Test System
ITC57300 - Integrated Technology Corp. (ITC)
The ITC57300 Dynamic Parametric Test System mainframe accepts Test Heads that perform nondestructive transient measurements on semiconductor devices such as Insulated Gate Bipolar Transistors (IGBT), power MOSFETs, diodes, and other bipolar devices(requires additional optional bias power supplies and custom personality boards). Included in the mainframe are all test equipment and software necessary to analyze and perform resistive and inductive switching time, switching losses, gate charge, Trr/Qrr, and other transient tests.
Topics
- System Test
- Test Systems
- Test
- Systems
- Bipolar Power
- Power Test Systems
- Switching Power Supplies
- Switch Test
- Bias Test
- Board Test
- Diode Test
- Non-destructive Test
- Parametric Test
- Semiconductor Test
- Test Boards
- Test Heads
- Test Software
- Power Supplies
- Switching Systems
- Gate
- Mainframes
- Power
- Switching
- Transient
- Analyze
- Bias
- Boards
- Diode
- Equipment
- Heads
- IGBT
- Measurement
- MOSFET
- Semiconductor
- Semi-conductor
- Software
- Time
