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NF
1) EMF closest to the antenna. 2) Near-field optics.
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2D Far-Field Analysis of Infrared Emitters
VTC 2400
Instrument Systems Optische Messtechnik GmbH
The VTC 2400 is a high-resolution infrared-camera that was developed specially for 2D-far-field analysis of the radiant intensity distribution of VCSELs and IR emitters. The measurement system consists of a light-permeable screen and a monochrome camera specialized for measurements in the near infrared range.
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Shielding Effectiveness/ Conductivity Test
EM-2107A | 30 MHz – 1.5 GHz
The EM-2107A is a standard test fixture for evaluation of the electromagnetic shielding effectiveness of planar material. The fixture is an enlarged section of coaxial transmission line and complies fully with the requirements of ASTM test method D4935-1. The measured data relates to the shielding effectiveness due to a plane wave (far field EM wave) from which near field values for magnetic and electric fields may be inferred. The EM-2107A is provided with a reference standard test specimen, a dynamic range specimen. Dynamic range of greater than 80dB is achievable, although the cables and other test system components usually establishes the limiting factors.
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500Mz Tracing Signal Genrator
SM-5006
is used for the early test in the development of electrical products, troubleshooting of CATV/MATV system as well as the test and trouble diagnosis of cellular phone system. Combined with the near field probes of Mz530, it can detect the missing fields of radio frequency
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Light Engines
Delivering the highest brightness and optical power available, our light engines provide optimized output solutions for a range of applications such as light guide and fiber optic coupling, fluorescence excitation, and unrivaled uniform near and far field illumination.
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Function Tester
IP-7000 series
In recent years, many companies place importance on vertical start-up at overseas factories and investment costs, but we have realized complete local support not only in Japan but also in China, Thailand, Vietnam, the Philippines and the sites where our bases are located. We have put in place a system that allows us to consistently carry out everything from manufacturing to maintenance near our customers.Our function testers, which can meet customers' requests for function inspections at overseas factories, are active in various fields such as industrial equipment, in-vehicle, IT, and medical industries.
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Advanced Thermal Imaging Camera
FLIR E76
The FLIR E76 offers complete coverage of near and distant targets through a range of interchangeable AutoCal™ lenses, with fields of view for everything from wide-angle roof inspections to electrical inspections performed from a safe distance. A step up from the FLIR E54, the E76 includes an optional temperature range to 1000°C (1832°F), laser-assisted autofocus, and 3 area measurement boxes. The 320 × 240 thermal resolution produces crisp, vibrant imagery that can be enhanced with patented FLIR MSX® technology for added detail and perspective. The onboard FLIR Inspection Route runs pre-planned routes to help you stay organized when surveying large or multiple locations. FLIR Ignite provides automatic uploading of E76 images directly from the camera to the cloud for easy, secure storage and sharing.
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RF Near Field Probe Set DC to 9GHz
EMF & RF close field sniffer-set for use with any Spectrum Analyzer or Measurement Receiver. The EMC Near Field probe set allows for straightforward pinpointing and measurement of interference sources in electronic component groups as well as execution and monitoring of generic EMC measurement. Our RF near field probe set is especially suitable for: - Pinpointing interference sources - Estimation of interference field strength - Verification of shielding and filtering measures - Identifying faulty components - Detecting circuitry overly sensitive to interference.
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VLF Diagnostics System
PHG 80 TD
BAUR Prüf- und Messtechnik GmbH
Cable testing and diagnostics with the BAUR PHG 80 TD. The combination of the PHG 80 programmable test generator with the BAUR dissipation factor measurement system produces the cable testing and diagnostics system PHG TD. It is operated via PC control. Dissipation factor measurement and diagnostic testing sequences can be programmed in the menu, after which the dissipation factor measured values are automatically determined in various voltage steps and a final evaluation is conducted.* Biggest dynamic range of tan delta measured values from 1 to 10-4 with a cable capacitance >10 nF to 20 uF* High resolution +/- 1x10-5 applicable even in new PE/XLPE cables* Insensitive against interferences due to complete mains separation* Lowest time required for assessing a medium-voltage cable (3-phase approx. 1 hour)
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Near-Field Detection Module for Imaging
Transmission
Detection optimized for high performance near-field imaging in transmission-modeEnables optical amplitude and phase resolved near field measurementsPatented background-free detection technologyEnables bottom-side (transmission-mode) sample illumination with broadband mirrorSuited for visible and infrared wavelength range 0.5 20 mRequires transparent sample substrateMotorized parabolic mirror for easy beam-alignment in transmission-modeStationary focal point with respect to AFM-tipVariable illumination spot size (ca. 2m 100m)Suitable for plane-wave illuminationSupported AFM scan-speed: up to 20 m/s @ highest spatial resolution
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Impedance/Game-Phase Analyzers
A/D converted input signals undergo discrete Fourier transform (DFT) to calculate complex impedance values and obtain parameters and characteristics specific to the DUT, such as its capacitance, inductance and quality factor. Original NF algorithms are also applied to allow equivalent circuits made up of R, L and C along with the constants for those circuits to be estimated from the complex impedance spectrum obtained by sweeping the frequencies.
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EMC Near Field Probes
TBPS01
The TBPS01 EMC near field probes H20, H10, H5 and E5 are magnetic field (H) and electric field (E) probes for radiated emissions EMC pre-compliance measurements. The probes are used in the near field of sources of electromagnetic radiation.
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AMIDA VCSEL Tester
AMIDA VCSEL tester can be divided into three parts: LIV measurement system, Near Field measurement system and Far Field measurement system. To achieve the above three measurements, in addition to the necessary optical components and optical instruments, the core technology is to provide fast and stable current pulses to drive the VCSEL laser diode to emit light, and then to test various optical and electrical properties
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Refractive Index Profiler
S14
The S14 Refractive Index Profiler complements optical fiber preform analysis measurements by providing highly accurate and precise characterization of the refractive index profile of drawn single-mode, multimode, and specialty fibers using the RNF (Refracted Near Field) technique. The S14 index profile data produces fiber geometry information directly. Manufacturers can also use S14 data for the prediction of fiber transmission parameters such as mode field diameter, cut-off wavelength, and chromatic dispersion.
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IRIG Time Code Receiver & Generator Module
TCR180
Meinberg Funkuhren GmbH & Co. KG
The module TCR180 has been designed to receive and to generate IRIG-A/B/G, IEEE 1344, IEEE C37.118 or AFNOR NF S87-500 time codes. It is used in applications like data acquisition, standalone computer time synchronization (for systems without a network connection or higher accuracy requirements) or as an IRIG converter device. The frequency locking of the master oscillator to the time code system enables this module to generate fixed and programmable standard frequencies with high accuracy and stability. Various oscillator options allow the cost efficient implementation of different requirements concerning the accurracy of the outputs. The generator of the IMS-TCR module generates pulses per second and per minute and per hour. Four programmable outputs are also available. The pulses are synchronized to UTC-second.
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Near Field Probe Set
RF100
The RF100 probe set consists of a passive E field probe and H field probe, BNC adaptor and carry case. The output is via a BNC socket. These are general purpose probes which are ideal for use in conjunction with an EMC measuring system. They are sensitive to sources in close proximity, but are insensitive to background signals. This makes them ideal for the identification of emission frequencies in noisy environments... thus making measurements easier and quicker. The proximity requirement also enables sources to be located and the exit route identified.
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Near-Field Scanning Optical Microscope Platform
MoScan-F
MoScan-F is a device that enables you to get the best up-to-date available spatial optical resolution using the near field scanning optical microscope (NSOM) principle
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Near Field Probes
Used for accompanying measurements of high-frequency, electric and magnetic RF fields on assemblies and devices.
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Lenses for Mid-Wave Infrared (MWIR) Cameras for 3-5 µm
MWIR Zoom Lens Assemblies
Teledyne FLIR custom and off-the-shelf mid-wave infrared (MWIR) continuous zoom (CZ) optical assemblies and lenses are for integrators and operators who do not compromise on quality. All lens assemblies have near diffraction limited performance and include advanced features that ensure continuous focus through the zoom. Formerly New England Optical Systems (NEOS) and now part of Teledyne FLIR, the world-class technical services team provides product support and can also develop new or customize existing lens assemblies for a camera, application, and mission. Designed to maximize infrared-camera performance, the MWIR CZ lens assemblies provide the competitive advantages required in the field and marketspace for a wide range of defense, security, and commercial applications.
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Lenses for Long-Wave Infrared (LWIR) Cameras for 8-14 µm
LWIR Zoom Lens Assemblies
Teledyne FLIR custom and off-the-shelf long-wave infrared (LWIR) continuous zoom (CZ) optical assemblies and lenses are for integrators and operators who do not compromise on quality. All lens assemblies have near diffraction limited performance and include advanced features that ensure continuous focus through the zoom. Formerly New England Optical Systems (NEOS) and now part of Teledyne FLIR, the world-class technical services team provides product support and can also develop new or customize existing lens assemblies for a camera, application, and mission. Designed to maximize infrared-camera performance, the LWIR CZ lens assemblies provide the competitive advantages required in the field and marketspace for a wide range of defense, security, and commercial applications.
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High Performance Analog & Mixed Signal Test Solutions
Applicos
Effective mixed-signal test solutions demand know-how and experience. Low level analog signals need to be stimulated and analyzed near fast switching digital logic. Cross talk, magnetic fields, clock jitter, ground noise and non-linearity of components, are just a few of the problems that must be addressed. Applicos knows what it takes to design and produce high quality mixed-signal test solutions. They have been servicing the mixed-signal test industry since 1993 and have established a distinguished reputation for providing our customers with high performance, cost effective solutions. In 2018 we acquired Applicos B.V. to extend our portfolio for the ATE business.
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Near Field Micro Probe ICR HV H Field
The measurement coil is located vertically in the probe head. The near field probes are run with a positioning system (Langer Scanner).
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Preamplifier
Is designed for the amplification of measuring signals, e.g. weak signals of near field probes with high resolution.
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Scanner Probe
RFS set
The RFS set consits of three passive near field probes designed for the use in a measurement scanner during the development of E-field and magnetic field. They are designed for frequency ranges of 30 MHz to 3 GHz. The probe heads of the RFS set allow for close measurements needed to correctly localize interference sources on an electronic assembly. They document the whole image of the device under test`s near field. The scanner probes have a sheath current attenuation and are electrically shielded. They are connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. They do not have an internal terminating resistance. The measuring signal can be increased with PA 203 or PA 303 preamplifier. On request RFS, LFS and XFS scanner probes can be produced.
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Camera Module Tester
Evolusys Technologies Sdn. Bhd.
• Lens Focusing plus Far Field Sharpness Testing - CTF/MTF/SFR• Near Field Sharpness Testing - CTF/MTF/SFR• Flat Field Grey Image Testing - Optical center, Defect pixels, particles, blemish, shading, color shading, color ratio, SNR, etc.• Dark Field Image Testing - Hot pixels, dynamic range, SNR, etc.• Current Measurement - Active, standby
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RGO-2000P Robotic Goniophotometer For Plant Lighting
Hangzhou Everfine Photo-E-Info Co., LTD
RGO-2000P proposed a solution based on the plant lighting requirement to measure and evaluate the spatial light distribution performance of plant lighting based on the limitations of far-field measurement and ILMD near field distribution goniophotometer.
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Near Field Micro Probes ICR HH H Field
The measuring coil is horizontally located in the probe head. The near field micro probes are operated with a positioning system (Langer Scanner).
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Near Field Probes 1GHz - 10 GHz
SX set
The SX1 set consists of 3 passive near field probes for making measurements in the development phase of E-field and magnetic field with a high clock frequency in the range from 1 GHz to 10 GHz. The probe heads of the set SX allow for measurements close to electronic assemblies, e.g. on single IC pins, conducting paths, components and their connectors, to localize interference sources. Field orientation and field distribution on an electronic assembly can be detected through trained use of the near field probe. The near field probes are small and handy. They have a sheath current attenuation and are electrically shielded. They can be connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. They have an internal terminating resistance.
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Near Field Probes 30 MHz up to 3 GHz
RF2 set
The RF2 near field probe set consists of 4 passive near field probes for measurements in the development phase of the magnetic field in the range from 30 MHz to 3 GHz on electronic assemblies. The probe heads of the RF2 set allow the step by step localization of interference sources of the RF magnetic field on assemblies. From greater distances the electromagnetic interference can be detected by RF-R 400-1 and RF-R 50-1 probes. The RF-B 3-2 and RF-U 5-2 probes with their higher resolution can more precisely detect the interference sources. Field orientation and field distribution on an electronic assembly can be detected through a trained special use of the near field probe. The near field probes are small and handy. They have a sheath current attenuation and are electrically shielded. They can be connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. They do not have an internal terminating resistance.
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Antennas
Our broad portfolio of antennas includes products designed for cellular, broadcast, navigation, RFID, IoT, DAS, mmWave, and more. Our antennas are available in standard and custom designs and engineered for use in cars, heavy-transport vehicles including rail, and a wide variety of personal electronics, including mobile device and wearable technology. Our antennas offer high-quality transmission for a wide variety of frequencies including, but not limited to Bluetooth, WLAN, and ZigBee. We manufacture our antennas in facilities worldwide, which include testing capabilities in near and far field patterns, scattering parameters, SAR, vibration, humidity, temperature shock, salt fog, throughput, and acoustic. We also manufacture antenna assemblies.
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EMC Scanner
EMxpert
EMXpert is a unique magnetic near field scanning system that helps designers be highly productive in understanding and diagnosing these problems, quickly and early in the development cycle.
