- Pickering Interfaces Inc.
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PXI/PXIe MEMS Optical MUX, 4-Channel, Multi-Mode, 50/125 Fiber
40-850A-514-M50-HI
The 40/42-850A-514-M50-HI is a PXI/PXIe 4-channel multiplexer with ST connectors, includes hardware interlock and is part of Pickering's range of PXI Fiber Optic MEMS Switching modules. They are available in many high density formats with a choice of different connector styles to suit most applications: FC/APC (for optimal performance), FC/PC and SC/PC for general applications and LC and MU for high density applications.
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Water quality profiler with optical fast DO sensor
AAQ-RINKO
The water quality profiler, AAQ 1183 has been redesigned as AAQ-RINKO with an optical fast response (63% response in water, 0.4 s) DO sensor, RINKO. Conventional water quality profilers with a slow response DO sensor require holding the instrument for a certain period at the measurement depths. AAQ-RINKO makes vertical measurements possible with a profiling speed of 0.5 m/s, similar to CTD observation, thereby significantly reducing the observation time. In addition to conductivity, temperature,...show more -
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3D Optical Profiler
Nexview™ NX2
Designed for the most demanding applications, the Nexview™ NX2 3D optical profiler combines exceptional precision, advanced algorithms, application flexibility, and automation into a single package that represents ZYGO's most advanced Coherence Scanning Interferometric (CSI) profiler.
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3D Optical Surface Profiler
NewView™ 9000
The NewView™ 9000 3D optical surface profiler provides powerful versatility in non-contact optical surface profiling. With the system, it is easy and fast to measure a wide range of surface types, including smooth, rough, flat, sloped, and stepped. All measurements are nondestructive, fast, and require no sample preparation.
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3D Optical Profilers
ZYGO's 3D Optical Profiler instruments enable precise, quantitative, ISO-compliant, non-contact surface measurement and characterization of micro- and nano-scale surface features, capturing up to two million data points in just seconds. Applications range from topography and waviness to roughness and microstructure characterization on samples as that vary from ultra-smooth sub-angstrom optical surfaces, to extremely rough and diffuse 3D printed surfaces.
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Non-contact Optical Surface Profiler
VS-OSP
The VersaSCAN OSP integrates the Base with a high-accuracy, high-speed laser displacement sensor. The OSP technique uses diffuse reflection mechanism to measure topography of a sample. OSP can be used to measure topography, as a very sensitive leveling mechanism, or charting topography to be implemented with other scanning probe techniques for constant-distance mode operation.
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Refractive Index Profiler
S14
The S14 Refractive Index Profiler complements optical fiber preform analysis measurements by providing highly accurate and precise characterization of the refractive index profile of drawn single-mode, multimode, and specialty fibers using the RNF (Refracted Near Field) technique. The S14 index profile data produces fiber geometry information directly. Manufacturers can also use S14 data for the prediction of fiber transmission parameters such as mode field diameter, cut-off wavelength, and chromatic dispersion.
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Logger version CTD profiler with optical fast DO sensor
RINKO-Profiler
CTD profiler with optical fast DO sensor
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Non-contact 3D Optical Profilers
LuphoScan platforms are interferometric, scanning metrology systems. They are designed to perform ultra precision non-contact 3D form measurements mainly of rotationally symmetric surfaces such as aspheric lenses.
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Profilometer
NANOVEA Optical Profiler is a 3D, non-contact profilometer designed with Chromatic Confocal technology, which uses wavelengths of light to accurately determine physical height. The Optical Profilers NANOVEA offers include compact, stand-alone and portable profilometer models. High-speed sensors are available to scan large surface at high accuracy.
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3D Optical Profiler
7503
Chroma 7503 uses the technology of white light interfaces to measure and analyze the surface profile of micro-nano structures with sophisticated scanning system and innovative algorithms.
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3D Profilers
AEP Technology offers different kinds of 3D profilers. Rugged platform, advanced electronic equipment, clean test space, low carbon emission, low machine noise, high-end lens, etc., make our surface profiler unique in the imaging world. In addition to providing stand-alone contact 3D profilers and optical 3D profilers, we also provide the world's only cross-platform, dual-mode 3D profiler that is compatible with both tactile and optical profilometers.
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Optical Profiler
DRK8090
Shandong Drick Instruments Co., Ltd.
This instrument uses noncontact, optical phase shift interferometry method does not damage the surface when measuring graphics can be quickly measured by a variety of three dimensional surface morphology, and analyzed to calculate the measurement results. Suitable for measuring a variety of blocks, the surface roughness of optical components; scale, dial the groove depth; magnetic (optical) disk, the head surface texture measurements; structural morphology of coating thickness and coating trough structure at the boundary of the grating; silicon surface roughness measurement and the graph structure and so on.
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Radiometer
HyperOCR
Hyperspectral ocean color radiometer (HOCR) sensors are designed for applications where performance, size and power are key constraints. HOCRs can be mounted on real-time profilers, moored on autonomous deepwater buoys, installed in autonomous underwater vehicles, as well as on ships and airplanes for above-water optic applications. HyperOCR sensors are fully digital optical packages, providing 136 channels of calibrated optical data from 350–800 nm.
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Broadband Optical Source - MATRIQ
Our SLED MATRIQ instrument is a compact super-luminescent LED light source with high output power, large bandwidth and low spectral ripple.The SLED comes in various wavelength models to address various key applications across telecom and datacom, and is ideal for building a customized optical testing platform that delivers reliable and repeatable results.
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Optical Profilometers
Profilm3D® and Zeta™ optical profilometers provide fast, easy, non-contact solutions for 3D surface topography measurements. Our portfolio of optical profilers supports a variety of measurement techniques, including white light interferometry, True Color imaging and ZDot™ confocal grid structured illumination. KLA Instruments can help guide you to the right optical profiler solution for your unique needs.
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Optical to Electrical Converters
High bandwidth, broadband optical to electrical converters available in a range of configurations. Choose from 1 or 2 channels, AC or DC coupling and various conversion gain and operating wavelength ranges.
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Optical-Electrical Converter - PXI
O2E 1000 – 1400 Series
The O2E is a high bandwidth, broadband optical to electrical converter.Available in a range of configurations; choose from 1 or 2 channels, AC or DC coupling and various conversion gain and operating wavelength ranges.
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Broadband Optical Source - PXI
SLED 1000 Series
The SLED 1000 Series is a super-luminescent LED light source with high output power, large bandwidth and low spectral ripple. It comes in various wavelength models to address applications in the telecom and datacom markets.The SLED is a single-slot PXIe module and is ideal for building a customized optical testing platform that delivers reliable and repeatable results in manufacturing or R&D environments.
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Optical Switches
Fast and reliable optical switches to streamline your test procedures. Can be customized with a wide range of switch configurations, fiber types and connectors.
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Multi-Parameter Profiler
fastCTDplus Rhodamine
An evolution of the miniCTD, the fastCTDplus multi-parameter profiler is designed to deliver the highest quality CTD and Rhodamine observations at fast drop rates.
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Automated Optical Switch - PXI
Add optical switching capability to your test system with Quantifi Photonics’ automated optical switches. The fast and reliable optical switch will enable automated sequential testing, saving time and streamlining your test procedures.
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Wave Profiler Fixture
KIC® Wave Surfer™
The KIC Wave Surfer is a self-contained system that provides critical data on wave solder machine set up and performance. Used in conjunction with your SlimKIC 2000 and the KIC 2000 software, you can ensure your wave solder machine is set up and performing properly.
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Multi-Parameter Profiler
fastCTDplus Chlorophyll a
An evolution of the miniCTD, the fastCTDplus multi-parameter profiler is designed to deliver the highest quality CTD and Chlorophyll a observations at fast drop rates.
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Camera BasedBeam Profilers
Our Camera beam diagnostic Line-up offers measuring capabilities starting from sub-micron laser beams to sensors of 1/1.2" with built-in automatic filters wheels. The camera based beam diagnostic offers the intensity measuring profile and the detailed beam power distribution within the profile.
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Specialized Beam Profiler Systems
DataRay offers specialized beam profiler systems. These systems offer solutions for complex applications. The large beam profiling system is suitable for beams up to 200 mm image area, and the line laser profiling system provides for direct measurement of line lasers up to 200 mm in length.
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YODA Profiler
The YODA profiler (“Yoing” Ocean Data Acquisition Profiler) is a “tow-yo” instrument to profile the water column with high spatial resolution from small boats without occupying much space. The instrument is provided with a deployment winch and sensors measuring conductivity, temperature, pressure, chlorophyll, turbidity and dissolved oxygen. The brush at the top of the instrument allows for a stabilizing effect on the free-fall sinking speed, which is approximately constant at 0.2 m/s. All data are stored internally and downloaded into a PC through a wet-connector and interface.
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Thermal Profiler
KIC K2
The latest-generation mobile-friendly profiling technologyThe KIC K2 Thermal Profiler features a compact and robust design that allows it to fit through the tight, heated chambers of lead-free reflow ovens. A plug-and-play hardware and graphical user interface makes profiling both quick and easy. The profile data measured by the K2 can now be viewed on either a PC or on a mobile device using the Profile Viewer App.
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Large Aperture Beam Profilers
Modern laser applications seldom require large beam profiling, combined with high resolution. The BeamOn HR 1" is the perfect solution enabling both relatively large beam characterization, with a high resolution detector of 20 MP. By implementing a diffuser to present the beam to a smaller detector via dedicated optics, one of the largest beam profilers of 60 mm is offered, i.e BeamOn LA U3. Even further than that, for collimated beams the Laser Analyzing Telescope offers an input aperture of 100 mm combined with high resolution, attitude and divergence measurement of the laser beam.
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Profiler
fastCTD Profiler
An evolution of the miniCTD, it has a conductivity cell designed for optimum flow-through, a fast response thermistor temperature sensor and a 0.01% pressure sensor synchronously sampling at 32Hz deliver the highest quality profiles in a lightweight and robust package. The package is completed with an integral fluorometer based on Valeport’s new Hyperion range and optional Bluetooth communications module.
