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MOSFET
Metal Oxide Semiconductor Field Effect Transistor
- Scientific Test, Inc.
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Automated Discrete Semiconductor Tester (ATE)
5000E
Same Proven Technology as all 5000 Series Testers. High Speed Single Test Measure. Capable of Testing Multiple and Mixed Devices. 1KV Standard, 2KV Optional. 1NA to 50A Standard, 100A Optional. 0.1NA Resolution. Complete Self Test. Auto-Calibration. RDSON to 0.1MOHM Resolution. Windows Application Software. Optional Scanner. Optional Wafer Mapping. Optional Curve Trace. MOSFET, IGBT, J-FETTriac, SCR, Sidac, Diac, Quadrac, STS, SBS Transistor, Diode, Opto, Zener Regulator, MOV, Relay. UNDER $23,000.00
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Built-in MOSFET Integrated SiP
Renesas Electronics offers SiP products with integrated MOSFETs to enable easy configuration of high-performance multi-phase power supplies. They combine in a single package either controller, driver, and MOSFETs or driver and MOSFETs. These products make it easy to build a high-performance DC/DC converter while reducing stray capacitance and inductance, and achieving higher mounting density.
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Thermal Characterization Testing Services
Thermal Engineering Associates, Inc.
Thermal Characterization - TEA offers this service to customers having need for precise thermal parameter values for product data sheets, purchase specifications, specific application configurations, and/or device comparisons. This service is offered for a wide range of Discrete Devices (i.e., Bipolar Junction Transistors, MOSFETs, IGBTs, Diodes, SCRs, Triacs) and Integrated Circuits (i.e., digital, linear and mixed-signal devices).
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Power MOSFETs
ST's power MOSFET portfolio offers a broad range of breakdown voltages from –100 to 1700 V, with low gate charge and low on-resistance, combined with state-of-the art packaging. ST's process technology for both high-voltage power MOSFETs (MDmesh™) and low-voltage power MOSFETs (STripFET) ensures an enhanced power handling capability, resulting in high-efficiency solutions. Power MOSFETs belong to the STPOWER family.
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Integrated Board Power Management Functions For The Forward Thinking Engineer
Power Manager II
*Up to 12 differential voltage sensors with immunity to noise on ground plane*Voltage trimming to within 1%*Ruggedized CPLD with up to 48 macrocells for sequencing and supervisory signal logic*Large operating power supply range (3.3 V + 20% to 3.3 V -15%)*Up to 4 High-Voltage MOSFET Driver Outputs*Voltage Measurement with 10-bit ADC through I2C*Up to 8 On-chip DACs for Margining and Trimming
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Power Cycling Semiconductor Life Test System
ITC52300
The ITC52300 is designed for high-volume intermittent or steady-state operating life testing on Insulated Gate Bipolar Transistors (IGBTs), power MOSFETs, diodes, and other bipolar devices in a production environment. (The ITC52300 is an enhanced version of the ITC5230.)
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MOSFETs For Amplifier
These are enhanced power MOSFETs with excellent frequency characteristics. They are ideal for audio amplifier output.
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General Purpose Low-side MOSFET Drivers
Renesas' family of low-side FET drivers are very high-speed matched dual-drivers capable of delivering peak currents of 2.0 amps into highly capacitive loads and excellent at driving large capacitive loads with minimal delay and switching times. The high-speed performance is achieved by means of a proprietary "Turbo-Driver" circuit that speeds up input stages by tapping the wider voltage swing at the output. Improved speed and drive capability are enhanced by matched rise and fall delay times. These matched delays maintain the integrity of input-to-output pulse-widths to reduce timing errors and clock skew problems. This improved performance is accompanied by a 10 fold reduction in supply currents over bipolar drivers, yet without the delay time problems commonly associated with CMOS devices. Dynamic switching losses are minimized with non-overlapped drive techniques.
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Relay Switch For Medium- To High-Power DC Loads
S20DC100
Series S20 relays switch medium- to high-power DC loads. These devices feature the latest-generation MOSFET technology as well as an innovative isolated driver to ensure fast power turn on and off. The relays feature triggered control input to avoid linear control risks and fast switching times. The relays also offer an LED for status.
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Brushless DC Drivers (BLDC)
Covering a wide range of power systems, our integrated MOSFET and gate driver ICs thrive in automotive, industrial, and consumer applications, ranging from 3.5 to 100 V operating voltage.
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DCDC
QQA Series
The QQA series features the latest in MOSFET design, state of the art surface mount technology, and offers a 4:1 ultra-wide input range, and efficiencies greater than 80% (typ). Features include continuous short circuit protection, 500 Vdc I/O isolation, and an operating temperature range of -25°C to +71°C with no derating. All models are packaged in a six-sided shielded miniature case measuring only 1.0” x 2.0” x 0.4” high.
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Medium- to High-Power DC Load ISSRs
Part No. S60DC40
Series S60 relays switch medium- to high-power DC loads. These devices feature the latest-generation MOSFET technology as well as an innovative isolated driver to ensure fast power turn on and off. The relays feature triggered control input to avoid linear control risks and fast switching times. The relays also offer an LED for status.Available options include:S60DC40 40A, 0-350 Vdc Load; 4.5-32 Vdc Control
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Power ICs - VRPower® (DrMOS) - Power Stage
The Next Generation VRPower® Power Stage, Vishay’s family of VRPower modules offers an integrated MOSFET and driver power stage with unsurpassed performance. The flagship device, SiC620R is capable of 70 A and achieves more than 95 % efficiency in a typical multiphase buck converter design. The device has several package enhancements that enable it to offer superior MOSFET dynamic performance. Combined with Vishay’s state-of-the-art Gen IV MOSFET technology, these enhancements enable 3 % better efficiency and over 50 °C lower operating temperatures compared to previous generation DrMOS devices while shrinking the footprint by 33 %.
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Atlas DCA Pro Advanced Semiconductor Analyser
DCA75
The DCA75 is a great instrument for identifying and testing a wide variety of semiconductor components. Just connect any way round! The DCA75 will perform the following:*Display component type (such as N-CH MOSFET, darlington transistor etc).*Display component pinout (such as drain, source, gate etc).*Display detailed parameter measurement.*Plot characteristics curves on your PC.
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Parametric Curve Tracer Configurations
Keithley PCT
Developing and using MOSFETS, IGBTs, diodes and other high power devices requires comprehensive device-level characterization such as breakdown voltage, on-state current and capacitance measurements. Keithley's line of high power Parametric Curve Tracer configurations supports the full spectrum of device types and test parameters. Keithley's Parametric Curve Tracer configurations include everything necessary for the characterization engineer to develop a complete test system quickly.
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Medium- to High-Power DC Load ISSRs
Part No. S20DC30
Series S20 relays switch medium- to high-power DC loads. These devices feature the latest-generation MOSFET technology as well as an innovative isolated driver to ensure fast power turn on and off. The relays feature triggered control input to avoid linear control risks and fast switching times. The relays also offer an LED for status.Available options include:S20DC30 30A, 0-130 Vdc Load; 4.5-32 Vdc Control
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Power Discretes
Our power discrete products are high-quality solutions for a wide range of high-voltage and high-power applications. They include a variety of high-voltage Switch Mode Power Supply (SMPS) transistors—Insulated-Gate Bipolar Transistors (IGBTs) Silicon Carbide (SiC) MOSFETs and Silicon MOSFETs—Diodes and Radio Frequency (RF) MOSFETs. Many of our products are offered in single- and combi-packaged options across a variety of voltage ratings, currents, and package styles.
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Test System
ITC57300
The ITC57300 Dynamic Parametric Test System mainframe accepts Test Heads that perform nondestructive transient measurements on semiconductor devices such as Insulated Gate Bipolar Transistors (IGBT), power MOSFETs, diodes, and other bipolar devices(requires additional optional bias power supplies and custom personality boards). Included in the mainframe are all test equipment and software necessary to analyze and perform resistive and inductive switching time, switching losses, gate charge, Trr/Qrr, and other transient tests.
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DCDC
Hua/Hud Series
The HUA/ HUD is a cost-effective series of DC/DC converters, offering both single and dualoutputs. These unregulated converters offer the latest in MOSFET technology. Featuring efficiencies to 80%, cool operating case temperatures and a high level of reliability with a MTBF in excess of 1,000,000 hours. Additional standard features include an internal Pifilter, 500 Vdc I/O isolation, up to 12 watts of output power and operating temperature of –25°C to +71°C with no derating. All this in a package measuring 2.0” x 2.0” x 0.40” high.
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Backend Test For Packaging Devices
Power MOSFETs need a lot of different tests. We understand backend test, and have over 80% of our installations used in this application, operational 24hrs every day delivering fully tested and QA approved products at throughput rates up to 20kuph. Backend test, for power devices in particular, has a diverse, but well-established list of technical demands to detect both failures and failure mechanisms.
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MOSFET Drivers
The bridge driver products handle voltages up to 100V, with industry-leading gate rise and fall times and exceptional input-to-output propagation delay performance. Select parts are available in 4mm x 4mm and 3mm x 3mm DFN packages which meet IPC-2221 creepage and clearance specifications for high-voltage systems.
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MOSFETs For High Frequency Amplifier
The MOSFETs shown below are best suited for amplification of high-frequency signals.
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MOSFETs
Products for a variety of applications, such as power supply, motor drive, high frequency amplification, and load switches.
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DCDC
DP Series
The DP family is an economically priced high performance series of regulated DC/DC converters offering single and dual outputs. Features include MOSFET design operating at a switching frequency of 100Khz, continuous short circuit protection, LC input filter, 500 Vdc I/O isolation, and an operating temperature range of -25°C to +71°C with no derating. These miniature converters maintain excellent regulation over varying line and load conditions (0.2% for line and 0.5% for load). They are packaged in an IC compatible 24 pin DIP configuration measuring 1.25” x 0.8” x 0.4” high.
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Digital Power Modules
Renesas' digital PMBus power modules integrate a PWM controller, inductor, power MOSFETs, and passive components into one small package making the design of high efficiency, compact and intelligent power supplies easy.
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Unclamped Inductive Load Tester
ITC55100STD
Model ITC55100STD performs ruggedness testing of power MOSFETs and IGBTs. It also tests single and dual diodes, and forward and reverse bias of IGBTs when used with an optional ITC55-RSF Output Selector Box.
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Test System Mainframe
ITC59000
The ITC59000 Test Platform is a desktop DynamicParametric Test System mainframe. The ITC59000Test Platform accepts up to four Test MeasurementUnits (TMUs) that perform transient measurements onsemiconductor devices such as power MOSFETs,IGBTs, and diodes.
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1584W to 2500W - Single Output
HFE Series
*1U rackmount containing up to 5 units*Up to 29.2W/in³ power density*Internal ORing MOSFET & Current Share*High Efficiency*Up to 9,500W in 1U rack*PMBus™(I2C) and LAN options
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Power MOSFETs For Automotive
Renesas achieves on-resistance specs among the lowest in the world through the use of ultra-fine technology, such as our 0.25um ANL3 process employing the latest trench technology, and package technology utilizing a new multi-bonding mount technology.
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Programmable Parametric Tester For Discrete Semiconductors
IST-8800
IST Information Scan Technology, Inc.
The IST-8800 is a fully programmable, low cost tester that provides parameter measurements or parametric GO/NO GO test for transistors, diodes, MOS-FETs, Regulators, Triacs, Zeners, SCRs, and J-FETs. These devices can be tested up to 5 amps or 1200 volts with a measurement range down to the nano amp range. Only four universal test fixtures are required which can test the device across a wide range of packages.
