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Focused Ion Beam
A scanning electron microscope with the electron source replaced by a gallium ion gun. Used for fault analysis and modification of modern microchips and semiconductor devices. (http://www.empa.ch)
See Also: Beam
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TEM Lamella Preparation And Volume Imaging Under Cryogenic Conditions
ZEISS Correlative Cryo Workflow
ZEISS Correlative Cryo Workflow connects widefield, laser scanning, and focused ion beam scanning electron microscopy in a seamless and easy-to-use procedure. The solution provides hardware and software optimized for the needs of correlative cryogenic workflows, from localization of fluorescent macromolecules to high-contrast volume imaging and on-grid lamella thinning for cryo electron tomography.
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Trace VOC Analyzer
PTR-TOF 6000 X2
The new PTR-TOF 6000 X2 is our premium PTR-TOF trace VOC analyzer. We conceived a unique system comprising of a novel high-resolution TOF and IONICON’s PTR technology with the new “X2” features, for the ultimate PTR-TOFMS experience. X2 combines the latest generation of performance enhancing tools incl. the ION-BOOSTER funnel as well as the hexapole ION-GUIDE. The ion funnel focuses the ions into the hexapole ion guide which results in nearly lossless transmission of an extremely focused ion beam into the TOF mass spectrometer. This increases the sensitivity dramatically and also improves the instrument’s mass resolving power. Utmost resolution, sensitivity and lowest real-time detection limit are now available in a robust, transportable platform that is smaller and lighter than previous products.
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Microscopy Software/Hardware
ZEISS Atlas 5
Atlas 5 is your powerful hardware and software package that extends the capacity of your ZEISS scanning electron microscopes (SEM) and ZEISS focused ion beam SEMs (FIB-SEM). Use its efficient navigation and correlation of images from any source, e.g. light- and X-ray microscopes. Take full advantage of high throughput and automated large area imaging. Unique workflows help you to gain a deeper understanding of your sample.
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Focused Ion Beam Scanning Electron Microscopes
FIB-SEMs
Combine imaging and analytical performance of a high resolution field emission scanning electron microscope (FE-SEM) with the processing ability of a next-generation focused ion beam (FIB).
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Ion Beam Etch
Nexus IBE Series
Etch precise, complex features for high-yield production of discrete microelectronic devices and components with the NEXUS® Ion Beam Etch (IBE) Systems.
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Ion Beam Milling Systems
When material specimen surfaces are prepared for SEM or incident light microscopy, the specimen usually undergoes multiple processes until the layer or surface to be analyzed is machined with precision. Leica Microsystems’ workflow solutions for solid state technology cover all steps required for demanding high-quality sample preparation.
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Ion Beam Sources
Veeco offers the most comprehensive array of ion beam sources for a broad range of applications, including the industry's only Linear gridded sources.
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Ion Chromatography
930 Compact IC Flex
The 930 Compact IC Flex is a versatile ion chromatograph developed with a focus on the requirements of routine users.
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Ion Meter
It can measure pH value, and several kinds of buffer solutions can be selected to have one-point or two-point (up to5-point) calibration. The user can establish standard buffer groups and the meter can recognize 10 kinds of buffer solutions.
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Beam Characterization
Thorlabs offers a wide range of products that can be used for beam characterization. Properties such as intensity, degree of collimation, power, wavefront shape, and spectral properties can be measured.
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Ion Source Packages
RBD Instruments provides a wide range of sputter ion sources used for sample cleaning, and depth profiling. No matter what the application, RBD provides the highest performance at the lowest price.
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ION 100 Portable Ion Meter
The new addition to the Environmental Express Oakton product line features updates to measuring water quality easier and faster. The larger LCD display is 2.75 in. by 2.0 in. for a better viewing angle, and has indicators for battery life, stability, and calibration. The ION 100 meter measures pH, mV, ion concentration of 16 commonly measured ions, and temperature. The microprocessor-based meter features automatic calibration, automatic temperature compensation, function setup, self-diagnostics, automatic power-off, and low voltage display. The meter uses advanced digital processing technology, intelligently improving the response time and accuracy of your measurements. Easily switch units among pX, mol/L, and mg/L (ppm).
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Ion Pumps & Controllers
Agilent Vacuum (formerly Varian) offers a complete portfolio of VacIon ion pumps that provide various pumping speeds (from 0.4 to 1000 L/s). Agilent also supplies smart combinations titanium sublimation pumps (Ion CombiTSP) and Non-Evaporable Getter (Ion CombiNEG) pumps for clean and vibration-free environments.Agilent ion pumps and controllers can be customized in a number of configurations to satisfy your vacuum requirements. They are the best choice for those applications where stable ultrahigh or extreme-high vacuum (UHV or XHV) conditions are essential, such as: laboratories, large research facilities, medical devices, scanning electron microscopes, and surface analysis tools.
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Ion Beam Deposition
Create ultra-precise, high-purity, thin film layer devices with maximum uniformity and repeatability with Ion Beam Deposition (IBD) Systems.
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Expanded Beam Connectors
Amphenol Fiber Systems International
Expanded Beam uses a lens in front of the fiber to collimate the light coming out of the fiber. The lens expands the size of the beam from 9 um to 285 um for SM. Expanded Beam connectors have distinct advantages and disadvantages compared to Physical Contact connectors. Read our White Paper on Expanded Beam Connectors for more in-depth details.
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Benchtop Ion Meters
Benchtop Ion Meters for Cl (chloride), F (fluoride), Na (sodium), Ca (calcium), Br, (bromide), NH4 (ammonium), NH3 (ammonia), Cn (cyanide), Ag (silver), K (potassium), S (sulphide), Pb (lead), I (iodide), Cu (copper), Cd (cadmium)
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50% Beam Splitter
10725A
The 10725A 50% beam splitter, designed for beam diameters of 9 mm or less, divides the beam into equal parts. It transmits one part straight through, and bends the other part at a 90-degree angle. This optic is without housing and requires a user-supplied mount.
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*Beam Profiling For 266nm To 3000µm
Unlike a power meter that measures average or instantaneous Watts or Joules of the overall laser beam, knowing how the power is distributed within the beam is equally as important. As an example, if you want to cut something the power should generally be focused in the center of the beam to concentrate the power density in a very small area but if you were trying to weld something with all the power in the center you would poke a hole in the weld; requiring the power to be equally distributed as in a top hat profile.
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Beam Profiler Software
RayCi
CINOGY’s beam profilers are available with the specifically designed beam profiling software RayCi, which utilizes new developed correction algorithms and incomparable visualizations modes. This ensures the highest accuracy in beam profile analysis according to ISO standards.
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Ion Sensor
984v2
The Meech Model 984v2 Ion Sensor is an easy-to-use device for checking the performance of both AC and DC powered static eliminator bars.
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Beam Bender
10726A
The Keysight 10726A bends the incoming beam at a 90-degree angle and is designed for beam diameters of 9 mm or less. This bare optic requires a user-supplied mount.
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LED Collimated Beam Sensor
LA-300
Panasonic Industrial Devices Sales Company of America
LED Collimated Beam Type, which is as accurate as a Laser Sensor, but much safer.
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Chloride Ion Test Kit for Abrasives
134A
Contamination can build up, particularly if the blast media is recycled several times. Using the Elcometer 134A Chloride Ion Test in the field will accurately identify contamination and prevent costly surface-related failures.
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Sodium Ion Concentration Pocket Water Meter
LAQUAtwin Na-11
The only pocket meter that directly measures sodium ion concentration in 0.3ml sample (or 0.05ml sample with sampling sheet B). Unique sensor allows measurement of viscous liquids, solids, and even powder samples. No need for a beaker to calibrate your meter or measure a sample. Just place few drops of the standard or sample onto the flat sensor. This procedure saves you time and prevents wasting your precious sample.
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Beam Profiler
BladeCam Series
0.65" Thin! Portable, Port-Powered, USB 2.0, Beam Profiling for Windows XP & Vista, Intel-Mac.
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ION Meters
GAOTek offers a wide selection of ion meters for precise calculation of number of ions in various kinds of solutions. These devices determine whether the solutions have positive or negative ion charge. A solution of known concentration is accurately prepared, and its mV value is plotted on a graph of mV vs. concentration to determine the corresponding unknown concentration. These devices are durable and easy to use portable field instruments.
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High Power Beam Analysis
The advantages of fiber lasers are their high power, mechanical stability and good beam quality; however beam quality and beam profile has to be periodically checked. In general, there are many difficulties in checking beam quality especially at the focal point, where densities will exceed 50KWatt per square cm. On one hand those energies are capable of melting and destroying most known materials, while on the other hand measuring a focused profile is the most significant measurement.
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Beam Pattern Measurement System
BP100
The BP100 is purpose-made for luminous intensity measurement of lamps, using a diffusely transmitting screen to provide a flat image that can be measured by an imaging photometer. This is a low cost, versatile solution in comparison to the traditional method of measuring lamp properties as a function of angle of emission, using Goniometers that are often costly and dedicated for one specific measurement.
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Beam Lead Capacitors
Beam lead capacitors have high insulation resistance, low dissipation factor, and low temperature coefficient, which allow for use in military and aerospace designs. Their robust performance and small form factor provide repeatable performance.
