Filter Results By:
Products
Applications
Manufacturers
- Pickering Interfaces Inc.
product
Surface Mount Reed Relays from Pickering Electronics
Pickering Electronics Surface Mount Reed Relays contain the highest quality instrumentation grade reed switches making them suitable for the most demanding applications and are suitable for infra-red or vapor phase reflow soldering.
-
product
Profilometer
NANOVEA Optical Profiler is a 3D, non-contact profilometer designed with Chromatic Confocal technology, which uses wavelengths of light to accurately determine physical height. The Optical Profilers NANOVEA offers include compact, stand-alone and portable profilometer models. High-speed sensors are available to scan large surface at high accuracy.
-
product
3D Profilers
AEP Technology offers different kinds of 3D profilers. Rugged platform, advanced electronic equipment, clean test space, low carbon emission, low machine noise, high-end lens, etc., make our surface profiler unique in the imaging world. In addition to providing stand-alone contact 3D profilers and optical 3D profilers, we also provide the world's only cross-platform, dual-mode 3D profiler that is compatible with both tactile and optical profilometers.
-
product
Surface Profilers
Taylor Hobson offers a world leading range surface form, surface finish and metrology solutions for 3D contour,ideal for the most demanding applications.
-
product
Robotic Vehicle Gap / Flush Measurement System
Automation
LaserGauge® Automation is a robotic system for measuring vehicle gap/flush on a moving assembly line. It is cost-effective, fast, flexible, and delivers LaserGauge® accurate measurements. Utilizing the Cross-Vector scanning and Blue Laser Technology, the system provides more assembled-panel surface information than any other robotic laser profiler.
-
product
3D Optical Profilers
ZYGO's 3D Optical Profiler instruments enable precise, quantitative, ISO-compliant, non-contact surface measurement and characterization of micro- and nano-scale surface features, capturing up to two million data points in just seconds. Applications range from topography and waviness to roughness and microstructure characterization on samples as that vary from ultra-smooth sub-angstrom optical surfaces, to extremely rough and diffuse 3D printed surfaces.
-
product
High Resolution Thickness & Surface Profiler for as-sawn Wafers
MX 70x
The MX 70x series measure Thickness, Warp, Waviness, Roughness and are usable for nanotopography.
-
product
Non-contact Optical Surface Profiler
VS-OSP
The VersaSCAN OSP integrates the Base with a high-accuracy, high-speed laser displacement sensor. The OSP technique uses diffuse reflection mechanism to measure topography of a sample. OSP can be used to measure topography, as a very sensitive leveling mechanism, or charting topography to be implemented with other scanning probe techniques for constant-distance mode operation.
-
product
3D Optical Surface Profiler
NewView™ 9000
The NewView™ 9000 3D optical surface profiler provides powerful versatility in non-contact optical surface profiling. With the system, it is easy and fast to measure a wide range of surface types, including smooth, rough, flat, sloped, and stepped. All measurements are nondestructive, fast, and require no sample preparation.
-
product
Optical Profilometers
Profilm3D® and Zeta™ optical profilometers provide fast, easy, non-contact solutions for 3D surface topography measurements. Our portfolio of optical profilers supports a variety of measurement techniques, including white light interferometry, True Color imaging and ZDot™ confocal grid structured illumination. KLA Instruments can help guide you to the right optical profiler solution for your unique needs.
-
product
Surface Analysis
Bruker Nano Surfaces provides industry-leading surface analysis instruments for the research and production environment. Our broad range of 2D and 3D surface profiler solutions supply the specific information needed to answer R&D, QA/QC, and surface measurement questions with speed, accuracy, and ease. Bruker’s AFMs are enabling scientists around the world to make discoveries and advance their understanding of materials and biological systems. Our tribometers and mechanical testers deliver practical data used to help improve development of materials and tribological systems.
-
product
Stylus Profilometry
Dektak®
Bruker's Dektak stylus profilers are the product of over four decades of proprietary technology advances. They provide repeatable, accurate measurements on varied surfaces, from traditional 2D roughness surface characterization and step height measurements to advanced 3D mapping and film stress analyses. Dektak surface profilers have been widely accepted as a superior solution for measuring thin film thickness, stress, and surface roughness and form in applications ranging from educational research verification to semiconductor process control.
-
product
Surface Profiler Measurement System
SP series
SP series, high accuracy 3D surface profiler measurement system with white light interferometry.
-
product
Multi-Surface Profiler
Tropel® FlatMaster® MSP
The Tropel® FlatMaster® MSP (Multi-Surface Profiler) is a frequency stepping interferometer that provides fast and accurate metrology for semiconductor wafers up to 300mm in diameter. In seconds up to 3 million data points are collected with sub-micron accuracy enabling total thickness and flatness characterization over the entire surface.
-
product
Surface Analysis
Bruker Nano Surfaces provides industry-leading surface analysis instruments for the research and production environment. Our broad range of 2D and 3D surface profiler solutions supply the specific information needed to answer R&D, QA/QC, and surface measurement questions with speed, accuracy, and ease. Bruker’s AFMs are enabling scientists around the world to make discoveries and advance their understanding of materials and biological systems. Our tribometers and mechanical testers deliver practical data used to help improve development of materials and tribological systems.
-
product
Wave Profiler
The Wave Profiler allows the user to measure non-directional wave parameters continuously for long periods of time with high temporal and spatial resolution in deeper water from the safety of an underwater mooring. The instrument is particularly useful for clients who need to measure long-period waves (such as rogue waves or infra-gravity waves), waves in wash and in wakes, and non-linear waves.
-
product
Sub-Bottom Profilers
ParaSound Series
The ParaSound is the most advanced hull mounted parametric sub-bottom profiler in the market. It utilises the parametric effect to generate a low frequency secondary signal by emitting two primary signals of higher frequencies.In comparison with traditional towed systems the ParaSound family offers very narrow transmission angle and greater positioning accuracy as well as higher operational speed and availability. Our sub-bottom profilers are suitable for operations to depths beyond the continental rise into the abyssal plains and down to the deep ocean trenches.
-
-
product
Ice Profiler
Estimate ice forces for design of offshore platforms and operational planningDetermine the extreme thickness of ice for pipeline installationsExamine in detail the underside of sea-iceUnderstand the dynamics and thermodynamics of the sea ice regime for scientific research.Climate change studies
-
product
Refractive Index Profiler
S14
The S14 Refractive Index Profiler complements optical fiber preform analysis measurements by providing highly accurate and precise characterization of the refractive index profile of drawn single-mode, multimode, and specialty fibers using the RNF (Refracted Near Field) technique. The S14 index profile data produces fiber geometry information directly. Manufacturers can also use S14 data for the prediction of fiber transmission parameters such as mode field diameter, cut-off wavelength, and chromatic dispersion.
-
product
Thermal Profiler
SPS Smart Profiler
The SPS Smart Profiler stands out as the best and “smartest” temperature profiling data collection system available. The hardware is the best in temperature tolerance design using an LCP (Liquid Crystal Polymer) enclosure for better protection and faster cool down between profiles. The design of the SPS thermal shields allows for easy and secure opening and closing, durability that meets the most stringent of drop tests, and temperature tolerance capabilities that exceed all previous KIC profiler and shield models.
-
product
Wind Profilers
Bristol Industrial & Research Associates Ltd
Biral provides Sodar systems for the 3-dimensional measurement of wind speed and direction in a vertical column extending hundreds of metres above the sensor. Sodar systems are used in applications such as wind energy site assessment, wind shear detection at airports, plume modelling and basic research.
-
product
3D Optical Profiler
7503
Chroma 7503 uses the technology of white light interfaces to measure and analyze the surface profile of micro-nano structures with sophisticated scanning system and innovative algorithms.
-
product
Shallow Water Ice Profiler
The Shallow Water Ice Profiler (SWIP) is a real-time acoustic ice thickness measurement (ice draft) instrument for shallow water applications. The underwater components include a low-cost acoustic transducer, a tilt sensor, a high-precision pressure sensor and a temperature sensor, all providing suitably high resolution for shallow water measurements.
-
product
Surface Analysis
Dimension AFP
The Dimension AFP is the world's only fab-based metrology tool specifically designed for both CMP profiling and etch depth metrology for current and advanced technology nodes. The system combines the superb resolution of an AFM with the long-scan capability of an atomic force profiler tomonitor etch depth and dishing and erosion on submicron features with unsurpassed repeatability.
-
product
Multi-Parameter Profiler
fastCTDplus Chlorophyll a
An evolution of the miniCTD, the fastCTDplus multi-parameter profiler is designed to deliver the highest quality CTD and Chlorophyll a observations at fast drop rates.
-
product
Surface Resistivity Meter
395
The ACL 395 handheld meter features sophisticated circuitry that allows for the same advantages as megohmmeters, but at an economical price. Utilizing color-coded zones, the LED scale is easy to read and evaluate. Half decades indicate where the measurement value falls within the decade giving a closer indication to actual value. Unlike other pocket-sized meters, the ACL 395 features rubber rails which provide the best possible contact.
-
product
Surface Measurement Instrumentts
Analyze surfaces texture with nanometer precision is already a technological challenge, but TR Scan Premium is able to perform this task with unprecedented speed! The TR Scan Premium is used in workshops and laboratories worldwide. It is completely designed and manufactured in Switzerland by TRIMOS. The TR Scan is focusing on Digital Holographic Imaging Technology. Accuracy, speed, ease of use and modular construction make it ideal for all types of surface measurements.
-
product
Surface Resistivity Meter
STME-SRM
Statclean Technology (S) Pte Ltd
Effective for a quick measurement of Surface Resistivity on most surfaces.
-
product
Surface Profile
Surface profile: The degree of profile on the surface affects a coating’s overall performance and determines aspects such as adhesion, coverage and overall volume of coatings used. If the profile is too large the amount of coating required increases, otherwise there is a danger that the peaks remain uncoated - allowing rust spots to occur. If the profile is too small there may be an insufficient key for adequate adhesion.
-
product
Surface Resistance Meter
WL MIDGET
WL MIDGET Surface Resistance Meter is an ultra-wide range, battery operated, portable instrument for measuring Surface Resistivity and Resistance to Ground of virtually any flat surface conforming to ASTM D-257 standard method by using recommended parallel bar sensing probe. Gives simple, repeatable measurements of conductive, static dissipative, and insulative surfaces. Ranging is automatic due to the use of high-speed OP-AMP Integrated circuits being linear, with changeover points +1/2 decade on a logarithmic scale. Repeatability equals + 5%.
