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Deep Ultraviolet Spectrophotometer System
VUVAS-10X
A new ultraviolet spectrophotometer system for optical metrology just arrived at NASA Goddard! The VUVAS-10X spectrophotometer works best in the 90 to 160 nanometer wavelength range, also known as deep or vacuum ultraviolet (VUV) region. It uses a windowless hydrogen plasma light source and differential pump section to reach many wavelengths beyond those of conventional deuterium lamps. The source also works with other gases, or gas mixtures, for atomic spectral line emission from about 30 nanometers (double ionized Helium gas) up to the Visible light range. The new spectrophotometer system, McPherson VUVAS-10X, uses a one-meter focal length high-resolution monochromator with the special light source, scintillated detector and Model 121 goniometric sample chamber. The system is ideal for optical transmission, absorbance and specular reflectance at incident angles up to 60 degrees. This McPherson spectrophotometer system will help develop, inspect and qualify optical materials and coatings used for very high altitude and extraterrestrial space flight missions.
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Deep Ultraviolet Observation System for Microscope
U-UVF248
Model Capable of High-magnification/High-contrast Deep Ultraviolet (DUV) Observation. A Semiconductor / FPD Inspection Microscopes.
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Ambient Pressure Photoemission Spectroscopy With Nitrogen Environment
The APS04-N2-RH incorporates a tuneable deep ultra-violet (UV) source outputting 3.4 - 7.0 eV, for absolute work function and highest occupied molecular orbital (HOMO) measurements, a surface photovoltage spectroscopy (SPS) module outputting 400 - 1000 nm for Voc and Eg measurements, together with a 50 x 50 mm scanning area for planar relative work function measurements (Fermi level).
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DUV Lithography Systems
ASML's deep ultraviolet (DUV) lithography systems dive deep into the UV spectrum to print the tiny features that form the basis of the microchip.
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EUV Lithography
NXE systems
NXE lithography systems are used in high-volume manufacturing of advanced Logic and Memory chips. The first systems to use ASML’s novel 13.5 nm EUV light source, they print microchip features with a resolution of 13 nm, which is unreachable with deep ultraviolet (DUV) lithography. Chipmakers use our NXE systems to print the highly complex foundation layers of their 7 nm, 5 nm and 3 nm nodes. Read about how EUV lithography went from imagination to reality.
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Ultra-High Vacuum Ф4 Scanning Kelvin Probe
The Ф4 Ultra-high Vacuum Scanning Kelvin Probe system gives the user full access to work function measurements under vacuum with the ability to alter the temperature from 77 K to 860 K. The Kelvin Probe measurement has resolution of 1 - 3 meV for a 2 mm tip on a conducting sample. The sample is mounted on a plate that is located on a motorized (x, y, z) translator attached to a stainless-steel vacuum chamber. Phi 4 also comes with a photoemission spectroscopy system with a tuneable source (3.4 - 7.0 eV). The deep ultra-violet (DUV) light spot measures approximately 3 x 4 mm. Absolute work function measurements can be obtained with this system in the range of 4.0 - 6.5 eV with an accuracy of 0.05 - 0.1 eV.
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Ultraviolet Analyzers
Teledyne Analytical Instruments
Ultraviolet Analyzers by Teledyne Analytical Instruments
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Ultraviolet Checker
For magnetic particle testing. Intensity of ultraviolet can be read directly in mw/c directly.
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Ultraviolet Meter
UVR Series
UVR series is suitable to manage lamp of ultraviolet curing equipment, Also suitable to measure intensity of ultraviolet ray for sun light and lamp.
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Ultraviolet Microscope
UVM-1
The UVM-1™ is a UV microscope that also can image in the visible and NIR. This UV-visible-NIR microscope embodies both advanced optics for cutting edge UV, color and NIR imaging and visualization. The system is a flexible design, very easy to use and very durable. It is designed with cutting edge CRAIC optics for the highest image quality and to give years of service.
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Solar Ultraviolet Pyranometers
UVR1-T, UVR1-A, &
The Middleton Solar UVR1 series are precision filter radiometers for measuring solar global ultraviolet irradiance. The UVR1-T and UVR1-A are suitable for air pollution monitoring. The UVR1-B is suitable for biological and human erythema (sunburn) monitoring.
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EUV (Extreme UltraViolet) Chucks
Lightweighted and low-expansion chucks with 10nm active-area flatness are required in EUV lithographic tools. These chucks also have low outgassing and low particle generation.
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On-Camera Deep Learning
Firefly DL
Deep learning is a powerful tool for system designers to quickly automate complex and subjective decision making and deliver higher quality products and improved productivity. Deploy your trained neural network to the FLIR Firefly DL with Neuro technology and reduce system cost and complexity by making decisions on-camera without host PC. With its very small size, low weight and power consumption, the Firefly DL camera is ideal for embedding into mobile, desktop, and handheld systems.
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Syscal Deep Marine
In fresh water environment, the standard Syscal Pro can be used for marine resistivity profiling. However, in highly conductive environment, a modified variant with higher current output is required.
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Deep Inspection Kit
GRL-KIT-DI20
The GRL Deep Inspection Kit (KIT-DI20) addresses the gap between expensive, challenging-to-use VNAs and simple functional/continuity tests that are not adequate for high speed interfaces. Now, users without years of signal integrity testing expertise can perform professional measurements with high accuracy to 20GHz with easy-to-use equipment.
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Deep Learning Accelerators
ADLINK’s Deep Learning Accelerators provide GPU- and VPU-accelerated inferencing with embedded, small, and standard form factors. ADLINK’s Deep Learning Accelerators offer high performance, power efficiency and longevity support required of AI applications at the edge, delivering actionable insights at the right place at the right time for industrial automation, transportation, smart city, military and aerospace applications and more.
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Deep Learning Bundle
Set of Deep Learning inspection libraries optimized for machine vision applicationsPerforms image classification, supervised or unsupervised segmentation and object localizationIncludes EasyClassify, EasySegment and EasyLocateSimple APIIncludes the free Deep Learning Studio application for dataset creation, training and evaluationSupports data augmentation and masksCompatible with CPU and GPU processing
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Deep Learning Tool
Labeling training data is the first crucial step towards any deep learning application. The quality of this labeled data plays a major role when it comes to the application's performance, accuracy, and robustness. With the Deep Learning Tool, you can easily label your data thanks to the intuitive user interface – without any programming knowledge. This data can be seamlessly integrated into HALCON and MERLIC to perform deep-learning-based object detection, classification, semantic segmentation, anomaly detection and Deep OCR. For classification and Global Context Anomaly Detection projects, you can also train and evaluate your model in the Deep Learning Tool.
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Deep Packet Inspection
FlowPro
FlowPro is inserted into areas of the network when visibility is needed. It uses a deep packet inspection (DPI) to compile a flow cache, and exports traffic and threat details reflecting 100% of all communications that pass by. FlowPro is a great complement to the Scrutinizer Incident Response System and ensures the security team has insight where they need it.
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Ultraviolet Light Distribution Measurement Film
UVSCALE
UVSCALE is a film that responds to UV light, and changes color depending on the amount of light it is exposed. This makes it easy to see UV light distribution. There are a roll type and a sheet type, with three types for different amounts of light.
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Multibeam Echosounder - Deep Water
HydroSweep MD/50
The HydroSweep MD/50 is a high resolution multibeam echosounder ideally suited for seabed mapping in mid and shallow water based on a sonar frequency range between 52 kHz to 62 kHz. Beside bathymetric depth information from 5 m to more than 2000 m, sidescan data and backscatter data for seabed classification can be acquired.
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Multibeam Echosounder - Deep Water
HydroSweep DS
The HydroSweep DS is a deep water multiebeam echosounder ideally suited for seabed mapping in deep water up to full ocean depth based on a sonar frequency between 14 kHz to 16 kHz. Beside bathymetric depth information from 10 m to more than 11,000 m, sidescan data and backscatter data for seabed classification are acquired. The HydroSweep DS does not only gather sea floor information, but also uses adaptive bottom tracking windows to identify sonar targets in the water column and can be optionally operated as a parametric sub-bottom profiler without additional transducers and electronics.
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Multibeam Echosounder - Deep Water
HydroSweep MD/30
The HydroSweep MD/30 is a deep water multibeam echosounder ideally suited for seabed mapping in medium and deep waters down to 7,000 m water depth. The HydroSweep MD/30 utilizes operating frequencies between 24 and 30 kHz to map the acquire bathytric depth information as well as sidescan and backscatter data.
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Multibeam Echosounder - Deep Water
SeaBat 7160
The SeaBat 7160 transducer array is comprised of linear receive and transmit arrays mounted together on a support base. The T-shaped array geometry provides the basis for a compact, high-resolution sonar which is easily installed for portable or hull mounts – a first for a high-resolution system in this frequency range. The system features a pitch-stabilized transmitter and an active roll compensated receiver.
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Deep Access RF Probes
GigaTest Microwave Probes are perfect for device characterization and modeling. GigaTest Probes have a high tolerance allowing them to land repeatedly and take high-quality data.
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Deep And Sloped Pan Fixtures
Line of deep and sloped pan fixtures for general purpose/system non-specific pcb test applications. H+W Test Products manufactures test fixture products for in-circuit, functional and combinational testers for users of automated test systems (ATE) such as Aeroflex, Agilent (HP), Checksum, Factron, Teradyne (GenRad), Test Research (TRI) and Testronics.
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Deep Dive Application Monitoring
Application performance management (APM) is critical to business success today. Dynatrace automatically sees and analyzes every single user transaction, all the time. All relevant metrics, environment changes, and application deployments are shown in real-time.
