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Bi-Directional Differential-TTL I/O PXI Card
GX5642
The GX5642 is a 3U PXI instrument card that can be used for general data acquisition, process control, Automatic Test Equipment (ATE), Functional Test, and factory automation applications. The GX5642 consists of 64 bi-directional TTL-to-differential LVDS I/O channels. Each channel has two ports (TTL and LVDS) and can be individually set to operate in either conversion or static I/O modes.
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Standards Reference for Test Systems PXI Card
GX1034
The GX1034 offers PXI system designers the capability to develop a system re-certification strategy that employs only internal system resources. By incorporating the GX1034 as part of a system configuration, it is possible to develop a system accuracy verification strategy that can recertify a system's source and measure baseband instrumentation resulting in simplified support / maintenance logistics and improved system availability.
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OLED Lifetime Test System
58131
The 58131 Lifetime Test System is designed specifically for the OLED industry. Model 58131 provides twoquadrant constant current (CC) and constant voltage (CV) stimulus to each OLED panel and acquires electrical and optical characteristics automatically. Two independent and isolated precision source-and-measure units (PMU) are incorporated in one modular card, which is capable of testing two OLED panels. Additional instrument cards are added to expand test capacity. Hot plug and play is a key feature of 58131. When a UUT fails or an instrument card needs to be replaced, 58131 does not have to be shutdown and testing continues for other UUTs. Hot plug and play obviates life test cycle restarts due to isolated faults and significantly improves life test efficiency. We firmly believe that hot plug and play capability should be mandatory for all lifetime test systems.
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PCIe 5.0 Test Platform
PXP-500A
The Teledyne LeCroy PXP-500A Test Platform provides a convenient means for testing PCIe 5.0 cards with a self-contained portable and powered passive backplane. The PXP-500A provides power required for both cards under test.
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FPGA PXI Card with 40 Channel ECL Buffer Module
GX3640
The GX3640 is comprised of the GX3500 FPGA card and the GX3540, 40 channel ECL expansion card. It is a 3U PXI instrument card that can be used for general data acquisition, process control, Automatic Test Equipment (ATE), and functional test applications. The GX3640 consists of 20 differential ECL drivers and 20 differential ECL receivers. Each channel can be accessed via software commands for use in static I/O applications.
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Test Card Generator
TCG1
This generator provides a standard 75O, 1-volt p-p; PAL encoded CCIR video signal for the testing of monitors and other CCTV equipment. The Test Card Generator TGC1 may display one of four test patterns , (i) Colour bars with reference, (ii) Red Raster, (iii) Peak White Raster and (iv) Composite Test Card (see picture below). The Test Card Pattern incorporates many of the attributes of broadcast test patterns for the evaluation and setting up of CCTV video equipment.
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Creepage Distances Test Card
CX-P27
Shenzhen Chuangxin Instruments Co., Ltd.
Creepage Distances Test Card Brief DescriptionCreepage Distances Test Card, Refer to GB4706.1-2005 the 29th Item Atc
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Magnetic Stripe Test Cards
Test Limit Cards (and tickets) are nominally encoded to ISO standards BUT WITH specific parameters deliberately set to predetermined levels, which can be inside or outside the ISO limits. The Test Limit Cards are designed for use by Test\Inspection Departments, Field Service Engineers, Reader \ Encoder Development Engineers to check and confirm proper operation of magnetic stripe reading equipment (e.g. ATMs and POS).
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Probe Card Test & Analysis
Automated probe card test and repair is used to monitor probe card health to ensure cards are ready and capable of testing semiconductor devices. In cases where the card is not meeting performance specification, repairs may be performed such as tip adjustment or card cleaning, thus returning the card quickly to a production state.
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Test & Test Development for Circuit Card Assembly
Teledyne Advanced Electronic Solutions performs comprehensive testing at the CCA and system level assembly. Teledyne AES can perform testing developed by the customer or develop a complete test strategy for the customer’s products.- Bed of Nails FixtureIn-Circuit Test (Bed of Nails) or Flying Probe Testing for rapid feedback on CCAs- Functional testing of CCAs or complete systems- Environmental testing to include vibration, thermal cycling, HASS, etc.- CCA and system level test development- High frequency testing – currently to 40 GHz- High power system testing – currently to 4kW
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Advanced Circuit Card Automated Test
ACCAT
The ACCAT is designed to support diagnostic and acceptance test requirements across a wide spectrum of testing parameters. ACCAT provides a suite of core parametric test instruments, advanced GUI based software, Huntron Access Robotic probing and Huntron Analog Signature Analysis (ASA). ACCAT provides stimulus and asurement capabilities necessary for full functional and parametric testing of circuit card assemblies along with robotic guided probes for fault verification and debug. The Huntron ASA test is ideal for pretest or safe to power up procedures protecting the integrity of the test system.
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High Flexibility Test Controller Card
TCC 1800-UE
The TCC1800-UE Test Controller Card is a generic control board for production testing of printed circuit boards (PCBs). The board is controlled by a command language on a PC to which it is connected via Ethernet.The TCC1800-UE is designed to work with positive voltages up to 24V. The card provides extensive IO: Analog and digital interfacing, counters, PWM outputs, bidirectional I/O, ethernet-, CAN, USB, SPI and I2C interfacing.
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In-Service Electrical Continuity Test Card
Cisco ONS 15454
The Cisco ONS 15454 In-service Electrical Continuity Test Card is a solution for confirming proper DS-1 and DS-3/EC-1 cabling between the Cisco ONS 15454 shelf assembly electrical interface adapter (EIA) panels and the user's patch panels. The solution is designed for shelf installations that are presently carrying traffic and tests for common wiring errors including electrical shorts, opens, wrong connections, and tip/ring reversals.
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Smart Card Module Test Cells
Current and voltage measures are executed on defined pins, in stable conditions.Measurements:- Open/short- Input leakage current- IDD Supply instant/average current test (static/dynamic mode)- Input capacitance @13 MHz and inductance- Retro modulation index (RMI)Test of passive devices:- Capacitors- Resistors- Resonators
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AFDX ® / ARINC 664 Test Cards
Our AFDX ® / ARINC664 test cards can be used for test and simulation applications in which it is necessary to send and receive data via the AFDX® data bus. They support the 10/100 Mbit / s ARINC 664 Part 7 Ethernet interface as well as the next generation 1 Gbit / s Ethernet. / ARINC 664 test cards are delivered with device drivers, high-level interfaces (APIs) for Windows Linux, VXWorks and LabVIEW / LabVIEW Real-Time (further on request).
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Standards Reference for Test Systems PXI Card
GX1034
The GX1034 offers PXI system designers the capability to develop a system re-certification strategy that employs only internal system resources. By incorporating the GX1034 as part of a system configuration, it is possible to develop a system accuracy verification strategy that can recertify a system’s source and measure baseband instrumentation – resulting in simplified support / maintenance logistics and improved system availability.
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JTAG/Background Debug Mode Test System PXI Card
NX5300
The NX5300 is a single slot 3U PXI device and interfaces to the unit under test via an On-Chip Debug (OCD) or JTAG port. The NX5300 is a high performance JTAG based background debug mode (BDM) diagnostic system designed for functional test, development, programming and troubleshooting of microprocessor and microcontroller based embedded processor systems.
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ARINC818 Cards
> ARINC818 is a specification which has become an Industry standard for the transmission of uncompressed digital video. This commercial standard uses Fibre Channel as a point-to-point communication link for low latency with the ARINC818 defining the packetized protocol for transmission of the digital video information. It is highly flexible and can be used for a variety of onboard display systems in both commercial and military applications. AIM’s ARINC818 cards use our field proven Common Core hardware design giving the best performance, best feature set and highest functional integration on the market. The use of SoC (System on Chip) based core designs with one dual core RISC processor per port, massive DDR3 memory and IRIG-B time encoder/decoder functions are standard. The ARINC818 modules are available in PCIe formats.The new ultra high performance intelligent 4-lane PCIe 2.0 interface modules offer 2 ports with full function test, simulation, monitoring and analyzer functions for ARINC818 interfaces. The dual core processor provides onboard processing and data transfer capabilities for the most demanding applications including ARINC818 support done on board level. Large and high data throughput DDR3 RAM is accessible for the onboard processor as is a high performance FPGA implementing the customized ARINC818 Interfaces enabling the board to analyze incoming data in real time. Each module provides 2 ARINC818 compliant ports. SFP cages make it suitable for different media types as optical or electrical network technologies. Each module is delivered with a Board Support Package (BSP) containing the onboard driver software, a full Application Programming Interface (API) and detailed getting started and programming guides. Powerful PBA.pro databus test and analysis software is optionally available for all our ARINC818 cards.
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ARINC825 Cards
AIM’s ARINC825 cards can work either with full functionality as an active CAN node for testing and simulating or in listening only mode for monitoring and recording purposes of Avionic CAN bus (ARINC825) applications on up to 4 electrically isolated CAN bus nodes concurrently. All nodes are in conformance with the ISO11898-1/-2 standard. They are accessible by software separately and can be used as 4 independent CAN bus nodes. An onboard IRIG-B time decoder allows users to accurately synchronize single or multiple modules to a common time source. All supported signals are available through front I/O and rear I/O interface. ARINC825 cards consist of FPGA based CAN interface controllers as well as a FPGA based 32-bit microcontroller core and a separate processor for IRIG-B synchronization with high resolution time stamping. All nodes are operating concurrently at CAN bus high speed bit rate of up to 1Mbit/s with the intelligence to process scheduling of CAN frames in real time onboard to significantly off-load the host processor.For embedded applications the AMC825-4 PMC module is available in a conduction cooled version. Using AIM’s family of PCI, CPCI (3U and 6U) and VMEbus carrier cards for PMC our clients have off the shelf solutions in a broad range of card formats. ARINC825 (CAN bus) modules are delivered with an Application Programming Interface (API) and Driver Software compatible with Windows, Linux and VxWorks.An ARINC825 Resource Component is available for AIM’s PBA.pro™ databus test and analysis tool including Tx and Rx simulation capabilities, a Chronological Bus Monitor and support for decoding of payload data within CAN messages. This allows to implement a powerful ARINC825 (CAN bus) analyzer or a complete test system in conjunction with other AIM avionics databus interfaces and PBA.pro™ supported 3rd party hardware.
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PCI Card
EXC-1394PCI
The EXC-1394PCI card for the PCI bus is an intelligent test and simulation card for interfacing to an IEEE-1394 data bus. It implements a 1394b PHY layer, operating at 100, 200, or 400 Mbps.
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Probe Card
VS Series
Japan Electronic Materials Corp.
*Vertical contact Probe Card with Spring*Suitable for Area array Bump Test
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Probe Card
T40™ Series
Ultra low noise and fast settling modeling and characterization tests are made possible by Celadon’s patented ceramic probe cards.
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Probe Card
VC20E Series
The 20mm VC20 is a highly adaptable probe card solution for a wide variety of tests including Modeling & Characterization, Wafer Level Reliability or Parametric Test. It can be easily combined with different interfaces to create modular probe cards supporting Keithley, Keysight or other custom tester platforms. Probes can be configured in either single or dual layer.
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Probe Card
VC43™/VC43EAF™
VC43™/VC43EAF™ probe cards offer a larger format version of the popular VC20. In addition to saving time, another advantage of the modularity is the ability to leave the interface in place and simply install the VC43™ topside using Celadon’s twist and lock insertion tool which minimizes the possibility of triboelectric or interconnect issues that can occur during typical probe card changes. The VC43™ can be used for production parametric test, modeling, characterization, and wafer level reliability testing. Cards can be configured up to 104 probes in either single or dual layer with near vertical probes to minimize scrub lengths on pads allowing the VC43s to probe pads as small as 30 microns.
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Probe Card
VC20E Lab
*20 millimeter ceramic probe card*Optimized for DC parametric test, modeling and characterization, and single site WLR*Can be quickly installed using an interface tool into various interfaces and takes minimal storage space on the test floor*Effective operating temperature range from -65° to 200° C*Leakage as low as 5fA/V. If you require faster settling time, click here*Can be configured with up to 48 probes
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Probe Card
Indexer™
The patented Indexer™ is the industry’s first automatic probe card changer designed for lights out parametric test.*Can support up to five VC20™’s with Advanced Cantilever™ technology, any variety*Card changes are complete in seconds*Fully programmable*Tested for hundreds of thousands of touchdowns.
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Probe Card
Tile-on-Card™
Celadon’s uniquely robust and repairable patented probe-in-ceramic crash resistant probe cards reduce maintenance headaches while increasing tester utilization. Celadon’s TOC™ probe cards are known for achieving 10 million+ touch downs before rebuild on test floors worldwide.
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Probe Card
Japan Electronic Materials Corp.
The probe card is a tool for testing semiconductors used at "Wafer Test" to check quality of IC or LSI in the first process of semiconductor manufacturing. The probe card is expendable.
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Probe Cards
Direct Dock
Direct dock style wafer probing allows for a higher bandwidth, increased pin density and testing more devices in parallel. Direct dock probe cards also support the growing movement of traditional final test to wafer probe which allows for known good die (KGD) and reduced cost of ownership.
