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- Pickering Interfaces Inc.
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Mass Interconnect
Mass Interconnect is a mechanical interface that simplifies connection between the power supplies, instruments and switching to the Device Under Test (DUT) in a test environment. In the illustration here, a test receiver is connected to the front of the modular instrumentation, in this case, a PXI chassis.
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InCal VNA Calibration
ATE has developed a revolutionary calibration and error correction methodology that can completely eliminate the need for operator intervention. This technology: Eliminates the need to attached calibration artifacts to the instruments. Allows the system to be automatically calibrated at any time without operator intervention. Permits calibration with or without the DUT connected.
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Device Measurement EXpert (DMX)
S94601B
Device Measurement eXpert (DMX) is a measurement configuration assistant that aides users in setting up and optimizing complex measurements for various types of devices. The customizable wizard guides users through DUT connection, measurement setup, and display. DMX provides repeatability across the workflow by automatically setting up measurements in a consistent and optimal manner.
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±6 kV ANSI/ESDA/JEDEC HBM Test System
HBM-TS10-A
High Power Pulse Instruments GmbH
*±6 kV Human-Body-Model (HBM) tester according ANSI/ESDA/JEDEC JS-001 standard with C = 100 pF, R = 1.5 kΩ discharge network*Wafer, package and system level HBM testing*True HBM: the classical discharge network of the HBM-S1-A according the standard ensures compliant waveforms for all load conditions*No trailing pulses*Integrated 10 kΩ charge removal resistor*Integrated DUT HBM current sensor for real time transient current monitoring with 1V/A output sensitivity into 50 Ω digital oscilloscope input*Integrated DUT HBM voltage sensor for real time transient voltage monitoring with 1/200V/V output sensitivity into 50 Ω digital oscilloscope input*Integrated overvoltage protection of the DUT voltage sensor, DUTcurrentsensor and DC test interface for efficient overload protection of the digital oscilloscope and SMU during high voltage HBM testing*Integrated DC test DUT switch with automatic switch control*Integrated 50 Ω precision hardware trigger output for high speed digital oscilloscopes*Fast HBM measurements, typically 0.5s per pulse including one-point DC measurement between pulses*Eficient sofware for system control and waveform data management (fully compatible with TLP measurement data)*The sofware can control automatic probers for fast measurements of complete wafers*Compact size 145 mm x 82.5 mm x 44 mm of the integrated HBM pulse generator probehead*System controller size 483 mm x 487 mm x 133 mm*High performance and high quality components*Optionally available hardware upgrades to all HPPI fully integrated HBM/HMM/TLP/VF-TLP test systems TLP-3010C, 4010C, 8010A, and 8010C
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PXI-4130, ±20 V, ±2 A DC, 40 W PXI Source Measure Unit
779647-31
±20 V, ±2 A DC, 40 W PXI Source Measure Unit - The PXI‑4130 is a programmable source measure unit (SMU). It has a single isolated SMU channel that offers a four-quadrant output that incorporates remote (4‑wire) sense. With its five current ranges, it is ideal for transistor characterization that requires accurately sourcing a constant current or voltage while sweeping another current. The PXI‑4130 also includes a utility channel that can source either current or voltage. This PXI SMU can act as either a constant voltage source or a constant current source, with a settable compliance limit for either mode. In addition, you can enable remote sense on the SMU channel to maximize voltage output and measurement accuracy on your device under test (DUT) for high-precision applications.
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Optical Spectrum Analyzer Module
OSAPXIe
OSAPXIe enables new measurement capabilities in PXI for truly effective mixed-signal testing. Conduct all your DUT characterization from one platform and spend less time switching cables and patchcords between instruments.
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Semiconductor Testing
The integrated PXI platform and the open interfacing provides extension capabilities for additional testing requirements like DUT specific resistors-networks or temperature sensors. The Test System comes with the ready-to-run GTSoftware package and allows easy programming of test sequences (GTbuilder) and fast execution in production/test mode (GTengine).
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DUT Matrix 32 DUT Matrix Channels
40-530-021
The 40-530-021 is a high density 32x8 1 pole reed relay matrix. Typical applications are signal routing in functional ATE and data acquisition systems. It consists of highly reliable sputtered ruthenium reed relays that offer >10e9 switching cycles to ensure maximum switching reliability with a long service life and stable contact resistance. Larger arrays can be built by daisy-chaining the common signals from multiple PXI modules
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NED-LMD Near-Eye Display Measurement Systems
NED-LMD W-Series
The world’s first wide field of view near-eye display light measurement device coupled with an integrated precision spectroradiometer that ensures single snapshot, high speed, high spectral accuracy characterization of AR, VR, MR and Heads-Up Displays. The benchtop instrument features a large 158deg field of view, motorized focus lens and a small 5mm entrance pupil to emulate the human eye. Its robust design and easy-to-use software with automated Device-Under-Test (DUT) Pass/Fail analysis allow it to be easily integrated on production lines.
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Signal Generator Frequency Extenders
FES
These frequency extension modules easily connect to the output of your signal generator so you have high-performance source for your DUT characterization activities. Characterize your DUT with the confidence that the superior performance in terms of output power, spurious and harmonic will provide product accurate results.
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Two-Quadrant SMU For Battery Drain Analysis, 20 V
N6781A
The Keysight N6781A is a source / measure unit (SMU) designed specifically for the task of battery drain analysis. Whether the device under test (DUT) is an eBook reader, MP3 player, mobile phone, or pacemaker, the N6781A’s seamless measurement ranging, programmable output resistance, and auxiliary DVM combine the best set of advanced features on the market for battery drain analysis. When used with the 14585A Control and Analysis software, the N6781A becomes an even more powerful battery drain analysis solution, offering additional insights into your measurements. Learn more about the 14585A Control and Analysis software.
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DC Power Module, 8 V, 6.25 A, 50 W
N6732B
The Keysight N6732B 50 W basic DC power module provides programmable voltage and current, as well as measurement and protection features at a very economical price. Use this module to power your DUT or ATE system resources, such as fixture control.
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2-Quadrant Source/Measure Unit for Functional Test, 20 V, 1 A or 6 V, 3 A, 20 W
N6782A
The Keysight N6782A is a source/measure unit (SMU) designed specifically for advanced functional testing of a device. The ability to modulate the output up to 100 kHz along with capability to source and sink current (2-quadrant operation) makes the N6782A a perfect fit for advanced functional test of a variety of devices such as DC/DC converters, power management units, power amplifiers, and power management ICs. The input stage of the DUT can be stimulated by the fast sourcing and waveform capabilities. While the output stage can be loaded down and measured with the electronic load capabilities, providing a total test solution.
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PathWave Lab Operations For Battery Test
EP1150A
PathWave Lab Operations for Battery Test enables efficient planning and coordination of your entire battery test laboratory. It manages all resources, including test fields, test systems, and your device under test (DUT). PathWave provides an integrated, web-based lab management platform that helps you modernize your test workflows, eliminating legacy paper-based processes, and increasing data integrity and traceability.
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Automatic Calibration Module
ACM2520
ACM2520 is an automatic calibration module that can be used with all CMT Vector Network Analyzers operating in frequency range up to 20 GHz. It is a fully automatic USB-controlled and powered electronic calibration module. Minimizing the number of steps required by technicians reduces the risk of human error and expedites the calibration process. Automating the calibration routine also reduces wear and tear on the analyzer and RF cables. To perform full 2-port calibration, each end of the ACM need only be connected to the analyzer once, as opposed to 18 connections with a traditional calibration. The ACM also contains a factory characterized 20dB in-line attenuator which acts as a simulated device under test (DUT). The confidence check feature loads the factory stored DUT into memory so proper calibration can be verified.
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Multi-Channel Attenuation Control Unit (4-channels), DC to 6 GHz, 0 to 121 dB, 1 dB Step
J7204A
The J7204A is a multi-channel (4-channels) attenuation solution for signal attenuation and conditioning of up to 4 devices under test (DUT). Operating frequency from DC to 6 GHz, with 121 dB, 1 dB steps. Exceptional 0.03 dB insertion loss repeatability per section for the entire 5 million cycles and excellent attenuation accuracy and flatness, the J7204A reduces cost of ownership and provide the best measurement accuracy.
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35/50 GHz 2/4 Port TDR/TDT Remote Sampling Head for the 86100D DCA-X
N1055A
Bandwidth options: 35 or 50 GHz (upgradable)Edge speed (10-90%, typical): 18 ps (35 GHz) or 7 ps (50 GHz)Channel options: 2 or 4 per module (upgradable) with independent skew control and up to 16 channels per 86100D mainframe Ultra-thin remote head: 1.6 m phase-stable cable, 2.92 mm (35 GHz) or 1.85 mm (50 GHz) connectors, and integrated 67 GHz diode limiters for ESD/EOS protection TDR fixture de-embedding removes effects of fixtures, cables or probes connected between remote heads and DUT
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Single Board Source/Meter/Switch
SMSU
SMSU Series SourceMeterSwitch Unit (SMSU), introduced by SW Link Ltd, is single-channel voltage/current sourcing, 4X6 switch matrix and measurement instruments. Each Series 100 SMSU instrument tightly integrates highly accurate stable DC power source and a true instrument-grade programmable gain amplifier and 18bits ADC on a 100x100mm PCBs. It can output up to 20V, sub-uA to 1A current to device under test (DUT)
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Signal Conditioning With SLSC
Switch Load and Signal Conditioning standardizes the "last mile" between the measuring device and the device under test (DUT) in hardware and software. SLSC is a modular extension for data acquisition products such as PXI and CompactRIO.
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High Current SMU 600/1200/2400 A
AXC85xx
Generate extremely short, fully regulated current pulses in 4 ranges. At the same time, carry out measurements directly on the DUT with the integrated VMU and CMU. Perfect for rapid semiconductor tests during production.
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Exchangeable Cassette Kit for 6TL36 Faraday Chamber
AN134
Exchangeable plates for RF applications. (Use with RF Kit, P/N AN133)).DUT maximum dimensions: 340 x 350mm
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High Current SMU Family 2000 A
AXC76xx
Generate very short, fully regulated current pulses from 2 ms to DC with up to 2000 A. Carry out measurements directly on the DUT with the integrated CMU and VMU.
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60 GHz Noise Figure Test Set
The Noisecom 60 GHz Noise Figure test set has 4 separate systems designed to perform Y-factor noise figure measurements using a high performance Spectrum Analyzer or a dedicated receiver. Each system contains a highly stable V-band noise source, isolator(s), optional waveguide to coaxial transitions and an optional pre-amplifier for use with a spectrum analyzer. The two standard calibration tables have ENR data points at 1 GHz intervals.* System ENR is measured before the DUT connector and at the final output stage allowing for pre-test calibration of the system.
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Single connector for a HG cable, and two HM connectors
MVNA-8-350-2
The lower part of the Central Unit model MP-8-350-2 has a single connector for a HG cable, and two HM connectors (Fig. 9). Two Harmonic Mixers can work simultaneously, for instance HM2 detecting transmission through the DUT, and HM1, at port 3 of a directional coupler, detecting reflection from the DUT.
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Compact Antenna Test Range
700.00 MHZ – 110000.00 MHZ
A Compact Antenna Test Range (CATR) allows electrically large antennas to be measured at a significantly shorter distance than would be necessary in a traditional far-field test range. Compact ranges use a source antenna (feed) to radiate a spherical wave in the direction of a parabolic reflector, collimating it into a planar wave for aperture illumination of a Device under Test (DUT). It's lowest operational frequency is determined by the size of the reflector, its edge treatment and the absorbers. The two edge treatments available are serrated edge for general purpose applications, and rolled edge to achieve higher accuracy for special applications. Multiple-feed systems may be used to improve the far-field characteristics. A compact range test system also allows system level testing of a complete device architecture.
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Emulate Test in simulation
STIL-VT
Emulate test patterns in simulation environment with DUT simulation model. The simulation allows pre-silicon debug of test patterns. Reads the intermediate STIL format of tester patterns and creates a Verilog /VHDL simulation test bench. (A sub-set of Virtual tester solution)
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Bit Error Rate Tester
100G NRZ BERT
The C-BERT 2810-4 is a complete bit error rate tester dedicated for 100G Ethernet applications. The four independent channels enable an actual operating environment with traffic on all lanes. The simultaneous testing of 4 channels is much faster than testing each channel individually saving time and money. The BERT eye scan reveals low-probability events and shows the true performance of the DUT to aid troubleshooting. The high RF port density eliminates long cable length which degrades the signal at 25 Gb/s. The OS independent GUI is easy to install and enable remote control from everywhere. The complete and compact C-BERT is a powerful and cost efficient test solution for 100G Ethernet.C-BERT MI-PE2810-4 Product sheet_rev05.
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Flexible Cable, 3.5 Mm (Test Port) To 3.5 Mm
85131E
Achieve phase stability with this 96.5-cm cable when a DUT is connected, with adapter, directly to the test set port
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Dynamic Digital I/O With Per Channel Timing, Programmable Logic Levels And PMU PXI Card
GX5296
The GX5296 offers advanced dynamic digital I/O performance and capabilities in a single slot, 3U PXI format. The 32-channel, GX5296 features timing per pin, multiple time sets, data formatting, and an advanced sequencer – providing users with the capability to emulate and test complex digital busses for system, board or device test applications. Offering sub-nanosecond edge placement resolution per pin and a PMU per pin, the GX5296 has the ability to perform both DC and AC parametric testing. Each digital channel can be individually programmed for a drive hi, drive lo, sense hi, sense lo, and load value (with commutation voltage level). In addition, each channel offers a parametric measurement unit (PMU) providing users with the capability to perform parallel DC measurements on the DUT (device under test).
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Adjustable Multisite Rail System™
The Celadon Rail System allows multi-site testing capability with flexible die to die spacing using existing Celadon VersaTiles™ to minimize cost of test with new DUT structures. The modular design allows for additional site assemblies and rail assemblies to be added after the original system purchase. With the Celadon Light-Tight Enclosure and Rail System Tool, high accuracy alignment and testing can be performed at extreme temperatures without affecting the thermal equilibrium of the system.
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Power Module, 100V, 3A, 300W
N6776A
The Keysight N6776A is a 300 W basic DC power module that provides programmable voltage and current, measurement and protection features at a very economical price, making these modules suitable to power the DUT or to provide power for ATE system resources such as fixture control.
