PCIe 5.0 Test Platform
PXP-500A - Teledyne LeCroy
The Teledyne LeCroy PXP-500A Test Platform provides a convenient means for testing PCIe 5.0 cards with a self-contained portable and powered passive backplane. The PXP-500A provides power required for both cards under test.
Test Platform
Format: PCIe
Subcomponents
SMA Jack (Female): Quantity: 1
SMA Jack (Female): Quantity: 1
SMA Jack (Female): Quantity: 1
SMA Jack (Female): Quantity: 1
-
product
Gen-Z
Gen-Z is a data-access technology designed to provide high-speed, low-latency, memory-semantic access to data and devices via direct-attached, switched or fabric topologies. Gen-Z components use low-latency read and write operations to directly access data and use a variety of advanced operations to move data with minimal application or processor involvement. Gen-Z fabric utilizes memory-semantic communications to move data between memories on different components with minimal overhead. Memory-semantic communications are extremely efficient and simple, which is critical to delivering optimal performance and power consumption. Teledyne LeCroy provides protocol analysis and error injection test equipment to support development and debug of Gen-Z based devices
-
product
PCI Express
PCIe
PCI Express (PCIe) has become the leading interconnect technology to succeed the Peripheral Connect Interface (PCI) architecture. The PCI Express(PCIe) architecture retains the PCI usage model and software interfaces for investment protection and smooth development migration. The technology is aimed at multiple market segments in the computing and communication industries, and supports chip-to-chip, board-to-board and adapter solutions. PCI Express 5.0 currently runs at 16GT/s or 32Gbps per lane in each direction, providing a total bandwidth of 128GBps in a 16-lane configuration which is the largest size in use.
