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Surface Profilers
Taylor Hobson offers a world leading range surface form, surface finish and metrology solutions for 3D contour,ideal for the most demanding applications.
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3D Optical Surface Profiler
NewView™ 9000
The NewView™ 9000 3D optical surface profiler provides powerful versatility in non-contact optical surface profiling. With the system, it is easy and fast to measure a wide range of surface types, including smooth, rough, flat, sloped, and stepped. All measurements are nondestructive, fast, and require no sample preparation.
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Non-contact Optical Surface Profiler
VS-OSP
The VersaSCAN OSP integrates the Base with a high-accuracy, high-speed laser displacement sensor. The OSP technique uses diffuse reflection mechanism to measure topography of a sample. OSP can be used to measure topography, as a very sensitive leveling mechanism, or charting topography to be implemented with other scanning probe techniques for constant-distance mode operation.
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Surface Profiler Measurement System
SP series
SP series, high accuracy 3D surface profiler measurement system with white light interferometry.
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High Resolution Thickness & Surface Profiler for as-sawn Wafers
MX 70x
The MX 70x series measure Thickness, Warp, Waviness, Roughness and are usable for nanotopography.
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3D Profilers
AEP Technology offers different kinds of 3D profilers. Rugged platform, advanced electronic equipment, clean test space, low carbon emission, low machine noise, high-end lens, etc., make our surface profiler unique in the imaging world. In addition to providing stand-alone contact 3D profilers and optical 3D profilers, we also provide the world's only cross-platform, dual-mode 3D profiler that is compatible with both tactile and optical profilometers.
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Multi-Surface Profiler
Tropel® FlatMaster® MSP
The Tropel® FlatMaster® MSP (Multi-Surface Profiler) is a frequency stepping interferometer that provides fast and accurate metrology for semiconductor wafers up to 300mm in diameter. In seconds up to 3 million data points are collected with sub-micron accuracy enabling total thickness and flatness characterization over the entire surface.
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Optical Profilers
Finally, measurements of surface roughness and topography can be made for a price that's less than that of a stylus profilometer. The Profilm3D has sub-nanometer vertical resolution, which surpasses optical profilometers that cost 3x as much. It does so by using the same state-of-the-art measurement technologies as the most sensitive optical profilers available: vertical-scanning interferometry (VSI) and phase-shifting interferometry (PSI).
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3D Optical Profilers
ZYGO's 3D Optical Profiler instruments enable precise, quantitative, ISO-compliant, non-contact surface measurement and characterization of micro- and nano-scale surface features, capturing up to two million data points in just seconds. Applications range from topography and waviness to roughness and microstructure characterization on samples as that vary from ultra-smooth sub-angstrom optical surfaces, to extremely rough and diffuse 3D printed surfaces.
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Surface Analysis
Bruker Nano Surfaces provides industry-leading surface analysis instruments for the research and production environment. Our broad range of 2D and 3D surface profiler solutions supply the specific information needed to answer R&D, QA/QC, and surface measurement questions with speed, accuracy, and ease. Bruker’s AFMs are enabling scientists around the world to make discoveries and advance their understanding of materials and biological systems. Our tribometers and mechanical testers deliver practical data used to help improve development of materials and tribological systems.
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Surface Analysis
Bruker Nano Surfaces provides industry-leading surface analysis instruments for the research and production environment. Our broad range of 2D and 3D surface profiler solutions supply the specific information needed to answer R&D, QA/QC, and surface measurement questions with speed, accuracy, and ease. Bruker’s AFMs are enabling scientists around the world to make discoveries and advance their understanding of materials and biological systems. Our tribometers and mechanical testers deliver practical data used to help improve development of materials and tribological systems.
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Nanocam HD Optical Profiler
The NanoCam™ HD dynamic profiler measures surface roughness on small to meter-scale coated and uncoated optics, as well as precision metals, plastics, and other polished specular surfaces.
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Optical Profilometers
Profilm3D® and Zeta™ optical profilometers provide fast, easy, non-contact solutions for 3D surface topography measurements. Our portfolio of optical profilers supports a variety of measurement techniques, including white light interferometry, True Color imaging and ZDot™ confocal grid structured illumination. KLA Instruments can help guide you to the right optical profiler solution for your unique needs.
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Profilometer
NANOVEA Optical Profiler is a 3D, non-contact profilometer designed with Chromatic Confocal technology, which uses wavelengths of light to accurately determine physical height. The Optical Profilers NANOVEA offers include compact, stand-alone and portable profilometer models. High-speed sensors are available to scan large surface at high accuracy.
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Robotic Vehicle Gap / Flush Measurement System
Automation
LaserGauge® Automation is a robotic system for measuring vehicle gap/flush on a moving assembly line. It is cost-effective, fast, flexible, and delivers LaserGauge® accurate measurements. Utilizing the Cross-Vector scanning and Blue Laser Technology, the system provides more assembled-panel surface information than any other robotic laser profiler.
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Stylus Profilometry
Dektak®
Bruker's Dektak stylus profilers are the product of over four decades of proprietary technology advances. They provide repeatable, accurate measurements on varied surfaces, from traditional 2D roughness surface characterization and step height measurements to advanced 3D mapping and film stress analyses. Dektak surface profilers have been widely accepted as a superior solution for measuring thin film thickness, stress, and surface roughness and form in applications ranging from educational research verification to semiconductor process control.
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Profiler
fastCTD Profiler
An evolution of the miniCTD, it has a conductivity cell designed for optimum flow-through, a fast response thermistor temperature sensor and a 0.01% pressure sensor synchronously sampling at 32Hz deliver the highest quality profiles in a lightweight and robust package. The package is completed with an integral fluorometer based on Valeport’s new Hyperion range and optional Bluetooth communications module.
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Beam Profiler
BladeCam Series
0.65" Thin! Portable, Port-Powered, USB 2.0, Beam Profiling for Windows XP & Vista, Intel-Mac.
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Beam Profiler
WinCamD series
CW & Pulsed laser profiling. Wavelength Range: 190 nm- 15 m*. Resolution: 5.0 m*. Smallest Beam: 42 m*.
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Ice Profiler
Estimate ice forces for design of offshore platforms and operational planningDetermine the extreme thickness of ice for pipeline installationsExamine in detail the underside of sea-iceUnderstand the dynamics and thermodynamics of the sea ice regime for scientific research.Climate change studies
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LIXI Profiler
The LIXI Profiler uses our proprietary technology, Radiometric Profiling, the only NDT technology that allows you to see everything you need to manage a healthy pipe system without touching a thing.
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MiniCTD Profiler
The miniCTD has been developed to provide a cost-effective tool for the collection of CTD Profiles, without compromising the quality of the data.
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Multi-Parameter Profiler
fastCTDplus Rhodamine
An evolution of the miniCTD, the fastCTDplus multi-parameter profiler is designed to deliver the highest quality CTD and Rhodamine observations at fast drop rates.
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Multi-Parameter Profiler
fastCTDplus Fluorescein
A conductivity cell designed for optimum flow-through, a fast-response thermistor temperature sensor and 0.01% pressure sensor together with a Fluorescein sensor, all synchronously sampling at up to 32Hz to deliver the highest quality profiles in a lightweight and robust package.
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Multi-Parameter Profiler
fastCTDplus Turbidity
An evolution of the miniCTD, the fastCTDplus multi-parameter profiler is designed to deliver the highest quality CTD and Turbidity observations at fast drop rates.
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Multi-Parameter Profiler
fastCTDplus Phycocyanin
An evolution of the miniCTD, the fastCTDplus multi-parameter profiler is designed to deliver the highest quality CTD and Phycocyanin observations at fast drop rates. A conductivity cell designed for optimum flow-through, a fast-response thermistor temperature sensor and 0.01% pressure sensor together with a Fluorometer sensor, all synchronously sampling at up to 32Hz to deliver the highest quality profiles in a lightweight and robust package.
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Multi-Parameter Profiler
fastCTDplus Chlorophyll a
An evolution of the miniCTD, the fastCTDplus multi-parameter profiler is designed to deliver the highest quality CTD and Chlorophyll a observations at fast drop rates.
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Optical Profiler
DRK8090
Shandong Drick Instruments Co., Ltd.
This instrument uses noncontact, optical phase shift interferometry method does not damage the surface when measuring graphics can be quickly measured by a variety of three dimensional surface morphology, and analyzed to calculate the measurement results. Suitable for measuring a variety of blocks, the surface roughness of optical components; scale, dial the groove depth; magnetic (optical) disk, the head surface texture measurements; structural morphology of coating thickness and coating trough structure at the boundary of the grating; silicon surface roughness measurement and the graph structure and so on.
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Sub-Bottom Profilers
ParaSound Series
The ParaSound is the most advanced hull mounted parametric sub-bottom profiler in the market. It utilises the parametric effect to generate a low frequency secondary signal by emitting two primary signals of higher frequencies.In comparison with traditional towed systems the ParaSound family offers very narrow transmission angle and greater positioning accuracy as well as higher operational speed and availability. Our sub-bottom profilers are suitable for operations to depths beyond the continental rise into the abyssal plains and down to the deep ocean trenches.
