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Discrete Component Testers
check connected individual semiconductor components.
- Valhalla Scientific Inc.
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4314-Ki Wide-Range, Ultra-Safe Digital Igniter Tester
Featuring the intrinsically-safe internal circuitry of our storied 4314 igniter tester line, the 4314Ki begins the next generation of precision measurement instruments.
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The Lorlin© Impact Series
Discrete Component Tester is designed to test small signal and power semiconductor components in both single and multi-device packages or hybrids.. The automatic test system can be used in all test applications including incoming inspection, wafer probe, QC, engineering, production, final test, and high reliability. The system tests most all discrete semiconductors with reliable, accurate, and repeatable results.
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Analogue IC Tester
SYSTEM 8 (AICT)
The SYSTEM 8 Analogue IC Tester is the answer to testing analogue devices. The key feature of the AICT is its ability to functionally test all common analogue ICs and discrete devices in circuit. It is also capable of testing all types of analogue and digital components by means of the well-known, power off V-I test technique. For users requiring only the latter function, please select the Analogue Test Station section.
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Benchtop Discrete Component Tester
Imapact 7BT
The 7BT Benchtop Discrete Component Tester is designed to test small signal and power semiconductor components in both single and multi-device packages or hybrids.. The 7BT automatic test system can be used in all test applications including incoming inspection, wafer probe, QC, engineering, production, final test, and high reliability.
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Impact Series Power Discrete Semiconductor Tester
The Impact Series Discrete Component Tester is designed to test small signal and power semiconductor components in both single and multi-device packages or hybrids.
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Bit Error Rate Tester - PXI
BERT 1001/1005 Series
The BERT is 2 or 4-channel PPG and Error Detector for the design, characterization and production of optical transceivers and opto-electrical components at data rates up to 30 Gb/s.With scalability and exceptional signal fidelity, it is a cost effective test solution for 400 Gb/s communication eco-systems.
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Automated Coherent Receiver Tester
CoRx Tester.
Quantifi Photonics’ CoRx Tester provides automated measurement of key coherent receiver performance parameters. The CoRx Tester is comprised of a pre-configured PXI chassis, a two-channel tunable laser, a polarization controller, and a two-channel Variable Optical Attenuator (VOA) with built-in power meter. Just connect the two optical outputs to your Integrated Coherent Receiver (ICR), connect your ICR to the oscilloscope and let the CoRx Tester software do all the rest.
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PAM4 Bit Error Rate Tester.
BERT-1102
The BERT-1102 is a 4 or 8-channel PPG and Error Detector for the design, characterization and manufacturing test of optical transceivers and opto-electrical components with symbol rates up to 29 GBaud/s in both NRZ and PAM4 formats. With scalability and exceptional signal fidelity, it is a cost-effective test solution for up to 400 Gb/s communication eco-systems.
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Passive Component Integration - MATRIQ
The Passive is a highly customizable benchtop accessory that can integrate the passive components of your choice for convenient storage and integration into your test set up.We can customize the Passive module with a wide range of passive components: WDM couplers, splitters, circulators, band-pass filters, PM beamsplitters, MUX, DeMUX and more.Our spec sheet contains a selection of popular configurations.Please contact us to discuss your specific requirements at sales@quantifiphotonics.com.
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PXI Vector Component Analyzer, 100 kHz to 32 GHz
M9816AS
The PXI vector component analyzer enables complex multiport device characterization with continuous wave and modulated signal measurements.
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PXI Vector Component Analyzer, 100 kHz to 53 GHz
M9818AS
The PXI vector component analyzer enables complex multiport device characterization with continuous wave and modulated signal measurements.
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Passive Component Integration - PXIe
Passive Series
The Passive PXIe module is a highly customizable PXIe module that can integrate the passive components of your choice.We can customize the Passive module with a wide range of passive components: WDM couplers, splitters, circulators, band-pass filters, PM beamsplitters, MUX, DeMUX and more.Our spec sheet contains a selection of popular configurations.Please contact us to discuss your specific requirements at sales@quantifiphotonics.com.
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ABex PXI to Analog Bus Bridge with Digital IOs
ABex AM-300 Controller
The ABex system controller ABex AM-300 is required to control the analog bus of a ABex chassis. It is used as an interconnection bridge between PXI and ABex backplane.In addition it features a whole bunch of additional functionality. Despite the 96 open drain outputs it has galvanically isolated IOs, and communication interfaces.
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RLC Component And Bridge Testers
RLC measurement bridges allow all precision measurements on components, either directly or by remote control.
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KVS Rugged Igniter Tester With Current Monitor
4314
The Valhalla Scientific Model 4314 KVS Digital Igniter Tester is designed to provide extremely safe and reliable resistance testing of explosive or volatile devices. Proven uses include fuses, squibs, igniters, explosive bolts, automobile airbag initiators and many others.
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Component Testers
After a wafer is tested through front-end test and back-end test, the component tester tests this final component or package assuring its quality for the semiconductor makers. DDR, DDR2, DDR3 memory component testers.
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Components
The Brooks field-proven wafer transport robots and modules deliver high performance and low total cost of ownership to create manufacturing efficiency, accelerate innovation, and drive profits for today’s manufacturers.
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Automotive Power Discretes
ST offers a wide portfolio of automotive grade power discrete devices for reliable, robust and power-efficient automotive applications.
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Component Testers
Unlike other handheld instruments such as LCR meters that make measurements using an AC signal with a specific test frequency, the 830C measures capacitance by applying a constant current that briefly charges, then discharges the connected capacitor.
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Control Components
From power supplies to counters to temperature controllers, we have all needed components for a successful and complete automation solution.
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Discrete Switch Cards
Compatible for use on the VXI, LXI, and GPIB platforms, these switch products were formerly sold under the Racal Instruments brand name.
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Automated Discrete Semiconductor Tester (ATE)
5000E
Same Proven Technology as all 5000 Series Testers. High Speed Single Test Measure. Capable of Testing Multiple and Mixed Devices. 1KV Standard, 2KV Optional. 1NA to 50A Standard, 100A Optional. 0.1NA Resolution. Complete Self Test. Auto-Calibration. RDSON to 0.1MOHM Resolution. Windows Application Software. Optional Scanner. Optional Wafer Mapping. Optional Curve Trace. MOSFET, IGBT, J-FETTriac, SCR, Sidac, Diac, Quadrac, STS, SBS Transistor, Diode, Opto, Zener Regulator, MOV, Relay. UNDER $23,000.00
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16-CH Discrete Input 16-CH Discrete Output Modules
HSL-DO16-UC / HSL-DI16-UC
- Support 16 DI channels and 16 DO channels- Transmission speeds: 3/6/12 Mbps- RJ-45 phone jack for easy installation- Compact design to meet space limitation and cost-effective requirement- Fuse design to protect digital output channelover-current
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Active Components
MUD frequency doublers featuring Millitech technology are balanced resistive-mode multipliers covering full waveguide bands. Power flatness for a given input power level for these units is typically ± 2.0 dB across the band.
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32-CH Discrete Output Module
HSL-DO32-M-N/HSL-DO32-M-P
Slave ID consumption: 2 consecutive from odd"N" type for NPN sinking type outputSwitch capacity: Single channel 500 mA; all channels 60 mA at 24VDCPhoto couple isolation voltage: 2500 VrmsResponse time: ON→OFF: 180µs, OFF→ON :1.2µsLED indicator: Power, Link and Output statusPower supply: +10V to +30 VDCOperating temperature: 0 to 60°C
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Imaging Systems & Components
Thorlabs offers a wide selection of laser scanning, widefield imaging, and OCT imaging systems, including multiphoton microscopes, confocal microscopes, electrophysiology rigs, swept-source OCT systems, and spectral-radar OCT systems.
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Electronic Component Counter
ZE 300
REINHARDT System- und Messelectronic GmbH
Instead of the widely used photoelectric barrier technology a new measuring technology is used in the new electronic component counter ZE 300: The laser technology offers a measuring beam with higher energy density and therefore more precise counting and faster counting speed. The ZE 300 component counter is microprocessor-controlled.
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System Components
For demanding computational tasks, Rohde & Schwarz offers the versatile, flexible equipment you need for everyday use – from the system controller and switch unit to the test chamber. All feature excellent EMC shielding, reliable test results and modular solutions.
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System Components
System components and accessories complete the Bender product portfolio:Coupling devices for ground-fault monitoring at high voltages, analog measuring instruments, power supply units, interface converters and interface repeaters.Please contact us for advice regarding these and other system components.
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Lightwave Component Analyzer
N4373E
The new Keysight N4373E LightWave Component Analyzer offers the latest N5224B, N5225B, and N5227B network analyzers with 2-port or 4-port configurations. This LCA is the ideal measurement solution for tests of electro-optical components up to 67 GHz. It is the ideal test instrument for electro-optical components for 40G/100GbE, for 400Gbit/s and 1 Tbit/s coherent transmission systems, as well as Radio over Fiber (RoF) and aerospace and defense (A&D) electro-optical test applications.
