SoC Test System
V93000 SoC / Smart Scale - Advantest Corp.
Advantest’s V93000 Smart Scale generation incorporates innovative per-pin testing capabilities. Each pin runs it own sequencer program for maximum flexibility and performance, for example in multisite applications. Full test processor control ensures time synchronization between all card types, like digital, Power, RF, mixed signal and so on. The user benefits are reduced test time, best repeatability and simplified program creation. The system design makes it easy to extend your configuration with new modules and instrumentation, as your test needs change.
Topics
- Test Systems
- System Test
- Test
- Systems
- SoC
- MIxed Signal Test Systems
- Power Test Systems
- Digital Signal Processor
- Test Program
- Design For Test
- Test Applications
- Test Cards
- Control Systems
- Mixed Signal
- Performance Testing
- RF Power
- Smart Card
- Synchronization Modules
- Time
- Cards
- Control
- Digital
- Instrumentation
- Modules
- Power
- RF
- Scales
- Sequencers
- Signal
- Synchronization
- Testing
