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- Pickering Interfaces Inc.
product
EBIRST 78-pin D-type Test Tool
93-006-001
The 93-006-001 eBIRST 78-pin D-type test tool is part of a range of USB controlled test tools capable of performing automated path resistance tests on Pickering Interfaces PXI, LXI or PCI controlled switching solutions. Each tool simply interfaces with the switching system's connector so a test can be run using the supplied Windows-based software.
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In-Circuit Test Systems
Keysight offers leading board test solutions for electronics manufacturers to tackle a wide range of PCBA test access and coverage issues for today's complex printed circuit assemblies.
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Averaging Extensometers for ASTM D5656 Shear Tests
Model 4013
Jinan Testing Equipment IE Corporation
The Model 4013 extensometer meets the requirements of ASTM D5656 for measuring the strain properties of an adhesive in shear. It uses different contact point spacing compared to the extensometer shown in D5656. This makes it much easier to mount and eliminates the slippage problems associated with the design shown in the ASTM standard. The Model 4013 is available with all of Epsilon’s temperature configurations. It has a 3.0 mm (0.12 inches) full scale measuring range. The conical point contacts included with the extensometer are made from tungsten carbide.The Model 4013 extensometers are strain gaged devices, making them compatible with any electronics designed for strain gaged transducers. Most often they are connected to a test machine controller. The signal conditioning electronics for the extensometer is typically included with the test machine controller or may often be added. In this case the extensometer is shipped with the proper connector and wiring to plug directly into the electronics. For systems lacking the required electronics, Epsilon can provide a variety of solutions, allowing the extensometer output to be connected to data acquisition boards, chart recorders or other equipment.
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Carrier - Virtex 7 W/FMC Site
VPF: 3U VPX
The VPF is a VPX form factor (VITA 46), FPGA processor board designed to meet the needs of challenging, embedded high‐performance digital signal processing applications at a competitive price point. AMD Virtex 7: VX330 and VX690 population options are available. The Virtex 7 FPGA provides impressive processing capabilities and supports operations such as: FFTs, FIR filters, fixed‐point and repetitive processing tasks. The VPF FPGA node processes input from the FMC HPC (Vita 57.1) site, allowing for maximum application configurability and performance when coupled with DEG’s market leading ADC and DAC FMC modules (250MSPS to 4.0GSPS). The VPF is fully compliant with the OpenVPX standard and accommodates the PCIExpress Gen 3.0 communication protocol. Delphi also offers a VPF FPGA Design kit which allows customers to leverage and modify DEG source code, develop within an open architecture, and rapidly integrate FPGA HDL. The DEG FPGA Design kit includes: Source code, simulation test bench and utilities to support custom algorithm development. Embedded Linux, VX Works and Windows software drivers are available. HPC FMC Site, Fully Compatible with all Delphi ADC and DAC FMC Modules.
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Insulation Tester
1kV Megohmmeter
*Calculations (automatic)*Potential Index and Dielectric Absorption Ratios*Tests Continuity, Resistance and Frequency Measurements*Programmable Alarms*Insulation Test, Resistance, Continuity*Hazardous Voltage Alert (Icon) if voltage is >70 volts 5.) On Board Timer, +1/- 1 sec
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Design for Test Service
Design For Test (DFT) is a technique used to implement certain testability features into a product. Testing House can provide an analysis of the CAD data for testability of your circuit board. Access to a board can be very difficult as boards get smaller and designs get more densely populated. We can work with your design engineer to improve testability and maintain an effective in-circuit test. When access to the board is limited and boundary scan devices are present, we can provide the customer a list of key nodes that will require access in order to provide a very effective test. Our analysis will provide a list of all the accessible test points and an explanation for any nodes declared inaccessible.
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Generic Probe Cards, PIB's, and Loadboards
Test Spectrum can provide generic Probe Cards, Probe Interface Boards (PIB), and loadboards. Choose from existing configurations already designed, or a generic test board for your specific tester configuration can be designed quickly.Teradyne J750 Probe Card and PIB; Teradyne Integra Flex PIB; Teradyne Ultra Flex PIB; Teradyne Catalyst PIB; Credence Quartet PIB (Probe Interface Board); Advantest 93K 1024 PIB
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DUT Prototype Board
DPB8800
The DPB8800 is an 11? x 14? PC board used to interface the tester with the Device Under Test (DUT). This board contains generous area for custom circuitry and extra relays. The DPB8800 is also available with standard solutions to test families of components like Op-Amps, Regulators, ADC?s and DAC?s. +/-15 V and +5 V are available to support circuitry biasing.
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Thermal Conductivity Measuring Device
TCM1001
In recent years, there has been a demand for small and thin electronic products such as mobile devices, and printed circuit boards are shifting to thin, multi-layered, and even modularized printed circuit boards. effect of bonding materials, that is, the ability to easily conduct heat, is emphasized, and testing equipment that evaluates thermal conductivity is required .As a business of our company, we have mainly manufactured and sold test equipment for solder wettability tests and solder bonding strength, but there was a need to urgently develop next-generation bonding material test equipment to replace these. Under these circumstances, we received a request from an academic research facility to manufacture a device that can measure the thermal conductivity of conductive adhesives under research and development, and we were able to obtain an opportunity to develop the device. We proceeded with the development based on these requirements .
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Boundary-Scan Interactive Analyzer & Toolkit
ScanExpress JTAG Debugger
Test probe access is a luxury—modern electronic system design techniques such as blind and buried vias or ball-grid-array (BGA) devices guarantee limited signal access. Test points quickly reduce precious board real-estate and can even degrade performance. ScanExpress JTAG Debugger overcomes these limitations to provide the control and visibility necessary to quickly debug and test hardware, using a simple JTAG port to interface with IEEE-1149.1 compliant devices.Whether debugging prototype hardware, enhancing production tests with boundary-scan control, or diagnosing a faulty board in the field, ScanExpress Debugger’s easy-to-use and versatile interface helps engineers test and debug systems faster and more efficiently.
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4K Picture Quality Analyzer
VP4000
The The frame delay of 2160p full sample 4K reference video and 4K test video are compensated to fit exactly to each other by pixel base, and a real time objective quality score (DSCQS) are calculated by the ITU-T J.144-based assessing method in conjunction with the differential values (PSNR). This scheme is best suited to the encoder evaluation, online/standby comparison, inspection geared to video servers, and so on. For conventional 1080i image evaluation, a single PROBE4000 board can serve the purpose.
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25 Pin Breakout Interface
VSI-Breakout-25
The VSI-Breakout-25 is a very useful tool in debugging signals or software in a system. It allows unlimited access to signals within the cabling that might otherwise be difficult to access. The board gives test points at each side of the connector and jumper with a easy to use tabbed shunt to allow for easy disconnection of any particular signal between the connectors. The jumpers also give an opportunity to inject a signal regardless of what signal was originally being driven.
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LED Tester Software
Lumeresoft
Evolusys Technologies Sdn. Bhd.
At the heart of the software design philosophy is the ease to create test recipe amidst the dynamic range of LED packages design & test requirements. Whether it is a single die LED, multiple die LEDs, Chip-On-Board (COB) substrate, etc. the same software can be used off-the-shelf without any special customization.
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Salt Spray, Salt Fog & Cyclic Corrosion Testing
We service most industry segments with harsh environment, salt fog corrosion testing.If your product is coated or painted for the marine, automotive or military industries, we are equipped to provide accredited testing within multiple chambers.We provide ASTM sample preparation for coated and painted articles to ensure that your test is performed correctly.We also provide custom configurations with varied salt concentrations and temperatures for many customers with products that are used in unique environments. Products like circuit boards, electronic devices and sensors may all have specialized testing requirements.
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Test system for Electronic Device
PCB
The main focus of the test system is validation and functional testing of electronic devices. The tests include electrical parameters and logical functions of the firmware. Device groups can be stimulated externally and output signals can be acquired by the test points on the board. Limits and ranges of the acquired signals can be monitored and stored for verification.
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Custom Pogo Pin Rings & Blocks
Reduce your cost-of-test with our pogo pin blocks and interfaces that transform complex DUT boards or breakout boards into universal motherboard-style interfaces. Eliminate the need to purchase or build a new board for every unique device, unit, or package.
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Meter Test Board
WECO 2150
Model 2150 automated test system is a fully ANSI compliant testboard that uses a single voltage and three independently controlled isolated current sources to test all electromechanical and solid state meters up to 50 Amps. Utilizing a precision laser optics system, the Model 2150 can test meters through the most grime-coated covers with unfailing accuracy. This same laser technology makes it possible to test using the disk’s edge without wasting time with the tricky optics adjustments found with other test systems.
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Modular Relay Board
Alliance Support Partners, Inc.
An increasing number of electronics products are being assembled in panels of 8 or more to minimize production cost. These products are typically tested with in-circuit tests (ICT) followed by power-on functional tests. Normally, ICT requires isolation of power and ground while measurements are being performed. Functional tests, including in-system programming (ISP), require board power to be applied. The Modular Relay Board (MRB) is designed to switch power onto each individual board and to disconnect sensitive signals during functional test.
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Compatible Adapter Carrier
PCI2PC104p
Use your PC/104p boards in a standard PC. Two orientations supported for production mode and test.
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AMIDA 3KS Tester
The AMIDA-3KS test system provides a lower cost, cost-optimized test solution for all consumer power management ICs and portable product components. The AMIDA-3KS tester provides 6 board slots in the test head for the required number of analog board channels, thus reducing the overall system procurement cost, making the cost-effectiveness of each board channel 2 times higher and more flexible. The customer's product testing time is greatly shortened.
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Software
From embedded low-level essentials like built-in-test and operating system board support packages, to advanced middleware for board and system health monitoring, image processing and autonomy support, Abaco's ever-growing software suite gives developers what they need to implement their application solutions.
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High Impact Shock Test System
KRD16 series
High impact shock test system meets MIL-S-901D standard which covers shock testing requirements for ship board machinery, equipment, systems, and structures, excluding submarine pressure hull penetrations. The purpose of these requirements is to verify the ability of shipboard installations to withstand shock loadings which may be incurred during wartime service due to the effects of nuclear or conventional weapons.
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PC Controlled Low Voltage Tester
Cablescan S9
The Cablescan S9, with a 9-board Expansion Cabinet, may be ordered with 1 to 9 low-voltage 128-point scanner boards. Fully loaded with scanner boards, this tester provides 1152 test points.
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ScanWorks Boundary-Scan Test
ScanWorks Boundary-Scan Test
The Boundary-Scan Test (BST) Development Software is one of the several configurations of the ScanWorks boundary-scan (JTAG) test and on-board programming environment. Test engineers can quickly develop interconnect tests and device-programming actions for use on first prototype board to accelerate the board bring-up process. Then tests can be exported for use in manufacturing and repair facilities.
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Wire/Cable Harness Tester
PANTHER 4HT
Qmax Test Technologies Pvt. Ltd.
The Panther 4HT Wire \ Cable Harness tester is designed for Automotive and Semiconductor industry to apply in testing of wire harnesses, that needs testing during production with whole new fleet of features that make the task reliable, complete and fast. It uses innovative technology to test the impedance values. It can be interfaced to any type of fixtures as required. It uses the Learn and Compare technique for finding out opens or shorts in a harness. The learnt open / short combination from a Good Board is taken as reference and compared with the Board Under Test for any mismatch.
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Supported Test Systems
TTCI is a leading solutions provider of application development for test systems from Seica, Keysight, Teradyne, Digitaltest, and XJTAG. We offer a wide variety of testers and test solutions to meet your needs. Our Seica Pilot and Digitaltest Condor flying probe systems can handle all of your low- to mid-volume production, prototypes, and PC boards with accessibility issues. The Keysight 3070 and Teradyne TestStation can address your larger production runs and fixture requirements. In addition, we can also address your functional and boundary scan needs.
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Cardboard Puncture Tester
DRK104A
Shandong Drick Instruments Co., Ltd.
DRK104A cardboard puncture tester is used to test the corrugated board anti-pierced performance (puncture strength). It has the snap-operating handle, automatic reset and safety protection function. It is the indispensable instrument for carton manufacturing plants, research and quality supervision, inspection and other enterprises and departments.
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Design for Test
Test Coach offers Design for Test (DFT) consulting to assist customers with design review of prototype boards prior to release for production. Design for Test analysis is extremely important in ensuring that an assembly will achieve the highest possible test coverage. For ICT, this DFT will review the board to confirm that the bed-of-nails test fixture can be fabricated to test an assembly without sacrificing test coverage. As with ICT, Flying Probe benefits from DFT analysis by reviewing test point access and mechanical challenges that may affect the potential test coverage. Completing a DFT enables Test Coach to make recommendations to our customers that may be implemented on boards during the design phase which will allow for the most comprehensive coverage at time of test.
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ATE
QT 200 NXG
Qmax Test Technologies Pvt. Ltd.
QT 200 Nxg a Highly sophisticated ATE, is now available as a desktop unit with the cost, flexibility, and performance demanded by a large number of users in research, design, manufacturing, and repair & maintenance industry. It is a combinational-mixed signal board tester for PCBAs designed to cater the needs of PCB test and repair depots, keeping in mind the changing PCB technology and challenges in testing them offline with the combination of all such complex test methodologies in a single test hardware platform with simple to use graphical user interface software.
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DUT Boards
RTI designs and manufactures DUT boards for many types of special purpose test equipment including: ESD test systems, special purpose functional testers, automated curve trace equipment, as well as standard semiconductor test equipment. All designs are performed in-house using PCB design software (Mentor PADS, CAM350) and 3D mechanical design software (Solid Edge) if required. PCB fabrication is sub-contracted to one of our long-time fabrication partners.
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ScanBridge
JT 2154
The JT 2154 is an experiment board based on National Semiconductor’s STA111 device, aimed at users looking to utilise addressable bridge/multiplexors within their designs, and thus set-up ‘system level’ JTAG access. The unit can also be used in semi-permanent installations to expand the TAP (Test Access Port) count on JTAG Technologies controllers in order to address highly segmented designs. Built-in support for ScanBridge-type devices within ProVision allows easy set-up of TAP assignments and device addressing.
