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Data Pattern
Produce data patterns for the assurance of logic circuits and digital semiconductors.
- TEAM SOLUTIONS, INC.
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Acute 112-Channel, 16-Event, 400Mbps, 256Mb/channel, Data/Pattern Generator
Acute DG3128B
Model / Data Channel / Event Channel / Pattern DepthDG3064B / 48 / 16 / 256Mb/ch (max)DG3096B / 80 / 16 / 256Mb/ch (max)DG3128B / 112 / 16 / 256Mb/ch (max)
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FMC, XMC & PMC
The FPGA Mezzanine Card is used by Data Patterns to implement signal interface with external world compatible FPGAs mounted on the FMC carrier there are primarily used for high speed analog interface for digitization (ADCs) and waveform generation (DACs). This form factor is also utilized for special I/O Interfaces such as various avionic protocols and buses. FMC I/O signals may be routed via front panel connectors or through Mezzanine connectors that route the signal back to the carrier board for routing through rear I/O of the Chassis. The system interface is designed for routing to FPGAs using a VITA 57 0.05 Pitch Terminal Array Assembly.
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VXI
VXI stands for VME eXtensions for Instrumentation. It is an open standard first developed by five leading Test and Measurement companies in 1987 to standardise a backplane capable of developing open, interchangeable instrument modules that could be used to build Automatic Test Equipment (ATE).Data Patterns designs and markets a wide range of VXI modules, some of which are listed below. Due to the use of the latest technologies, Data Patterns VXI modules offer the highest I/O density available in the industry today.Further enhancements of functional capabilities are achieved by the use of VXI IP carriers and VXI M Module carriers. This extends standard functions available from Data Patterns in these mezzanine architectures to the VXI platform.
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Bi-Sector Array Antennas
*Dual 33 degree beam antennas with a 65 degree pattern foot print*Multi-band capable*IIndependent tilt control for each beam**RemoteElectricalTilt (AISG 2.0)*Increase site capacity & data throughput
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Reticle Manufacturing
An error-free reticle (also known as a photomask or mask) represents a critical element in achieving high semiconductor device yields, since reticle defects or pattern placement errors can be replicated in many die on production wafers. Reticles are built upon blanks: substrates of quartz deposited with absorber films. KLA’s portfolio of reticle inspection, metrology and data analytics systems help blank, reticle and IC manufacturers identify reticle defects and pattern placement errors, thereby reducing yield risk.
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PCI Fault Insertion Switch Range for Differential Serial Interfaces
50-200/201
Pickering Interfaces, a leading supplier of modular signal switching for electronic test and simulation, is expanding its range of PCI Fault Insertion switching with the introduction of two new modules (models 50-200 and 50-201) designed for use with differential serial interfaces. PCI Fault Insertion Switch Cards for Differential Serial InterfacesThe new modules include the Differential PCI Fault Insertion Switch (model 50-200) which is designed for lower data rate serial interfaces such as CAN and FlexRay, and the High Bandwidth Differential PCI Fault Insertion Switch (model 50-201) which is designed for higher data rate serial interfaces such as AFDX and 1000BaseT Ethernet. Each module allows the introduction of fault connections that include data paths open, data paths shorted together, and data paths shorted to externally applied faults such as power supplies and ground. The software driver defaults to a protective mode where conflicting faults are prevented to avoid accidentally shorting unintended paths, such as power to ground. A separate mode allows complete freedom in setting fault patterns.
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Digital/Pattern/PE Card
PE32H
The PE32H represents a new level of performance andcapabilities for PXI-based digital instrumentation. Basedon the proven architecture of the PE32, the PE32Hoffers high performance pin electronics and an enhancedtiming generator in a compact, 3U PXI form factor. Eachcard can function as a stand-alone digital subsystem orif required, multiple cards can be interconnected,supporting up to 256 bi-directional pins (8 boards). ThePE32H also supports deep pattern memory by offering32M of on-board vector memory with dynamic per pindirection control and with test rates up to 66 MHz.With new 32M log memory, PE32H can capture 32channels data or fail log .
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Acute 80-Channel, 16-Event, 400Mbps, 256Mb/channel, Data/Pattern Generator
Acute DG3096B
Model / Data Channel / Event Channel / Pattern DepthDG3064B / 48 / 16 / 256Mb/ch (max)DG3096B / 80 / 16 / 256Mb/ch (max)DG3128B / 112 / 16 / 256Mb/ch (max)
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PAM4 Bit Error Rate Tester
Shenzhen Golight Technology Co.,Ltd
Golight PAM4 BERT integrates a 4-CH or 8-CH multistage pulse pattern generator (PPG) and a highsensitivity error detection (ED) to achieve BER measurement of data transmission in 200Gbps and 400Gbps. PAM4 BERT provide the best solution for automated production testing of 200G and 400G highspeed optical transceiver.
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EBSD Detector
Symmetry
Electron backscatter diffraction – is a powerful microanalysis technique that enables rigorous characterisation of the micro structural properties of crystalline materials. A high performance EBSD detector is critical for the effectiveness of the technique, influencing both speed and data quality. Symetry is Over 3000 indexed patterns per second (pps). Up to 30x faster than existing CCD-based detectors. Extreme sensitivity for low current and low kV analyses. Megapixel resolution for HR-EBSD applications. High resolution patterns (at least 156 x 128 pixels) at all speeds.
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Compact Anechoic Chambers
If you have mmmwave or THz antenna phased-array that require Over the Air measurements, MilliBox has the equipment and tools that you need. With the help of MilliBox compact anechoic chamber system, you can plot radiation pattern , collect data from those plots, and assess your antenna performance easily and precisely.
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Line Scan Camera
Piranha4
The Piranha4 cameras offer advanced features such as sub-pixel spatial correction, areas of interest (up to 4 at a time) to reduce data processing and simplify cabling, as well as dual-line area mode to double line rate, HDR mode, shading and lens correction. The Piranha4 is built for the real world with features to ease system integration. The advanced GenICam compliant user interface makes it easy to set up and control camera parameters such as exposure control, FFC, white balance, gain, test patterns, diagnostics and more.
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Acute 48-Channel, 16-Event, 400Mbps, 256Mb/channel, Data/Pattern Generator
Acute DG3064B
Model / Data Channel / Event Channel / Pattern DepthDG3064B / 48 / 16 / 256Mb/ch (max)DG3096B / 80 / 16 / 256Mb/ch (max)DG3128B / 112 / 16 / 256Mb/ch (max)
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PXIe-6536, 32-Channel, 25 MHz, 100 MB/s PXI Digital I/O Module
779988-01
32-Channel, 25 MHz, 100 MB/s PXI Digital I/O Module—The PXIe‑6536 can continuously stream data over the PXI Express bus. It's an ideal solution for interfacing and testing image sensors or display panels. The module is also well-suited for other common digital applications such as pattern I/O, change detection, protocol emulation, or other custom digital interfacing. It features selectable voltage levels and per-channel directional control of the digital lines.
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VME64x IP Carrier Module
DP-VME-5121
Data Patterns DP-VME-5121 VME IP carrier board is a 6U VME bus card that provides an electrical and mechanical interface for four industry standard IP modules. The board provides full data access to the IP modules I/O, ID and memory spaces. The programmable registers are used for configuring and controlling the operation of IP modules.Each IP module supports two interrupt requests. The VME bus interrupt level is software programmable. The software configured interrupt modes are:a.Single level interrupt mode: All IP module interrupts can be mapped to a single VME bus interrupt level.
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PCIe-6536B, 32-Channel, 25 MHz, 100 MB/s Digital I/O Device
782630-01
The PCIe-6536 can continuously stream data over the PCI Express bus. It's an ideal solution for interfacing and testing image sensors or display panels. The module is also well-suited for other common digital applications such as pattern I/O, change detection, protocol emulation, or other custom digital interfacing. It features selectable voltage levels and per-channel directional control of the digital lines.
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VLSI Test Systems
50/100 MHz clock rate50/100 Mbps data rate1024 I/O pins (Max :1280 I/O pins)Up to 1024 sites Parallel testing32/64 M pattern memoryVarious VI sourceFlexible HW-architecture (Interchangeable I/O, VI, ADDA,)Real parallel trim/match functionTime & frequency measurement unit (TFMU)High-speed time measurement unit (HSTMU)AD/DA test optionSCAN test option (max 1G M/chain)ALPG test option for embedded memorySTDF tools supportTest program/pattern converter(J750, D10, V50, E320, SC312, V7, TRI-6020, ITS9K)User friendly windows 7 environmentCRAFT C/C++ programming languageSW (Software) same as 3380P & 3360P
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CPCI
Modules in compact PCI from Data Patterns are available for Data Acquisition and Control, Simulation, Communication Automatic test equipment, Rugged systems, Fail-safe systems, Computer controlled logic controls, Plant automation and similar requirements. Other I/O functions available from our IP and Mezzanine Module families can be directly integrated into our cPCI systems.Data Patterns has also pioneered cPCI derivatives such as 9U High Voltage systems, Multiple backplane support with Hot Standby Switchover capabilities. Continuous innovation enables MMI options such as CRT & LCD displays, Keyboards, Pointing devices, Finger print security devices and so on.
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Pulse Pattern Generator, 3.35 GHz, single channel
81133A
The Keysight 81133A single-channel 3.35 GHz Pulse Pattern Generator is the latest product in the long history of Keysights high-speed Pulse Pattern Generators. When timing and performance requirements are critical, for example in high-speed serial bus applications like PCI Express or Serial ATA, its fast rise times and low intrinsic jitter allow the precise and in-depth characterization of devices, e.g. receivers or backplanes. Like its predecessor, the Keysight 8133A, the new 81133A sets the standard for high-speed applications. The Keysight 81133A lets you test your DUT instead of the pulse or data source! For applications that require multiple output channels or multi-level signaling like pre- and de-emphasis (PCI Express) or squelch (Serial ATA), please refer to the 81134A.
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80Gbps Video Analyzer/Generator for DisplayPort 2.0 Testing
M42d
The Teledyne LeCroy quantumdata M42d Video Analyzer/Generator provides functional and will support compliance testing for video, audio and protocol of DisplayPort 2.0 and DisplayPort 1.4. The M42d supports legacy DisplayPort lane rates of 1.62, 2.7, 5.4, 8.1 Gb/s and the new DP 2.0 higher speed lane rates of 10.0, 13.5, & 20.0 Gb/s data rates with the new line coding—128b/132b. The protocol analyzer provides a snap shot status view and deep analysis using captures of incoming DisplayPort 2.0 streams from source devices including DSC/FEC compressed streams. The M42d’s video generator can be used for testing silicon as well as devices such as displays, USB-C adapters, extenders, etc. The video generator offers a large library of standard video timings and test patterns necessary for testing next generation high resolution displays.
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Advanced 3D Graphic
Geo Surface3D PRO
ScienceGL offers 3D visualization for extended GIS data that combines multiple layer terrain and multi-variable thematic map in one interactive 3D screen. Visualize Digital Elevation Model (DEM), land map, roads, satellite image, LIDAR data in the same screen. Combine terrain data with vector graphics, businesses thematic map, weather map, etc. Use transparancy to highlight more important data. The unique combination of GIS and multi-variable thematic maps helps to discover trends and patterns quickly and accurately. No other data presentation method comes close to expressing so much information within such a small space.
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Cable Testers
Passage test:Detects open wires, short circuits and faulty wiring. Pass / fail test using a given pattern cable. Finding intermittent connections.Save cable data for documentation purposes. Print wiring diagrams. Printing labels. Log and print error logs.Graphical representation of the wiring of cables, graphical comparison of two cables. Easy, intuitive, graphical tracking of individual wires of a cable.Quickly install quick-mount boards for a variety of connector types such as BNC, RJ45, Sub-D, flat-ribbon connectors, and many more.Easy connection to the PC via USB .Light Director System:LED-led assembly of connectors. Optional also with voice output. High degree of safety due to fault checking during assembly.
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Material Testing Software
TRAPEZIUM X
Windows 10 compatible TRAPEZIUM X can carry out various tests ranging from simple test control to complex custom-made patterns, using the industry's first data search and preview function, free layout reports, visual wizard settings, quick panel, and quick conditions lists.
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Digital Flight Control Computer
The Digital Flight Control Computer is a Quadruple Redundant Flight Control Computer designed by DRDO and ADE and manufactured by Bharat Electronics Limited. Data Patterns has designed and manufactured the Automated Test Equipment required for the validation of this DFCC.
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Test Pattern Generator Delay & AV Sync Analyzer
VQDM-100
Versatile compact and robust multi-purpose tool for R&D and glass-to-glass QA/QC Instant visual-aural quality estimation plus automatic latency, AV sync and 3D LR sync measurement Multi-channel time-line analysis, including video frames continuity testing 4 Light Sensors with vacuum caps, 4 Audio inputs (standard line levels) 2 channels of AV timing analysis, simultaneous measurements of Video and Audio Latencies Real time multi-channel data acquisition via USB port Unique sophisticated set of static and dynamic test patterns up to 1080p@60fps - see more details in separate VQL page Source of VQDM, VQMA2, and VQMA3 Test Patterns for VideoQ Analyzers Multi-format digital and analog AV outputs: HDMI, YPrPb, S-video, SPDIF, LR analog audio Networkable unit, easy expansion with any external USB storage device: live clips, user content, etc.
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MMW Field Sensors
ITS-9050
The Innovative Technical Systems ITS-9050 Detector is a sensitive, harmonic mixing detector designed to measure millimeter-wave free-space radiation. It is ideal for measuring radiation patterns of antennas inboth the near and far-field. The ITS-9050 employs a free-running dielectric resonator oscillator (DRO) and an integrated harmonic mixer with a waveguide RF input that either connects directly to a circuit under test or to an antenna for radiation detection. The resulting IF is amplified and detected by an IF log-detector that drives a front panel LCD voltmeter to provide an indication of signal strength. A DC output voltage from the log detector is available on a BNC connector to drive external data acquisition instrumentation. Also, a sample of the IF output is provided for measurement on a spectrum analyzer.
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VPX
The VPX standard defined by ANSI/VITA 46.0 is a modern derivative of the older VME standards that is primarily targeted at defence applications, leveraging latest technologies in high speed electronics in order to provide higher performance computing, improved ruggedisation and thermal management capability, higher I/O densities and improved maintainability due to better immunity to ESD. Data Patterns has designed and manufactured a broad range of VPX products required for high end Radar / Electronic Warfare / Image Processing and Sonar applications.
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Communication Test Set
Eye-BERT 100G
The Eye-BERT 100G is a low cost, full-featured, stand-alone communication test set with an integrated post equalizer eye opening monitor / scanner. Ultimate flexibility is provided with three different physical interfaces, 13 different configurations, and configurable transmit and receive clocks. The tester supports PRBS patterns up to 263-1 and select data rates from 1.25 to 29Gbps on up to 4 simultaneous channels. Front panel controls are also provided for stand-alone operation. Unlike competing products, fast post equalizer eye monitoring and scanning is included and can be performed on any input channel above 5Gbps.
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Multi-Wafer Test & Burn-in System
FOX-XP
The key features of the new FOX-XP test cell that contribute to the cost-effectiveness of the solution include the ability to provide up to 2,048 "Universal Channels" per wafer, which allows the system to test all the devices on the wafer in parallel. The new "Universal Channel" architecture allows any channel to be any function (I/O, Device Power Supply (DPS) or Per-pin Precision Measurement Unit (PPMU)). This enhanced architecture now allows customers to perform per pin parametric testing, more extensive digital pattern test with deeper data stimulus / capture memory (32M per pin), and deeper scan (768M) optimized for BIST/DFT testing.
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Clock Drivers
Multiple timing signals ("clocks") are required by CCDs, IR FPAs, and some CMOS image sensors to transport electrical charge across the array to a sense amplifier for conversion into image data. Pulse Instruments offers a line of "clock drivers" for generating these timing signals. The parameters of these clocks (clock rate, pulse width, pulse amplitude, rise- and fall-times, etc.) greatly influence the behavior and performance of the imaging device. Our products take logic-level inputs from a pattern generator and allow the user to adjust the output parameters to suit their device and testing requirements. Clocks can be "tweaked" in real-time to determine optimal operating parameters for a particular device, or else programmed in accordance with a test plan for automated production test.
