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Silicon
atomic number 14 tetravalent metalloid chemical element.
- Applied Rigaku Technologies, Inc
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Affordable EDXRF Analyzers
NEX QC Series
Applied Rigaku Technologies, Inc
NEX QC is the lowest cost variant of a line of affordable benchtop EDXRF spectrometers designed for rapid qualitative and quantitative analysis of elements from sodium (Na) to uranium (U) in solids, liquids, alloys, powders, and thin films. For more demanding applications, or for situations where short analysis time is critical, we recommend the NEX QC+ spectrometer. Employing the next generation silicon detector technology, the enhanced NEX QC+ affords significant improvement in elemental peak resolution and counting statistics.
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Endevco Miniature Piezoresistive Silicon Pressure Sensors
Accurate and Reliable Performance at Extreme Pressures.
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Silicon Resistivity, PN type & Alarm Tester
HS-PSRT
It use Four Probe to test the resistivity and P/N type of wafers、ingots and all type of silicon materials.It can be used by Solar and Semiconductor industry.
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Optical Power Monitor Instruments
MPA-100
MPA-100 is a highly integrated rack mountable model of pigtailed photo-detectors. Multi-channel optical power from MPO or MTP connectors are measured. Photo-detectors of Silicon type for 850 nm range and InGaAs type for 1260 - 1610 nm are available. The detected photo-current is converted into a voltage output using a 16-bit multi-channel DAQ interface. The dimensions are (W) 482.6 x (D) 430 x (H) 44 mm. The highly integrated MPA-100 is available up to 80 channels with an excellent cost performance and small footprint. The MPA-100 is useful for many 40 GbE / 100 GbE applications, such as testing and monitoring of transceivers (SR4, SR10, LR4, and ER4) for data communications, broadband / CATV, and telecommunications. Tap-PD model (Eg. a partial 5 % tapped power detection) is also available with customization.
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High Level Language Debugger and Emulator Tool
Universal Debug Engine
Programmierbare Logik & Systeme GmbH
With Universal Debug Engine (UDE®) PLS offers on top solutions for software development of systems-on-silicon including debug support for the 16 Bit and 32 Bit microcontrollers C16x, C166™, ST10F276, ST10F280, XC166, XC2000, XE166, XMC4500, C166S V2, SDA6000, TriCore™ from Infineon and STMicroelectronics, Power Architecture® MPC55xx, MPC560x, MPC563x, MPC57xx from NXP™, PowerPC PPC440SPe from AMCC, Power Architecture® SPC560, SPC563, SP574 from STMicroelectronics, ARM7™, ARM9™, ARM11™, Cortex™-M0, Cortex™-M0+, Cortex™-M3, Cortex™-M4, Cortex™-M7, Cortex™-R4, Cortex™-A8, Cortex™-A9, XScale™, SuperH™ SH-2A derivatives in a new multicore debug environment as well as technical support. The extensive feature list includes functions like: high speed and flexible target access via JTAG, cJTAG with OCDS L1, EmbeddedICE, OnCE, COP, DAP, DAP2, SWD support, OCDS L2 trace, MCDS trace, CoreSight™ trace, ETM trace, ETB trace, Nexus trace, ASC, SSC, 3Pin and CAN, in-system FLASH memory programming of FLASH / OTP with UDE MemTool, support of various RTOS, OSEK® and test automation tools.
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AC Input Single
AC input/single transistor output photocouplers (optocouplers) are optically coupled isolators containing GaAs infrared light emitting diodes and an NPN silicon phototransistor. This type consists of two infrared light emitting diodes connected in inverse-parallel, and operates directly on AC input current.
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Capacitive Touch Controllers
TouchXpress
Silicon Labs' TouchXpress devices are highly optimized solutions that enable designers to easily design and integrate capacitive sensing into applications. These devices quickly replace mechanical buttons and switches with modern capacitive touch buttons by eliminating the firmware complexity and reducing development time.
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Lightning Current Generator
Shanghai Guantu Technology Co., Ltd.
The lightning wave impulse current generator is an impulse current generator that generates a simulated lightning current waveform . Its working process is as follows: first, the transformer charges the capacitor bank through the silicon pile, when the charging voltage reaches a predetermined value, the spark gap is triggered, and the capacitor is discharged through the total inductance and total resistance of the circuit. When the resistance is greater than or equal to the critical damping value, a unidirectional impulse current wave is generated in the circuit. When the resistance is less than the critical damping value, an oscillating impulse current wave is generated. The magnitude of the impact current amplitude is related to the circuit parameters. When the capacitance value and charging voltage are the same, the smaller the inductance value, the greater the current amplitude. In order to obtain as much current as possible, a pulse capacitor with a small inductance value is usually selected, and the total length of the connecting line should be as short as possible when arranging the main capacitor, so that the total loop inductance value can be reduced as much as possible.
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Schottky Barrier Bridge Quads
SemiGen’s Silicon Schottky Diodes are designed for applications through 40Ghz. The special process technology utilizes various metal schemes to provide excellent performance of Low, Medium, and High Barrier applications. The end result is a low resistance diode with tightly controlled capacitance which allows for optimum performance. Low conversation loss and superior TSS make these diodes ideal for detector / mixer applications with frequency ranges from S band to Ka band as well as modulators, lower power limiters and high speed switches.
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Laboratory Centrifuges
Centrifuge systems are designed for the development, test, evaluation and calibration of accelerometers and a variety of inertial devices. Centrifuges provide a cost-effective solution for simulating high-"G" environments in the laboratory. They support testing of devices such as MEMS-based Inertial Measurement Units (IMUs), low-cost quartz or silicon sensors, Ring Laser Gyros (RLGs), Fiber-Optic Gyros (FOGs), fuzes and crash sensors.
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5G Active Antenna Innovator’s Kit
AWMF-0129
The AWMF-0129 is an active array for 5G wireless applications developed using planar antenna technology resulting in a very low profile, lightweight unit. The surface mount assembled antenna board is based on Anokiwave’s AWMF-0108 Silicon Quad Core IC and demonstrates the performance achievable using low power silicon integration and efficient antenna layout and design. Using the AWMF-0108, the antenna provides +50dBmi output power while consuming just 12W DC power in the RF circuits and has achieved Gb/s data rates in OTA trials. The electronic 2D beam steering is achieved using analog RF beam forming, with independent phase and gain control in both Tx and Rx operating modes. The AWMF-0129 antenna leads the way in showing how 5G coverage can be rolled out by network operators using the mmW bands, with low power footprint and high energy efficiency, while meeting key operating specifications for data rate, latency, coverage, and reliability.
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Low cost EDXRF Elemental Analyzer
NEX QC+ QuantEZ
Applied Rigaku Technologies, Inc
As a premium low-cost benchtop EDXRF elemental analyzer, the Rigaku NEX QC+ QuantEZ delivers wide elemental coverage with easy-to-learn Windows®-based QuantEZ software. Non-destructively analyze from sodium (Na) through uranium (U) in almost any matrix, from solids and alloys to powders, liquids, and slurries. The 50 kV X-ray tube and Peltier cooled silicon drift detector (SDD) deliver exceptional short-term repeatability and long-term reproducibility with excellent element peak resolution. This high voltage capability, along with multiple automated X-ray tube filters, provides a wide range of XRF applications’ versatility and low limits-of-detection (LOD).
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Silicon Pyranometer
LPSILICON-PYRA04
Pyranometer with silicon photodiode for measuring the GLOBAL SOLAR IRRADIANCE, diffuser for cosine correction. Spectral range 400…1100 nm.
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Spectroelectrochemical Flow Cell
SEC-2F
Using the spectroelectrochemical flow cell, it is possible to have a different optical path length changing the gasket. We offer, as an optional item, a silicon and Teflon gasket with a 100, 250 and 500 m of the thickness. SEC-2F Spectroelectrochemical flow cell was designed to fit perfectly in the SEC2000 Spectrometer, and it eliminated the use of the optical fiber to connect the Spectrometer to the SEC-2F. Even for another brand of the spectrometer, you can connect the SEC-2F using the collimating lens and optical fiber.
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PCI/USB Device Driver Development Tool
WinDriver
The WinDriver™ device driver development tool supports any device, regardless of its silicon vendor, and enables you to focus on your driver’s added-value functionality, instead of on the operating system internals. WinDriver’s driver development solution covers USB, PCI, PCI Express, CardBus, CompactPCI, ISA, PMC, PCI-X, PCI-104 and PCMCIA.
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Limiters
Macom Technology Solutions Holdings Inc.
At MACOM we offer a complete line of RF and microwave limiters, LNA/limiters and limiting amplifiers up to 18 GHz. These products use the latest thin-film hybrid manufacturing techniques to obtain the highest levels of performance, repeatability, reliability and cost-effectiveness. Using the latest technology available in the industry for silicon and GaAs FET MMICs, these products are ideal for multi-market and aerospace and defense applications.
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AC Hysteresis Graph Test System
DX-2012SA
Under continuous frequency of 1 kHz to 500 kHz, automatic measurement of magnetic hysteresis loop of the soft magnetic materials such as silicon steel, precision alloy, non-crystal and ferrite, accurate measurement on the dynamic magnetic characteristic parameters such as amplitude permeability µa, loss angle d, loss iron Pc, remanence Br and coercivity Hc.
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Meters For Contact Angle And Surface Tension + Semiconductor Technology, Micro Scriber
SURFTENS HL Automatic
Optik Elektronik Gerätetechnik GmbH
Fully automatic contact angle meter for silicon wafers up to 12 inch The contact angle measuring system SURFTENS HL automatic is designed for use in semiconductor industry and research, in particular for process control of wafer coating and in the photolithographic process.
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Preset Torque Screwdrivers
FG
Engineered and assembled in the Silicon Valley, the Mountz FG line of preset precision torque screwdrivers are the most advanced hand tools in the world.
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Scienlab Battery Test System – Pack Level, 220 KW
SL1730A
Keysight’s SL1700A Scienlab Battery Test System – Pack Level Series allows to realistically emulate the environment of the future battery pack application in order to test the high-power battery pack comprehensively and improve its functions and safety. The growing demand of e-mobility increases the need of vast battery test labs for EV battery development. Keysight developed the SL1700A Series to accelerate the development and validation of batteries. It offers a voltage range of up to 1500 V and power options between 100 and 300 kW including a Performance Bundle to increase the power up to 330 kW. The new high-voltage SiC (silicon carbide) technology provides a high energy efficiency on a small footprint and helps to minimize your operating costs.
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Digitizer
720 Family
The 720 is a family of CAEN Waveform Digitizer able to perform basic waveform recording and run online advanced algorithms (DPP) of charge integration and pulse shape discrimination. Data is read by a Flash ADC, 12-bit resolution and 250 MS/s sampling rate, which is well suited for mid-fast signals as the ones coming from liquid or inorganic scintillators coupled to PMTs or Silicon Photomultipliers. In the waveform recording mode, algorithms of zero suppression are also implemented to reduce the data throughput.
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Ka-Band Silicon 5G Quad Core IC
AWMF-0108
The AWMF-0108 is a highly integrated silicon quad core IC intended for 5G phased array applications. The device supports four Tx/Rx radiating elements, includes 5 bit phase and 5 bit gain control for analog RF beam steering, and operates in half duplex fashion to enable a single antenna to support both Tx and Rx operation. The device provides 26 dB gain and +9 dBm output power during transmit mode and 28 dB coherent gain, 5.0 dB NF, and -28 dBm IIP3 during receive mode. Additional features include gain compensation over temperature, temperature reporting, Tx power telemetry, and fast beam switching using eight on-chip beam weight storage registers. The device features ESD protection on all pins, operates from a +1.8 V supply, and is packaged in a 48 lead 6x6 mm QFN for easy installation in planar phased array antennas.
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Broadband Detectors
These waveguide bandwidth detectors use silicon beam lead diodes on a planar stripline circuit to obtain an extremely rugged and compact device. Most millimeter wave broadband detectors have very poor VSWR due to the difficulty in obtaining a good wideband impedance match to the diode. To overcome this problem, these detectors utilize two diodes and an internal matched termination and 3 dB hybrid as shown below. This circuit allows a VSWR of 2.0 or better over a full waveguide bandwidth for most of these detectors. Detectors for waveguides WR-8 and smaller use a single zero bias GaAs diode. The high sensitivity zero bias GaAs diodes can also be special ordered for use at lower frequencies when highest sensitivity is required.
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Probes
SHOCONA Probes are designed for non-vibrating, contact mode applications and are compatible with most commercially available SPMs/AFMs. These probes are nanofabricated using highly doped single crystal silicon with unparalleled reproducibility, robustness and sharpness for consistent high resolution imaging capabilities. This is a box of 10 probes.
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Stimulus Induced Fault Testing
SIFT
SIFT allows for the analysis of numerous stimuli to identify speed, fault, and parametric differences in silicon. The heart of the SIFT technique revolves around intentionally disturbing devices with external stimuli and comparing the test criteria to reference parts or timing/voltage sensitivities. Synchronous interfacing is possible to any tester without any wiring or program changes. The system can be based on either a motorized probe station or portable microscope stand for test head applications.
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Particle Metrology System
Archimedes
Archimedes is an innovative instrument which uses the technique of resonant mass measurement to detect and accurately size and count particles in the size range 50nm to 5um*. Archimedes can distinguish different species from their buoyant mass is particularly useful when characterizing proteinaceous aggregates from contaminating silicon oil in biopharmaceutical preparations, in distinguishing bubbles from lipid micelles and contaminants in ultrasound contrast agents or protein from fat in dairy products.
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330 System
NSX
With a combination of inspection plus metrology, NSX 330 System measures multiple applications including wafer-level metrology for micro bumps, RDL, kerf, overlay, and through silicon via (TSV) in a single wafer load.
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Hybrid Verification Platform
HES-DVM
HES-DVM™ is a fully automated and scalable hybrid verification environment for SoC and ASIC designs. Utilizing the latest co-emulation standards like SCE-MI or TLM and newest FPGA technology, hardware and software design teams obtain early access to the hardware prototype of the design. Working concurrently with one another they develop and verify high-level code with RTL accuracy and speed-effective SoC emulation or prototyping models reducing test time and a risk of silicon re-spins.
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64 Channel 16 bit 125 MS/s Digitizer
VX2740
The VX2740 Digitizer is a 64-channel digital signal processor for radiation detectors in a VME64X form factor. It offers not only waveform digitization and recording but also Multi-Channel Analysis for nuclear spectroscopy using Silicon strip, segmented HPGe, Scintillation detector with PMTs, Wire Chambers, and others.
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Absolute Contamination Standards (ACS)
The Absolute Contamination Standard (ACS) is used to calibrate instruments which size and detect particles on the surface of bare silicon wafers. Use ACS to characterize particles, before particles characterize products.
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Interference Lithography Gratings
Interference lithography is an optical nanolithography technology for the fabrication of extensive periodic nanostructures. Critical dimensions of less than 50 nm can be realized. At AMO two interference lithography tools are installed. One setup for extensive, high quality gratings with fixed periods, the other more flexible tool allows quick prototyping. We offer grating fabrication on silicon, silicon dioxide and other substrates with tailored pitch, etch depth and size.
