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ESD
ESD Testing Equipment includes Surface Resistance/Resistivity Meter, Electrostatic Field Meter, Wrist Strap Checker, and Constant Wrist Strap Monitors.
See Also: ESD Test, Surface Resistivity
- TEAM SOLUTIONS, INC.
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PCI Bus Analog Output Board, 4 Isolated Outputs, 14 Bit
APCI-3501-4
4 analog output channels Optical isolation 500 V Settling time 30 µs typ. 14-bit resolution (13 bit for 0-10 V) Output voltage: ±10 V, 0-10 V (switchable through software) Output voltage after reset: 0 V Each output channel has its own ground line (without optical isolation from the others) Driver capacity: 5 mA/500 pF Short-circuit protection, EMI filters Noise neutralization of the PC supply Creeping distance: 3.2 mm acc. to DIN VDE 0411-100 Watchdog for resetting the analog output channels (4 different time units: µs, ms, s, min) or as 12-bit timer (with interrupt possibility), when the watchdog function is not necessary2 digital input channels, 24 V, isolated 2 digital output channels, 24 V, isolated Noise immunity Test level: ESD: 4 kV Fields: 10 V/m Burst: 4 kV Cond. radio interferences: 10 V
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ESD Latch Up Tester
1100-ESD
Tokyo Electronics Trading Co., Ltd.
The Model 1100-ESD can easily and accurately perform ESD tests (HBM, MM) on ICs up to 64 pins. Also, all common pin combinations required by the standard can be realized.
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USB Isolators
USB isolators protect the communication interface between the host, such as a PC, and its peripheral. Utilizing iCoupler® digital isolation technology, Analog Devices offers USB 2.0 compliant SOIC components with data rates up to 12 Mbps that provide EMC protection and safety isolation, reduce design size and time, and lower system cost. Galvanically isolated USB μModule® (micromodule) transceivers integrate the USB interface with an isolated dc-to-dc converter for up to 2.5 W of isolated power and provide ±15 kV ESD. Whether for host, hub, bus splitter, or peripheral device, these transparent USB digital isolators are easy to use—they just work—all while meeting the demanding standards required for medical and industrial applications.
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Handheld ESD Simulator
Battery operated handheld ElectroStatic Discharge (ESD) generator up to 30kV.Discharge networks according to IEC 61000-4-2, ISO 10605, MIL-STD-461 CS118, DO-160 section 25 and many more standards.
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Special / Customer Spec. Crates
6U VME64x 6023 JLAB Crates
For the Thomas Jefferson National Accelerator Facility (JLAB) in Virginia (USA), a special version of the VME 6023 crate series with front to rear air-cooling was developed. “JLAB style” VME crates are available with standard VME/VME64 backplane and mechanics as well as with VME64x or VXS (see VXS section) backplane and IEEE 1101.10 compatible mechanics, (enhanced EMC and ESD shielding).
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ESD Tester
PurePulse
Grund Technical Solutions, Inc.
PurePulse is a flexible and efficient ESD tester for HBM, TLP, MM and HMM. Its 2-pin style setup reduces tester parasitics, it captures waveform data and can be automated to test thousands of pins without the need for a test fixture. Our PurePulse system was designed from the ground up to be customized to meet your testing needs, take a look at the features below and schedule a demo with us to learn more.
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Measuring and Calibration Stations
PCB
Is used to measure electric and magnetic fields of an ESD generator
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Ohm-Stat Ground/Circuit Tester to Test ESD Ground
Tests ground for all 110v electrical circuitsWill determine the status of all electrical groundsEasy to use LED lightsWarranteeProduct conforms to the ESD S.20.20 spec standardsIdentify electrical problemsUsed with the Ohm-Stat RT-1000 resistivity meter
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Electromagnetic Immunity Scanner
SmartScan BASIC
The BASIC is manually operated system for performing susceptibility scanning at the system level with minimal data storage capability. This system includes:1. Up to 8kV (optional. 4kV base) pulse generator for ESD susceptibility testing- Camera and camera shutter to take DUT picture and failing spots- Control computer2. Up to 8kV Probe Sets:- 1mm Hx/y Field Probe- 5mm Hx/y Field Probe- D=8mm Hz Field Probe- D=8mm Ez Field Probe- Contact API for custom design probes3. Manual input of testing location and failing condition over the DUT to be included in final report.
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Economy Combo Tester
780
The ACL 780 Economy Combo-Tester measures electrical resistance of wrist straps and heel grounders simultaneously and individually. This is a good alternative for companies seeking a personal auditing station but do not need to save data. Adjustable limits add versatility for ESD managers that may need to modify verification plans.
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Transceiver Module
Mornsun Guangzhou Science & Technology
MORNSUN transceiver modules include integrated high efficiency CAN, RS485, RS232 isolated transceiver module, protocol conversion module and serial port to ethernet transceiver module. These industrial bus transceiver with DIP, SMD, SOIC and DFN optional packages features compact size, surge and ESD bus protection, a maximum isolation voltage up to 5,000 VDC and a wide operating temperature range of -40°C to 85°C, even up to 105°C, etc. Coupled with the use of IC integrated technology, the isolated transceiver module can easily be embedded in the user's end equipment, and achieve fully-functional bus network connectivity and data communication. Check out these isolated transceiver modules with a reasonable price along with high performance and we hope that they are an ideal fit for your application needs.
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HBM Discharge Simulator
PSD-510
The PSD-510 is a low cost, light weight, battery powered Human Body Model (HBM) simulator designed to help customers determine the HBM ESD sensitivity of a device in accordance with ANSI/ESDA/JEDEC JS-001.
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ESD, Latch-up testing / design service
ESDdoctor
ESDdoctor consulting service can identify, diagnose, and solve any ESD/EOS problem quickly and definitively, at a surprisingly low entry cost. You can choose testing and diagnosis only, or add ESD design services to the consulting package. ESD, Latch-up testing: HBM (ANSI/ESDA and JEDEC) on packaged dies. MM (ANSI/ESDA and JEDEC) on packaged dies. Latch-up JEDEC on packaged dies TLP on packaged and bare dies.VF-TLP on bare dies.
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Ka-Band Silicon 5G Quad Core IC
AWMF-0108
The AWMF-0108 is a highly integrated silicon quad core IC intended for 5G phased array applications. The device supports four Tx/Rx radiating elements, includes 5 bit phase and 5 bit gain control for analog RF beam steering, and operates in half duplex fashion to enable a single antenna to support both Tx and Rx operation. The device provides 26 dB gain and +9 dBm output power during transmit mode and 28 dB coherent gain, 5.0 dB NF, and -28 dBm IIP3 during receive mode. Additional features include gain compensation over temperature, temperature reporting, Tx power telemetry, and fast beam switching using eight on-chip beam weight storage registers. The device features ESD protection on all pins, operates from a +1.8 V supply, and is packaged in a 48 lead 6x6 mm QFN for easy installation in planar phased array antennas.
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Electrostatic Discharge
Our electrostatic discharge (ESD) measurement and control solutions include charge plate monitors, sensors, resistivity meters, and voltmeters. Reliably monitor, measure, locate, and test for static electricity.
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Test and Analysis
ESDEMC Technology will calibrate; the Contact Mode ESD current waveform and tip voltage to 4 GHz and 30 kV, the frequency response of ESD Target & Adapter Line to 4 GHz, and the DC Resistance
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NF-Series Standard Models
The E-DRIV® NF-Series standard models feature an adjustable RPM setting on the tool and a selectable Soft Start mode. Engineered for high volume manufacturing applications the brushless motor design ensures durability and reduces the standard maintenance costs associated with brush type electric screwdrivers. The NF power tool is ESD certified, ensuring less than 1 Ohm at the bit tip. ESD management assures product quality, cost savings and a reduction in overall ESD failures.
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Wafer ESD Tester lineup
Hanwa Electronic Ind. Co.,Ltd.
◆Correspond to 300mm Wafer. This tester can measure LED or the large sizes Wafer, such as a system LSI. And Zap of HBM/MM can be performed. The Automatic destructive judging by V/I measurement can also be performed after Zap.◆Waveform guarantee in Zap needles. HED-W5100D carries out the calibration before shipment in the place of Zap needles. Therefore, Correlation of the Result of a Package Device becomes clear easily.◆Correspondence to Standards This Tester corresponds to the Standard of JEITA, ESDA, and JEDEC. A Zap unit adopts the plug-in system and also has the waveform of Customer's requests.◆Connection with TLP This Tester is the best for TLP Testing with deep relation of ESD. The protection circuit of a device with an ESD problem is investigated.
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2GHz programmable frequency dividerValon
3010a*
● 5MHz to 2GHz input● Accepts input signal <-30dBm● 50Ω RF outputs● Multiple 3.3V CMOS TTL compatible outputs● TTL division ratios down to 512 available● Rugged milled aluminum housing● RFI shielded construction● EMI/EMC enhanced circuitry● ESD protected● Suitable for frequency synthesis, clock division, clock distribution in electro-optics, molecular spectroscopy, particle physics, and general lab use.$279 plus shipping
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Digital Step Attenuators (DSA)
High linearity, fast switching time with broad bandwidth. Best-in-class attenuation error with fine attenuation steps. Most robust ESD protection available.
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Electrostatic Discharges
ESD3000
ESD3000 is the only ESD generator in the market using standard AA batteries to offer full flexibility to the user to replace them when needed.
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Edge Gateway
UBC-330
UBC-330 is a RISC computing box powered by a TI Sitara™ AM3352 Cortex®-A8 processor and equipped with 2 Gigabit Ethernet, 5 serial, 4 GPI, and 4 GPO ports. For industrial applications, the serial and GPIO ports feature rugged ESD and isolation protection to prevent system damage from power fluctuations. UBC-330 also supports multiple power input voltages and a wide operating temperature, making it the ideal solution for automation control in smart grid, industrial, and machinery automation applications.
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EMC / EMI / ESD Laboratory
As one of North America’s largest and most diversified product testing and engineering service providers, Trialon provides a comprehensive range of EMI/EMC, ESD and Electrical testing solutions. Our EMC Testing Laboratory is ISO/IEC 17025 accredited, as well as being an approved facility for both General Motors and Ford Motor Company. Plus, we provide multi-shift support to assure programs meet time lines. Trialon’s EMC team has NARTE-certified personnel that will provide you with reliable and cost-effective testing that complies with a wide range of industry standards.
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ESD Event Detector
PED-718
The PED-718 is a portable indicator that will help you quickly detect ESD events in your process. If you’re handling ESD sensitive devices, use the PED-718 to detect and count discharges as well as showing you the relative strength of each ESD event.
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ESD & Latch-Up Test System
Identify and help correct ESD and latch-up susceptibility issues on sensitive integrated circuit components prior to full-scale production with the Thermo Scientific™ MK.2-SE ESD and Latch-Up Test System. The MK.2-SE test system provides advanced capabilities to test high pin count IC devices to Human Body Model (HBM) and Machine Model (MM) ESD standards. The system’s pulse delivery design addresses wave form hazards such as trailing pulse and pre-discharge voltage rise, and performs Latch-Up testing per the JEDEC EIA/JESD 78 Method.
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Robotic ESD Tester
SmartZap
The SmartZap is a fully automated zap gun tester with automatic failure detection capability, providing far superior performance than manual zap gun test. It is complying IEC61000-4-2 test standard.
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ESD Testing & Latch-Up Testing Services
EAG is an industry leader in ESD testing (Electrostatic Discharge) and Latch up testing. Our highly experienced engineering team use their industry leading knowledge and years or real world experience of the latest semiconductor technologies, circuit design, and device physics to optimize our customer's ESD and latch-up results. Human Body Model (HBM) and Machine Model (MM), Charged Device Model (CDM), Latch-up, Transmission Line Pulse (TLP).
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Planar-Doped Barrier Diode Detector, 0.01 to 50 GHz
8474E
The Keysight 8474E is a high-performance detector using a gallium arsenide, planar-doped barrier detecting element. It features extremely flat frequency response over its entire band of operation and very good frequency response stability versus temperature. The Keysight 8474E is also very rugged with high resistance to ESD damage. The Keysight 8474E detector is available with a 2.4-mm (0.01 to 50 GHz) connector. This detector offers the options for optimal square-law loads (Option 102) and for positive polarity output (Option 103). Because the unit-to-unit frequency response tracking of this device is typically better than plus or minus 0.3 dB, no matched response option is offered.
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Stand-Alone Automated ESD Scanner
SmartScan 550
API's main hardware platform that most scan technologies can be integrated to this platform. 550 represents the four-axis robot arm size. It is a stand-alone model.:
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Pulsed IV-Curve Solutions
Pulsed IV-Curve Test and Analysis System is our new development for 2015. It is an advanced and compact pulsed IV-curve characterization system designed to simulate pulsed ESD events such as TLP, vf-TLP, HMM, HBM, EFT, and LV-Surge. It will monitor the transient voltage and current waveform during the pulse in ps or ns segment, and test the pre- and post-pulse status (leakage current, breakdown voltage, biasing current, static IV curve, etc) of the device under test (DUT), such as protection devices, semiconductors, circuit modules, touch panel sensor, etc.
