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Ferroelectric Test System
LCII
Precision LC II is an affordable Ferroelectric Tester for research labs. This system offers 5Khz at 9.9V and also comes in a built in 10V, 30V, 100V, and 200V option. This unit can also be expanded to 10kV for bulk ceramic testing. Vision Software is provided with the LCII Test System. Vision uniquely allows the user to construct complex or simple programs with any number of tests to characterize all aspects of the sample in one execution while keeping track of the measurement results and the history of the sample being tested. Tasks such as Hysteresis, I/V, C/V, PUND, Waveform, Magnetoelectrics, Piezoelectrics are just a few features to choose from.
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OLED Lifetime Test System
58131
The 58131 Lifetime Test System is designed specifically for the OLED industry. Model 58131 provides twoquadrant constant current (CC) and constant voltage (CV) stimulus to each OLED panel and acquires electrical and optical characteristics automatically. Two independent and isolated precision source-and-measure units (PMU) are incorporated in one modular card, which is capable of testing two OLED panels. Additional instrument cards are added to expand test capacity. Hot plug and play is a key feature of 58131. When a UUT fails or an instrument card needs to be replaced, 58131 does not have to be shutdown and testing continues for other UUTs. Hot plug and play obviates life test cycle restarts due to isolated faults and significantly improves life test efficiency. We firmly believe that hot plug and play capability should be mandatory for all lifetime test systems.
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Programable DC Power Supply
ADG-L Series
14 models and three different output power, 4kW, 8 kW and 12 kW. Utilizing PWM technology, ADG-L delivers stable output and precise measurement. With CV, CC and CP mode, ADG-L series is ideal for Photovoltaic, Electric Vehicle, battery, fuse/capacitor and third party laboratory testing.
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High Power DC Electronic Load
33500F Series（2.4KW~14.4KW）
33500F Series has its own control and display panel, CC / CR / CV / CP / Dynamic modes, 150 sets Store/Recall memory which provides load set-up more efficiently, also can be remote controlled via GPIB、RS232、USB and LAN interface. SHORT time setting and SHORT_VH, SHORT_VL setting function, also can measure Short Voltage and Current.
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Semiconductor Device Parameter Analyzer and Measurement Modules
B1500A Series
Keysight B1500A Semiconductor Device Analyzer of Precision Current-Voltage Analyzer Series is an all in one analyzer supporting IV, CV, pulse/dynamic IV and more, which is designed for all-round characterization from basic to cutting-edge applications. It provides a wide range of measurement capabilities to cover the electrical characterization and evaluation of devices, materials, semiconductors, active/passive components, or virtually any other type of electronic device with uncompromised measurement reliability and efficiency. In addition, the B1500A’s modular architecture with ten available slots allows you to add or upgrade measurement modules if your measurement needs change over time.
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Mini Digital Clamp Tester (CE)
M-140HC
MULTI MEASURING INSTRUMENTS Co., Ltd.
*Easy!:Measurale Load Current at high voltage CV/CVT cables with grounding lines for shield phase.*Epoch-Making!:Can measure phase current of CVT cable just by putting CT head on to the conductors as well as CV cable just by clamping CT to the conductors in a lump.*Low Cost!:Can measure line/leakage current in the same manner as ordinary clamp meters.
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Single Channel Linear DC Power Supply
MPS-D+ series
Voltage stabilitySource effect CV≤0.01%+2mVLoad effect CV≤0.01%+2mVRipple and noise CV≤1mV(rms）CC≤5mA(rms）Voltage temperature coefficient 150ppm/°CCurrent stabilitySource effect CC≤0.2%+2mALoad effect CC≤0.2%+5mACurrent temperature coefficient 500ppm/°C
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PathWave IC-CAP BSIM3 Model Extraction Package
W7024E
The W8553EP IC-CAP BSIM3 Model Extraction Package provides complete measurement and extraction procedures for DC, CV and RF model parameters. The intuitive, Windows-style user interface enables engineers to quickly produce an accurate model.
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High Power DC Electronic Load
36000A Series（50KW / 60KW）
36000A Series has its own control and display panel, CC / CR / CV / CP / Dynamic modes, 150 sets Store / Recall memory which provides load set-up more efficiently, also can be remote controlled via GPIB、RS232、USB and LAN interface.SHORT time setting and SHORT_VH, SHORT_VL setting function, also can measure Short Voltage and Current.
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High Power DC Electronic Load
34000C Series（6KW~24KW）
34000C Series has its own control and display panel, CC / CR / CV / CP / Dynamic modes, 150 sets Store / Recall memory which provides load set-up more efficiently, also can be remote controlled via GPIB、RS232、USB and LAN interface.
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Controllable, Programmable Linear DC Source
LAB / S
*Linear laboratory power supply*High quality DC sources with the lowest residual ripple*CV / CC mode with LED display*Protection against short circuit, overload and overtemperature*Optional IEEE 488, RS232, analog interfaces*3-phase input optional
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Cryogenic Probe Station
CPX-VF
The Lake Shore CPX-VF probe station enhances the standard probe station capabilities with the addition of a ±2.5 T vertical field superconducting magnet. It can do all the standard C-V, I-V, microwave, and electro-optical probing of the CPX, plus out-of-plane vertical field superconducting magnetic measurements. Researchers can use it to perform Hall effect measurements and test magneto-transport parameters. The CPX-VF is one of Lake Shore’s premium probe stations for combining microwave measurements with magnetic field.
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High Power DC Electronic Load
3350G Series（4KW~6KW）
Each 3350G Series module has its own control and display panel, CC / CR / CV / CP /Dynamic modes, also can be controlled via RS232、Ethernet、USB and GPIB interface.
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High Performance High Power DC Electronic Load
IT8900 Series
IT8900 series of high performance high power dc electronic loads provide three voltage ranges 150V/600V/1200V. The power expands to 600kW by master-slave paralleling, and maintains stand-alone functions. 50kHz high speed measurement, six working modes, transient over-power loading capability, CV loop speed adjustment, Measurement function, 25kHz dynamic test and other multiple accurate testing functions make IT8900 series well-suited for types of high power applications.
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Semiconductor Switching Systems
Keithley 700 Series
The high speeds and low currents of semiconductor devices demand high quality, high performance switching of I-V and C-V signals. We offer switching solutions for both semiconductor R&D and production test applications with mainframes that can support up to 2,880 channels and a family of matrix cards designed specifically for semiconductor applications.
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Load Banks
PT04 Series
Quality ProductRugged and Reliable DesignCurrent control from 0 to 70A on 64V RangeCurrent control from 0 to 135A on 32V Range4kW plus rating (at 40°C ambient)Cost effective; simple robust designCC, CP, CR and CV modes as standardCurrent control from either ATE with0 – 5V demand input or from a RemoteControl Box (both standard)Ultra Low electrical noiseSelectable Range 64V or 32VTemperature controlled quiet fans19 Inch Rack case 4U
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Electronic Yarn Count System
Y006
Consists of an electronic balance (220 grams x 0.001 grams) with internal and external custom software which calculates yarn, sliver and roving counts as well as fabric yield in various systems and provides statistics on any number of tests including totals, average, CV and SD
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Power Supplier QS3020 30V
*16 hours at full load*Low ripple and noise*Automatic switching CV / CC*Aluminum heat sink*Displays 3 or 4 digit depending on the model
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Reference Electrodes
Reference electrodes are widely used as: electrochemical measurements (CV, LSV, DPV, etc.) electrochemical devices (detectors for HPLC, biosensor, etc.)
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Cryogenic Probe Station
EMPX-HF
The Lake Shore EMPX-H2 probe station enhances standard probe station capabilities with the addition of a ±0.6 T horizontal field electromagnet. All standard C-V, I-V, microwave, and electro-optical probing, plus in-plane horizontal field electromagnetic measurements can be performed on this versatile station. Researchers can use it for testing magneto-transport parameters. The EMPX‑H2 is Lake Shore’s premier probe station for vector-dependent magneto-transport measurements.
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Machine Vision Computer with Built in I/O
Neousys Nuvis
Nuvis-5306RT , Nuvis-534RT, Nuvis-7306RT contain interfaces for connecting to all necessary devices: LED lighting controller, camera trigger, encoder input, PWM output and digital I / O lines.- Intel® 7th Gen Core ™ i7 / i5 65W / 35W, up to 32GB DDR4- Built-in I / O- 4-CH CC / CV backlight controller- 4-CH trigger camera- 1-CH quadrature encoder input- 8-CH isolated DI and 8-CH isolated DO- Built-in camera interfaces- 4-CH IEEE 802.3at Gigabit PoE + ports- 4-CH USB 3.1 Gen1 ports- NVIDIA 75W GPU Support
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LED Test Programmable DC Electronic Load
IT8912E Series
IT8900 series high accuracy LED specific testing electronic loads can simulate the real output of LED lights with different characteristics.Their specific circuit can realize CR-LED mode, adjustable frequency, duty ratio PWM dimming output port (frequency: 20Hz-2KHz), I-pp/I-max measurement function can test current ripple and start up surge current of LED constant flow source. Voltage and current testing speed can reach 50KHz. IT8900 series provides CR-LED / CC / CV + CC / CR /CW and other working modes, built-in USB / RS232 / GPIB communication interface. Widely used in LED driver power dimming test.
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6kW Regenerative DC Electronic Load (CC/CR/CV/CP/CC+CV/CR+CV)
PLZ6000R
PLZ6000R is a DC electronic load that regenerates load power to the AC line. Regular electronic loads consume load power by having semiconductor devices convert it into heat. By contrast, PLZ6000R converts load power into reusable electric power, rather than converting it into heat as is typically done, and feeds this power to the AC line, thereby substantially reducing the amount of waste energy. PLZ6000R is an environment-friendly electronic load that can contribute significantly to your energy saving efforts.
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Software
MOS Doping Profile Analysis
Materials Development Corporation
MDC uses the comprehensive Ziegler algorithm toconvert pulsed MOS C-V data to a doping profile. The doping profile is accurate from the oxide semiconductor interface to the maximum depletion depth and is therefore useful for low dose ion implant monitoring. Peak doping, range, and total active dose are computed. The technique is sensitive enough to resolve changes in the substrate doping profile due to redistribution during oxidation.
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Copper Diffusion TestSystems
Materials Development Corporation
MDC announces the addition of software and hardware for copper diffusion studies to its CSM/Win suite of semiconductor test systems and software. This new CSM/Win feature plays an important part in the development of processes and materials for the next advance in integrated circuit technology that employscopper as a conductor. Special Current-Voltage Bias-Temperature Stress (IV-BTS) software can measure the degradation of insulator quality due to copper diffusion.Multiple test sites can be stressed with a constant voltage while the current through each site is measured and recorded. The Current-Voltage Bias-Temperature Stress test supplements conventional MOS C-V measurements and Triangular Voltage Measurements (TVS) that are also employed in copper diffusion studies.
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Vacuum Chambers
CV 400/CV 250
The CV 250 and CV 400 are vacuum chambers for altitude flight simulation for avionics instruments such as altimeters, rate of climb indicators and all non pressurised equipment. They are fitted with pneumatic and electric connectors and a quick locking door.
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High Slew-Rate High Power DC Electronic Load （100A/μS）
34110A-11（10KW）
34000A Series has its own control and display panel, CC / CR / CV / CP / Dynamic modes, 150 sets Store / Recall memory which provides load set-up more efficiently, also can be remote controlled via GPIB、RS232、USB and LAN interface.
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Test Software
American Probe & Technologies, Inc.
This new series of software allows you to analyze materials or semiconductor leakage with all of the capabilities of your HP 4140B to resolutions of 1 fA @ 100VDC. Completely rewritten in Visual Basic for Windows XP operating system, it offers Virtual Front Panel Operation of 4140B for I-V & CV Analysis and allows operator to virtually control the 4140B for any instrument operation. I-V Plots with options of displaying current over time. CV Plots with high resolution plotting capability.
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Software
Quasi-Static Measurements
Materials Development Corporation
The Quasi-static measurement ompares a high frequency capacitance-voltage plot to a C-V plot measured near zero Hertz (quasi-static). By analyzing the difference in the depletion region of the curves, the interface trap density (Dit) can be determined in the sample under test.
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DC Electronic Load
3110 Series（250W~700W）
Each 3110 Series stand-alone load has its own control and display panel, CC / CR / CV / CP/ Dynamic modes, also can be controlled intranet via RS232 and USB interface.
