Filter Results By:
Products
Applications
Manufacturers
DDR
Double Data Rate memory achieved by reading both the rising and falling edge of clock.
See Also: Memory, Memory Test, NAND, DRAM, Memory Device, DDR4
-
product
DH Series Tip - CrossSync PHY PCIe5 CEM x16
DH-CSPHY-PCIE5-CEMX16
Teledyne LeCroy’s DH series 8 to 30 GHz differential probes offer the combination of bandwidth, input range and offset capability to address any high-speed probing requirement from debugging serial data interfaces to validating DDR memory systems. DH series probes provide superior loading characteristics and are calibrated with a custom “fine-tuned” frequency response. The ultra-low loading and flat frequency response ensure accurate measurements.
-
product
16 GHz Differential Probe with ProLink Interface
DH16-PL
Teledyne LeCroy’s DH series 8 to 30 GHz differential probes offer the combination of bandwidth, input range and offset capability to address any high-speed probing requirement from debugging serial data interfaces to validating DDR memory systems. DH series probes provide superior loading characteristics and are calibrated with a custom “fine-tuned” frequency response. The ultra-low loading and flat frequency response ensure accurate measurements.
-
product
S.O. DIMM Converter
DDR 200-pin
The RAMCHECK DDR 200-Pin Converter is a perfect low-cost solution for testing modern laptop DDR memory. The converter plugs directly into the 184-pin RAMCHECK DDR main adapter, providing you with fast, convenient testing capabilities
-
product
Interface IP
Synopsys provides the industry’s broadest portfolio of complete, silicon-proven IP solutions, with leading power, performance, area, and security, for the most widely used interfaces such as PCI Express®, CXL, USB, Ethernet, DDR, HBM, Die-to-Die, CCIX, MIPI, HDMI, and Bluetooth.
-
product
Component Testers
After a wafer is tested through front-end test and back-end test, the component tester tests this final component or package assuring its quality for the semiconductor makers. DDR, DDR2, DDR3 memory component testers.
-
product
Resistivity Meters
DDR3
Integrated Geo Instruments & Services Private Limited
The DDR 3 Resistivity Meter is a specialized version of IGIS Resistivity meters designed for use in Resistivity surveys up to about 200m depth. It utilizes rechargeable batteries as power source to energize the ground thus eliminating the necessity of using the relatively expensive dry cells.
-
product
PCIe-SpaceWire
PCIe-SpaceWire implements SpaceWire in a convenient PCIe format. Four fully independent and highly programmable LVDS IO ports are provided by the PCIe-SpaceWire design. The SpaceWire protocol is advanced with link testing, error handling, command and data protocols built in. The SpaceWire electrical interface is point-to-point with token based flow control. Now with DDR memory for 32 Mbytes per port [256 MB total]
-
product
Multifunction Data Collection and Analysis System
9000
The Model 9000 DME System is a high performance multifunction data collection and analysis system. It is suitable for application in an electrical utility substation or plant environment to produce Sequence of Event (SER), Digital Fault Recorder (DFR), Dynamic Disturbance Recorder (DDR), and Continuous Recorder data in conformance with PRC-002-1 and PRC-018-1. All data recorded by the DME system is stored in IEEE C37.111 format and named in conformance with IEEE C37.232. The system also has a software option to enable the Phasor Measurement Unit (PMU) feature to provide streaming data in conformance with IEEE C37.118.
-
product
DH Series High-Sensitivity Solder-In Tip, 30 GHz BW, 2.0 Vpp Range
DH-SI-HS
Teledyne LeCroy’s DH series 8 to 30 GHz differential probes offer the combination of bandwidth, input range and offset capability to address any high-speed probing requirement from debugging serial data interfaces to validating DDR memory systems. DH series probes provide superior loading characteristics and are calibrated with a custom “fine-tuned” frequency response. The ultra-low loading and flat frequency response ensure accurate measurements.
-
product
AXIe Logic Analysis & Protocol Test
Keysight's AXIe Modular Logic Analysis and Protocol test modules and powerful analysis software provide essential capabilities for engineers working on fast digital designs and chipsets using high speed parallel and serial buses, such as DDR and PCI Express Gen 3.
-
product
Memory Analysis Software for Logic Analyzers
B4661A
DDR3, DDR4, DDR5, LPDDR2, LPDDR3, LPDDR4, and LPDDR5 Analysis . The Keysight B4661A memory analysis software offers a suite of options that include the industry’s first protocol compliance violation testing capability across speed changes, a condensed traffic overview for rapid navigation to areas of interest in the logic analyzer trace, powerful performance analysis graphics, and DDR and LPDDR decoders. With the B4661A memory analysis software and a Keysight logic analyzer*, users can monitor DDR/2/3/4/5 or LPDDR2/3/4/5 systems to debug, improve performance, and validate protocol compliance. Powerful traffic overviews, multiple viewing choices, and real-time compliance violation triggering help identify elusive DDR/LPDDR system violations.
-
product
QDRII/DDRII/ QDRII+/DDRII+ SRAM
DDR II / II+ (Double Data Rate) SRAMs and QDR^(TM) II / II+ (Quad Data Rate) SRAMs are the ideal memory devices for next generation networking and communications systems. These ultra-fast devices can support high bandwidth systems that require memories capable of very high operating frequencies combined with low latencies and full cycle utilization.
-
product
DH Series QuickLink Adapter Kit with 3 x QL-SI Tips
DH-QL-3SI
Teledyne LeCroy’s DH series 8 to 30 GHz differential probes offer the combination of bandwidth, input range and offset capability to address any high-speed probing requirement from debugging serial data interfaces to validating DDR memory systems. DH series probes provide superior loading characteristics and are calibrated with a custom “fine-tuned” frequency response. The ultra-low loading and flat frequency response ensure accurate measurements.
-
product
PXI Digital Waveform Instrument
PXI Digital Waveform Instruments feature up to 32 channels, can sample and generate digital waveforms at up to 200 MHz, and interface with various standard TTL and low-voltage differential signals (LVDS), as well as settable voltage levels. These devices offer per clock cycle, per channel bidirectional control, and phase shifting. They include deep onboard memory with triggering and pattern sequencing. Some models also support doubledatarate (DDR) technology and real-time hardware data comparison. You can use Digital Waveform Devices to create device simulation and complex stimulusresponse tests.
-
product
Training Board
JT 2156
The JT 2156 training board has been devised to demonstrate all the latest features and test techniques available to users of JTAG Technologies’ ProVision & JTAG Live application development systems. As well as a modern ARM Core processor, the design also includes an Altera Cyclone FPGA, DDR Memory, Ethernet PHY, and several SPI and I2C peripheral parts. The JT2156 is shipped with a comprehensive self-study manual for getting to know the in-depth features of ProVision and/or JTAGLive Studio. For Altium users the design also serves as an example of how to adapt the Nano board into a realistic custom design.
-
product
30 GHz Differential Probe with 2.92mm Interface
DH30-2.92MM
Teledyne LeCroy’s DH series 8 to 30 GHz differential probes offer the combination of bandwidth, input range and offset capability to address any high-speed probing requirement from debugging serial data interfaces to validating DDR memory systems. DH series probes provide superior loading characteristics and are calibrated with a custom “fine-tuned” frequency response. The ultra-low loading and flat frequency response ensure accurate measurements.
-
product
IDM+
Multi-functional fault recorder including: -- Disturbance fault record (DFR)- Dynamic disturbance recording (DDR) - Phasor measurement unit (PMU C37-118)- Power Quality (PQ Class A)- Travelling wave fault location (TWS to +/-60m) - Impedance fault location- Protocols (61850, Modbus, DNP3) - Sequence of event recording (SOE)- GPS, IRIG and NTP time sync- iQ+ masterstation software.
-
product
DDR5 Protocol Debug And Analysis Solution
U4970A
The DDR5 solution bundle provides a systemized hardware, probing, and software solution for DDR / 2 / 3 / 4 / 5 protocol debug, compliance validation, and analysis.
-
product
Logic Analyzer
GoLogicXL-72
Logic analyzers and oscilloscopes offering fast sample rates and large memory depths are required to debug and test modern electronics. The GoLogicXL captures a very large window of bus activity using sample depths up to 1 billion samples. 4 GHz sampling rates expose the finest details in your signals. 1 GHz Transitional sampling provides the optimum method to capture fast data bursts separated by seconds, minutes, or even hours of bus inactivity. The GoLogicXL State analysis can also synchronize with single-data-rate 300 MHz SDR clocks, and double-date-rate 250 MHz DDR clocks (500 MHz effective).
-
product
DH Series QuickLink Adapter, 8 GHz BW
DH-QL
Teledyne LeCroy’s DH series 8 to 30 GHz differential probes offer the combination of bandwidth, input range and offset capability to address any high-speed probing requirement from debugging serial data interfaces to validating DDR memory systems. DH series probes provide superior loading characteristics and are calibrated with a custom “fine-tuned” frequency response. The ultra-low loading and flat frequency response ensure accurate measurements.
-
product
8 GHz Differential Probe with ProLink Interface
DH08-PL
Teledyne LeCroy’s DH series 8 to 30 GHz differential probes offer the combination of bandwidth, input range and offset capability to address any high-speed probing requirement from debugging serial data interfaces to validating DDR memory systems. DH series probes provide superior loading characteristics and are calibrated with a custom “fine-tuned” frequency response. The ultra-low loading and flat frequency response ensure accurate measurements.
-
product
3.5" Embedded SBC With AMD LX800, Dual LANs, 4 COM, 4 USB 2.0 And VGA/TTL (-40°C To +85°C)
SBC84620
The SBC84620 supports AMD LX800 500MHz processor and full feature I/Os. It is an ideal entry level PC-based embedded platform and be able to be fanless operation for industrial applications. The new integrated graphic controller, 4 COM, 4 USB 2.0 ports and 1GB DDR memory features empower the system value without extra development cost. In the meanwhile, for the expansion interface, the SBC84620 provides PCI with Mini PCI socket and ISA bus through PC/104 interfaces. Also, SBC84620 gives the best TCO (Total-Cost-of-Ownership) for system design due to DDR memory supported.
-
product
25 GHz Differential Probe with 2.92mm Interface
DH25-2.92MM
Teledyne LeCroy’s DH series 8 to 30 GHz differential probes offer the combination of bandwidth, input range and offset capability to address any high-speed probing requirement from debugging serial data interfaces to validating DDR memory systems. DH series probes provide superior loading characteristics and are calibrated with a custom “fine-tuned” frequency response. The ultra-low loading and flat frequency response ensure accurate measurements.
-
product
DDR Validation License Suite
SW00DDRV
The DDR Validation License Suite is part of the subscription based Oscilloscope Compliance Test Software Suites. This suite covers Tx Validation licenses for DDR with coverage across the DDR technology starting from DDR3. Together with the subscription model, this enables the support and coverage continuity as the DDR technology progresses through generations.
-
product
4-Channel DAC FMC Module
SMT-FMC211 – LPC
Sundance Multiprocessor Technology Ltd.
The main component of the SMT-FMC211 is the Texas Instruments 4 channel DAC – TI’s Quad 1.25GHz DAC3484. This device offers excellent SFDR performance better than 70dBc, with an output sample rate of over 312MSPS. It interfaces to an Artix-7 XC7A15T-2C FPGA using a 16 bit differential DDR bus.
-
product
Memory Module Testers
The module tester tests the modules in which the final tested components are assembled together. This test is also one of the most important factors to guarantee the quality of the products. DDR, DDR2, DDR3, FBDIMM,
-
product
Logic Analyzer
GoLogicXL-36
Logic analyzers and oscilloscopes offering fast sample rates and large memory depths are required to debug and test modern electronics. The GoLogicXL captures a very large window of bus activity using sample depths up to 1 billion samples. 4 GHz sampling rates expose the finest details in your signals. 1 GHz Transitional sampling provides the optimum method to capture fast data bursts separated by seconds, minutes, or even hours of bus inactivity. The GoLogicXL State analysis can also synchronize with single-data-rate 300 MHz SDR clocks, and double-date-rate 250 MHz DDR clocks (500 MHz effective).
-
product
8 GHz Differential Probe with ProBus2 Interface
DH08-PB2
Teledyne LeCroy’s DH series 8 to 30 GHz differential probes offer the combination of bandwidth, input range and offset capability to address any high-speed probing requirement from debugging serial data interfaces to validating DDR memory systems. DH series probes provide superior loading characteristics and are calibrated with a custom “fine-tuned” frequency response. The ultra-low loading and flat frequency response ensure accurate measurements.
-
product
DH Series PT Browser Tip, 16 GHz BW, 3.5 Vpp Range
DH-PT
Teledyne LeCroy’s DH series 8 to 30 GHz differential probes offer the combination of bandwidth, input range and offset capability to address any high-speed probing requirement from debugging serial data interfaces to validating DDR memory systems. DH series probes provide superior loading characteristics and are calibrated with a custom “fine-tuned” frequency response. The ultra-low loading and flat frequency response ensure accurate measurements.
-
product
13 GHz Differential Probe with ProLink Interface
DH13-PL
Teledyne LeCroy’s DH series 8 to 30 GHz differential probes offer the combination of bandwidth, input range and offset capability to address any high-speed probing requirement from debugging serial data interfaces to validating DDR memory systems. DH series probes provide superior loading characteristics and are calibrated with a custom “fine-tuned” frequency response. The ultra-low loading and flat frequency response ensure accurate measurements.
