Device Under Test
a specific purpose component or module check; ex. substantial component of a PCB.
See Also: DUT, Unit Under Test, EUT
- Blackline Safety Corp.
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G7 Connected Safety Devices
Our G7 product line incorporates leading incident detection and advanced location technology with 3G and satellite communications to ensure seamless monitoring. From gas detection to lone worker monitoring and evacuation management, G7 has your teams covered.
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MEDTEQ Testing Services
The MEDTEQ facility has a medium range of test equipment as detailed below for testing to various standards. MEDTEQ reports have the equivalent status of a manufacturer's report, which is acceptable under medical device regulations for many regions, such as US, Europe, Canada and Australia. The reports contain a cover page, general description, sample identification (including photos), clause list (core evaluation), and test data. Unlike CB scheme reports, the test data section is a self contain...show more -
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Scalar Network Analyzers
An RF network analyzer used to measure amplitude properties like VSWR and Return loss of Device Under Test.
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6kV, 100 MHz High Voltage Differential Probe with Auto Zero Disconnect
HVD3605A
The HVD3000A series of high voltage differential probes cover the fullest range of applications, from 120/240 V switch-mode power supplies through 600 V class and 5 kV electrical apparatus. The table below provides a list of recommended probe models based on specific device under test applications.
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HandyScope HS6-DIFF With SafeGround & SureConnect: 200 MS/s, 250MHz BW, 4 Channel (256MS/ch), USB Differential Digital Storage Oscilloscope, Spectrum Analyzer, Voltmeter, Transient Recorder
HS6-DIFF-200XMSG-W5
The only oscilloscope in the world that has:- SafeGround, differential input channels that can be switched to single ended.-SureConnect, auto-detects a true connection between the probe tip and the device under test.- CMI interface.- USB 3.0 interface, 5Gb/s data transfer- Lowest noise
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Qualification Tester
LQ404
Computer Gesteuerte Systeme GmbH
The qualification tester LQ402 is designed to support up to 12 DUTs (Device under Test), for which the loads are installed in separate load boxes. The system consists out of 3 cabinets. One is for the electronic components with the primary measurement devices and the other two hold the 12 load boxes.
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DC Hipot Test Instrument
M100DC
Performs concurrent ground continuity test. ARC and OVERCURRENT detection circuits. Fast discharge of Device Under Test (DUT) and other test standards
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Electromechanical Transfer Switches up to 40 GHz
Fairview Microwave’s line of electromechanical relay transfer switches can be utilized for numerous applications to increase system level capabilities and can help simplify the overall design approach. With two input and two output ports, transfer switches can connect two different instruments with two devices under test. Additionally, they can be used as drop-out switches, for signal reversal or to bypass a component under test. These products are typically used in military communications and broadcast systems, SATCOM, test & measurement, instrumentation applications and are suitable for aircraft use.
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PXI Power & Sense Multiplexer, 2-Pole, 18-Channel
40-658A-002
The 40-658-002 is a PXI multiplexer combining a 2-pole 18-way power distribution MUX with a second lower power 2-pole 18-way MUX in a convenient single slot PXI module. It is ideal for power distribution where power and sense signals are required to be connected to an array of devices under test.
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Performance Board
The role of the performance board is accurate transmission of tester signals all the way to the device leads. Custom performance boards from ADVANTEST deliver support for DUTs (devices under test), as they become faster and smaller, with greater pin counts, and increasingly take the form of SMDs. ADVANTEST performance boards also support a host of test requirements, such as analog test, high-speed performance, and high-density, for testing state-of-the-art ICs.
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PXI Matrix Switch Modules
PXI matrix switch modules deliver low, medium and high-density switching of multiple channels in a single instance. They are organized in rows and columns to provide maximum flexibility, allowing you to connect any row to any column, making them ideal for routing multiple signals between your device under test and your instruments.
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Pressure Comparator (System E)
P014
AMETEK Sensors, Test & Calibration
The P014 hydraulic jack pump (System E) is an extremely effective pressure pump designed for easy, controlled, high pressure generation. Each comparator includes a 4 connection manifold, which can be used for the reference indicator, the device under test, a fine adjust, an isolation valve, or a fluid reservoir. The adjustable reference pressure port lets you set your reference gauge at the best viewing angle.
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Test Connector Components
Any flat substrate, or bumped substrate, can be compressed against Z-Axis Elastomeric Connectors to make contact. The picture illustrates a Z-Thru Z-Alloy Connector Frame used to connect the DUT (Device Under Test) to a circuit board.
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Reach-In Temperature and Humidity Control Chamber
The High Low Humidity and Temperature Test Chamber from Weiber are specially designed equipments that are used for testing a wide variety of products for their performance under alternating hot and cold temperature and humidity conditions. These test chambers are most commonly employed for the testing of electronic items, electrical devices and equipments, aviation products and other materials and find widespread usage in aerospace industries, electronics industry and scientific organizations in...show more -
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Bulk Current Monitoring Probe
MP-50
The Current Monitoring probes may be used whenever RF current measurements are required. Current measurements are made by placing a current carrying conductor within the “sensing” window of the probe and measuring the probe’s output voltage with an RF detector. Calibration of the probe permits the conversion of the voltages measured to current. Current measurements can be made over the frequency range shown in the transfer impedance curve furnished with each probe. There is virtually no loading ...show more -
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Artificial Power Supply Network
KH3763
Beijing KeHuan Century EMC Technology Co,.LTD
The artificial power supply network (also called the power supply impedance stabilization network) should be able to provide a stable impedance to the device under test in the radio frequency range, isolate the device under test from high-frequency interference on the power grid, and then couple the interference voltage to the receiver.
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Cantilever Spring Pin ULTRA
CONTACT Series
ULTRA® CONTACT Series offers high yield, durability and consistent performance under the most demanding testing environment. Our design offers easy integration to most test handler platforms and on automotive devices.
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1kV, 80 MHz High Voltage Differential Probe with 6m Cable and Auto Zero Disconnect
HVD3106A-6M
The HVD3000A series of high voltage differential probes cover the fullest range of applications, from 120/240 V switch-mode power supplies through 600 V class and 5 kV electrical apparatus. The table below provides a list of recommended probe models based on specific device under test applications.
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EMC Accessories
Complete your EMC test setup with the essential accessories to compliment the test equipment. Whether it is a LISN (or V-Network) to counteract interference from external power sources on conducted emissions from the device under test, probes to locate the near field sources of radiated emissions, receive and transmit antennas, or tripods for holding antennas in place, the Rohde & Schwarz catalog of EMC accessories provides the additional items you need for EMI and EMS measurements, guaranteed 100% suitable for use with Rohde & Schwarz EMC test equipment.
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DUT Prototype Board
DPB8800
The DPB8800 is an 11? x 14? PC board used to interface the tester with the Device Under Test (DUT). This board contains generous area for custom circuitry and extra relays. The DPB8800 is also available with standard solutions to test families of components like Op-Amps, Regulators, ADC?s and DAC?s. +/-15 V and +5 V are available to support circuitry biasing.
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Large Earth Resistance Tester
WA 180
Wuhan Sangao Electrical Test Installations Limit Co.
WA180 Type Large earth resistance tester,To test substation earthing network(4Ω), Hydroelectric and Thermoelectric Power Plant,microwave(10Ω),lighting rod(10Ω)etc.Using new type variable frequency AC power supply, And adopts microcomputer control and signal processing measures, Solved the problem of interference of the testing process, To simplify the test procedure, To improve the precision and accuracy of the test results, reducing test personnel's the labor intensity and the cost of testing.T...show more -
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NI-9224, ±10 V, 1 kS/s/ch, 24-Bit, Simultaneous Input, 8-Channel C Series Voltage Input Module
783862-01
±10 V, 1 kS/s/ch, 24-Bit, Simultaneous Input, 8-Channel C Series Voltage Input Module - The NI‑9224 performs differential analog input. With channel‑to‑channel isolation, your entire system, including the device under test, is protected from harmful voltage spikes up to the isolation rating. The NI‑9224 is simultaneous sampling with two options for filtering a low-latency filter or a 50/60 Hz rejection filter. The low-latency filter enables users to use this module in industrial or control applications while getting better external noise rejection.
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Customized Test Fixtures
Test fixture is a device designed to mount a device under test (DUT), equipment under test (EUT) and unit under test (UUT) in place and allow it to be tested by being subjected to controlled electronic test signals and procedures.
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Keysight Dual/Quad 4x8 Reed Matrix for 34980A
34933A
The Keysight 34933A module for the 34980A Multifunction Switch/Measure Unit gives you the most flexible connection path between your device under test and your test equipment, allowing different instruments to be connected to multiple points on your device under test at the same time. Dual 4x8, 8x8, or 4x16 2-wire configurations 64 2-wire or 128 1-wire cross-points High-speed reed relays Connections to the internal DMM Expandable via four 2-wire analog buses Relay counter ±150 V peak, .5 A switch, 1.5 A carry current
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Flex Socket Test Module
JT 2127/Flex Socket Test Module
The JT 2127/Flex STM memory socket tester is a family of hardware adapters specifically designed for the testing of of PCB-mounted DIMM & SODIMM sockets using a JTAG/boundary-scan controller and supporting software. The testing of memory sockets has always been troublesome for test and production engineers using JTAG/boundary-scan systems. Even when it is possible to create memory writes/reads from a boundary-scan compliant access device on the UUT (Unit Under Test), the initialization pro...show more -
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ISI Channel Boards
M8049A
The M8049A ISI channel boards can be used to emulate channel loss in receiver test setups. The boards are used to emulate channel loss for data rates of 32 Gb/s and higher. A choice of 21 PC board traces with different lengths can be inserted into the signal path. The trace lengths range from 0.8 inch (20.3 mm) to 22.3 inch (566.4 mm). By cascading the traces within one board or with another board, a wide range of channels can be emulated with very fine resolution of insertion loss steps. With their small size the ISI channel boards can be located closely to the device under test.
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NI-9228, ±60 V, 1 kS/s/ch, 24-Bit, Simultaneous Input, 8-Channel C Series Voltage Input Module
783861-01
±60 V, 1 kS/s/ch, 24-Bit, Simultaneous Input, 8-Channel C Series Voltage Input Module - The NI‑9228 performs differential analog input. With channel-to-channel isolation, your entire system, including the device under test, is protected from harmful voltage spikes up to the isolation rating. The NI‑9228 is simultaneous sampling with two options for filtering: a low-latency filter or a 50/60 Hz rejection filter. The low-latency filter enables users to use this module in industrial or control applications while getting better external noise rejection.
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Millimeter-Wave Noise Source, R-band, 26.5 to 40 GHz
R347B
The Keysight R347B noise source covers a 26.5 to 40 GHz frequency range. This waveguide noise source allows you to make accurate and convenient noise figure measurements on millimeter-wave devices. The R347B provides highly precise broadband noise at the input of the system or component under test. The noise figure meter then processes the ON/OFF ratio of noise power present in the system IF, and provides an accurate reading of noise figure and gain. The R347B noise source has remarkable ENR stability over time, which allows longer recalibration cycles and more accurate noise figure measurements.
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Motors and Resolvers
We design, manufacture and test highly reliable motion control devices for extreme environments that range from vacuum and the extreme cold of outer space to high pressure and temperature applications many miles under the earth's surface.
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NI-9229, ±60 V, 50 kS/s/ch, 24-Bit, Simultaneous Input, 4-Channel C Series Voltage Module
779785-01
±60 V, 50 kS/s/ch, 24-Bit, Simultaneous Input, 4-Channel C Series Voltage Module - The NI‑9229 performs differential analog input. The NI‑9229 is an effective general-purpose analog module because of its resolution, sample rate, and input range. With channel‑to‑channel isolation, your entire system, including the device under test, is protected from harmful voltage spikes up to the isolation rating. In addition to safety, isolation eliminates measurement errors caused by ground loops because the front end of the module is floating.
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JTAG 3rd Party Controller Support
Corelis offers support for a variety of devices and instruments from third-parties in an effort to provide existing test platforms comprehensive JTAG test execution with Corelis ScanExpress software products. Supported instruments include National Instruments PXI-655x HSDIO and Teradyne Di-Series modules. Corelis also provides support for JTAG testing with FTDI FT2232 ICs embedded on a unit under test (UUT).
