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Silicon
atomic number 14 tetravalent metalloid chemical element.
- Applied Rigaku Technologies, Inc
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Low cost EDXRF Elemental Analyzer
NEX QC+ QuantEZ
Applied Rigaku Technologies, Inc
As a premium low-cost benchtop EDXRF elemental analyzer, the Rigaku NEX QC+ QuantEZ delivers wide elemental coverage with easy-to-learn Windows®-based QuantEZ software. Non-destructively analyze from sodium (Na) through uranium (U) in almost any matrix, from solids and alloys to powders, liquids, and slurries. The 50 kV X-ray tube and Peltier cooled silicon drift detector (SDD) deliver exceptional short-term repeatability and long-term reproducibility with excellent element peak resolution. This high voltage capability, along with multiple automated X-ray tube filters, provides a wide range of XRF applications’ versatility and low limits-of-detection (LOD).
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Automotive Back Probe Pins
142-5
Flexible 1.5 inch silicon pins provide easy back probing connections for DMM and Scope measurements
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Split Core Current Transformers
LZCK-55
Beijing GFUVE Electronics Co.,Ltd.
Outdoor waterproof current transformers are applicable for AC power system 35kV and measurement of current of power supply equipment below 10KV also can be used for microcomputer protection. This type of current transformer employs imported silicon steel which with high permeability as magnetic material, has the characteristics of Small magnetic circuit loss and can be split, its semicircular core and secondary windings employ high quality epoxy resin vacuum, casting in plastic-case(ABS or PC) which is flame retardance anti-moisture, stable performance, no maintenance.
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Schottky Barrier Ring Quads
SemiGen’s Silicon Schottky Diodes are designed for applications through 40Ghz. The special process technology utilizes various metal schemes to provide excellent performance of Low, Medium, and High Barrier applications. The end result is a low resistance diode with tightly controlled capacitance which allows for optimum performance. Low conversation loss and superior TSS make these diodes ideal for detector / mixer applications with frequency ranges from S band to Ka band as well as modulators, lower power limiters and high speed switches.
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R&D Solutions From Teledyne LeCroy Quantum Data
Teledyne LeCroy offers a wide variety of products for engineers in the R&D lab. R&D testing entails functional testing for source and sink devices as well as interoperability testing for diagnosing problems between A/V devices. Solutions for silicon chip manufactures are available for both source and sink devices. Quantum Data solutions are available for testing HDMI, MHL, DisplayPort, HDBaseT and 3G-SDI products.
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SOI Bonding Systems
An accurate wafer bonding process is the key factor in obtaining high quality single crystalline silicon films on insulating substrates. The EVG850 SOI/Direct Wafer Bonding systems are designed to fulfill a wide range of fusion/molecular wafer bonding applications, with main focus on SOI substrates manufacturing. Ultra clean handling of wafers throughout the bonding process assures high-yield and void-free bonds. All essential steps, from cleaning and alignment to pre-bonding and IR-inspection are combined in one high volume production system. EVG850 is the only production bonding system built to operate in high throughput, high-yield environments and guarantees void-free SOI wafers up to 300 mm.The EVG300 series single wafer cleaning systems are designed for efficient removal of particles. In semiconductor processing, efficient cleaning and particles removal prior to critical process steps enables maximum yield. Wafer Bonding is a process which is strongly affected by particles: each particle on the wafer surface produces a void orders of magnitude larger than its diameter, contributing to a dramatic yield loss.
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Transimpediance Amplifiers
The UDT TRAMP products are transimpedance amplifier (current-to-voltage) instruments that provide a low input impedance to accurately measure the short circuit current of phototransducers such as silicon and germanium photodetectors, vacuum photodiodes and photomultiplier tubes. The range includes the economically priced TRAMP, and for ultra precision and accuracy, the TIA-3000.
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Silicon-Microphone 8Ch Auto Test System
BK9015
Based on the BK3011 MEMS Mic Tester, the BK9015 is our fully automatic 8 channel MEMS (Silicon) mic sweep tester. Testing up to 8 DUT's simultaneously, the BK9015 can test 8 mics simultaneously and sort them according to passing grade and cause of failure! Because it uses a sweep test, it can check characteristics for the entire frequency range. Your data can be viewed in real time or stored so you can analyze problems or trends.
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Silicon Pyranometer
SP LITE2
SP Lite2 can be used under all weather conditions. The sensor measures the solar energy received from the entire hemisphere. It is ideal for measuring available energy for use in solar energy applications, plant growth, thermal convection and evapotranspiration.
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Capacitors - DC Floating/RF Bypass Mounting
Macom Technology Solutions Holdings Inc.
MACOM’s Mounting Capacitors are designed for transient protection for MICs and FETs. Since the capacitor substrate is silicon, it provides an optimum match both thermally and mechanically with the device to be mounted. A wide range of sizes and capacitance values are available as standard products. Our design flexibility allows MACOM to offer a variety of size and capacitance options for specific customer requirements.
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Temperature Measurement IR Sensors & Detectors
ST60 High Temperature
A single-channel silicon-based thermopile that will withstand operating temperatures of 225C, with a small active area of 0.61mm x 0.61mm in a TO-5 package. The reduced height package functions as an internal aperture. Two thermistor options provide ambient package temperature measurement. Currently only available with 8-14um silicon window. Time constant of 18ms with Nitrogen encapsulation gas delivers a very low Temperature Coefficient of Responsivity of -0.4%C. This detector has a very short thermal shock response to ambient temperature change.
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NUV-PL SiC Defect Inspection System
VS6845E
Industrial Vision Technology Pte Ltd.
Comply with IEC63068-3 Standard: Test method for defects using photoluminescence, Model VS-6845 SiC Wafer defect inspection system has capability on Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices.
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Life-time Measurement System For Silicon Bulks / Ingots With Non-contact
HF-90R
*Silicon bulk, Prismatic shape (JIS code), Ingot condition*Non-contact photoconduction vibration decay method*Data processing by digital oscilloscope and PC with software
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Switches-SP4T
Macom Technology Solutions Holdings Inc.
At MACOM we offer an extensive collection of switches covering multiple commercial and aerospace and defense markets. Our product portfolio has a broad frequency spectrum from DC to 70 GHz. Our silicon Heterolithic Microwave Integrated Circuit (HMIC) PIN diode process is ideal for high power and broadband switches operating from 50 MHz to 26 GHz. Our AlGaAs PIN diode process can extend the upper frequency range of our switch die beyond 70 GHz and is ideal for instrumentation and radar applications. Our GaAs pHEMT and MESFET technology is ideal for fast switching and low control voltage switches optimized for both narrow band and broadband applications. Our 75 Ohm absorptive switches are designed specifically for demanding CATV, FTTx and DBS Infrastructure and CPE applications.
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Computer-On-Module
CM22301
LinkedHope Intelligent Technologies Co.,Ltd.
CM22301 uses Intel® sixth-generation Skylake platform and Core M low-power SoC processors, and integrates the full functions of CPU, GPU and South/North Bridge on a single chip. The processor provides powerful computing and display performance with dual-core and four threads configuration. Its turbo frequency can boost up to 3.1GHz and the display output resolution can be up to 4K. CM22301 has an amazing thermal design power consumption of only 4.5W (TDP) and can be used for a variety of high-performance fanless designs. CM22301 supports up to 16GB dual-channel low-voltage DDR3L memory populated onboard, and up to 64GB on-board solid state disk silicon, as benefit the development of ruggedized products for harsh environment applications.As defined by VITA 59 specification, CM22301 provides up to 6 PCIe lanes, enabling flexible functionality expansions, such as NICs, DAQs, video capture and so on. Meanwhile, CM22301 also provides up to date computer interfaces like GbE, SATA3, USB3.0/2.0, HD Audio, etc. CM22301 uses the same 220pin board-to-board connector and Type10 pin out definition as COM Express.
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High Level Language Debugger and Emulator Tool
Universal Debug Engine
Programmierbare Logik & Systeme GmbH
With Universal Debug Engine (UDE®) PLS offers on top solutions for software development of systems-on-silicon including debug support for the 16 Bit and 32 Bit microcontrollers C16x, C166™, ST10F276, ST10F280, XC166, XC2000, XE166, XMC4500, C166S V2, SDA6000, TriCore™ from Infineon and STMicroelectronics, Power Architecture® MPC55xx, MPC560x, MPC563x, MPC57xx from NXP™, PowerPC PPC440SPe from AMCC, Power Architecture® SPC560, SPC563, SP574 from STMicroelectronics, ARM7™, ARM9™, ARM11™, Cortex™-M0, Cortex™-M0+, Cortex™-M3, Cortex™-M4, Cortex™-M7, Cortex™-R4, Cortex™-A8, Cortex™-A9, XScale™, SuperH™ SH-2A derivatives in a new multicore debug environment as well as technical support. The extensive feature list includes functions like: high speed and flexible target access via JTAG, cJTAG with OCDS L1, EmbeddedICE, OnCE, COP, DAP, DAP2, SWD support, OCDS L2 trace, MCDS trace, CoreSight™ trace, ETM trace, ETB trace, Nexus trace, ASC, SSC, 3Pin and CAN, in-system FLASH memory programming of FLASH / OTP with UDE MemTool, support of various RTOS, OSEK® and test automation tools.
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Generates Test Cases on ICE
TrekSoC-Si
TrekSoC-Si automatically generates self-verifying C test cases to run on the embedded processors in SoCs in in-circuit emulation (ICE), FPGA prototyping, and production silicon. This verifies your chips more quickly and more thoroughly than hand-written diagnostics or running only production code on the processors. TrekSoC-Si's generated test cases target all aspects of full-SoC verification and work in a variety of different environments. TrekSoC-Si is a companion to TrekSoC, which generates test cases for simulation and acceleration. TrekSoC-Si extends the benefits of TrekSoC into hardware platforms.
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Silicon Drift Detector
Octane Elite (SDD) Series
The game changing advancements in the Octane Elite Silicon Drift Detector (SDD) Series take detector technology to the next level. This line of detectors incorporates a new silicon nitride (Si3N4) window, which offers remarkable improvements in low energy sensitivity for light element detection and low kV microanalysis. The Octane Elite Series also uses the widely praised CUBE technology, which yields high speed X-ray data processing within a smaller and fully vacuum encapsulated detector device.
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Climatic Chamber
Wewon Environmental Chambers Co, Ltd.
Climatic chamber is designed to do high temperature & high humidity, high and low temperature, or temperature cycling test, Climatic chamber mainly used for quality checking and assessing their quality reliability and life test. ● The climatic chamber simulate a full range of temperature testing and humidity testing conditions.These chambers are designed for ease-of-use, reliability and performance and include many user-friendly features standard with your purchase for the best value in the industry. ● Climatic test chambers are able to provide rapid product temperature change rates and use varying levels of relative humidity to locate design problems prior to shipping your products, improving product quality and reliability. climatic chamber For conditioning of samples prior to testing. Climatic chamber also can be used for a variety of materials of high – low temperature alternating test. The test temperature, humidity, time can be programmed. Provides conditions of temperature form -70 degree to +150 degree and of humidity from 20% to 98%. ● This type climatic chamber use 16bit Industry-grade PLC, programmable controller to control the test temperature test, and recycle time, more excellent anti jamming, high reliability of the data. ● TEMI880 large color LCD touched screen temperature & humidity controller. Real-time display program running time, the number of segment, the remaining time, repeat frequency,can display experimental data, including the pre-set segment time, heating status, calendar time, etc; climatic chamber directly digital display. ● Climatic chambers apply controllable silicon step-less adjusting technology to adjust temperature and humidity test continuously and precisely, and without over heated as the PID adjusting function. ● The thermal insulation material between outside and inside for climatic chamber is high-quality ultra-fine glass fiber insulation cotton, good thermal insulation effectivity. Thermal insulation layer composed of flame fire PU + glass wool insulation (insulation thickness 10.0 cm)
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40 Gigabit Ethernet AdvancedTCA® Fabric Interface Switch Blade
aTCA-3710
The aTCA-3710 is a high performance, high bandwidth, 40G Fabric switch blade for AdvancedTCA® platforms. This product is ideal for bandwidth intensive telecom applications such as wireless access controller, DPI/security network, IPTV, IP multimedia subsystem, RNC/BSC, broadband access/bearer network, data center, and LTE/4G network applications. The aTCA-3710 provides 40GbE hub-to-node connectivity and integrated switch silicon that supports load balancing, priority queues, packet classification, and flow control to enable strict bandwidth management for implemented applications.
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SiC Diodes
ST’s silicon carbide diodes range from 600 to 1200 V – as single and dual diodes – and feature unbeatable reverse recovery characteristics and improved VF. Available in a wide variety of packages, from D²PAK to TO-247 and the insulated TO-220AB/AC, they offer great flexibility to designers looking for efficiency, robustness and fast time-to-market. ST’s SiC Schottky diodes show a significant power-loss reduction and are commonly used in hard-switching applications such as high-end-server and telecom power supplies, while also intended for solar inverters, motor drives and uninterruptible power supplies (UPS). ST’s automotive-grade 650 and 1200 V SiC diodes – AEC-Q101-qualified and PPAP capable – feature the lowest forward voltage drop (VF) on the market, for optimal efficiency in electric vehicle (EV) applications.
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Digital Solutions
Digital ST60 Thermopile (Preliminary)
A single channel silicon- based thermopile in a TO-5 package that includes integrated electronics which incorporate an industry standard digital SMBus interface. The small active area size is 0.61mm x 0.61mm.
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Silicon O/C Content Tester
OCT-2000
Manual, non-contact measurement of wafer thickness, TTV and bow. Portable and easy to set-up, the Proforma 300/G measures all wafer materials including Silicon, Gallium-Arsenide, Indium-Phosphide and wafers mounted to sapphire or tape.
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Super Silicon Resistivity and Type Tester
HS-3FC II
Super Silicon Resistivity and Type Tester is specially designed for silicon sorting，it can quickly test the silicon type, heavy-doped, resistivity and current, and can be widely used in all kinds of silicon sorting, like granular polysilicon material, break semiconduct silicon wafer, chunk material, top and tail material and so on. Furthermore, it integrates two probes, three probes and four probes. With the three probes, it could show type and heavy type simultaneously, strongly improved the sorting efficiency.
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Semiconductor Large Range Type Tester
HS-PSTT
HS-PSTT large Range Type Tester is a high-grade semiconductor material Type testing equipment,has the feature that testing large range,special suitable for testing the high-Resistivity Silicon Material(contains Silicon Core, phosphorus stick, Boron stick and so on),the resistivity require range is 0.0001～19999Ω·cm, Covers all measurement requirements of various silicon material type testing at the semiconductor and solar energy level at present .
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Silicon Oscillators
Analog Devices silicon oscillators are frequency programmable via pin-strapping, or through the resistor connection or serial interface (SPI or I2C). These solid-state clocks are well-suited for general-purpose usage, such as PGAs, ASICS, microprocessors, or UARTS, and they operate from 1 kHz to 170 MHz. Silicon oscillators are also ideal switching regulator clocks as they provide synchronization and EMI reduction (via spread spectrum).
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HF/HNO3 Monitor
CS-153N
The CS-153N is a high-precision chemical solution concentration monitor designed to meet the strict demands of semiconductor wet-etching processes. Etching processes use HF/HNO3 solution to etch silicon oxide and remove particles from the wafer surface. The CS-153N continually monitors each component of the HF/HNO3 solution (HF/HNO3/H2O), alerting the user each time the solution is replaced or replenished. This allows you to maintain the concentration of the HF/HNO3 solution within the tolerance range, while eliminating unnecessary solution replacement.
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80Gbps Video Analyzer/Generator for DisplayPort 2.0 Testing
M42d
The Teledyne LeCroy quantumdata M42d Video Analyzer/Generator provides functional and will support compliance testing for video, audio and protocol of DisplayPort 2.0 and DisplayPort 1.4. The M42d supports legacy DisplayPort lane rates of 1.62, 2.7, 5.4, 8.1 Gb/s and the new DP 2.0 higher speed lane rates of 10.0, 13.5, & 20.0 Gb/s data rates with the new line coding—128b/132b. The protocol analyzer provides a snap shot status view and deep analysis using captures of incoming DisplayPort 2.0 streams from source devices including DSC/FEC compressed streams. The M42d’s video generator can be used for testing silicon as well as devices such as displays, USB-C adapters, extenders, etc. The video generator offers a large library of standard video timings and test patterns necessary for testing next generation high resolution displays.
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Silicon Pyranometer
LPSILICON-PYRA04
Pyranometer with silicon photodiode for measuring the GLOBAL SOLAR IRRADIANCE, diffuser for cosine correction. Spectral range 400…1100 nm.
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Blackbody System
IR-563/301
Infrared Systems Development Corp.
IR-563 is a ideal source for the Near (1-3 um), Mid (3-8) and Far (8-30+ um) infrared bands. The IR-563 has been the industry standard 1000º C blackbody for more than 30 years, and continues to provide excellent service to infrared applications throughout the industry. The IR-564 extends the temperature range of the IR-563 to 1200º C by changing cavity materials to Silicon Carbide and high purity Alumina ceramics, otherwise the two units are virtually identical.
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Thermal Neutron Detector
TN15
The TN15 high sensitivity thermal neutron detector utilizes a state-of-the-art silicon photomultiplier (SiPM) and offers world-leading specification in a compact form. The TN15 surpasses the performance of a 100mm long 13mm3 He tube at 4 atmospheres and does not need cooling but operates at room temperature.
