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Analysis System
Pegasus (EDS-EBSD)
The Pegasus Analysis System enables the simultaneous collection of Energy Dispersive Spectroscopy (EDS) (chemistry) and Electron Backscatter Diffraction (EBSD) (crystallography) data, allowing direct correlation between the elemental content and microstructural aspects of the material being studied.
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Transmission Electron Microscope
TEM
Atomic Resolution Electron Microscope offering a maximum accelerating voltage of 300 kV, and equipped with JEOL’s own Cs Correctors. This instrument guarantees an unprecedented STEM-HAADF image resolution of 63 pm.
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PIN Photodiode
PIN photodiode is a kind of photo detector, it can convert optical signals into electrical signals.This technology was invented in the latest of 1950's. There are three regions in this type of diode. There is a p-region an intrinsic region and an n-region. The p-region and n-region are comparatively heavily doped than the p-region and n-region of usual p-n diodes. The width of the intrinsic region should be larger than the space charge width of a normal p-n junction. The PIN photo diode operates...show more -
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Auger Microprobe
Auger
It is a high specification Auger electron spectrometer with a hemispherical analyzer to provide high throughput analysis of the chemical bonding state at nano to micro areas, and a field emission electron gun also used for EPMA, because it can deliver a large, stable electric current The highly precise eucentric specimen stage makes it possible to perform the previously-impossible analysis of insulators. This in combination with the floating type ion gun offers the versatility to handle any specimen, such as metals and insulation materials, to obtain composition information to and chemical information.
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Analytical Services
Surface Analysis; X-Ray Photoelectron Spectroscopy (XPS, ESCA), Auger Electron Spectroscopy (AES), Time-of-Flight Secondary Ion Mass Spectrometry (Static) (TOF-SIMS), Dynamic Secondary Ion Mass Spectrometry (D-SIMS). Microscopy & Diffraction; Organic Material Analysis; Bulk Chemistry.
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Ion Pumps & Controllers
Agilent Vacuum (formerly Varian) offers a complete portfolio of VacIon ion pumps that provide various pumping speeds (from 0.4 to 1000 L/s). Agilent also supplies smart combinations titanium sublimation pumps (Ion CombiTSP) and Non-Evaporable Getter (Ion CombiNEG) pumps for clean and vibration-free environments.Agilent ion pumps and controllers can be customized in a number of configurations to satisfy your vacuum requirements. They are the best choice for those applications where stable ultrahigh or extreme-high vacuum (UHV or XHV) conditions are essential, such as: laboratories, large research facilities, medical devices, scanning electron microscopes, and surface analysis tools.
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Pulsed And CW ESR/EPR: Quasi-continuous Powerful Millimeter (mm-wave) And Sub-millimeter (sub-mm Wave) Orotron Generator
Insight Product Company offers Quasi-continuous powerful millimeter (mm-wave) and sub-millimeter (sub-mm wave) Orotron Generators which can be used for both continuous wave (CW) and pulsed electron spin resonance (ESR) and electon paramagnetic resonance (EPR) experiments.
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Level Detectors
Becker Nachrichtentechnik GmbH
Becker Nachrichtentechnik offers selective RF level detectors for air interface monitoring. The detectors are especially designed for frequencies used in e.g. electron accelerators. Due its mechanical design, the modules are compatible to cable route mounting systems. The detection of unintentional RF radiation is a main application field.
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GC/MS CI , CI/NCI And SMCI Measurement
CI is a softer ionization method than EI, fragmentation is less likely to occur, so molecular weight information is more readily obtained. Negative chemical ionization (NCI) or negative ion chemical ionization (NICI) enables selectively measuring, with ultra high sensitivity, chemical substances with an electron affinity, such as chlorine-based compounds.
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XPS/ESCA Service
X-ray Photoelectron Spectroscopy (XPS Analysis), also known as Electron Spectroscopy for Chemical Analysis (ESCA), is used to determine quantitative atomic composition and chemistry. It is a surface analysis technique with a sampling volume that extends from the surface to a depth of approximately 50-70 Angstroms. Alternatively, XPS analysis can be utilized for X-ray Photoelectron Spectroscopy (XPS) or Electron Spectroscopy for Chemical Analysis (ESCA) from Evans Analytical Group (EAG).sputter depth profiling to characterize thin films by quantifying matrix-level elements as a function of depth.
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Electron Microscope Analyzer
QUANTAX EBSD
QUANTAX EBSD system, with its popular OPTIMUS 2 detector head, is the best available solution for analyzing nanomaterials in the SEM
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Simulation Software For Cyclic Voltammetry
Digisim
Cyclic voltammetry can readily provide qualitative information about the stability of the oxidation states and the electron transfer kinetics of a redox system. However, quantitative studies using cyclic voltammetry (e.g., mechanistic investigations) are more difficult and typically require the use of simulation software. A number of methods have been developed for the simulation of cyclic voltammograms. Of these methods, the fast implicit finite difference method has been shown to be the most efficient, stable, and accurate, and this method is used for the DigiSim simulation software from BASi®.
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Radiation Microdosimeters
Teledyne e2v HiRel Microdosimeter is a compact hybrid microcircuit which directly measures total ionizing dose (TID) absorbed by an internal silicon test mass. The test mass simulates silicon die of integrated circuits on-board a host spacecraft in critical mission payloads and subsystems. By accurately measuring the energy absorbed from electrons, protons, and gamma rays, an estimate of the dose absorbed by other electronic devices on the same vehicle can be made. The Microdosimeter can operate...show more -
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Tube Tester / Tube Checker
RM 1
Using the RM 1 Tube Checker it is immediately possible to do an exact plate current measurement without doing the often very toilsome procedures mostly necessary with classical devices. Put the electron tube, which should be measured, simply into the accordingly marked test socket, switch the equipment on, select the socket by using the rotary switch (it is indicated by a LED), wait for approx. three minutes till the tube is working stabile and read off the value on the panel meter.
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Electron Spectrometers
SPECS Surface Nano Analysis GmbH
Nanotechnology is focused on the engineering and the physical properties of small structures. Therefore techniques that have sensitivities at a scale of 0.1 nm to 100 nm are required to study these structures. Different methods of electron spectroscopy (XPS, UPS and AES) have a sensitivity in this range and are therefore key techniques in nanoscience.Thanks to our high level of expertise in electron optics and electronics we can offer electron spectrometers with the highest resolution and transmission possible.
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MICROWAVE TUBES
High reliability dispenser cathode technology (up to 90,000 hrs operation achieved for S band Watchman ATC radar)European “Centre of Excellence” for cathode and electron gun designIn-house cathode technology minimising reliance on ITAR controlled partsFast warm (under 3 seconds) versions available in Ku bandEmission testing and surface analysis facilities in-houseAir, land and sea platforms supported
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Fast Low Noise SWIR InGaAs Camera
C-RED 2
C-RED 2 is a revolutionary ultra high speed low noise camera designed for high resolution Short Wave InfraRed imaging. Thanks to its state of the art electronics, software, and innovative mechanics, C-RED 2 is capable of unprecedented performances: up to 400 images per second with a read out noise from 10 to 30 electrons. Designed for high-end SWIR applications, smart and compact, C-RED 2 is operating from 0.9 to 1.7 μm with a very good Quantum Effi ciency over 70%, offering new opportunities for industrial or scientifi c applications.
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Collaborative Correlative Microscopy
nanoGPS navYX
Correlative microscopy is the combination of multiple modalities performed on the same sample. The results produced emphasize the strengths of each modality while offsetting their individual limitations.nanoGPS navYX™ is an open solution which makes SEM-Raman correlative microscopy seamless regardless of the electron and optical microscopes used. Simply stick the Coordinates Transfer System to the sample!
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Light Sources
The unique dual-output of equivalent beams make it a useful source for many comparative applications in addition to wavelength calibration and so on. The two output beams originate from two views of the single emitting spot where the electron beam from the single hairpin filament collides with the interchangeable anode.
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MultiBeam System
FIB
An easy-to-use, out-lens type scanning electron microscope (SEM) equipped with a Schottky electron gun, as well as a new FIB column capable of large current processing (maximum ion current 90nA) installed into one chamber. JIB-4610F enables high-resolution SEM observation after high-speed cross-section milling with FIB, and high-speed analysis with a variety of analytical instruments, such as energy dispersive X-ray spectroscopy (EDS) that takes advantage of the Schottky electron gun delivering ...show more -
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Metallurgy Analysis
The metallurgical group is well equipped and staffed (9 full-time metallurgists and technicians) to evaluate materials ranging from cast iron to superalloys to composites. They are experienced in classical metallographic techniques, as well as the latest preparation methods. Advanced analytical tools such as image analysis and scanning electron microscopy (SEM) are used in their evaluations.
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High-end Transmission Electron Microscope
CryoARM
JEOL announces the latest member in its family of high-end transmission electron microscopes, the CryoARM. This highly automated TEM is designed for unattended operation and high throughput imaging of cryo-EM specimens. The CryoARM was initially introduced to a select audience at the 2016 Gordon Research Conference in Hong Kong, M&M 2016 in Columbus, OH and EMC 2016 in Lyon, France. The CryoARM is a dedicated cryo-TEM, based on the highly successful JEOL ARM (Atomic Resolution Microscope) series, an ultrahigh performance, highly stable platform considered to be the "best-in-class" TEMs. The development of the CryoARM was accomplished in collaboration with leading Life Science researchers.
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Electron Probe Microanalyzer
JXA-8530FPlus
JEOL commercialized the world's first FE-EPMA, the JXA-8500F in 2003. This highly regarded FE-EPMA has long been used in various fields, such as: metals, materials and geology in both industry and academia. The JXA-8530FPlus is a third-generation FE-EPMA that comes with enhanced analytical and imaging capabilities. The In-Lens Schottky field emission electron gun combined with new software provides higher throughput while maintaining high stability, thus allowing a wider range of EPMA applications to be achieved with higher resolution.
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Scanning Kelvin Probe Microscope
VS-SKP
The Kelvin Probe experiment uses a nondestructive method to determine the relative work function difference between the probe and the sample. Work function describes the energy required to liberate an electron from the surface of a conductor; electrochemists often interpret this as the difference from an electrode’s Fermi Level, average energy of electrons, and that of vacuum.
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Hot Electron Bolometer (HEB) Mixers/ Receivers In Terahertz Range
Insight Product Company offers Hot Electron Bolometer (HEB) mixers, receivers, and chips made from NbN or NbTiN thin film. The HEB mixers can operate at frequencies of up to several terahertz.
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CMAS Analyzers and Field Monitors
Backed by at least one of the 8 corrosion sensor patents wholly owned by Corr Instruments, our nanoCorr analyzers and field monitors are widely used for online and real-time localized and general corrosion monitoring. These ultra-high precision instruments measure extremely low currents in the pico-ampere levels, which can be translated into a corrosion rate as low as a few nanometers per year, in some applications (PDF). Our analyzers and monitors are based on the patented coupled multielectrode array sensor (CMAS) technology which measures the flow of electrons from corroding electrodes to one or more cathodes.
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Gamma Detectors
In Gamma detectors, the gamma radiations produce electrons by interacting with the cathode material and the filling gas.These electrons ionize the gas and the charge carriers are collected by the electrodes. The resulting anode pulse is detected by a load circuit. The primary electrons are created by several interaction mechanisms:- Photoelectric effect- Compton scattering- Pair production
