope Platform
MoScan-F
MoScan-F is a device that enables you to get the best up-to-date available spatial optical resolution using the near field scanning optical microscope (NSOM) principle
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500Mz Tracing Signal Genrator
SM-5006
is used for the early test in the development of electrical products, troubleshooting of CATV/MATV system as well as the test and trouble diagnosis of cellular phone system. Combined with the near field probes of Mz530, it can detect the missing fields of radio frequency
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Near-field Goniophotometer
RiGO801
TechnoTeam Bildverarbeitung GmbH
Correct determination of the luminous intensity distributions (lid) of lamps and luminaires far within their photometric near-field range. Capture of ray data.
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Near Field Probes 30 MHz up to 3 GHz
RF6 set
The RF6 near field probe set consists of 2 passive magnetic field probes and 2 passive E field probes for measurements in the development phase of the E-field and magnetic field in the range from 30 MHz to 3 GHz on electronic assemblies. The probe heads of the RF6 set allow a step by step localization of interference sources of the RF magnetic field and RF-E-field on an assembly. From a larger distance the electromagnetic interference is detected by RF-R 50-1 for the magnetic field and by RF-E 02 for the E-field. The RF-B 3-2 and RF-E 10 probes with their higher resolution can more presicely detect the interference sources of the magnetic field and the E-field. Field orientation and field distribution on an electronic assembly can be detected by special guidiance of the near field probe. The near field probes are small and handy. They have a sheath current attenuation and are electrically shielded. They can be connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. They do not have an internal terminating resistance.
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Fiber optic active antennas / field probes
EFS-105
The EFS-105 is the first in a family of fiber-optic active antennas & E-field probes. The field distortion caused by the probe head is nearly zero due to the exceptionally small probe head and the all-optical signal transmission and power supply. This gives an invaluable advantage for near field measurements and measurements close to metallic parts.
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Hearing Aid Compatibility Automated Test System
MiNi-HAC
Hearing Aid Compatibility (HAC) evaluation of wireless handsets ensures accessibility of these technologies to the hearing impaired. The MiNi-HAC system can be used for the design and development of wireless handsets as well as for evaluation of hearing aids used by the hearing impaired to gain access to mobile wireless technologies. RF Emissions Test - near field measurements of the electric and magnetic fields emitted by a wireless device.
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Preamplifier
Is designed for the amplification of measuring signals, e.g. weak signals of near field probes with high resolution.
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Advanced Thermal Imaging Camera
FLIR E76
The FLIR E76 offers complete coverage of near and distant targets through a range of interchangeable AutoCal™ lenses, with fields of view for everything from wide-angle roof inspections to electrical inspections performed from a safe distance. A step up from the FLIR E54, the E76 includes an optional temperature range to 1000°C (1832°F), laser-assisted autofocus, and 3 area measurement boxes. The 320 × 240 thermal resolution produces crisp, vibrant imagery that can be enhanced with patented FLIR MSX® technology for added detail and perspective. The onboard FLIR Inspection Route runs pre-planned routes to help you stay organized when surveying large or multiple locations. FLIR Ignite provides automatic uploading of E76 images directly from the camera to the cloud for easy, secure storage and sharing.
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Imaging Goniometers
Radiant Vision Systems fully-automated goniometric systems are combined with a ProMetric® Imaging Colorimeter or Photometer and specialized software to capture a precise, comprehensive model of a light source’s near-field output.
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Near Field Micro Probe ICR HV H Field
The measurement coil is located vertically in the probe head. The near field probes are run with a positioning system (Langer Scanner).
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Combination Board Tester
ATE QT2256-640 PXI
Qmax Test Technologies Pvt. Ltd.
Most commercial ATEs does only functional test and do not carry out DC/AC parameter testing, which are very essential in increasing the fault coverage and for achieving near zero field returns. The testing challenges get worse when the boards are equipped with BS compatible components, DSP chips and CPUs or micro controller based boards. ATE QT2256-640 PXI system is designed as a combination board tester capable of testing highly complex and PCBs employing various techniques on a single platform. It can be easily upgraded to 640 digital channels and with programmable UUT power supplies, IEEE or PXI external instrumentation, Bus cycle signature system, ICE and integrated Boundary scan Test AC/DC parametric testing. The ATE is interfaced to an external host PC using a PCI express interface card allowing a maximum data transfer rate. Most commercial ATEs does only functional test and do not carry out DC/AC parameter testing, which are very essential in increasing the fault coverage and for achieving near zero field returns. The testing challenges get worse when the boards are equipped with BS compatible components, DSP chips and CPUs or microcontroller based boards.
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Near-Field Detection Module for Imaging
Transmission
Detection optimized for high performance near-field imaging in transmission-modeEnables optical amplitude and phase resolved near field measurementsPatented background-free detection technologyEnables bottom-side (transmission-mode) sample illumination with broadband mirrorSuited for visible and infrared wavelength range 0.5 20 mRequires transparent sample substrateMotorized parabolic mirror for easy beam-alignment in transmission-modeStationary focal point with respect to AFM-tipVariable illumination spot size (ca. 2m 100m)Suitable for plane-wave illuminationSupported AFM scan-speed: up to 20 m/s @ highest spatial resolution
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High Performance Analog & Mixed Signal Test Solutions
Applicos
Effective mixed-signal test solutions demand know-how and experience. Low level analog signals need to be stimulated and analyzed near fast switching digital logic. Cross talk, magnetic fields, clock jitter, ground noise and non-linearity of components, are just a few of the problems that must be addressed. Applicos knows what it takes to design and produce high quality mixed-signal test solutions. They have been servicing the mixed-signal test industry since 1993 and have established a distinguished reputation for providing our customers with high performance, cost effective solutions. In 2018 we acquired Applicos B.V. to extend our portfolio for the ATE business.
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Near Field Moving Detector Goniophotometer
LSG-1900B
LSG-1900B Goniophotometer is near field Type C automatic goniophotometric instrument for luminous intensity distribution measurement. The LSG-1900B uses a constant temperature detector. It is for industrial laboratory photometric data measurements of small luminaires, such as down light, bulb light, etc.
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Advanced Raman, AFM & SNOM Imaging Systems
alpha300 Series
Alpha300 series consists of advanced Raman, Atomic Force Microscopy (AFM) and Scanning Near-field Optical Microscopy (SNOM) imaging systems. Its sophisticated design ensures exceptionally high-throughput and sensitivity. A unique modularity allows for single-technique solutions as well as correlative imaging configurations.
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Emissions Test System
PC-114
Perform Radiated & Conducted EMI pre-compliance testing at your facility up to 1 GHz. Com-Power PC-114 EMI emissions test system is a ideal solution performing pre-compliance EMC testing from 9 kHz - 1 GHz.. It has essential equipment needed for radiated and conducted EMI emissions measurements. The system includes a spectrum analyzer, antennas, near field probes, a preamplifier, LISN and a non conductive antenna tripod. Pre-compliance testing in EMC is a commonly used term not easy to define. In general, it implies testing done prior to formal testing for legal compliance. Formal legal compliance is performed at a facility designed and equipped with test instrumentation that is fully compliant with the applicable EMC standards. Such facility and instrumentation is capital intensive and can be expensive even to rent and not easily available. Compliance testing is performed per exacting requirements of the Standards and other reference documents adhering to the test methods and last detail. In addition, the test facility may require to be accredited by an accreditation body such as NVLAP, A2LA. Often it is desirable to know prior to compliance testing at such facility, whether a product is close to compliance and also how close. Pre-compliance testing is specially useful for specifications such as FCC, Part 15, EN 55022 or EN 55011 (CISPR 22 or CISPR11). Pre-compliance testing usually means using the full compliance methods but making a few educated compromises in use of site or equipment to reduce costs and testing time. Here are some benefits of pre-compliance testing.
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Scanner Probe
RFS set
The RFS set consits of three passive near field probes designed for the use in a measurement scanner during the development of E-field and magnetic field. They are designed for frequency ranges of 30 MHz to 3 GHz. The probe heads of the RFS set allow for close measurements needed to correctly localize interference sources on an electronic assembly. They document the whole image of the device under test`s near field. The scanner probes have a sheath current attenuation and are electrically shielded. They are connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. They do not have an internal terminating resistance. The measuring signal can be increased with PA 203 or PA 303 preamplifier. On request RFS, LFS and XFS scanner probes can be produced.
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Lenses for Long-Wave Infrared (LWIR) Cameras for 8-14 µm
LWIR Zoom Lens Assemblies
Teledyne FLIR custom and off-the-shelf long-wave infrared (LWIR) continuous zoom (CZ) optical assemblies and lenses are for integrators and operators who do not compromise on quality. All lens assemblies have near diffraction limited performance and include advanced features that ensure continuous focus through the zoom. Formerly New England Optical Systems (NEOS) and now part of Teledyne FLIR, the world-class technical services team provides product support and can also develop new or customize existing lens assemblies for a camera, application, and mission. Designed to maximize infrared-camera performance, the LWIR CZ lens assemblies provide the competitive advantages required in the field and marketspace for a wide range of defense, security, and commercial applications.
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Antenna Test Chamber
Comtest provides Antenna test ranges fully covered with microwave absorbers for both near-field and far-field measurements. Because we always strive for new solutions, our R&D department developed our ‘Javelin Tip’ polystyrene absorbers. The enhanced material composition and altered shape, lead to improved performance and cleaner working space, enabling you to make high precision antenna testing fast, reliable, and worry-free.
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QAM Shadow
ComSonics' QAM Shadow is targeted for in-building leakage detection and ingress mitigation when portability and ease-of-use is most important.contractor work verificationevaluate new property wiringingress detection and mitigationextremely easy to use with one-button operationDOCSIS 3.1 ready to future proof your investmentbuilt-in near-field antenna eliminates the need for external antennas
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Near Field Probes
MFA Family
The micro probes allow detailed measurements of high-frequency magnetic fields in the layout, at the smallest SMD components(0603-0201) and at IC pins of printed circuit boards.
