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Charge-Coupled Device
Devices for recording images, typically consisting of an integrated circuit (IC) with an array of coupled capacitors.
- Blackline Safety Corp.
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Loner Connected Safety Devices
Loner solutions are wirelessly configurable from Blackline Live with profiles that remove the guesswork related to managing a world-class safety monitoring program.
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Charge-Coupled Devices ("CCD") Cameras
Improve limits of detection and quantification. The camera generates large amounts of data, but handles it smoothly via the new super speed USB 3.0 interface.
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Device Networking
Offers complete control of how and when the application can discover, connect, disconnect, and get status from the USB device across the network.By integrating the SDK, you can create your own user interface and make it work seamlessly with your application.The SDK supports searching device servers on the network.Supports getting information and status from the USB device server.
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Device Tester
DeviceTester is an easy, fast and convenient way to test NTCIP communication between a central controller and a field device. DeviceTester is a database product that can mimic the functions of a traffic device or serve as a testing tool. The main purposes of the tool are to provide a method of testing the functionality of a new device, or aid in troubleshooting a device that is not functioning as expected. It can automatically check all device OIDs, perform automatic error simulation and create result logs and reports for your records. DeviceTester is based on a powerful database structure and includes interfaces for simple and advanced testing. All data can be exported in a variety of formats for additional custom reporting.
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Loading Devices
Educated Design & Development, Inc.
Built-in fans provide sufficient coolingSelf-contained unit eliminates hazards due to exposed wiringFine tuning mechanism allows for ultra precise measurementsUnits are on casters, providing a portable test station!
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Input Devices
In fact, our in-house electronics production capabilities, incorporating the most advanced technological trends, streamline and ease our customers’ ability to bring their concepts and designs to fruition. From complete assembly through automated placement of components on foil, our automated production machinery brings precision and reliability to the production process, while skilled manufacturing staff oversee and control all aspects of manufacturing. Post-production inspection then ensures that our – and our customers’ – highest standards are met.
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Passive Devices
Fiber Splitters, Muxes, CWDM, DWDM, WDM, PON, Fiber Jumpers, Fiber Attenuators.
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Device Test Automation for Android OS devices
QUIKSTRESS™
New testing platform designed for lab and live testing. The platform was adopted by a leading Wireless Service Provider to support both device pre-launch and device reverse logistics processes. In the pre-launch process the devices are tested with all the applications loaded on the device exercising real end-customer usage scenarios and ensuring there are no adverse impacts on user experience under varying network and device stress conditions. In the device post-launch process
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Aircraft Interface Devices
AID
Versatile Ballard Aircraft Interface Devices (AIDs) from Astronics offer a secure, open-architecture approach that empowers you to take control of your software and your data today and prepares you to leverage and incorporate the next-generation technologies of tomorrow, including the Internet of Things (IoT) for the aircraft.
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Device Interface
Providing flexible, dependable services for device interface design, development, ordering, production, and support. The importance of the device interface has greatly increased, as high speed, high density semiconductor devices are more rapidly developed, and as customers more severely demand high accuracy, high reliability, and high productivity of testing.
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Clock Distribution Devices
Analog Devices offers ultralow jitter clock distribution products that fan out given signals for wireless infrastructure, instrumentation, broadband, ATE, and other applications demanding subpicosecond performance. Our clock products are ideal for clocking high performance analog-to-digital converters (ADCs) and digital-to-analog converters (DACs). ADI clock ICs integrate PLL cores, dividers, phase offset, skew adjust, and clock drivers in small chip scale packages.
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High-Voltage Test Device
PGK 150 / 5 HB
BAUR Prüf- und Messtechnik GmbH
Cable testing and diagnostics with the BAUR PGK H. There are hardly any other longer-lasting, more robust and cost-effective testing devices than the two-piece high-voltage test devices from the PGK HB series. They generate continuous adjustable test voltages with mains frequency or optionally DC with positive or negative polarity. The display instruments for current and voltage, the safety control unit and the regulating transformer for the voltage are integrated in the operating unit.* Testing of medium- and high-voltage cables* DC voltage testing of up to 150 kV output voltage with positive or negative polarity* AC voltage testing - up to 110 kV for switchgear, busbars and insulating elements* Easy-to-maintain 2-piece design
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Monitoring Devices
TDK Monitoring Devices - rf shielded hd video camera, rf shielded hd mini video camera, camera controller
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Device Parameter Analysis
bsw TestSystems & Consulting AG
The complexity of DC Parametric Characterisations has significantly increased with the level of miniaturisation in the semiconductor industry. The demand is not only on the precision of the measurements. New measurement methods have emerged to gain insight into phenomena previously unknown or only of marginal relevance. One example is "Pulsed IV" which is now widely in use. The modular concept of the Keysight B1500A allows users to tailor their instrument exactly to their needs. Flexible upgrades ensure the investment for many years. Together with bsw AG you will get an optimum solution for your application. Our experts provide not only support for the instrument itself but have also working knowledge of all the solutions surrounding it. This includes Cabeling and Adapters, Fixturing for packaged Parts and of course Wafer Probing. We help customers from replacements of broken or worn-out parts to planning and deployment of turn-key-systems.
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High-Voltage Test Device
PGK 260 HB
BAUR Prüf- und Messtechnik GmbH
Cable testing and diagnostics with the BAUR PGK HB. There are hardly any other longer-lasting, more robust and cost-effective testing devices than the two-piece high-voltage test devices from the PGK HB series. They generate continuous adjustable test voltages with mains frequency or optionally DC with positive or negative polarity. The display instruments for current and voltage, the safety control unit and the regulating transformer for the voltage are integrated in the operating unit. *Testing of medium- and high-voltage cables * DC voltage testing of up to 260 kV output voltage with positive or negative polarity * AC voltage testing - up to 190 kV for switchgear, busbars and insulating elements * Easy-to-maintain 2-piece design
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Test And Simulation Devices
BreakingPoint
Control global threat intelligence at Internet-scale to create massive-scale, high fidelity simulation and testing conditions for battle-testing infrastructures, devices, applications, and people.
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High Power Devices
SemiProbe configures our PS4L Adaptive Architecture into the Voltarus (TM) family of probe stations to fulfill the unique requirements of testing high power devices at wafer level prior to packaging. Voltarus probe stations are available in manual, semiautomatic, and fully automatic configurations that can test and characterize power devices up to 10 KV or 200 Amps (pulsed).
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Collaboration Devices
VIA family of True-Collaboration™ solutions: VIA Collage for more complex meeting spaces and VIA Connect PRO for huddle spaces and small to mid-sized meeting rooms.
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Measuring Device
CAN-Bus Tester 2
Gesellschaft für Mikroelektronikanwendung Chemnitz mbH
The CAN-Bus Tester 2 is a widely used measuring device for control of bus parameters. The success story starts already in year 2002 with the first model. The hardware was completely redesigned in version 2. The corresponding software is still developed and has been enhanced with extensive updates.
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Microwave Devices
Photonis Defense and its predecessors have been designing and manufacturing Traveling Wave Tubes (TWTs) since their invention in the early 1940’s. Photonis manufactures helix-type tubes that are constructed using the industry standard metal-ceramic construction. Our tubes are conduction cooled and feature rare earth periodic permanent magnets for power-free focusing.
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Connection Devices
Our Connection Devices include Network Media for Ethernet, ControlNet™, DeviceNet™, Power Media, and Safety Connection Systems. We offer many products for DC Micro (M12), AC Micro (1/2), MiniPlus (1, 1-1/8), Mini (7/8), Pico (M8), and M23: cordsets, patchcords, V- and Y-cables, splitters, field attachable connectors, and receptacles. Our I/O Wiring Systems include interface modules and cables that connect through pre-wired cables to digital and analog I/O. We offer several IEC and NEMA terminal blocks to meet your needs.
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Digital Multimeter Device
Digital Multimeters measure voltage, resistance, current, capacitance, inductance, and temperature. Some models also have an isolated digitizer mode. Use these products to test consumer electronics, fuel cells, aerospace production, and more.
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Pinhole Detection Devices
ElektroPhysik Dr. Steingroever GmbH & Co. KG
The coating control by means of pore testing makes use of electrical voltage in order to uncover microscopically small defects (> 20 μm) in the coating of a surface. If even a small defect can be detected during pore testing of surface coatings, urgent action is required. Minimal flaws in the coating are sufficient to cause great damage.
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Gas Metering Device- Ancillary
TR143 Gas Regulator
The TR143 is a double diaphragm , spring leaded direct acting type regulator with integrated large surface area filter. The optimised valve head, venturi sensor, and low body pressure drop allows maximum capacity flow at very low inlet pressures.
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Magnetic Field Press Device
Sometimes, magnetic application technology that can achieve results that push the limits of your products. Magnet-related equipment plays an important role in various fields such as electronics, metals, and physics.
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Analog Output Device
The Analog Output Device helps you create applications such as stimulus-response, power supply control, deterministic control, and sensor/signal simulation. The Analog Output Device supports various output resolutions, channel counts, and other onboard features, so you can replace several kinds of instruments in your system, including stand-alone proportional integral derivative (PID) controllers, low-speed arbitrary waveform generators, and function generators.The Analog Output Device includes the NI-DAQmx driver and configuration utility that simplify configuration and measurements. NI-DAQmx supports NI programming environments as well as Python, ANSI C, C#.NET, and MathWorks MATLAB® software.
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Digital Reconfigurable I/O Device
The Digital Reconfigurable I/O (RIO) Device features user-programmable FPGA for onboard processing and flexible I/O operation. You have complete control over the synchronization and timing of all signals and operations along with custom onboard decision-making that executes with hardware-timed speed and reliability. You can configure user-defined hardware for a wide variety of applications, such as custom digital DAQ, high-speed waveform generation, sensor simulation, hardware-in-the-loop (HIL) test, custom digital communications protocols, bit error rate testing, and other applications that require precise timing and control.
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Device Testing
The BTL Working Group (BTL-WG) has developed a test package which contains a set of testing procedures. These can be acquired and used by manufacturers to pre-test their products for BACnet compliance before they send their products to an RBTO (Recognized BACnet Testing Organization) for BTL Testing. The BTL Test Package is available on the test documentation page.
