![Fastest Flying Probe Test System for Semiconductor Substrate Interconnect Test](https://d27wgn5g4t3wja.cloudfront.net/img/4b36cd3e-fb90-4256-9a3c-74d0c721be71/13689.png)
Fastest Flying Probe Test System for Semiconductor Substrate Interconnect Test
GATS-3200 - W.M. Hague Company (W.M. Hague)
* Test individual packages or * Test Multi-image panels with Step&Repeat Function * single flying probe top using very high speed voice coil motor (VCM) technology * 50 - 100 tests per second ... high throughput * Dual Flying Probe Top for testing bump-to-bump nets * flying probe head allows testing of all nets including each power and ground point * 4-wire test capability