Semiconductor Memory Tester
T5851 - Advantest Corp.
Advantest Corporation has introduced the T5851 system, designed to provide a cost-effective test solution for high-performance universal flash storage (UFS) devices and PCIe BGA solid-state drives (SSDs) memory ICs in high demand by makers of low-power, mobile applications such as smart phones, tablets and ultra-portable laptops. The flexible T5851 tester is available in both production and engineering models. This allows the system to be used for reliability and qualification testing as well as test-program development or, when equipped with an automated component handler such as Advantest''''s M6242, high-volume production. As a fully integrated, system-level test solution, the T5851 provides multi-protocol support in one tool while its tester-per-DUT architecture and proprietary hardware accelerator allow it to achieve industry-leading test times.
Topics
- Memory Testers
- Memory
- Testers
- Test Systems
- Semiconductor
- Semi-conductor
- Production Test Systems
- Flash Memory
- Automated Test Systems
- Memory Test Systems
- Mobile App Testing
- Universal Flash Storage
- System Test
- Component Test
- Test Applications
- Test Development
- Test Engineering
- Application Development
- Component Testers
- Flash Device
- Memory Device
- Mobile Application
- Mobile Phone
- Test
- Systems
- BGA
- Component
- Development
- Drives
- DUT
- Handlers
- Model
- PCIe
- PCI Express
- Phone
- Qualification
- Reliability
- Testing
- Time
- UFS
- Well
