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Probes, Magnetic Field
EM-6882 | 20 MHz To 230 MHz
The EM-6880, EM-6881 and EM-6882 Magnetic Field Probes operate in conjunction with any 50 ohm input impedance receivers.
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Probes, Magnetic Field
EM-6881 | 480 KHz To 30 MHz
The EM-6880, EM-6881 and EM-6882 Magnetic Field Probes operate in conjunction with any 50 ohm input impedance receivers.
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Probes, Magnetic Field
EM-6880 | 9 KHz – 520 KHz
The EM-6880, EM-6881 and EM-6882 Magnetic Field Probes operate in conjunction with any 50 ohm input impedance receivers.
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Flexible Magnetic Field Probes
Projekt Elektronik Mess- und Regelungstechnik GmbH
The active probes are equipped with active amplifier electronics and have an extremely low-impedance output, ie they can also drive long lines. The output signal is calibrated according to specification. They can not only be connected to a certain type of teslameter, but can also be connected to any signal input.
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Field Probe for Electric & Magnetic Field Measurement
WP400-3
Wavecontrol presents a new and unique field probe for the measurement of electric and magnetic fields that integrates both E & H sensors within dimensions of only 3 cm². Which makes it unique is that Wavecontrol has managed to add an E field sensor in a basic structure of a classical 3 cm² field probe. It has been possible, therefore, to obtain a 3 cm² field probe without compromising the capability of assessing E and H fields of its 100 cm² big sister, the recognized and successful WP400.
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Magnetic Field Meter
MP - 2000
The new magnetic field meter MP - 2000 first used probes (tangential and Axialfeldsonden), in which an own microcontroller, the analog sensor signals are digitized and linearized directly in the probe. This new technique is extremely trouble-free and allows very precise measurements, especially at high magnetic field strengths, where Hall probes can not operate linearly.
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Active Loop Antennas / Magnetic Field Probes
Is an active, shielded handheld loop antenna with nearly con- stant antenna factor over the entire frequency range. It can be used for testing according to CISPR, MIL, FCC, EN, ISO, ANSI, ETSI and many other standards.
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Magnetic Field Measurement Systems
The magnetic field probe performs non-contact current measurements and can be used for real traces. The probe of higher resolution enables pinpoint measurements.
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Relay / Magnetic Field Testers
PeakTech Prüf- und Messtechnik GmbH
Ideally suited for checking magnetic fields and the correct function of coils, e.g. Relays and solenoid valves. The magnetic field detector works without contact, so that opening the housing is not necessary in most cases. When a magnetic field is detected, the probe tip lights up permanently blue, with clocked relays in the same cycle as they are controlled. The function of the magnetic field detector can be checked before each measurement with the enclosed test permanent magnet.
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Universal Measuring Device For Magnetic Fields
Teslameter M-Test MK4
The M-Test MK4 precisely detects and measures static or dynamic magnetic fields. The ~ 1 mm thick tangential probe allows precise, punctual measurements in hard-to-reach places, air gaps or on surfaces. The M-Test MK4 is particularly suitable for measuring permanent magnets or small ferromagnetic parts.
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Near Field Probes
MFA Family
The micro probes allow detailed measurements of high-frequency magnetic fields in the layout, at the smallest SMD components(0603-0201) and at IC pins of printed circuit boards.
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Magnetic Field Camera: mapping for MRI applications
MFC2046
MRI and NMR spectroscopy applications require a highly uniform magnetic field, within at most a few ppm. NMR is the only magnetic measurement technique capable of providing a field map with that degree of precision. Introduced 25 years ago, Metrolab’s NMR Magnetic Field Cameras have revolutionized field mapping for MRI magnets. They reduced acquisition times from hours to minutes, positioning errors to fractions of a millimeter, and they rendered human and drift errors negligible. Now, meet the latest generation NMR Magnetic Field Camera, the MFC2046! Map any magnet with the New generation of MFC probe arrays. Magnetometer Teslameter Gaussmeter
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EMC Near Field Probes
TBPS01
The TBPS01 EMC near field probes H20, H10, H5 and E5 are magnetic field (H) and electric field (E) probes for radiated emissions EMC pre-compliance measurements. The probes are used in the near field of sources of electromagnetic radiation.
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Near Field Probes 1GHz - 10 GHz
SX set
The SX1 set consists of 3 passive near field probes for making measurements in the development phase of E-field and magnetic field with a high clock frequency in the range from 1 GHz to 10 GHz. The probe heads of the set SX allow for measurements close to electronic assemblies, e.g. on single IC pins, conducting paths, components and their connectors, to localize interference sources. Field orientation and field distribution on an electronic assembly can be detected through trained use of the near field probe. The near field probes are small and handy. They have a sheath current attenuation and are electrically shielded. They can be connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. They have an internal terminating resistance.
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Near Field Probes 30 MHz - 6 GHz
XF Family
The XF family consists of 4 passive magnetic field probes and 3 passive E field probes designed for measuring magnetic and E-fields in ranges from 30 MHz to 6 GHz during the development phase. Due to their integrated impendance matching the probes are less sensitive in the lower frequency range than the RF type probes.
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Magnetic Flaw Detector
CJX-A
multifunctional magnetic flaw detector absorbed the advantages of similar products at home and abroad. With small size, light weight, easy operation, multifunction in one unit. The detector can equip A, D, O three types of probes to realize the functions of magnetic clamp detection, electromagnetic yoke detection, ring detection. It is the necessary detector to do flaw testing, quality control, safety check, life evaluation in the fields of petrol, chemicals, metallurgy, shipbuilding, aviation, railway etc..
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Magnetic Flaw Detector
CDX-Ⅲ
magnetic particle flaw detector is the self-designed magnetic participle flaw detector of MITECH CO.,LTD. With small size, light weight, easy operation, multifunction in one unit. The detector can equip A, D, E O four types of probes to realize the functions of magnetic clamp detection, electromagnetic yoke detection, cross magnetic yoke detection, ring detection. It is the necessary detector to do quality control, safety check, life evaluation in the fields of petrol, chemicals, metallurgy, shipbuilding, aviation, railway etc
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Near Field Probes 30 MHz up to 3 GHz
RF2 set
The RF2 near field probe set consists of 4 passive near field probes for measurements in the development phase of the magnetic field in the range from 30 MHz to 3 GHz on electronic assemblies. The probe heads of the RF2 set allow the step by step localization of interference sources of the RF magnetic field on assemblies. From greater distances the electromagnetic interference can be detected by RF-R 400-1 and RF-R 50-1 probes. The RF-B 3-2 and RF-U 5-2 probes with their higher resolution can more precisely detect the interference sources. Field orientation and field distribution on an electronic assembly can be detected through a trained special use of the near field probe. The near field probes are small and handy. They have a sheath current attenuation and are electrically shielded. They can be connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. They do not have an internal terminating resistance.
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Near Field Probes 30 MHz up to 3 GHz
RF1 set
The RF1 near field probe set consists of 4 passive near field probes for making measurements in the development phase of E-field and magnetic field in the ranges of 30 MHz to 3 GHz on electronic assemblies. The probe heads of the RF1 set allow for measurements close to the electronic assemblies, e.g. on single IC pins, conducting paths, components and their connectors in order to localize interference sources. Field orientation and field distribution on an electronic assembly can be detected through a trained special use of the near field probe. The near field probes are small and handy. They have a sheath current attenuation and are electrically shielded. They can be connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. They do not have an internal terminating resistance.
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Near Field Probes 30 MHz up to 3 GHz
RF6 set
The RF6 near field probe set consists of 2 passive magnetic field probes and 2 passive E field probes for measurements in the development phase of the E-field and magnetic field in the range from 30 MHz to 3 GHz on electronic assemblies. The probe heads of the RF6 set allow a step by step localization of interference sources of the RF magnetic field and RF-E-field on an assembly. From a larger distance the electromagnetic interference is detected by RF-R 50-1 for the magnetic field and by RF-E 02 for the E-field. The RF-B 3-2 and RF-E 10 probes with their higher resolution can more presicely detect the interference sources of the magnetic field and the E-field. Field orientation and field distribution on an electronic assembly can be detected by special guidiance of the near field probe. The near field probes are small and handy. They have a sheath current attenuation and are electrically shielded. They can be connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. They do not have an internal terminating resistance.
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Near Field Probes 30 MHz up to 6 GHz
XF1 set
The XF1 set of near field probes consists of 4 passive near field probes and one passive E field probe for making measurements in the development phase of the magnetic and electric fields in ranges from 30 MHz to 6 GHz. Due to their integrated impendance matching, the probes are less sensitive in the lower frequency range than the RF type probes. The probe heads of the XF1 set allow for the step by step identification of interference sources of the magnetic field on an electronic assembly. At first, for example the XF-R 400-1 detects the fields which the assembly emits in total. Next, using higher resolution probes the interference sources can be more precisely detected. The E field probe is used for the detection of electric interfering fields near the assemblies. With trained use of the near field probes, field orientation and field distribution can be detected. The near field probes are small and handy. They have a sheath current attenuation and are electrically shielded. They can be connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. They have an internal terminating resistance.
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Zero Field Cavity
Zero field cavities generate a zero magnetic field in an air gap. They are mainly used to calibrate hall probes for their zero scale value of output for the magnetic field strength H or the magnetic flux density B they measure. For example Gaussmeters can be calibrated by using Zero Field Cavity.
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Magnetic Susceptibility Meter for Multi-Layer Survey
MULTI KAPPA
Multi Kappa instrument serves for fast field survey allowing both spot measurement and mapping by means of several probes. Together with GF Instruments traditional pocket magnetic susceptibility meters cover wide range of demands for accurate susceptibility measurement on ground surface, outcrops and samples of rock and soil. geological survey, archaeology, agriculture and forestry, raw material prospecting, mineralogy, sedimentology, detection of metallic objects, UXO survey.
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EMC Probes
The Beehive Electronics 100 series EMC probes allow the accurate measurement of magnetic and electric fields. They are useful for EMC troubleshooting, field strength measurement, and troubleshooting of RF circuits.
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Scanner Probe
RFS set
The RFS set consits of three passive near field probes designed for the use in a measurement scanner during the development of E-field and magnetic field. They are designed for frequency ranges of 30 MHz to 3 GHz. The probe heads of the RFS set allow for close measurements needed to correctly localize interference sources on an electronic assembly. They document the whole image of the device under test`s near field. The scanner probes have a sheath current attenuation and are electrically shielded. They are connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. They do not have an internal terminating resistance. The measuring signal can be increased with PA 203 or PA 303 preamplifier. On request RFS, LFS and XFS scanner probes can be produced.
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Cryogenic Probe Station
CPX-VF
The Lake Shore CPX-VF probe station enhances the standard probe station capabilities with the addition of a ±2.5 T vertical field superconducting magnet. It can do all the standard C-V, I-V, microwave, and electro-optical probing of the CPX, plus out-of-plane vertical field superconducting magnetic measurements. Researchers can use it to perform Hall effect measurements and test magneto-transport parameters. The CPX-VF is one of Lake Shore’s premium probe stations for combining microwave measurements with magnetic field.
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USB Hall Probes
MAGNET-PHYSIK Dr. Steingroever GmbH
The USB Hall probe is simply connected to a computer and operated using easy-to-understand software. No additional measuring device is required to measure the magnetic field strength. You can download the "USB Teslameter" software for Windows here. A Linux version is available from us on request.
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Scanning Probe Microscopy
SPECS Surface Nano Analysis GmbH
As Scanning Probe Microscopy (SPM) is a key tool for nanotechnology, SPECS offers dedicated solutions for highly demanding requirements.In UHV, strong emphasis lies on spectroscopic methods such as scanning tunneling spectroscopy and inelastic tunneling spectroscopy as well as single atom and molecule manipulation. With the invention of a Joule-Thomson cryostat by Prof. Wulf Wulfhekel, SPECS now offers the JT-STM , operating sample and sensors in thermal equilibrium below 1K with optional high magnetic field.
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Probes for Tube Inspection
Probes for tube inspection are lightweight but solidly constructed eddy current, remote field, magnetic flux leakage, and IRIS ultrasound. These probes are used for ferromagnetic or non-ferromagnetic tube inspection applications.
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Micro probes 1 MHz up to 1 GHz
MFA 02 set
The two in the set included micro probes are used to measure low-frequency magnetic fields up to 1 GHz, e.g. at signal conductors (150µm), SMD componets (0603-0201) or IC pins. The MFA micro probes are guided by hand. An amplifier stage is integrated into the probe head. The amplifier stage (9V, 100mA) is powered via the BT 706 Bias tee. It has an impedance of 50 Ohm. The micro probes are connected via the Bias tee to a spectrum analyzer or an oscilloscope. The MFA 02 set delivery of Langer EMV-Technik GmbH includes correction lines. With the help of the correction lines the probe output voltage is converted either into the respective magnetic field or to the current which is running through the conductor.
