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Transmission Electron Microscopes
image a beam electrons through a thin specimen.
See Also: Electron Microscopes
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Transmission Electron Microscope
TEM
Atomic Resolution Electron Microscope offering a maximum accelerating voltage of 300 kV, and equipped with JEOL’s own Cs Correctors. This instrument guarantees an unprecedented STEM-HAADF image resolution of 63 pm.
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High-end Transmission Electron Microscope
CryoARM
JEOL announces the latest member in its family of high-end transmission electron microscopes, the CryoARM. This highly automated TEM is designed for unattended operation and high throughput imaging of cryo-EM specimens. The CryoARM was initially introduced to a select audience at the 2016 Gordon Research Conference in Hong Kong, M&M 2016 in Columbus, OH and EMC 2016 in Lyon, France. The CryoARM is a dedicated cryo-TEM, based on the highly successful JEOL ARM (Atomic Resolution Microscope) series, an ultrahigh performance, highly stable platform considered to be the "best-in-class" TEMs. The development of the CryoARM was accomplished in collaboration with leading Life Science researchers.
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Segmented STEM Detector
Opal
In a drive to meet our customers’ needs, El-Mul developed a detection solution for Scanning Transmission Electron Microscopes (STEM) which can support multiple applications such as DPC, cryo tomography, imaging of strain, charge, light elements or Z-contrast.
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TEM Sampler
Naneos Particle Solutions gmbh
The naneos partector TEM sampler is the perfect marriage between simplicity and power: You can use it as a simple survey instrument to quickly identify nanoparticle sources in workplaces. You can also use it to sample particles directly to a standard transmission electron microscope (TEM) grid.
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Electron Microscope Analyzer
QUANTAX Micro-XRF
Micro-X-ray Fluorescence (Micro- XRF) spectroscopy analysis is a complementary non-destructive analytical technique to traditional Energy Dispersive Spectroscopy (EDS) analysis using a Scanning Electron Microscope (SEM).
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Electron Microscope Analyzer
QUANTAX EDS for TEM
Long standing expertise in EDS ensures the configuration of the best solution for your specific microscope (STEM, TEM or SEM) thanks to slim-line detector design and geometrical optimization for each microscope pole piece and EDS flange type
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Electron Microscope Analyzer
QUANTAX FlatQUAD
QUANTAX FlatQUAD is the EDS microanalysis system based on the revolutionary XFlash® FlatQUAD. This annular four-channel silicon drift detector is inserted between SEM pole piece and sample, achieving maximum solid angle in EDS.
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Electron Microscope Analyzer
QUANTAX EDS for SEM
Bruker's latest generation of QUANTAX EDS features the XFlash® 7 detector series, which provides the largest solid angle for X-ray collection (also called collection angle) and the highest throughput.
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Electron Microscope Analyzer
QUANTAX EBSD
QUANTAX EBSD system, with its popular OPTIMUS 2 detector head, is the best available solution for analyzing nanomaterials in the SEM
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Electron Microscope Analyzer
QUANTAX WDS
The QUANTAX WDS (WDX) for SEM consists of the XSense wavelength dispersive spectrometer yielding the best resolution among all parallel-beam WDS systems.
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Electron Microscope Analyzers
Bruker’s electron microscope analyzers EDS, WDS, EBSD and Micro-XRF on SEM offer the most comprehensive compositional and structural analysis of materials available today. The full integration of all these techniques into the ESPRIT software allows you to easily combine data obtained by these complementary methods for best results.
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Electron Microscope Analyzers
Bruker’s electron microscope analyzers EDS, WDS, EBSD and Micro-XRF on SEM offer the most comprehensive compositional and structural analysis of materials available today. The full integration of all these techniques into the ESPRIT software allows you to easily combine data obtained by these complementary methods for best results.
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Scanning Electron Microscope
Verios G4 XHR SEM
The Thermo Scientific™ Verios G4 scanning electron microscope (SEM) provides sub-nanometer resolution from 1 to 30 kV and enhanced contrast needed for precise measurements on materials in advanced semiconductor manufacturing and materials science applications, without compromising the high throughput, analytical capabilities, sample flexibility and ease of traditional Scanning Electron Microscope (SEM).
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Scanning Electron Microscope
JSM-IT510
Scanning electron microscopes (SEMs) are indispensable tools not only for research but also for quality assurance and manufacturing sites.At those scenes, the same observation processes need to be performed repeatedly and there has been a need to improve the efficiency of the process.
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Scanning Electron Microscope
SEM
Delivers the world's best resolution with the incorporation of the newly-developed, super-high resolution Gentle Beam (GBSH). In addition, the maximum probe current of the In-lens Schottky Plus gun has been increased from 200 nA to 500 nA.
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Scanning Electron Microscopes
Our Scanning Electron Microscopes (SEMs) resolve features from the optical regime down to the sub-nanometer length scale.
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Scanning Electron Microscopes
SEM
Scanning Electron Microscopes (SEM) scan a sample with a focused electron beam and obtain images with information about the samples’ topography and composition.
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Electron Microscope Sample Preparation
Excellent sample preparation is the prerequisite for first-class electron microscopy. Be prepared – for great results in EM Sample Preparation! Perfect preparation makes the difference between trying and achieving, between failure and success, between results and excellent results. So be prepared for great results with Leica Microsystems!
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Scanning Electron Microscope (SEM)
Prisma E
Prisma E scanning electron microscope (SEM) combines a wide array of imaging and analytical modalities with new advanced automation to offer the most complete solution of any instrument in its class. It is ideal for industrial R&D, quality control, and failure analysis applications that require high resolution, sample flexibility and an easy-to-use operator interface. Prisma E succeeds the highly successful Quanta SEM.
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Atomic Resolution Analytical Electron Microscope
NeoARM JEM-ARM200F
"NEOARM" comes with JEOL’s unique cold field emission gun (Cold-FEG) and a new Cs corrector (ASCOR) that compensates for higher order aberrations. The combination of a Cold-FEG and ASCOR enables atomic-resolution imaging at not only 200 kV accelerating voltage, but also a low voltage of 30 kV."NEOARM" is also equipped with an automated aberration correction system that incorporates JEOL’s new aberration correction algorithm for automatic fast and precise aberration correction. This system enables higher-throughput atomic-resolution imaging even at low accelerating voltages. Furthermore, a new STEM detector that provides enhanced contrast of light elements is incorporated as a standard unit.
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Focused Ion Beam Scanning Electron Microscopes
FIB-SEMs
Combine imaging and analytical performance of a high resolution field emission scanning electron microscope (FE-SEM) with the processing ability of a next-generation focused ion beam (FIB).
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Scanning Electron Microscope w/ EDX Laboratory
Trialon has the equipment and experienced staff to operate this highly technical piece of laboratory equipment. Our state-of-the-art materials analysis lab located in Auburn Hills, MI is managed by a Ph.D with over 20 years of hands-on experience in root cause failure analysis of design, material and process for current and future products.
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Electron Multipliers
Electron multipliers are mainly used as positive/negative ion detectors. They are also useful for detecting and measuring vacuum UV rays and soft X-rays. Hamamatsu electron multipliers have a high gain (multiplication factor) yet low dark current, allowingoperation in photon counting mode to detect and measure extremely small incoming particles and their energy. This means our Hamamatsu electron multipliers are ideal for electron spectroscopy and vacuum UV spectroscopy such as ESCA (electron spectroscopy for chemical analysis) and Auger electron spectroscopy as well as mass spectroscopy and field-ion microscopy.
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Electron Sources
SPECS Surface Nano Analysis GmbH
To our customers in research and industry we offer a variety of sources for deposition, excitation and charge neutralization as well as analyzers and monochromators. Most of our sources originate from product lines which we have taken over from Leybold AG, Cologne, and from VSI GmbH. The X-ray monochromator Focus 500 and the UV monochromator TMM 302 are original developments by SPECS.Compliance with industry standards, a good price-performance ratio, stability, and longevity are the guidelines for our product development. We focus on standardized easy handling, user-friendliness, standardized software interfaces and safety.
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Electron Spectrometers
SPECS Surface Nano Analysis GmbH
Nanotechnology is focused on the engineering and the physical properties of small structures. Therefore techniques that have sensitivities at a scale of 0.1 nm to 100 nm are required to study these structures. Different methods of electron spectroscopy (XPS, UPS and AES) have a sensitivity in this range and are therefore key techniques in nanoscience.Thanks to our high level of expertise in electron optics and electronics we can offer electron spectrometers with the highest resolution and transmission possible.
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Real-Time X-Ray Imaging and Variable Pressure Scanning Electron Microscope
Trialon has the equipment and experienced staff to operate this highly technical piece of laboratory equipment. Our state-of-the-art materials analysis lab located in Auburn Hills, MI is managed by a Ph.D with over 20 years of hands-on experience in root cause failure analysis of design, material and process for current and future products.
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Microscope
Instrument that produces enlarged images of small objects, allowing the observer an exceedingly close view of minute structures at a scale convenient for examination and analysis.
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Microscopes
A digital or traditional optical microscope can help engineers check on their high-speed probing activities much more easily. It will assure the probe tips will touch on the right contact(s), with correct contact angle and right amount of force. We use both digital and optical microscopes in our own lab. The information in this page is to help you choose a microscope best suits you.
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Microscopes
Bruker's world-leading microscopy systems are helping scientists and engineers to make breakthrough discoveries and develop new applications and products that improve nearly all aspects of our world. Our microscopes enable scientists to explore life and materials at the molecular, cellular and microscopic levels.
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Microscopes
Olympus is a leading manufacturer of microscopes for life science and industry. With over 100 years of experience developing microscopes, we offer innovative optical solutions for many applications. Explore our microscopes for education, training, laboratories, and leading-edge research in the life science fields, such as pathology and cytology.
