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See Also: Performance Testing, Validation, Characterization
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EDXIR-Analysis Contaminant Finder/Material Inspector
EDXIR-Analysis software is specially designed to perform qualitative analysis using data acquired by an energy dispersive X-ray (EDX) fluorescence spectrometer and a Fourier transform infrared spectrophotometer (FTIR). This software is used to perform an integrated analysis of data from FTIR, which is excellent at the identification and qualification of organic compounds, and from EDX, which is excellent at the elementary analysis of metals, inorganic compounds and other content. It then pursues identification results and the degree of matching. it can also be used to perform EDX or FTIR data analysis on its own. The library used for data analysis (containing 485 data as standard) is original to Shimadzu, and was created through cooperation with water supply agencies and food manufacturers. Additional data can be registered to the library, as can image files and document files in PDF format. It is also effective for the linked storage of various types of data as electronic files.
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Regenerative Battery Pack Test System
17020
Chroma's 17020 is a high precision system specifically designed for secondary battery modules and pack tests. Accurate sources and measurements ensure the test quality that is suitable to perform repetitive and reliable tests that are crucial for battery modules / packs, for both incoming or outgoing inspections as well as capacity, performance, production and qualification testing. Chroma's 17020 system architecture offers regenerative discharge designed to recycle the electric energy sourced by the battery module ei ther back to the channel s in the sys tem performing a charging function or to the utility mains in the most energy efficient manner. This feature saves electricity, reduces the facilities thermal foot print and provides a green solution by reducing the environmental impact on our planet. Chroma's 17020 system is equipped with multiple independent channels to support dedicated charge / discharge tests, on multiple battery modules / packs, each with discrete test characteristics. The channels can easily be paralleled to support higher current requirements. This feature provides the ultimate flexibility between high channel count and high current testing.
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Shock & Drop Testing
Shock testing is often performed as part of a hardware qualification or design process. Information obtained during shock testing can improve the survivability of products as well as verify that they will perform properly in service. These types of tests require special transducers and measurement systems to record and process the high level, high frequency response.
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EEE Component Testing and Screening Services
DPACI performs 100% screening as well as qualification testing on electronic parts supplied to the high reliability commercial, industrial, space, and U.S. military sectors. We generate software and hardware to test microcircuits, discrete semiconductors, hybrids, PEMS, and other EEE electronic components to exact customer and military specifications. Our engineering experience in electronic parts screening, qualification, and in-house test fixture fabrication allows us to provide value added components in a timely manner.
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Software
Tool Qualification Solutions
Many regulatory agencies require that any software tool used to tailor the safety life-cycle must be qualified to ensure that the tool is functioning correctly for the intended purpose. Genuen’s Tool Qualification Kits (TQK) provide a solid foundation for achieving formal qualifications used as part of your development process in highly regulated industries such as automotive, aerospace and medical.
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Broadband DSL Test Set
Copper Pro 990DSL
The 990 CopperPro Series II provides a full range of troubleshooting, fault locating, testing and qualification capabilities. That means top performance with fewer tools to carry.
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Handheld VoIP Service Tester
925VST
THE 925VST is a powerful handheld voice over packet (VoP)service qualification tool for field deployment and troubleshootingpersonnel who need a rapid and reliable installation tool.
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Non Destructive Testing (NDT)
NDT covers a wide group of testing techniques used to evaluate the properties of a material, part, product, weld or system without causing damage. NDT carried out at KLL includes:Liquid Penetrant Testing (LPT) is used for the detection of surface breaking discontinuities on magnetic and non-magnetic metallic materials.Fluorescent and colour contrast penetrants are available to be used in the following methods:-Water washableSolvent removablePost emulsifiableMagnetic Particle Inspection (MT/MPI) is used for the detection of surface breaking and slightly sub-surface (up to 2mm) discontinuities.Bench type crack detectors and portable units are employed producing various waveforms (i.e. A.C, HWDC and induced magnetic flow) to give both circular and longitudinal magnetism.On-site testing is carried out using electro magnetic yokes and permanent magnets producing induced magnetic flow.Ultrasonic Flaw Detection (UT), also known as Ultrasonic Inspection, is used for the detection of volumetric discontinuities in ferrous and non-ferrous products (forgings and castings etc.), and welds in magnetic and non-magnetic materials.UT is capable of penetrating metals, dependent on the material characteristics, up to 10m in length.Some thickness and depth checks can also be carried out using ultrasound.Radiography services are available through sub-contract booked in advance. Notice is required for on-site work.Personnel are available at short notice for in-house or on-site work in the UK and overseas.All inspectors undertaking non destructive testing (LPT, MT/MPI and UT) are qualified to, and meet a minimum of, PCN Level 2.PCN Level 3 supervision is available in-house for LPT, MT/MPI, UT offering consultancy services including procedure writing and commentary, auditing of techniques and Level 3 Supervisor cover.We can assist clients in product qualification, material testing, quality assurance and audit programmes.
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SSD Test Dystems
MPT3000HES / MPT3000HES2
Compact, highly efficient SSD test solution allows customers to accelerate time to qualification for their new designs and time to market for their latest storage products.
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Testing Services
*Programmable Multipoint Tester*Over 8,000 programmable test points (DWV, Capacitance, Insulation Res., 2/4-Wire Resistance, etc.)*1500VDC / 1000 VAC Dielectric Withstanding Voltage (DWV)/ Hi-Pot (Programmable Dwell times)*Full Electronics laboratory complete with state of the art testing equipment*Custom Unit Testing (Designing of Specialized Test fixtures)*EMI Testing*Temperature and Humidity Testing*Shock Testing*Vibration Testing*Sand and Dust / Altitude Testing*Military Qualification Tests Performed
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Advanced Ethernet Tester
LinkRunner® 10G
Quickly test, verify, and troubleshoot 1Gig, Multi-Gig and 10Gig Ethernet (copper, fiber) including line-rate performance testing and packet captureLayer 1-7 AutoTest enables any technician to find network problemsMonitor networks for intermittent issues, every minute for up to 24 hours AllyCare-enables in-depth network discovery features and web remote controlLANBERT™ Media Qualification app tests the capability of premise cabling and media components for carrying Multi-Gig and 10Gig EthernetTwo LinkRunner 10G units can be used for line-rate performance testing to verify network capacity, performance and QoS, as well as service provider SLAs between sites
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Substrate Manufacturing
KLA’s substrate manufacturing portfolio includes defect inspection and review, metrology and data management systems that help substrate manufacturers manage quality throughout the wafer fabrication process. Specialized wafer inspection and review tools assess wafer surface quality and detect, count and bin defects during production and as a critical part of outgoing wafer qualification. Wafer geometry systems ensure the wafer shape is extremely flat and uniform in thickness, with precisely controlled wafer shape topography. Data analysis and management systems proactively identify substrate fabrication process excursions that can lead to yield loss. KLA’s substrate manufacturing systems support process development, production monitoring and final quality check of a broad range of substrate types and sizes including silicon, prime silicon, SOI, sapphire, glass, GaAs, SiC, GaN, InP, GaSb, Ge, LiTaO3, LiNBO3, and epitaxial wafers.
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Qualification Testing
Teledyne Storm Microwave ensures your design specifications are met by conducting in-house testing at all production phases. This comprehensive qualification process guarantees high-quality performance and reliability in every cable assembly, meeting the stringent requirements of your application.
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Infrared Interferometers
Optical imaging applications are broad and varied. Testing at a system's design wavelength is critical for development, final alignment and qualification.
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PCIe® Gen5 NVMe SBExpress Test System
SBExpress-RM5
The SANBlaze SBExpress-RM5 is a complete turnkey PCIe® Gen5 NVMe SSD Drive validation test system. The SBExpress-RM5 feature set provides unique functions applicable to all aspects of a product lifecycle, from development and QA, to design validation and manufacturing test cycles. The ability to drive Gen5 NVMe SSDs with a wide range of configurable attributes provides engineers with a flexible, multi-controller supported validation test platform. Development, qualification, and certification test cycles can be highly automated, thus reducing overall test time, and rapidly surfacing errors and non-conformance.The SANBlaze SBExpress-RM5 hardware provides a rackmount chassis with sixteen dual or single port front-accessible drives.
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Defect Inspection and Review
KLA’s defect inspection and review systems cover the full range of yield applications within the chip and wafer manufacturing environments, including incoming process tool qualification, wafer qualification, research and development, and tool, process and line monitoring. Patterned and unpatterned wafer defect inspection and review systems find, identify and classify particles and pattern defects on the front surface, back surface and edge of the wafer. This information allows engineers to detect, resolve and monitor critical yield excursions, resulting in faster yield ramp and higher production yield.
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Detective Logic Analyzer
LPDDR3
Provides logic analyzer like deep transaction Listing and Waveform captureCan store up to 1G of captured States at 1600MT/sContinuous, real time analysis, not post-processingEye Detector guarantees valid data acquisitionExtensive Triggering and Storage Qualification allows precise insightProtocol Violation Detector provides hundreds of simultaneous, real time tests to JEDEC specificationsMode Register Listing providedSupports Auto-Clock rate detect and clock stoppageConnects to the target under test with Flying Lead, BGA interposers or a midbus probeIntegrated Microsoft Charts gives quick insight into large trace capturesTrigger In & Out allows the Detective to integrate with other test tools
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Ordnance Release Testing Services
Dayton T. Brown, Inc. can help ensure that your payload is delivered accurately and reliably every time. Our team is responsible for first article, production lot, qualification, and associated testing and engineering support for mechanical and electrical armament and missile launching systems. DTB can help you develop a customized test plan that combines testing across many specifications – environmental, dynamics, EMI/EMC, structural, and non-destructive. Some of the standards that we follow include:
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Device Modeling Products
Our products and premier solutions provide for characterization and modeling of cutting-edge CMOS and compound semiconductor devices. Keysight is the only vendor that provides complete end-to-end modeling solutions, from automated measurements, accurate device model extraction, comprehensive qualification to final process design kit (PDK) validation. Comprehensive modeling services are offered, supported by Keysight's expert engineers and advanced labs. Our key device modeling and characterization EDA software and hardware solutions are included below.
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VDATS, Cable Assembly Kit, All-Inclusive
541139193
VDATS, Cable Assembly Kit, All-InclusiveTop-Level part number for VDATS cable assembly kit that includes 26 individual cable assembly part numbers and a quantity of 35 total cable assemblies. Requires special order qualification.
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GETTER Scorption Analyzer
DELTA-P MODEL 410
ORS manufactures the Delta-P Model 410 for companies that want to perform on-site getter qualification and lot conformance testing.
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Evaluation Kit for Differential Pressure Sensors of the SDP3x Series
EK-P4
The evaluation kit EK-P4 is designed for an easy and cost-efficient evaluation and qualification of Sensirion's SDP3x differential pressure sensors. Test now the features of the new differential pressure sensor. Especially at lowest pressure differences, the sensor provides highest accuracy and long-term stability. The evaluation kit EK-P4 is designed for an easy and cost-efficient evaluation and qualification of Sensirion's SDP3x differential pressure sensors. Test now the features of the new differential pressure sensor. Especially at lowest pressure differences, the sensor provides highest accuracy and long-term stability. The evaluation kit consists of a USB stick connected to a PCB on which an SDP3x differential pressure sensor is already attached. The included flow element can be easily affixed to the kit with two screws and then directly connected to the gas flow. Detailed information about the flow element can be found in the application note.
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Acoustic Testing
Our acoustic testing experience includes acoustic qualification and evaluating sound pressure levels. We utilize microphones, pressure trans-ducers, and an acoustic intensity meter to record acoustic measurements.
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EMI Testing
Independent Testing Laboratories
ITL offers compliance and qualification testing for virtually any type of electronic product or system.
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Pressure Testing
All metal, plastic, and composite parts intended to contain liquids or gases under pressure are required to undergo stringent pressure testing procedures to meet qualification standards.
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Space Applications & High Performance Cable Assemblies
Teledyne Stom Microwave’s space flight heritage began in the 1990s when one of our military/aerospace customers independently performed space qualification testing on our cables. Since 2010, TSM has dedicated design, engineering, test, qualification and documentation resources to specifically service a growing list of military and commercial space customers. These customers include most of the major US defense contractors and a growing number of Low Earth Orbit and small satellite companies.
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Bluetooth RF Test System
FRVS
FRVS is recognized by the Bluetooth SIG as a validated test system for qualification testing of products to Bluetooth BR/EDR and low energy RF test specifications.
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Round Wire Coil Inductors
Round wire coil (RWC) inductors come in six platform sizes and enable the highest efficiency of any SMT inductor through the use of a low loss ferrite core material which minimizes AC losses and also eliminates thermal ageing. The use of round magnetic wire instead of rectangular flat coils enables a lower cost while still maintaining a low DCR and small footprint. The platforms have passed the AEC-Q200 stress test qualification proving the designs robustness and suitability to difficult environments but the parts are not IATF certified. The platform range from 7.6×7.4×6.4mm to 26x26x15mm and are suitable for a wide range of applications and markets including communications, computing and industrial.
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Open Top BGA Sockets
Ironwood has the most comprehensive collection of open top BGA and QFN sockets that can be used for qualification application, silicon FIB testing, system development, thermal characterization, burn-in application, etc. IC socket can be defined as an electromechanical device, which provides removable interface between IC package and system circuit board with minimal effect on signal integrity. Typical packages include BGA, LGA, QFN, QFP, WLCSP, etc. Open top allows access to the top side of IC. Below is an example BGA socket that uses low cost elastomer contact technology.
