![Low Voltage Burn-in and Test System](https://d27wgn5g4t3wja.cloudfront.net/img/cc9bc994-cced-4dfe-abe1-b51825a2027e/27949.png)
Low Voltage Burn-in and Test System
Max 450 - Aehr Test Systems
For burning-in and testing DUTs such as microprocessors, DSPs and logic devices, which require low voltage. Output monitoring gives functional test results for every device during burn-in