Burn-In
The application of current, typically at high temperatures, over periods of time to detect infant mortality.
See Also: Burn-In Boards, High Power Burn-in, Burn-In Sockets, PCB Inspection
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Memory Burn-In Test
The N3500 is Neosem Technology’s fourth generation memory test system. Specifically designed for Flash Components and Flash Cards, the N3500 tester-on-a-board architecture targets the broadest range of DUT technologies in various form factors and packages. Each Tester Board (or “Blade”) contains 288 I/O pins and 32 DPS supplies.
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Burn-in and Test Sockets
Loranger International Corporation
Loranger International Corporation designs and manufactures thousands of socket styles for the burn-in and test of semiconductors and electronic components. Some of the socket styles are listed below.
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Automated Production Testing
Automated production testing is critical in today’s competitive manufacturing environment. Companies can no longer rely on variable costs, non-uniformity, and potential health hazards that come with a laborer-based manufacturing line. This is no less true for sound and vibration tests, ranging from in-process burn-in tests to product validation and verification tests.
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Photonics Test Solutions
Chroma offers precision instruments such as laser drivers, photodetector monitoring, and temperature controllers. These lab class instruments are often intefrated into production solutions for wafer probe test, burn-in and device or module characterization with inspection, metrology, robotics, Industry 4.0 and more.
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Burn-in or Rapid Temperature Cycling Chamber
KDL Series
The Bemco KDL series is designed for production testing of electronic circuit boards and completed electronic systems. They accept Bemco KDLC Carts that have a working area of 42 wide by 60 high by 48 deep suspended on insulated runners and casters 11 inches above the test area floor.
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Wireless Digital Multimeter 6000 count / NCV / SPT / Anti Burn Protection and with free "K" type temperature sensor (-40°C ~ 250°C).
MS-W2036P2T
This is a Palm size, external wireless connectivity Digital Multimeter integrated with 6000 Count, True RMS auto and manual measurement.
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AC/DC Leakage Current Tester
228
Test for dangerous leakage current with the Simpson Model 228, designed to meet the latest UL, IEC, and ANSI specifications. The 228 detects both AC and DC leakage current and simulates human response at three different levels -- reaction, let-go, and burn hazard. Each Model 228 comes with test leads with alligator clips, manual, and batteries.
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Flash Point
At which temperatures will your sample burn, ignite, or cause fire? How are your flammable liquids composed, and what are their properties? Volatility is directly related to a substance‘s flash point temperature (flammability). Anton Paar’s flash point testing equipment safely and easily determines the values you require for the processing, storage, transportation, and classification of dangerous liquids.
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RELIABILITY BOARD (Reliability Test Board)
The reliability test board is used for testing of HAST, THB, HTOL, BURN-IN, etc. It is a product that evaluates the environmental test and durability when applied to actual products such as lifetime test, high temperature, low temperature, high humidity and thermal shock
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Multisite Probe Card
T300 ButtonTile™
The Celadon T300™ probe cards are designed for long-term, multi-site, high-density wafer level reliability or burn-in tests up to 400°C. In today’s economic environment, conventional reliability data is needed quickly while eliminating the cost, electrical stress, and delay of parts packaging while maintaining a wafer performance map.
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Burn-in and Stress Screening Chambers
KDR
Supervise the operation of your product, electronic device, circuit board, or medical device while they are stress screened, burned-in, or temperature cycled inside a Bemco Kardburn or Koldburn glass front chamber. With a huge amount of testing or storage space within instant reach, KD Chambers provide a compact and attractive alternative to a walk-in chamber.
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Environmental Test Chamber
High and Low Temperature Test Chambers, ESS Environment Stress Screening, 2 Zone Thermal Shock Test Chamber, 3 Zone Thermal Shock Chambers, Walk-In Chambers, Burn-in Room and Aging Test Chambers, Altitude Chambers, Industrial Drying Oven, Salt Spray Test Chambers, Temperature Humidity Vibration Comprehensive Test Chamber, Test Machine Series, Custom Made Environmental Test Equipment, Double-Layer High and Low Temperature Chamber, Explosion Proof Temperature Chamber For Power Battery, etc.
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Open Top BGA Sockets
Ironwood has the most comprehensive collection of open top BGA and QFN sockets that can be used for qualification application, silicon FIB testing, system development, thermal characterization, burn-in application, etc. IC socket can be defined as an electromechanical device, which provides removable interface between IC package and system circuit board with minimal effect on signal integrity. Typical packages include BGA, LGA, QFN, QFP, WLCSP, etc. Open top allows access to the top side of IC. Below is an example BGA socket that uses low cost elastomer contact technology.
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Loopbacks
Loopbacck plugs are used for network diagnostics, system configuration testing, and device burn-in. Looping back the signal allows for testing of the optical network.
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DC Electronic Loads
An adjustable electronic load gives the test engineer the ability to qualify designs, check production batches or service and repair electrical products. Many applications demand an adjustable electronic load. These include the burn-in of new devices along with general power supply, battery, fuel cell and generator testing.Both static and fully dynamic DC loads are offered. With dynamic functionality 2 levels of load current can be set. The rise and fall time can then be adjusted together with the time period spent at each level. The load can also be made to follow complex waveforms by tracking an external arbitrary oscillator input.
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Burn-In Systems
OPTIMUM Series
Advanced Microtechnology, Inc.
The OPTIMUM product line of burn-in systems has a model to meet your individual testing requirements. Please select one of the models below for more specific information
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Laser Diode Reliability Burn-In / Life-Test System
58602
Chroma 58602 is a high density, precision multi source measurement Unit (SMU) module with temperature control and exchangeable interface developed for burn-in, reliability and life test of optoelectronic components including laser diodes, VCSELs, VCSEL Arrays, silicon Photonics, photo-diodes and other similar components.
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Flame Ionization Detector
A flame ionization detector converts a hydrocarbon gas concentration into an electrical signal. The flame is hydrogen fueled and burns in hydrocarbon free combustion air. Either side of the flame are two electrodes between which an electric field is generated by means of a polarization voltage. The sample is pre-mixed with the fuel gas and heated in the flame to a temperature at which the hydrocarbon molecules ‘crack’ and CH fragments appear. These CH fragments are oxidated by the oxygen in the ...show more -
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LED Burn-In Test
Burn-in system, based on LXI instrumentation, for concurrent testing of up to 80 DUTs in a climatic chamber. Devices to be tested include modern light emitting diodes and LED modules.The system consists of 2 control cabinets, each with 40 independent supply and measurement channels. Each channel can be configured individually via the operator software (current or voltage, including the relevant limit values). The software supports logging of current and voltage values for each DUT on all 80 chan...show more -
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Head Mounted Temperature Transmitters
Datexel manufactures a large range of head mounted temperature transmitters. Field proven and high accuracy are the ingredients in the Datexel range of head mount temperature transmitters. Low cost, fully isolated, PC programmable, direct or inverse output, up scale or down scale burn out are just some of the features available on the Datexel range of head mounted temperature transmitters.
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Multi-Channel Controllers
7000 Series
The new 7000 Series MultiSource Multi-Channel Controller is designed for applications requiring a large number channels in a cost-effective and compact solution. With both laser driver and temperature controller options, the MultiSource is an excellent building block for system applications such as device burn-in and characterization.
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Wireless Digital Multimeter 4000 count / NCV / SPT / Anti Burn Protection and with Max./Min./Max.-Min. display
MS-W2044P2
This is a external wireless connectivity Digital Multimeter integrated with 4000 Count, True RMS auto and manual measurement.
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IC Test Services
With knowledge gathered from decades of supporting Tier 1 and emerging industry leaders, Amkor understands test solutions must address advanced technology, quality, performance and cost of test. We offer full turnkey solutions including wafer processing, advanced bump, wafer probe, assembly, final test, system-level test, burn-in and end-of-line services.
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Memory Test System
T5230
T5230 memory test system for NAND/NVM devices adopts a combined array architecture to achieve best-in-class cost-of-test performance for wafer test, including wafer-level burn-in (WLBI) and built-in self-test (BIST). The system can perform on-wafer test of 1,024 memory devices per test head in parallel, delivering high productivity and enabling floor space savings of up to 86%. Multiple test cells are connected per system controller in the T5230, allowing independent wafer test of each test cell...show more -
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Memory Burn-in Tester
B6700 Series
B6700 can test as many as 48 burn-in boards in parallel at speeds up to 10 MHz, which helps memory suppliers get their newest products to market faster while also reducing testing costs. An original high performance chamber improves yield by assuring high temperature accuracy while generating high temperature. It also shortens the temperature rise and fall time which leads to shortening the test time.
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Polarity & Burn in Test Systems
Our polarity and burn-in test systems are available for components such as multilayer, disc type or hollow ceramics.
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Power-Switching Test System
High Voltage Switching Test System
The Accel-RF Power-Switching Test System is capable of measuring reliability under a variety of conditions for switching power applications up to 1kV (off) and 25A (on) at rates up to 1MHz switching frequency, dependent on voltage. By leveraging technology developed for the RF burn-in tray platform with new fast switching measurement techniques, this system can support testing of multiple devices under elevated temperature stimulus in a small physical area, and offers the flexibility to test both soft- and hard-switching applications. The Accel-RF Power-Switching System is the most flexible and accurate power switching platform available.
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AC & DC Loadbanks
Regular load bank testing of generators provides an essential health check service to prevent diesel engine failure due to wet stacking. Wet stacking occurs due to under loading of the genset which results in wet un-burned fuel building up in the engine. This fuel build up will over time line the combustion chamber cylinders and cause a reduction of the engines rating and efficiency which will ultimately cause premature failure of the generator. Running the generator on load of 50% - 100% of the genset rating will allow the engine to reach the recommend operating temperature, which will burn off the choke deposits.
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Thermal Protective Performance Tester (TPP)
Sataton Instruments Technology CO., Ltd
Thermal protective performance tester (TPP) is to determine the heat transmission of protective clothing or textiles exposed to flame and radiant heat resources. The tester which can provide thermal protection index (TPI) calculated by software is the recommended tool for evaluation the potential of second degree burn of the materials to block convective and radiant heat penetration. Analysis software can display real-time temperature curve and automatically detect heat time curve to show Stoll curve for rating the thermal protective performance of tested textiles.