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Particle
fundamental objects of quanta.
See Also: Nanoparticle, Airborne Particle, Particle Accelerator, Particle Counters, Particle Detection, Wave
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Compressed Gas Particle Counters
Supports a complete contamination control solution including cleanroom certification and clean area monitoring, while meeting global requirements for data integrity.
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Spray Particle Size Analyzer
Spraytec
Malvern Panalytical's Spraytec laser diffraction system allows measurement of spray particle and spray droplet size distributions in real-time for more efficient product development of sprays and aerosols. It has been specifically designed to address the unique requirements for spray characterization and deliver robust, reproducible droplet size data.
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Particle Impact Detection System 10
BW-LPD-DAQ4000HD
This system is capable of vibration testing up to 10 pounds and detecting defects that produce noise, such as loose screws, particles, etc. Right from the start of PIND testing, B&W patented the first MIL-STD compliant system outperforming the competition by over 30% better detection rate as tested by the NBS (now National Institute of Science and Technology) in a well known 1978 study (NBSIR 78-1590 NASA).
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Residual Pollution Analysis System
Cleanalyzer
The Cleanalyzer is a high-end analytical system designed to examine particles on filters – a key procedure in performing reliable and reproducible evaluation of component cleanliness. High-resolution, optical zoom system (15µm and 5 µm version. High-resolution, fixed magnification optical system (35µm version).
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Cascade Impactors
TSI’s suite of cascade impactors can collect particles with aerodynamic diameters (cutpoints) from 10 nm to 10 µm, in 3 to 13 different size fractions, and at flow rates of 2, 10, 30 or 100 L/min. The number of stages determines the size resolution of the collected samples, and consequently determines the level of detail of the data generated from the quantitative analysis of these collected samples. MOUDI II impactors have rotating stages. When the stage is rotated relative to the nozzle plate, the impacted particles are deposited in a more uniform manner across the impaction surface. This increases the amount of particle mass that can be collected, reduces the probability of particle bounce and re-entrainment, and optimizes quantitative analysis of the collected samples.
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Magnetic Particle Flaw Inspection System
This model can perform every kinds of magnetic particle flaw inspection in our unit. circular magnetization longitudial magnetization continuous magnetization, residual magnetization threading bar magnetization current induction magnetization, AC magnetization AC demagnetization DC magnetization, DC demagnetization.
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Electrostatic chucks
Semiconductor substrates such as Si wafers or masks for the next generation of extreme ultraviolet lithography (EUVL) are handled in a vacuum. For nm structures and exact overlay, the reproducibility of the substrate evenness is a crucial factor, as unevenness results in structural distortions. Particles are problematic and heat input as well as thermal expansion must be taken into account.
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Remote Particle Counters
Their small size, flexible power options and wireless capabilities allow installation where space is limited. Worry-free monitoring with best-in-class data buffering reduces risk of data loss during network outages. Only the AeroTrak+ Remote Particle Counters are backed by an industry exclusive 5 year laser warranty.
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PXIe-5763, 16-Bit, 500 MS/s, 4-Channel PXI FlexRIO Digitizer
785165-01
The PXIe-5763 is a PXI FlexRIO Digitizer that simultaneously samples four channels at 500 MS/s with 16 bits of resolution and features 225 MHz of analog input bandwidth. With over 73 dB of SNR, the PXIe-5763 is ideal for applications that require a wide dynamic range with a wideband digitizer. The FlexRIO driver includes support for finite and continuous streaming modes, and you can implement custom algorithms and real-time signal processing on the LabVIEW-programmable Xilinx Kintex UltraScale FPGA. Available in AC and DC coupled variants, the PXIe-5763 is ideal for both time and frequency domain applications, including radar prototyping, LIDAR, communications, microscopy, OCT, event detection, and particle physics.
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Electromagnetic Express
EM-X
Is a physics modelling package for electromagnetic fields and charged particles. A CAD component allows the definition of mechanical parts and assignment of electric potentials, magnetization and charged particle sources. A time domain, particle-in-cell (PIC) tool then solves the electromagnetic fields and moves the particles within them. The particles’ own charges andmotions are fed back into the electromagnetic fields allowing the effects of space charge and selfmagnetism to be accounted for.
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Adhesion testing
Adhesion is the tendency of dissimilar particles and/or surfaces to cling to one another. The adhesive strength of paint and coatings are of crucial importance to enable the material to meet the basic functions of protection and decoration. Cross-Cut or Cross Hatch Test, Scrape Adhesion, Pull-Off Test.
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Preclinical Imaging Modalities and Solutions
Bruker offers advanced preclinical imaging solutions for a broad spectrum of application fields, such as oncology, neurology, cardiology, inflammation, infectious diseases, cancer research, functional and anatomical neuroimaging, orthopedics, cardiac imaging and stroke models. Our range of techniques includes MRI (Magnetic Resonance Imaging) , PET (Positron Emission Tomography), SPECT (Single Photon Emission Computed Tomography) micro-CT (Micro Computed Tomography), optical imaging and magnetic particle (MPI) imaging.
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Laser Scattering Particle Size Distribution Analyzer
Partica LA-960V2
This latest evolution in the LA series advances scientific knowledge for tomorrow's world through intuitive software, unique accessories, and high performance.The LA-960V2 continues HORIBA's proud tradition of leading the industry with innovative design.
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Magnetic Particle Flaw Detector
MT-1B
MT-1B magnetic particle flaw detector adapts high-capacity lithium battery pack, converse DC to AC through variable-frequency, providing magnetic powder flaw detector with magnetic power supply. With low power consumption, it can continuous work more than four hour after charging. It especially suits for working in the wild and aerial area.
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Neutron Scattering and Beamline Systems
For optical, neutron and particle beam experiments, Cryogenic offers a range of split pair magnets. These allow strong magnetic fields to be produced in a small volume with maximum access to the working space. Split pair coils can be mounted to provide either a vertical field with horizontal access or a horizontal field offering horizontal or vertical access.
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Ingress Protection
Ingress Protection testing evaluates the resistance to particle and liquid entry for an enclosed product. After testing has been performed, the product receives an IP rating, based on IEC 60529, according to the achieved resistance to solid particles and liquids.
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Cement, Coal & Mineral Test & Analytical Solutions
Keep coal, cement, or mineral processing operations running efficiently, safely, and profitably. Thermo Scientific™ cross-belt online analyzers for cement and coal reduce process upsets and increase throughput with minute-by-minute composition analysis of ores and concentrates. Additionally, Thermo Scientific elemental and particle size analyzers for mineral beneficiation and flotation plants—when integrated with our sampling and analysis solutions—help you to increase the efficiency of your process.
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PCIe-5764, 16-Bit, 1 GS/s, 4-Channel PCI FlexRIO Digitizer Device
785961-01
The PCIe-5764 is a PCI FlexRIO Digitizer Device that simultaneously samples four channels at 1 GS/s with 16 bits of resolution and features 400 MHz of analog input bandwidth. With up to 70 dB of SNR, the PCIe-5764 is ideal for applications that require a wide dynamic range with a wideband digitizer. The FlexRIO driver includes support for finite and continuous streaming modes, and you can implement custom algorithms and real-time signal processing on the LabVIEW-programmable Xilinx Kintex UltraScale FPGA. Available in AC and DC coupled variants, the PCIe-5764 is ideal for both time and frequency domain applications, including radar prototyping, LIDAR, communications, microscopy, OCT, event detection, and particle physics.
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Magnetic Flaw Detector
CDX-Ⅲ
magnetic particle flaw detector is the self-designed magnetic participle flaw detector of MITECH CO.,LTD. With small size, light weight, easy operation, multifunction in one unit. The detector can equip A, D, E O four types of probes to realize the functions of magnetic clamp detection, electromagnetic yoke detection, cross magnetic yoke detection, ring detection. It is the necessary detector to do quality control, safety check, life evaluation in the fields of petrol, chemicals, metallurgy, shipbuilding, aviation, railway etc
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PXIe-5774 , 12-Bit, 6.4 GS/s, DC-Coupled, 2-Channel PXI FlexRIO Digitizer
785646-02
The PXIe-5774 provides up to 3 GHz of DC-coupled analog bandwidth and 12 bits of resolution. You can operate the PXIe-5774 in a dual-channel mode at 3.2 GS/s or in a single-channel interleaved mode at 6.4 GS/s. The voltage ranges are software-selectable and include 200 mV peak-to-peak and 1 V peak-to-peak, with a selectable DC offset. The PXIe-5774 is ideal for time-domain measurements in areas such as scientific instrumentation, medical imaging, and particle physics. The FlexRIO driver includes support for finite acquisition, and you can implement custom algorithms and real-time signal processing on the LabVIEW-programmable Xilinx Kintex UltraScale FPGA.
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Shaker
DRK8091
Shandong Drick Instruments Co., Ltd.
Widely used in particle analysis in pharmaceutical, food, cosmetics, food and other industries, the use of advanced integrated circuit control, the operation is extremely simple.
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Dispersion
Dispersions are often used in latex wall paints, which can thus be diluted with water. The homogenity of a dispersion depends on size and weight of particles. To determine the size of particles the use of a Fineness of Grind gauge or grindometer is needed. For proper mixing and / or stirring a variety of laboratory and industrial tools are available depending on volume or capacity.
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Defect Inspection and Review
KLA’s defect inspection and review systems cover the full range of yield applications within the chip and wafer manufacturing environments, including incoming process tool qualification, wafer qualification, research and development, and tool, process and line monitoring. Patterned and unpatterned wafer defect inspection and review systems find, identify and classify particles and pattern defects on the front surface, back surface and edge of the wafer. This information allows engineers to detect, resolve and monitor critical yield excursions, resulting in faster yield ramp and higher production yield.
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PCIe Gen3 4K Compact, High Speed Camera for Testing
CB120MG-CM-X8G3
4K, compact, high speed camera for: Vehicle Impact, Airbag Deployment and Safety Restraints Testing, Digital Image Correlation (DIC), Projectile, Explosives, Ballistics, Combustion and Missile Launch Tracking, Fluid and Flow Visualization, Sports Broadcasting, Commercial Film, Television and Studio Production, Fluidics and Particle Image Velocimetry (PIV), Flat panel inspection (FPD), printed circuit board (PCB) examination and more.
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Semiconductor Inspection (SEMI)
A process for detecting any particles or defects in a wafer.
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Standard CW Amplifiers
The BT-AlphaA-CW series is a range of classAB RF power amplifiers covering the 10kHz to1MHz frequency range.• Rugged, solid-state design - high reliability• Extremely high phase and amplitude stability• High linearity• In-Built Protection• Very fast blanking• Capable of pulsed operation• Competitively pricedSuitable for CW radar, communications, HF/VHF jamming, particle accelerator applications/plasma systems, plasma, RF heating and otherscientific applications.
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PXIe-5763, 16-Bit, 500 MS/s, 4-Channel PXI FlexRIO Digitizer
785161-01
The PXIe-5763 is a PXI FlexRIO Digitizer that simultaneously samples four channels at 500 MS/s with 16 bits of resolution and features 225 MHz of analog input bandwidth. With over 73 dB of SNR, the PXIe-5763 is ideal for applications that require a wide dynamic range with a wideband digitizer. The FlexRIO driver includes support for finite and continuous streaming modes, and you can implement custom algorithms and real-time signal processing on the LabVIEW-programmable Xilinx Kintex UltraScale FPGA. Available in AC and DC coupled variants, the PXIe-5763 is ideal for both time and frequency domain applications, including radar prototyping, LIDAR, communications, microscopy, OCT, event detection, and particle physics.
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Aerosol Neutralizer
3054
Aerosol neutralization is an important component of aerosol science and engineering. Neutralizing aerosol particles can reduce electrostatic losses of particles within tubing or to other surfaces. Neutralization is also critical to gathering reliable particle size data when using a sizing instrument based on electrical mobility.
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Laser Particle Size Analyzer
Easysizer20
Zhengzhou Nanbei Instrument Equipment Co. Ltd
sysizer20 is the latest product of OMEC in Year 2006 and is highly automated, all the process can be done automatically after setting up initial parameters. Multiple sample feeding systems are available to meet your requirements. Applications：Measure the particle size distribution of powder or latex Principle：Use the principle of laser light scattering to determine particle size distribution.
