Spring Probes
ECT (Everett Charles Technologies)
An essential component in the testing of electronic components. In Test & Measurement applications, they are used to make contact with test points, connecting the DUT (device under test) with the test equipment.
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Battery Probes
Offer a wide range of terminations for SMT, PTH or double-ended probes for simplified hardware mount solutions.
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Bead Target Probes
A methodology for placing test points directly on a PCB's copper traces, or top metal, thus forming a “Bead Probe”.
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Custom Probe
When your application demands a unique set of physical attributes, Everett Charles Technologies’ team is ready to provide a custom solution. ECT has been providing custom spring probes for over 50 years. By leveraging this vast experience ECT can effectively work with you to understand your requirements and translate them into a targeted solution.
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High Current Probes
*Low internal resistance to minimize arching*PogoPlus bias ball design*High current optimized base material and plating*Higher temperature spring design*Specialized high current tip geometry
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RF High Frequency Probes
*Low impedance*High bandwidth up to 20 GHz*Repeatable measurements*Coaxial design*Interchangeable center conductor
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ICT / FCT Probes
*Decades of experience*Proprietary base materials and coatings*Innovative designs*Optimized electrical path
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Solar Panel Probes
*Effective *Reliable solution for non-destructive electrical contacting *For standard or custom applications
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Step Probes
*Precisely controlled probe travel*Step tip geometry*Replaceable and non-replaceable versions*Plating options available
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Switch Probes
Switch point flexibilityDesigned for long life and reliable performanceVariety of tip options
