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Device Under Test
a specific purpose component or module check; ex. substantial component of a PCB.
See Also: DUT, Unit Under Test, EUT
- Pickering Interfaces Inc.
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Built-In Relay Self-Test Diagnostic Test Tool
BIRST
Verification and diagnosis of complex switching operation in a test system has always been an issue. BIRST (Built-In-Relay-Self-Test) diagnostic test tool provides a quick and simple way of finding relay failures available on some of our LXI and PXI switch matrices.
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NI Software Suites
NI software suites aggregate the most popular LabVIEW add-ons and other application software typically combined with LabVIEW and other development environments to help you build test, design, and control applications. Each suite, excluding the Multi-IDE Bundle and the Software Platform Bundle, also includes one year of unlimited access to professional training and certification.The suites come with related NI device drivers and are shipped on USB 3.0 media to speed up your installation.The NI Automated Test Software Suite combines LabVIEW, LabWindows/CVI, and Measurement Studio with the TestStand ready-to-run, customizable test executive and the Switch Executive intelligent switch management and routing application to help you build manufacturing or production test systems.The NI Embedded Control and Monitoring Software Suite features LabVIEW and the recommended add-ons specifically for building embedded control and monitoring systems on NI reconfigurable I/O (RIO) hardware. The LabVIEW FPGA Module extends the LabVIEW graphical development platform to target FPGAs on NI RIO hardware, and the LabVIEW Real-Time Module builds on LabVIEW to deliver a programming environment for creating reliable, deterministic, and stand-alone embedded systems.The NI HIL and Real-Time Test Software Suite combines LabVIEW with VeriStand, a configuration-based software environment for efficiently creating real-time test applications. It also includes the LabVIEW Control Design and Simulation, LabVIEW Real-Time, and LabVIEW FPGA modules.To learn more about each suite, use the navigation options on the left side of the page.The mark LabWindows is used under a license from Microsoft Corporation. Windows is a registered trademark of Microsoft Corporation in the United States and other countries.
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PXI Single 36 Channel MUX, SMB Connectors
40-735-912-S4
The 40-735 data communications multiplexer is designed for switching the data lines of serial interfaces (RS232, USB). Careful attention to the design of the module ensures that the switching system minimizes its impact on the transmission distance of USB1.1 interfaces. The MUX is available in 36:1 or 18:1 formats and enables a single source of serial data to be switched to one of 36 or 18 devices under test. This allows the data source to load information to, or receive information from, the device under test. This 36:1 version can be software configured into two independent 18 way MUXs enabling two separate sources of serial data to be connected to separate banks of 18 devices. The module is ideal for performing bulk testing of any device that relies on a serial data communications port to load software or control the device operation. It can also be used for a variety of other applications where ever a 2-pole low power MUX is required.
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Chamber/Pyroelectric Task
Radiant's Chamber/Pyroelectric Task sets the sample to a series of temperatures by performingGPIB control of an external thermal device. At each temperature it captures the sample’s polarization response and/or small-signalcapacitance. These are combined to calculate the pyroelectric coefficient. The Pyroelectric Task is to be used with a Radiant Test System and a Linkam Stage (-196C to 600C), Thermal Chambers, Hot Chucks, or a Furnace to automatically measure the Pulse Polarization response and Small Signal Capacitance of a Pyroelectric material that is being heated and/or cooled. Radiant's Pyroelectric measurement Task can be added to Vision at additional cost. This measurement suite fully characterizes the pyroelectric charge (polarization) response of the sample under test. The Pyroelectric Task suite controls various thermal controllers such as Quantum Design, Lake Shore, Delta Design, and many others. Detailed Listing of Thermal Controllers Registered in Vision. The Chamber/Pyroelectric Task is quoted upon request.
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NI-9239 , ±10 V, 50 kS/s/ch, 24-Bit, Simultaneous Input, 4-Channel C Series Voltage Input Module
780181-01
±10 V, 50 kS/s/ch, 24-Bit, Simultaneous Input, 4-Channel C Series Voltage Input Module - The NI‑9239 performs differential analog input. With channel‑to‑channel isolation, your entire system, including the device under test, is protected from harmful voltage spikes up to the isolation rating. In addition to safety, isolation eliminates measurement errors caused by ground loops because the front end of the module is floating. Designed for both speed and accuracy, the NI‑9239 is an effective general-purpose analog module because of its resolution, sample rate, and input range.
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Logic Analyzer Probes
Three probe types are available for GoLogicXL logic analyzers: flying leadset, Mictor, and Pinpoint probes. The Mictor and Pinpoint probes are compatible with similar Keysight/Agilent "soft touch" and Tektronix "connectorless" probes. All GoLogicXL probes are coaxially shielded and use passive termination inputs to prevent loading the device under test. Both differential and single-ended input signals are supported by all probes. Input voltage swings small as 300 mV are supported in single-ended mode, and 150 mV for differential signals.
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PXI Matrix Switch: 8x32, 1-Wire, 100Vrms/2A, Armature Relays
M9122A
The M9122A is an 8x32 full crosspoint switch matrix offering high-voltage switching in a high-density PXI module. This module allows for higher voltage switching of multiple channels in a single instance. Any row can be connected to any column, making it ideal for routing instrument signals to the device under test. This module is configured with a common ground. The durable armature switches are capable of switching up to 100Vrms, with up to 60W of power. The 8-wide bus can be used to route signals between your instruments and the device under test. Choose from the durable connector block or standard cable connections.
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Pulsed IV-Curve Solutions
Pulsed IV-Curve Test and Analysis System is our new development for 2015. It is an advanced and compact pulsed IV-curve characterization system designed to simulate pulsed ESD events such as TLP, vf-TLP, HMM, HBM, EFT, and LV-Surge. It will monitor the transient voltage and current waveform during the pulse in ps or ns segment, and test the pre- and post-pulse status (leakage current, breakdown voltage, biasing current, static IV curve, etc) of the device under test (DUT), such as protection devices, semiconductors, circuit modules, touch panel sensor, etc.
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PXI Dual 18 Channel MUX, 96-Pin SCSI Connector
40-735-912-S1
The 40-735 data communications multiplexer is designed for switching the data lines of serial interfaces (RS232, USB). Careful attention to the design of the module ensures that the switching system minimizes its impact on the transmission distance of USB1.1 interfaces. The MUX is available in 36:1 or 18:1 formats and enables a single source of serial data to be switched to one of 36 or 18 devices under test. This allows the data source to load information to, or receive information from, the device under test. The 36:1 version can be software configured into two independent 18 way MUXs enabling two separate sources of serial data to be connected to separate banks of 18 devices. The module is ideal for performing bulk testing of any device that relies on a serial data communications port to load software or control the device operation. It can also be used for a variety of other applications where ever a 2-pole low power MUX is required.
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PXI Single 18 Channel MUX, BNC Connectors
40-735-902-S3
The 40-735 data communications multiplexer is designed for switching the data lines of serial interfaces (RS232, USB). Careful attention to the design of the module ensures that the switching system minimizes its impact on the transmission distance of USB1.1 interfaces. The MUX is available in 36:1 or 18:1 formats and enables a single source of serial data to be switched to one of 36 or 18 devices under test. This allows the data source to load information to, or receive information from, the device under test. The 36:1 version can be software configured into two independent 18 way MUXs enabling two separate sources of serial data to be connected to separate banks of 18 devices. The module is ideal for performing bulk testing of any device that relies on a serial data communications port to load software or control the device operation. It can also be used for a variety of other applications where ever a 2-pole low power MUX is required.
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Digital Leakage Current Tester
Educated Design & Development, Inc.
Fast - All operator controls are located on the front panel to expedite testing. The entire test can be performed in a matter of seconds! Pays for itself in time and stress savings. Versatile - Measures Leakage Current in accordance with UL, CSA, EN, and IEC/ International Standards. Includes ability to perform open neutral, open ground, and line polarity forward/reverse test conditions. Adaptable - Universal rear panel receptacle allows for testing products with any plug configuration. Accurate - True RMS meter accurately measures both sinusoidal and non-sinusoidal waveshapes. This is important when testing products using a switch mode power supply which can generate non-sinusoidal leakage currents. Calibrated, traceable to NIST. Flexible - A front panel switch permits testing either through the power cord of the product under test, from surface/ patient connection-to-ground, or from surface/ patient connection-to-surface/ patient connection. Portable - Lightweight, with integral handle. Other Features - Product Ground Switching (grounding conductor maintained to device under test when not measuring leakage). Automatic front receptacle disconnect when configured in the 240V test mode (prevents inadvertent connection of 120V when configured for 240V operation). Proven - These are the only leakage current testers designed and supported by Product Safety experts. That is part of the reason why they have become the standard in the industry. Full technical support by experienced safety engineers.
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Vibration Testing
Vibration testing includes kinetic energy transfer to the test specimen, often described as the Device Under Test or simply DUT. Typically specified in terms of displacement, velocity, acceleration or the corresponding power spectral density units as a function of frequency. The form of the vibration may be sinusoidal, random, or a combination.
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Qualification Tester
LQ404
Computer Gesteuerte Systeme GmbH
The qualification tester LQ402 is designed to support up to 12 DUTs (Device under Test), for which the loads are installed in separate load boxes. The system consists out of 3 cabinets. One is for the electronic components with the primary measurement devices and the other two hold the 12 load boxes.
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ISI Channel Boards
M8049A
The M8049A ISI channel boards can be used to emulate channel loss in receiver test setups. The boards are used to emulate channel loss for data rates of 32 Gb/s and higher. A choice of 21 PC board traces with different lengths can be inserted into the signal path. The trace lengths range from 0.8 inch (20.3 mm) to 22.3 inch (566.4 mm). By cascading the traces within one board or with another board, a wide range of channels can be emulated with very fine resolution of insertion loss steps. With their small size the ISI channel boards can be located closely to the device under test.
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NI-9228 , ±60 V, 1 kS/s/ch, 24-Bit, Simultaneous Input, 8-Channel C Series Voltage Input Module
783861-02
±60 V, 1 kS/s/ch, 24-Bit, Simultaneous Input, 8-Channel C Series Voltage Input Module - The NI‑9228 performs differential analog input. With channel-to-channel isolation, your entire system, including the device under test, is protected from harmful voltage spikes up to the isolation rating. The NI‑9228 is simultaneous sampling with two options for filtering: a low-latency filter or a 50/60 Hz rejection filter. The low-latency filter enables users to use this module in industrial or control applications while getting better external noise rejection.
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Keysight Dual 4x8 Armature Matrix for 34980A
34931A
The Keysight 34931A module for the 34980A Multifunction Switch/Measure Unit gives you the most flexible connection path between your device under test and your test equipment, allowing different instruments to be connected to multiple points on your device under test at the same time. Dual 4x8, 8x8, or 4x16 configurations 64 2-wire cross-points Connections to the internal DMM Expandable via four 2-wire analog buses Relay counter Latching armature relays 300 V, 1 A switch; 2 A carry current
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Multimedia Test Video Generator/Analyzer
882EA-DP
The Teledyne LeCroy quantumdata 882EA-DP test instrument with both a DisplayPort 1.1 transmitter and receiver (analyzer) option is packed with features for video and audio testing of DisplayPort monitors and sources at pixel rates up to 268 MHz. The 882EA-DP test instrument provides two (2) additional DisplayPort ports for passive monitoring of the link layer through the optional Aux Channel Analyzer (ACA) application. The ACA option enables you to monitor link training transactions either between the instruments Tx port or its Rx port with the DisplayPort device under test. The 882EA-DP instrument can optionally be equipped with industry approved compliance tests for Link Layer, EDID and HDCP 1.2.
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Spectral Response SystemsQuantum Efficiency SystemsIPCE Measurement Systems
QE system provides electronics and software designed for fully automated measurement of external quantum efficiency of solar cells. All systems include probes and a fixed plate sample stage for samples up to 150 mm x 150 mm. The main system components include: custom designed software, measurement electronics, and computer system (Windows 8 operating system). The measurement involves focusing monochromatic light to a spot on the device under test, then accurately measuring the photon flux and current from the test cell. The system utilizes a dual beam configuration with lock-in detection, providing an absolute accuracy of ±3%. The QE system uses a grating monochrometer with silicon/InGaAs/Ge detectors. The system includes automatic order sorting filters and two light sources for monochromatic illumination (a Xenon- arc lamp and a halogen lamp). A single lock-in amplifier is used to measure both the reference detector and test device. The main system comes with all the hardware needed to measure quantum efficiency, a fixed plate sample stage and probes.
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Test System
LB302
Computer Gesteuerte Systeme GmbH
The LB302 test system is the most used midsize range version of the LB-300 series. It is designed for development as well as for production. The ‘device under test’ (DUT) is connected with a G12 receiver (Virginia Panel Company), which has a high number of possible contacting and a low transition resistance.
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PXI-2559, 2.5 GHz, 75 Ω, Dual-Terminated SPDT PXI RF Relay Module
778572-59
2.5 GHz, 75 Ω, Dual-Terminated SPDT PXI RF Relay Module - The PXI‑2559 is a general-purpose switch module featuring two independently terminated single‑pole double‑throw (SPDT) relays. You can use it to add flexibility to your video switch network or to maintain uniform signal paths across multiple channels when building high-channel-count multiplexers. The PXI‑2559 termination resistors minimize reflections on open channels and protect your source or device under test from damage. The module also features excellent insertion loss, voltage standing wave ratio (VSWR), and isolation parameters to minimize signal degradation. You can use its onboard relay count tracking feature to predict relay lifetime and reduce unexpected system downtime.
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IoT Testing Service
With test IO, professionals around the world perform IoT testing under real-life conditions — connecting devices to their TV’s, cameras, and home wiring, using them on congested home networks, and controlling them with apps running on a range of phones. We recruit testers with the right equipment and environment, then coordinate with you to test the right combination of hardware and software. Skilled IoT testers can perform complex software updates on pre-release devices while also providing you usability feedback based on their experience with comparable products, so you can ship to paying customers with confidence.
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Automatic Fixture Removal
S95007B
Many devices do not have coaxial connectors and so they are put in fixtures in order to measure them in a coaxial environment. You must accurately remove the effects of the fixture to get a good measurement of the device under test (DUT). This option adds a powerful application wizard to guide you through characterizing a fixture and removing it from the measurement. The S95007B software is compatible with M980xA PXI Vector Network Analyzers.
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Automatic Calibration Module
ACM4509
ACM4509 is an automatic calibration module that can be used with all CMT Vector Network Analyzers operating in frequency range up to 9 GHz. It is a fully automatic USB-controlled and powered electronic calibration module. Minimizing the number of steps required by technicians reduces the risk of human error and expedites the calibration process. Automating the calibration routine also reduces wear and tear on the analyzer and RF cables. To perform full four-port calibration, each end of the ACM need only be connected to the analyzer once, as opposed to 18 connections with a traditional calibration. The ACM also contains a factory characterized 20dB in-line attenuator which acts as a simulated device under test (DUT). The confidence check feature loads the factory stored DUT into memory so proper calibration can be verified.
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Power/Voltage Rail Probe. 4 GHz Bandwidth, 1.2x Attenuation, +/-30V Offset, +/-800mV
RP4030
The Teledyne LeCroy RP4030 Power Rail Probe meets the specific requirements of those who need to acquire a low-voltage DC signal as part of a:-Comprehensive power integrity, digital power management IC (PMIC), voltage regulator module (VMR), point-of-load (POL) switching regulator, or low-dropout regulator testing- Complete embedded power management system that includes PMICs, VRMs, POLs, and LDOsThe RP4030 will faithfully acquire a low-impedance, low-voltage DC power/voltage rail signal without unduly loading the device under test (DUT), while providing high offset to allow DC power/voltage rail signal display on an oscilloscope with high gain.
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GONIOPHOTOMETRY
Goniophotometers are required to measure angular resolved distributions of photometric or colorimetric quantities, either by rotating the lighting device under test or by moving the sensor around the device. Depending on the application, different geometries are used to obtain distributions in the appropriate CIE coordinate system.
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256 Channel Power Supply
IDPS750
Salland Engineering’s Independent Device Power Supply (IDPS) can expand your existing Automated Test Equipment (ATE) with up to 256 independent DPS sources to increase parallel testing. It offers Force Voltage (FV) and Measure Current (MI) that can be used for continuity tests, parametric supply current (IDD) and quiescent supply current (IDDQ) measurements or simply for powering devices under test. The IDPS750 is targeted to reduce test costs for a wide range of applications including smart cards, memory, microprocessors and FPGA’s. Its design makes it useful in applications where many resources are required, or were the original ATE supplies do not meet your required specifications.
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4 Channel 1.0 ~ 17.0 Gb/s Pulse Pattern Generator and Error Detector
CA9806
The UC INSTRUEMNTS CA9806 is a high performance, flexible four channel Pulse Pattern Generator and Error Detector that can operate from 1.0 to 17.0 Gb/s (consult factory for higher or lower operation speeds). It is also a standalone Bit Error Rate test solution that incorporates an internal full rate clock synthesizer. Its small size allows it to be placed close to the device under test, it can also be placed further away using the TX driver pre and post emphasis controls features to compensate for cable and interconnect losses. It also has a non destructive, integrated eye outline capture feature along with a quick eye height and width measurement capability. Build‐in 8.5 ~ 15 Gb/s eye diagram testing function.
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Regenerative Power System 2000 V, ±30 A, 30 KW, 400/480 VAC
RP7983A
The RP7983A regenerative power system is a single output, bi-directional, regenerative DC power supply with highly integrated safety features that protect both your people and your device under test.
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Oil Immersed Test Transformer
SG-YD
Wuhan Sangao Electrical Test Installations Limit Co.
AC and DC test oil immersed transformer.Traditional oil immersed test transformer is used to do power frequency withstand voltage and DC current withstand voltage test for variety kinds of high voltage electric device, insulating material.YD series oil transformer, also known as test booster, which test insulation strength under specified voltage for various electric products, components, insulation materials. It can test products insulation level, find insulation defect and judge overvoltage ability. It is widely used in power station, power supply and distribution system and research institute.
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1kV, 25 MHz High Voltage Differential Probe Without Tip Accessories and with Auto Zero Disconnect
HVD3102A-NOACC
The HVD3000A series of high voltage differential probes cover the fullest range of applications, from 120/240 V switch-mode power supplies through 600 V class and 5 kV electrical apparatus. The table below provides a list of recommended probe models based on specific device under test applications.
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Mobile Communications DC Sources (45 W, 100 W):
663xx Series
Use this family of specialized DC power sources to test your digital wireless appliances. All models offer DC sourcing, current sinking, fast transient response, GPIB, and measurement capabilities to help you with the unique challenges of simulating batteries and battery packs and measuring the current drawn by your device under test.
