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- InterWorking Labs, Inc.
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DHCP Tests
The Dynamic Host Configuration Protocol (DHCP) provides configuration parameters to Internet hosts. DHCP consists of two components: a protocol for delivering host-specific configuration parameters from a DHCP server to a host and a mechanism for allocation of network addresses to hosts. DHCP is built on a client-server model, where designated DHCP server hosts allocate network addresses and deliver configuration parameters to dynamically configured hosts. (Source: RFC 2131)
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Data Acquisition Switch System
M300
No matter the product performance test in the R & D stage or the automatic test in the production process, for the application of multiple test points and multiple signal measurement, the M300 series data acquisition / switch system with modular structure combines the precise measurement function with the flexible signal connection function, and can provide a wealth of test measurement solutions.
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FPD Tester Model
27014
Chroma 27014 Flat Panel Display Tester is a complete testing solution that meets the Liquid Crystal Module testing requirements of production line. With integrated video generator, multi-channel precision power supply and process control unit, the system allows a complete test of signal, pattern and electrical parameters of LCM through a PC or remote control box.
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Boundary-Scan Interactive Analyzer & Toolkit
ScanExpress JTAG Debugger
Test probe access is a luxury—modern electronic system design techniques such as blind and buried vias or ball-grid-array (BGA) devices guarantee limited signal access. Test points quickly reduce precious board real-estate and can even degrade performance. ScanExpress JTAG Debugger overcomes these limitations to provide the control and visibility necessary to quickly debug and test hardware, using a simple JTAG port to interface with IEEE-1149.1 compliant devices.Whether debugging prototype hardware, enhancing production tests with boundary-scan control, or diagnosing a faulty board in the field, ScanExpress Debugger’s easy-to-use and versatile interface helps engineers test and debug systems faster and more efficiently.
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Thermo-hygrometer Handheld Temperature And Humidity Meter
HW100
Shenzhen Chuangxin Instruments Co., Ltd.
HW100 temperature humidity meter is a portable temperature humidity test instrument., selecting high performance capacitor type polymer film humidity sensor and semiconductor type temperature sensor. It has features of volume small, weight light, easy carrying, multi-function, and high precision, etc., applies to various fields such as hot comfortable research, indoor air quality assessment, verification of HVAC system run situation in building, heating and refrigeration system overhaul, and detection of the air conditioning system during the production process and so on.
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Switching Power Supply ATS (SMPS ATS)
8200
Chroma Power Supply Auto Test System model 8200 provides complete solution for PC ATX power supply, adapter and battery charger testing. The application oriented system structure makes it the most cost effective test equipment for initial test in power supply production line. To meet the power supply test requirements, Chroma Power Supply Auto Test System model 8200 has built in 20 ready-made test items. Users can simply enter the test conditions and test the power supply features while proceeding. With the report and management functions, Chroma Power Supply Auto Test System model 8200 is able to provide versatile tools to establish test documents and perform system administration.
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Build to Print Services
Amfax are a Build to Print manufacturer with the production and quality processes necessary to service the demanding Aerospace, defence and commercial markets, but it is our extensive engineering and manufacturing expertise that really differentiates us. As a leading test system integrator and supplier, we are able to apply this expertise to your Build-to-Print projects.
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PXIe-S5090 2-Port 9 GHz Analyzer
PXIe-S5090
The PXIe-S5090 delivers metrology-grade VNA performance and speed to National Instruments’ PXI system. This high-performance vector network analyzer allows testing of two-port devices from the bench to the production floor in a compact, modular form factor. With 138 dB dynamic range and +13 dBm maximum power, this VNA is engineered for short time to first measurement and also for high performance automation with fast test times.
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Battery Pack ATS
8700
Chroma transfers its successful experience in 8000 ATS which is quite well-known in the power electronics industry to the battery application field by developing the Test Items specifically for the battery industry. It can perform automatic tests on the Battery Management System (BMS), semi products and finished products tests on the production line as well as provide long term maintenance and service to the battery module. 8000 (8700) ATS has flexible hardware architecture that can select a variety of hardware devices, such as DC Power Supply, Electronic Load, LCR Meter and 6 1/2 digits Meter, etc. to comply with different automatic testing requirements for various applications. In addition new hardware and test items can be expanded to meet the demands for inspecting the highly customized battery products with diversified tests. The capabilities supported are:
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Solenoid Test Systems
The production solenoid test systems are designed to check a high volume of parts each shift, verifying all important parameters of the solenoid.
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PXI Digital Pattern Instrument
The PXI Digital Pattern Instrument is designed for semiconductor characterization and production test. It provides 32 channels, a voltage range of -2 V to 6 V, a PPMU force voltage range of -2 V to 7 V, up to a 200 Mb/s data rate, and a clock generation rate up to 160 MHz. The module includes Digital Pattern Editor software as well as debugging tools like shmoo, digital scope, viewers for history RAM, pin states, and system status.
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LitePoint RF Test System
J750
The option of adding LitePoint instrumentation to the J750 system delivers a cost-effective, complete production test solution covering global wireless connectivity standards.
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Boundary-Scan Test Executive
ScanExpress Runner
Efficiency in engineering means managing your most precious resources: time and effort. Automated testing is essential and boundary-scan is a critical component; no other structural test system provides the same value.When down to the wire, your boundary-scan test system needs to be built both for ease-of-use and reliability; a robust and powerful mechanism to ensure that no matter the state of production, all boundary-scan tests can be quickly and faithfully executed to maintain forward momentum.
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Supported Test Systems
TTCI is a leading solutions provider of application development for test systems from Seica, Keysight, Teradyne, Digitaltest, and XJTAG. We offer a wide variety of testers and test solutions to meet your needs. Our Seica Pilot and Digitaltest Condor flying probe systems can handle all of your low- to mid-volume production, prototypes, and PC boards with accessibility issues. The Keysight 3070 and Teradyne TestStation can address your larger production runs and fixture requirements. In addition, we can also address your functional and boundary scan needs.
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Amplifier, Switch and Test Box
CLIOQC Model V
The QCBOX Model 5 is a non-conventional unit designed to fulfil actual and future needs of an electro-acoustical analyzer like the CLIO system. It is USB linked to a PC and can be configured, with dedicated software controls, to assist frequency response and impedance measurements or to perform DC measurements. Using it for frequency response measurements acts as 50W power amplifier to drive the speaker or network under test while routing one-of-four inputs to the analyzer as well the current sensing output. The four inputs are able to provide a phantom power supply both for Audiomatica or general purpose microphones (0-24 V range, software controlled). Impedance measurements can be done either switching the D.U.T.’s load across the analyzer’s input or using a dedicated output, ISENSE, thus allowing impedance measurements in constant voltage mode as well voice coil current distortion analysis. An internal ADC measures the DC current into the voice coil. Thanks to an internal software controlled voltage generator the speaker can be driven with a superimposed DC voltage (±20V), allowing for measurements of large signal parameters. Two ADC converters with a ±2.5 V and ±5 V are available at inputs 3 and 4 to measure the displacement with a laser sensor or any other DC signal. A dedicated digital input handles an external foot pedal switch (or TTL signal) to be connected and triggers QC operations. A 6 bit output – 5 bit input TTL digital port is available to interface the QCBOX and driving software with external hardware (like turntables for example).The QCBOX Model 5 finds use both in laboratory for R&D applications and in production lines setups.
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Air-Cooled Universal Test Platform
Diamondx
Diamondx semiconductor test system extends Cohu’s low-cost, high-throughput production test solution platforms to high pin count, higher site count wireless, mobility, SOC, Flat Panel Display drivers, Power Management, and microcontrollers. Designed to meet the cost drivers IC companies face, Diamondx extends Cohu’s leadership in lowering the cost of operations.
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Semiconductor Test Services
Test Evolution’s engineering team has developed instrumentation as well as complete systems for other commercial ATE manufacturers for many years. Lab characterization and production test can sometimes require customized solutions ranging from individual instruments and subsystems to full blown systems.
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True Average Connected Power Sensors
CPS2000
CPS2000 True Average Connected Power Sensors provide USB, LAN and PoE capabilities to enable easy RF power measurement of modulated and CW signals from 50 MHZ to 8 GHz. Compatible with Windows and Linux systems, CPS2000 sensors include all the necessary drivers for programming through SCPI, IVI and LabVIEW. Connectivity and compatibility, combined with 60 dB dynamic range and 100 measurements per second, CPS2000 sensors are the ideal solution for lab, field, production test, ATE remote monitoring and embedded environments.
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Test Systems
As new products emerge and change, the requirements for the industry also increase becoming more and more challenging. Complex products require demanding and versatile test systems, capable of performing complex test cycles. The ultimate goal is to ensure the validation of the final product during the different stages of the production process.
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Probe Series
AVIOR Series
The MPI AVIOR series offers a broad lineup of high performance prober systems targeting the Optical Communications market. Our prober systems are available in Top emitting (TP), Flip chip (FP) emitting and Die/Package (DP) configurations to meet your specific test requirements. Whether it be R&D or mass production, MPI has a solution that will meet your needs for accurate and reliable measurements in conjunction with a reduced cost-of-test.
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Power Conversion Automated Test Platform
C8000
Chroma Systems Solutions, Inc.
Power conversion testing is our core competency. Chroma’s engineering delivers cost-effective automated test system and software platforms to fit your Design Validation Testing (DVT) requirements in the lab or High Speed Functional Testing in the production line. Built into each system are Chroma’s years of expertise, precision instrumentation, pre-written test libraries, and local program management with global support. From power conversion to battery to electrical safety, our test systems will maximize your time, improve your validation process, and increase your throughput.
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Pressure Decay Leak Tester
Defender
You just can’t test slow, with The Defender. The Defender is LeakMaster’s latest Pressure Decay leak testing inno vation specifically designed to reduce integration costs and improve repeatability. The Defender is ideal for a variety of pressure/vacuum decay leaktesting appli cations. It’s compact design makes it ideal for applica tions with limited space. Standard Ethernet/IP module for seamless integration with Allen Bradley EtherNet/IP or other compatible devices, eliminates I/0 wiring and reduces start-up time and hardware cost. This instrument provides ultimate control and the ability to capture valu able leak rate data for data collection systems critical for today’s production environment.
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Electromagnetic anechoic box/Shield box/Anechoic chamber
The necessity of a wireless system test has risen by the spread of recent wireless telecommunication equipment as shown in cellular phone, wireless LAN, RF-ID tag and ETC (Electronic Toll Collection system). It is necessary for a wireless test to be performed in anechoic environment in which an external noise is intercepted and a radio wave does not reflect internally. An anechoic chamber (room version of a shield box) is proper facilities but needs a wide space and a huge cost. Especially, the equipment under wireless system test on the production line can not radiate any signal radio wave outside before approval. The shield box satisfies these conditions.
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Testing Cars and Trucks
Sun Test Systems develops, produces and installs high-quality testing equipment suitable for dynamic vehicle testing at the end of the production line.As a result of the long-term and intensive cooperation with our customers products have come into being with unique features such as high safety, great flexibility, optimal operational reliability and low costs during the long life span.
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Ground Continuity Tester - 25, 30, 35 AMP
M25, 30, 35
Production / Quality Assurance Testing - Performs ground continuity tests in full compliance with BSI, VDE and IEC. Measures ground continuity from ground to the power cord ground pin of the DUT. Interface enables interconnection to any ROD-L Hipot & Leakage testers to form a complete automatic test system.
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In-circuit and Functional Tester
Compact SL
This configuration offers a completely automated solution via an integrated, SMEMA-compatible conveyor system, allowing completely automatic board handling and easy integration into high volume production lines. Configurable as ICT, pre-functional, functional and combinational. The compact footprint and the compliance with WCM criteria, enable easy and successful integration both in-line and/or within an automated test island. Cost reduction and high throughput guaranteed.
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PXI-Based Modules
PXI-based modules form the core of many measurement and automation systems. These modules are designed to integrate into design verification and high-volume production test systems. Combined with our demonstrated microwave and high-speed digital expertise, SCT’s PXI design capabilities make us well positioned to deliver innovative products to the wireless test market.
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Industrial Electronics Testing for Smart Devices & More
As more and more devices are being designed with inherent intelligence and the ability to connect and communicate, the amount and complexity of electronic content is continuously increasing for our industrial customers. They need the ability to quickly and efficiently verify proper operation of these products as they flow off the production line. Circuit Check responds to these needs by offering a wide range of industrial electronics testing solutions from consulting to complete test system and software design. We also offer adaptable support solutions to ensure proper equipment operation throughout its life cycle.
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Modular Test Systems
Whether thin film, thick film, MEMS, multilayer or bulk: With test systems from AixACCT Systems, you can characterize your piezoelectric materials both in development and during production with the greatest accuracy.
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Software Tool Especially Designed for Production Process Supervision
LEON OP
The Leon OP is a software tool especially designed for production process supervision. Therefore, the application provides the following key features:- Execution of KT ICT sequences or NI TestStand sequences- Parallel, semi-parallel or sequential execution of test sequences, individually definable per Test Sequence- Customizable User Interface, simple or detailed test views, grid or board layout arrangement possibilities- Tracing into sequence execution- User management with different user levels and restrictions per user group- Displaying execution results and statistics by panel or nest- Supporting interaction with an automation (e.g.: handler system)- Supporting interaction with a process control / MES system- Integrated Callback structure to adopt to different workflows- Maintenance view for fast displaying of fails inside a board- Result History View to quickly access the last test results- Store execution results in result files with user defined format- Autostart-option for running application in automation mode without any operator interaction at all- Several abortion criteria to abort execution by fail count (consecutive or time based)- A Maintenance View for viewing testprobe locations on the DUT is available via Aster Quadview
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VXI Digital Multiplier
4152A
The 4152A’s advanced features like limit testing, averaging, speed/resolution trade-offs, and fast function changes provide the high “test system” throughput required in today’s production test environments.
